JPS6428863A - Semiconductor wafer - Google Patents

Semiconductor wafer

Info

Publication number
JPS6428863A
JPS6428863A JP62185293A JP18529387A JPS6428863A JP S6428863 A JPS6428863 A JP S6428863A JP 62185293 A JP62185293 A JP 62185293A JP 18529387 A JP18529387 A JP 18529387A JP S6428863 A JPS6428863 A JP S6428863A
Authority
JP
Japan
Prior art keywords
discriminating
memories
chip
wafer
dicing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62185293A
Other languages
Japanese (ja)
Inventor
Masahide Kaneko
Ryuichi Matsuo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP62185293A priority Critical patent/JPS6428863A/en
Publication of JPS6428863A publication Critical patent/JPS6428863A/en
Pending legal-status Critical Current

Links

Landscapes

  • Semiconductor Memories (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PURPOSE:To prevent a wafer from mixing with the other wafers, by providing a wafer discriminating memory on a dicing region between mask ROM chips. CONSTITUTION:In a silicon wafer 11 having a mask ROM chip 14 divided by dicing lines 12, 13, discriminating memories 15 are arranged on the dicing line region. An original data of manufacturing maker are programmed on the discriminating memories. By reading the data stored in the discriminating memories, the mixing with the other wafers can be prevented. On the occasion of chip-by- chip separation, the discriminating memories are destructed, so that the data can be prevented from being known by other companies and the like.
JP62185293A 1987-07-23 1987-07-23 Semiconductor wafer Pending JPS6428863A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62185293A JPS6428863A (en) 1987-07-23 1987-07-23 Semiconductor wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62185293A JPS6428863A (en) 1987-07-23 1987-07-23 Semiconductor wafer

Publications (1)

Publication Number Publication Date
JPS6428863A true JPS6428863A (en) 1989-01-31

Family

ID=16168323

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62185293A Pending JPS6428863A (en) 1987-07-23 1987-07-23 Semiconductor wafer

Country Status (1)

Country Link
JP (1) JPS6428863A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7603248B2 (en) * 2006-02-28 2009-10-13 Fujitsu Microelectronics Limited Testing circuit and testing method for semiconductor device and semiconductor chip
WO2021095252A1 (en) 2019-11-15 2021-05-20 キオクシア株式会社 Storage device and storage system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7603248B2 (en) * 2006-02-28 2009-10-13 Fujitsu Microelectronics Limited Testing circuit and testing method for semiconductor device and semiconductor chip
WO2021095252A1 (en) 2019-11-15 2021-05-20 キオクシア株式会社 Storage device and storage system
US11422712B2 (en) 2019-11-15 2022-08-23 Kioxia Corporation Storage device and storage system including a memory to store a check code for an integrity check

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