JPS6413466A - Test probe housing type tester - Google Patents
Test probe housing type testerInfo
- Publication number
- JPS6413466A JPS6413466A JP16999887A JP16999887A JPS6413466A JP S6413466 A JPS6413466 A JP S6413466A JP 16999887 A JP16999887 A JP 16999887A JP 16999887 A JP16999887 A JP 16999887A JP S6413466 A JPS6413466 A JP S6413466A
- Authority
- JP
- Japan
- Prior art keywords
- test
- wires
- probe housing
- tester body
- test probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE:To prevent the disconnection and loss of the lead wire parts of test probes by forming the lead wire parts of the test probes to a spiral shape and housing the test probes into a tester body. CONSTITUTION:The lead wires 1 are formed by spirally treating PVC insulated wires. these wires shrink upon ending of a measurement and are housed together with test bars 4 into a test probe housing space 3 of the tester body 2. The test probes for a measuring instrument are smoothly housed simultaneously with the test bars 4 into the tester body 2 by the shrinkage force of the spirally formed lead wires in such constitution.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16999887A JPS6413466A (en) | 1987-07-08 | 1987-07-08 | Test probe housing type tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16999887A JPS6413466A (en) | 1987-07-08 | 1987-07-08 | Test probe housing type tester |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6413466A true JPS6413466A (en) | 1989-01-18 |
Family
ID=15896693
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16999887A Pending JPS6413466A (en) | 1987-07-08 | 1987-07-08 | Test probe housing type tester |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6413466A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03160338A (en) * | 1989-11-17 | 1991-07-10 | Hitachi Ltd | Adhesive type capacitive strain gauge |
JP2016095187A (en) * | 2014-11-13 | 2016-05-26 | 中国電力株式会社 | Electric tester |
-
1987
- 1987-07-08 JP JP16999887A patent/JPS6413466A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03160338A (en) * | 1989-11-17 | 1991-07-10 | Hitachi Ltd | Adhesive type capacitive strain gauge |
JP2016095187A (en) * | 2014-11-13 | 2016-05-26 | 中国電力株式会社 | Electric tester |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0426275A3 (en) | Electrical test probe | |
JPS5382377A (en) | Probe used in measuring instruments | |
JPS6450956A (en) | Pipe wall inspection method and apparatus | |
DE432870T1 (en) | ELECTRIC TEST PROBE. | |
GB2198854B (en) | Poynting vector probe for measuring electrical power | |
AU2924792A (en) | Process and measurement probe for measuring the electrical conductivity of body fluids | |
EP0242747A3 (en) | Probe for measuring workpieces and electrical connections therefor | |
GB2094479B (en) | Determining probe contact in testing integrated circuits | |
JPS6413466A (en) | Test probe housing type tester | |
GB8805488D0 (en) | Measuring electrical impedance of low conductivity samples | |
ES2077661T3 (en) | PACEMAKER STIMULATION PROBES. | |
FR2453630A1 (en) | Probe for examination of colon - uses series of electrodes for detecting state of movement within colon | |
DE68915781D1 (en) | ELECTRIC TEST PROBE. | |
JPS57131071A (en) | Nondestructive impedance measuring device | |
EP0526132A3 (en) | Electrical contact test probe | |
EP0413272A3 (en) | Process, appliance and probe for measuring an electrical triphase system using an oscilloscope | |
Watt | A Consideration of an A. C. Potential Drop Method for Crack Length Measurement | |
GB1244572A (en) | Electrical probe | |
CA2001583A1 (en) | Noise measurement probe | |
JPS6454267A (en) | Contact probe | |
HU9401111D0 (en) | Testing probe for electric measuring apparatuses, in particular for voltmeters | |
ZA806155B (en) | Connector plug and measurement probe for such plug | |
KR910001190U (en) | Connection mechanism between the center conductor of the probe and coaxial cable | |
JPS53138377A (en) | Insulation testing method | |
JPS5353265A (en) | Prober |