JPS6412210A - 3-d image analyzer - Google Patents

3-d image analyzer

Info

Publication number
JPS6412210A
JPS6412210A JP62168077A JP16807787A JPS6412210A JP S6412210 A JPS6412210 A JP S6412210A JP 62168077 A JP62168077 A JP 62168077A JP 16807787 A JP16807787 A JP 16807787A JP S6412210 A JPS6412210 A JP S6412210A
Authority
JP
Japan
Prior art keywords
depth
light source
image analysis
laser beam
mirrors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62168077A
Other languages
Japanese (ja)
Inventor
Hiroshi Shimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KIKUKADOU KK
Original Assignee
KIKUKADOU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KIKUKADOU KK filed Critical KIKUKADOU KK
Priority to JP62168077A priority Critical patent/JPS6412210A/en
Publication of JPS6412210A publication Critical patent/JPS6412210A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)

Abstract

PURPOSE:To achieve a highly accurate 3-D image analysis, by making linear laser beam corresponding to X, Y and Z axed irradiate a long-sized rotary mirror, rotating intermittently at a set angle, at a specified interval. CONSTITUTION:Laser light source 1-3 generate luminous fluxes, for example, 1mm wide and 1m long, corresponding to X, Y and Z axes. A camera 4 is movable by steps along the depth of an object to be measured (3-D object) to allow the moving thereof at a position corresponding to the depth of field of the object so that accurate results are obtained at a less focus depth even in a photography. Laser beam from the light sources 1-3 are deflected in respective axes with rotary mirrors 5-7, which 5-7 are driven to rotate intermittently being synchronized with a pulse motor 8. A mirror 13 set with a tilt of 45 deg. to a photographing base deflects an optical axis of the light source 3 in the Z axis. 3-D measurement is possible by turning the mirrors 6 and 7 in the same direction. This enables highly accurate measurement and taking of size with a simple construction, thereby achieving a 3-D image analysis.
JP62168077A 1987-07-06 1987-07-06 3-d image analyzer Pending JPS6412210A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62168077A JPS6412210A (en) 1987-07-06 1987-07-06 3-d image analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62168077A JPS6412210A (en) 1987-07-06 1987-07-06 3-d image analyzer

Publications (1)

Publication Number Publication Date
JPS6412210A true JPS6412210A (en) 1989-01-17

Family

ID=15861416

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62168077A Pending JPS6412210A (en) 1987-07-06 1987-07-06 3-d image analyzer

Country Status (1)

Country Link
JP (1) JPS6412210A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08293795A (en) * 1995-02-22 1996-11-05 Fujitsu Ltd Encoder, a/d converter and semiconductor integrated circuit device
CN113310428A (en) * 2021-06-11 2021-08-27 安徽工程大学 Synchronous transmission surface profile measuring system and method based on line structured light

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08293795A (en) * 1995-02-22 1996-11-05 Fujitsu Ltd Encoder, a/d converter and semiconductor integrated circuit device
CN113310428A (en) * 2021-06-11 2021-08-27 安徽工程大学 Synchronous transmission surface profile measuring system and method based on line structured light
CN113310428B (en) * 2021-06-11 2023-06-02 安徽工程大学 Synchronous transmission surface profile measuring system and measuring method based on line structured light

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