JPS6411131B2 - - Google Patents
Info
- Publication number
- JPS6411131B2 JPS6411131B2 JP12677683A JP12677683A JPS6411131B2 JP S6411131 B2 JPS6411131 B2 JP S6411131B2 JP 12677683 A JP12677683 A JP 12677683A JP 12677683 A JP12677683 A JP 12677683A JP S6411131 B2 JPS6411131 B2 JP S6411131B2
- Authority
- JP
- Japan
- Prior art keywords
- diamond
- absorption coefficient
- infrared light
- infrared
- strength
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000010432 diamond Substances 0.000 claims description 43
- 229910003460 diamond Inorganic materials 0.000 claims description 39
- 238000010521 absorption reaction Methods 0.000 claims description 19
- 230000031700 light absorption Effects 0.000 claims description 11
- 230000001066 destructive effect Effects 0.000 claims description 4
- 238000012360 testing method Methods 0.000 claims description 4
- 208000010392 Bone Fractures Diseases 0.000 description 8
- 206010017076 Fracture Diseases 0.000 description 8
- 238000000034 method Methods 0.000 description 7
- 238000005520 cutting process Methods 0.000 description 6
- 230000007547 defect Effects 0.000 description 6
- 239000013078 crystal Substances 0.000 description 5
- 238000009826 distribution Methods 0.000 description 5
- 208000013201 Stress fracture Diseases 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 230000000704 physical effect Effects 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 238000000862 absorption spectrum Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000004005 microsphere Substances 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58126776A JPS6018744A (ja) | 1983-07-11 | 1983-07-11 | 工具用ダイヤモンドの非破壊強度試験方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58126776A JPS6018744A (ja) | 1983-07-11 | 1983-07-11 | 工具用ダイヤモンドの非破壊強度試験方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6018744A JPS6018744A (ja) | 1985-01-30 |
JPS6411131B2 true JPS6411131B2 (enrdf_load_stackoverflow) | 1989-02-23 |
Family
ID=14943645
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58126776A Granted JPS6018744A (ja) | 1983-07-11 | 1983-07-11 | 工具用ダイヤモンドの非破壊強度試験方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6018744A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0332082U (enrdf_load_stackoverflow) * | 1989-08-04 | 1991-03-28 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007147486A (ja) * | 2005-11-29 | 2007-06-14 | Allied Material Corp | 工具用ダイヤモンドの選別方法 |
JP5527628B2 (ja) * | 2012-04-09 | 2014-06-18 | 住友電気工業株式会社 | ダイヤモンド単結晶 |
-
1983
- 1983-07-11 JP JP58126776A patent/JPS6018744A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0332082U (enrdf_load_stackoverflow) * | 1989-08-04 | 1991-03-28 |
Also Published As
Publication number | Publication date |
---|---|
JPS6018744A (ja) | 1985-01-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Marshall et al. | The nature of machining damage in brittle materials | |
US5032734A (en) | Method and apparatus for nondestructively measuring micro defects in materials | |
US4854710A (en) | Method and apparatus for evaluating surface and subsurface features in a semiconductor | |
US4952063A (en) | Method and apparatus for evaluating surface and subsurface features in a semiconductor | |
US4933567A (en) | Method and apparatus for nondestructively measuring subsurface defects in materials | |
AU2002331938B2 (en) | Examining a diamond | |
EP0266728A3 (de) | Verfahren und Vorrichtung zur Ermittlung der Qualität von Oberflächen, insbesondere von Halbleiterscheiben | |
US5587532A (en) | Method of measuring crack propagation in opaque materials | |
JPS62247236A (ja) | 機械部品の疲労・余寿命評価法 | |
Evans et al. | Changes in the defect structure of diamond due to high temperature+ high pressure treatment | |
JPS6411131B2 (enrdf_load_stackoverflow) | ||
Lakhdari et al. | Relationship between subsurface damage depth and breaking strength for brittle materials | |
Shand | Correlation of strength of glass with fracture flaws of measured size | |
KIRCHNER | Comparison of single‐point and multipoint grinding damage in glass | |
Waters | Crack-growth phenomena in fatigued poly (methylmethacrylate) | |
JP3465539B2 (ja) | 半導体シリコン結晶中の酸素濃度評価方法及び装置 | |
Motochi et al. | Surface Brillouin scattering in ion-implanted chemical vapor deposited diamond | |
Gonon et al. | Depth profiling of photooxidized styrene-isoprene copolymers by photoacoustic and micro-Fourier transform infrared spectroscopy | |
RU2095885C1 (ru) | Способ контроля дефектности диэлектрических пленок в полупроводниковых структурах | |
Sopori | Rapid nondestructive technique for monitoring polishing damage in semiconductor wafers | |
Luciani et al. | Photoacoustic monitoring of damage in ion implanted and annealed si layers | |
Levengood et al. | Morphology of Fractures in Polished Glass Surfaces | |
JP6086050B2 (ja) | ウエーハの評価方法 | |
JP2007147486A (ja) | 工具用ダイヤモンドの選別方法 | |
CN115753770B (zh) | 镀覆磨料的镀层结合力测量方法及品质检测方法 |