JPS6388741U - - Google Patents
Info
- Publication number
- JPS6388741U JPS6388741U JP18435686U JP18435686U JPS6388741U JP S6388741 U JPS6388741 U JP S6388741U JP 18435686 U JP18435686 U JP 18435686U JP 18435686 U JP18435686 U JP 18435686U JP S6388741 U JPS6388741 U JP S6388741U
- Authority
- JP
- Japan
- Prior art keywords
- plunger
- die
- chamber
- flow
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Injection Moulding Of Plastics Or The Like (AREA)
- Aerodynamic Tests, Hydrodynamic Tests, Wind Tunnels, And Water Tanks (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18435686U JPH068536Y2 (ja) | 1986-11-29 | 1986-11-29 | フロ−テスタ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18435686U JPH068536Y2 (ja) | 1986-11-29 | 1986-11-29 | フロ−テスタ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6388741U true JPS6388741U (enrdf_load_stackoverflow) | 1988-06-09 |
| JPH068536Y2 JPH068536Y2 (ja) | 1994-03-02 |
Family
ID=31131952
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18435686U Expired - Lifetime JPH068536Y2 (ja) | 1986-11-29 | 1986-11-29 | フロ−テスタ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH068536Y2 (enrdf_load_stackoverflow) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7319335B2 (en) | 2004-02-12 | 2008-01-15 | Applied Materials, Inc. | Configurable prober for TFT LCD array testing |
| US7330021B2 (en) | 2004-02-12 | 2008-02-12 | Applied Materials, Inc. | Integrated substrate transfer module |
| US7355418B2 (en) | 2004-02-12 | 2008-04-08 | Applied Materials, Inc. | Configurable prober for TFT LCD array test |
| US7535238B2 (en) | 2005-04-29 | 2009-05-19 | Applied Materials, Inc. | In-line electron beam test system |
| US7569818B2 (en) | 2006-03-14 | 2009-08-04 | Applied Materials, Inc. | Method to reduce cross talk in a multi column e-beam test system |
| US7602199B2 (en) | 2006-05-31 | 2009-10-13 | Applied Materials, Inc. | Mini-prober for TFT-LCD testing |
-
1986
- 1986-11-29 JP JP18435686U patent/JPH068536Y2/ja not_active Expired - Lifetime
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7319335B2 (en) | 2004-02-12 | 2008-01-15 | Applied Materials, Inc. | Configurable prober for TFT LCD array testing |
| US7330021B2 (en) | 2004-02-12 | 2008-02-12 | Applied Materials, Inc. | Integrated substrate transfer module |
| US7355418B2 (en) | 2004-02-12 | 2008-04-08 | Applied Materials, Inc. | Configurable prober for TFT LCD array test |
| US7535238B2 (en) | 2005-04-29 | 2009-05-19 | Applied Materials, Inc. | In-line electron beam test system |
| US7569818B2 (en) | 2006-03-14 | 2009-08-04 | Applied Materials, Inc. | Method to reduce cross talk in a multi column e-beam test system |
| US7602199B2 (en) | 2006-05-31 | 2009-10-13 | Applied Materials, Inc. | Mini-prober for TFT-LCD testing |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH068536Y2 (ja) | 1994-03-02 |