JPS6387832U - - Google Patents

Info

Publication number
JPS6387832U
JPS6387832U JP18255586U JP18255586U JPS6387832U JP S6387832 U JPS6387832 U JP S6387832U JP 18255586 U JP18255586 U JP 18255586U JP 18255586 U JP18255586 U JP 18255586U JP S6387832 U JPS6387832 U JP S6387832U
Authority
JP
Japan
Prior art keywords
pellets
course
movement
calculates
camera
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18255586U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18255586U priority Critical patent/JPS6387832U/ja
Publication of JPS6387832U publication Critical patent/JPS6387832U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Die Bonding (AREA)
JP18255586U 1986-11-26 1986-11-26 Pending JPS6387832U (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18255586U JPS6387832U (ko) 1986-11-26 1986-11-26

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18255586U JPS6387832U (ko) 1986-11-26 1986-11-26

Publications (1)

Publication Number Publication Date
JPS6387832U true JPS6387832U (ko) 1988-06-08

Family

ID=31128462

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18255586U Pending JPS6387832U (ko) 1986-11-26 1986-11-26

Country Status (1)

Country Link
JP (1) JPS6387832U (ko)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02174132A (ja) * 1988-12-26 1990-07-05 Toshiba Corp 半導体ペレットのダイボンディング方法
KR100681772B1 (ko) * 1998-12-01 2007-02-12 후지쯔 가부시끼가이샤 반도체 시험 방법 및 반도체 시험 장치
JP2019145634A (ja) * 2018-02-20 2019-08-29 ワイエイシイガーター株式会社 剥離装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS575345A (en) * 1980-06-13 1982-01-12 Hitachi Ltd Isolating and picking up method for pellet
JPS5954236A (ja) * 1982-09-22 1984-03-29 Toshiba Corp ダイボンダ等におけるペレツト認識方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS575345A (en) * 1980-06-13 1982-01-12 Hitachi Ltd Isolating and picking up method for pellet
JPS5954236A (ja) * 1982-09-22 1984-03-29 Toshiba Corp ダイボンダ等におけるペレツト認識方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02174132A (ja) * 1988-12-26 1990-07-05 Toshiba Corp 半導体ペレットのダイボンディング方法
KR100681772B1 (ko) * 1998-12-01 2007-02-12 후지쯔 가부시끼가이샤 반도체 시험 방법 및 반도체 시험 장치
JP2019145634A (ja) * 2018-02-20 2019-08-29 ワイエイシイガーター株式会社 剥離装置

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