JPS6383907A - Thin film magnetic head of planar construction and manufacture thereof - Google Patents

Thin film magnetic head of planar construction and manufacture thereof

Info

Publication number
JPS6383907A
JPS6383907A JP62229920A JP22992087A JPS6383907A JP S6383907 A JPS6383907 A JP S6383907A JP 62229920 A JP62229920 A JP 62229920A JP 22992087 A JP22992087 A JP 22992087A JP S6383907 A JPS6383907 A JP S6383907A
Authority
JP
Japan
Prior art keywords
film
magnetic
insulating
insulating film
recess
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62229920A
Other languages
Japanese (ja)
Other versions
JPH083884B2 (en
Inventor
ジーン ピエール ラザーリ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of JPS6383907A publication Critical patent/JPS6383907A/en
Publication of JPH083884B2 publication Critical patent/JPH083884B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127Structure or manufacture of heads, e.g. inductive
    • G11B5/31Structure or manufacture of heads, e.g. inductive using thin films
    • G11B5/3103Structure or manufacture of integrated heads or heads mechanically assembled and electrically connected to a support or housing
    • G11B5/3106Structure or manufacture of integrated heads or heads mechanically assembled and electrically connected to a support or housing where the integrated or assembled structure comprises means for conditioning against physical detrimental influence, e.g. wear, contamination
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127Structure or manufacture of heads, e.g. inductive
    • G11B5/31Structure or manufacture of heads, e.g. inductive using thin films
    • G11B5/3163Fabrication methods or processes specially adapted for a particular head structure, e.g. using base layers for electroplating, using functional layers for masking, using energy or particle beams for shaping the structure or modifying the properties of the basic layers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127Structure or manufacture of heads, e.g. inductive
    • G11B5/31Structure or manufacture of heads, e.g. inductive using thin films
    • G11B5/3176Structure of heads comprising at least in the transducing gap regions two magnetic thin films disposed respectively at both sides of the gaps
    • G11B5/3179Structure of heads comprising at least in the transducing gap regions two magnetic thin films disposed respectively at both sides of the gaps the films being mainly disposed in parallel planes
    • G11B5/3183Structure of heads comprising at least in the transducing gap regions two magnetic thin films disposed respectively at both sides of the gaps the films being mainly disposed in parallel planes intersecting the gap plane, e.g. "horizontal head structure"
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49002Electrical device making
    • Y10T29/4902Electromagnet, transformer or inductor
    • Y10T29/49021Magnetic recording reproducing transducer [e.g., tape head, core, etc.]
    • Y10T29/49032Fabricating head structure or component thereof
    • Y10T29/49036Fabricating head structure or component thereof including measuring or testing
    • Y10T29/49043Depositing magnetic layer or coating
    • Y10T29/49044Plural magnetic deposition layers
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49002Electrical device making
    • Y10T29/4902Electromagnet, transformer or inductor
    • Y10T29/49021Magnetic recording reproducing transducer [e.g., tape head, core, etc.]
    • Y10T29/49032Fabricating head structure or component thereof
    • Y10T29/49036Fabricating head structure or component thereof including measuring or testing
    • Y10T29/49043Depositing magnetic layer or coating
    • Y10T29/49046Depositing magnetic layer or coating with etching or machining of magnetic material
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49002Electrical device making
    • Y10T29/4902Electromagnet, transformer or inductor
    • Y10T29/49021Magnetic recording reproducing transducer [e.g., tape head, core, etc.]
    • Y10T29/49032Fabricating head structure or component thereof
    • Y10T29/4906Providing winding
    • Y10T29/49064Providing winding by coating

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Magnetic Heads (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 (発明の背景) 本発明は、プレーナ構造の薄膜磁気ヘッドの製造プロセ
スおよび本プロセスによって得られるヘッドに関わる。
DETAILED DESCRIPTION OF THE INVENTION (Background of the Invention) The present invention relates to a process for manufacturing a thin film magnetic head with a planar structure and a head obtained by this process.

2つのタイプの薄膜磁気ヘッドが知られている、すなわ
ち読み出しまたは記録用磁性膜に直角に取り付けられる
もの、および当該磁気膜に平行に取り付けられるもので
ある。
Two types of thin film magnetic heads are known: those mounted at right angles to the read or write magnetic film, and those mounted parallel to the magnetic film.

例えば第1図に示すヘッドは、空気間隙Eを区切る2つ
の磁極片P1およびP2ならびに当該磁極片を取り巻く
コイルBから成る。記録膜Cは、空気間隙Eの前部を通
っている。このようなヘッドは、例えば1981年9月
22日付の日本国特許抄録vo1.5.No、150.
P−81,822に述べられている。
For example, the head shown in FIG. 1 consists of two pole pieces P1 and P2 that define an air gap E and a coil B surrounding the pole pieces. The recording film C passes in front of the air gap E. Such a head is disclosed in, for example, Japanese Patent Abstract vol. 1.5 dated September 22, 1981. No, 150.
P-81,822.

このようなヘッドによって発生する磁気勾配は大きいの
で、記録膜中に強い減磁界を生じ、これによって書き込
みが困難となる。更に、読み出しにおいて、第2図に示
すような信号Vが発生する。磁極片の外部角度に直角を
なすところでは、電圧の極性の逆転が起こり、これが情
報読み出し処理に関して深刻な問題を起こす。
The large magnetic gradient generated by such a head creates a strong demagnetizing field in the recording film, which makes writing difficult. Furthermore, during reading, a signal V as shown in FIG. 2 is generated. At right angles to the external angle of the pole piece, a reversal of voltage polarity occurs, which causes serious problems with the information readout process.

これらの理由により第3図に示すような水平取り付は型
のヘッドを使用することが推奨される。
For these reasons, it is recommended to use a type head for horizontal mounting as shown in FIG.

このようなヘッドは、No、0152326で公告され
た欧州特許出願85400136.9中に述べられてい
る。第3図から分かるように、第1の磁性膜1があり、
その中でコイル2が形成され、また、磁気スペーサ4に
よって2つの部分に分割されている第2の磁性膜がある
。硬質膜5がアッセンブリを保護し、膜の平面性を確実
ならしめている。
Such a head is described in European patent application 85400136.9, published no. 0152326. As can be seen from FIG. 3, there is a first magnetic film 1,
There is a second magnetic film in which a coil 2 is formed and which is divided into two parts by a magnetic spacer 4 . A hard membrane 5 protects the assembly and ensures flatness of the membrane.

第4図には、水平ヘッドを製造する既知のプロセスが示
されている。このプロセスは、1981年1月14日付
の日本国特許抄録vo1.5.No、5.P−44,6
77に説明されている。基板6の上に最初の磁気膜M1
が堆積し、ついで絶縁@7およびコイルBが堆積される
(第4図C参照)。この後で絶縁膜8が堆積され、さら
に2つのウェル(well) P 1およびP2がエツ
チングされる(第4図す参照)。この後で、第2の磁気
膜M2が堆積されるが、このM2は、2つのウェルP1
およびP2が形成された結果、第1の磁性膜と接触する
(第4図C参照)。この後で、空気間隙の形成、ガラス
層(第4図C参照)の堆積およびアッセンブリの平面化
(第4図C参照)がこの順序で行われる。
In FIG. 4 a known process for manufacturing horizontal heads is shown. This process is described in Japanese Patent Abstract vol. 1.5 dated January 14, 1981. No, 5. P-44,6
It is explained in 77. First magnetic film M1 on the substrate 6
is deposited, followed by insulation@7 and coil B (see FIG. 4C). After this, an insulating film 8 is deposited and two further wells P1 and P2 are etched (see FIG. 4). After this, a second magnetic film M2 is deposited, which M2 covers the two wells P1.
As a result of the formation of P2 and P2, it comes into contact with the first magnetic film (see FIG. 4C). This is followed by the formation of the air gap, the deposition of the glass layer (see FIG. 4C) and the planarization of the assembly (see FIG. 4C) in this order.

あるいくつかの点では充分であるが、これら先行技術お
よび手段はいくつかの不利点をもっている。第3図に示
すヘッドの場合、磁極片の端部がいまだ外部に出ている
ため、読み出し信号が逆転するおそれがある。第4図に
図示されているプロセスにおいては、磁極片の端部が微
細になったり薄くなフたりすることは避けられるが、空
気間隙が外部に開かれていてしかも比較的幅が広いため
、この空気間隙は、磁性を帯びた粒子によフて徐々に埋
められ、やがてヘッドを磁気的にショート(短絡)させ
る。最後には、コイルによって発生した磁束が、準−室
区分回路にそって流れ、その結果、空気間隙の所では磁
束密度がゼロになっていしまう。更に、第4図のプロセ
スでは、コイルBは1つの平面にだけ存在するのではな
く、2つの分離された平面上にあり、こわら2平面の内
の1つは第1の磁極片の上部中央に対応し、もう1つの
低い方の平面は2つの側部(その内の1つだけが・例え
ば、第4図a中では、右の方に示されている)に対応し
ている。この側部によって、磁極片の回りの巻き線を閉
じることが可能となる。更に、磁極片M1は基板6中に
埋め込まれていないのでヘッドが大きく盛り上ってしま
うことが分かる。最終的には、保護膜9によってカバー
されていない磁極片M2の部分が非常に広くなり(実質
的にはコイルと同じほど広いからである)、このためヘ
ッドは非常に脆弱になる。
Although sufficient in certain respects, these prior art techniques and procedures have several disadvantages. In the case of the head shown in FIG. 3, the ends of the pole pieces are still exposed to the outside, so there is a risk that the read signal will be reversed. In the process illustrated in FIG. 4, the ends of the pole pieces are prevented from becoming fine or thin, but because the air gap is open to the outside and relatively wide, This air gap is gradually filled with magnetic particles, eventually magnetically shorting the head. Finally, the magnetic flux generated by the coil flows along the sub-chamber circuit, resulting in a zero magnetic flux density at the air gap. Furthermore, in the process of Figure 4, coil B is not in just one plane, but in two separate planes, one of which is above the first pole piece. Corresponding to the center, another lower plane corresponds to the two sides (only one of which is shown, for example, on the right in FIG. 4a). This side makes it possible to close the winding around the pole piece. Furthermore, it can be seen that since the magnetic pole piece M1 is not embedded in the substrate 6, the head bulges out greatly. Eventually, the part of the pole piece M2 not covered by the protective film 9 becomes very wide (as it is essentially as wide as the coil), and the head therefore becomes very fragile.

(発明の概要) 本発明の目的は、これら不利点を回避することにある。(Summary of the invention) The aim of the invention is to avoid these disadvantages.

したがって本発明は、磁性膜および磁極片によフて形成
される空気間隙を狭くすることが可能で、その結果、磁
束密度が空気間隙の近傍において発生し、保護されてい
ない表面が小さくなるような製造プロセスを提案する。
The present invention therefore makes it possible to narrow the air gap formed by the magnetic membrane and the pole piece, so that the magnetic flux density occurs in the vicinity of the air gap and the unprotected surface becomes smaller. We propose a new manufacturing process.

さらに、本発明のプロセスによって、基板中に埋め込む
、すなわち、はめ込む構造が可能となり、従って盛り上
りが発生することはない。さらに利点を追加して述べれ
ば、本発明のプロセスは先行技術によるプロセスと異な
り、研ぎ仕上げを必要としないということである。
Additionally, the process of the present invention allows structures that are embedded or nested in the substrate, so that no bulges occur. An additional advantage is that the process of the present invention, unlike prior art processes, does not require a sanding finish.

本発明のプロセスは、さまざまな磁性膜に関する電界堆
積操作だけでなく、集積回路技術に関連する従来の薄膜
堆積操作およびエツチング操作を含む。
The process of the present invention includes conventional thin film deposition and etching operations associated with integrated circuit technology, as well as field deposition operations for various magnetic films.

本発明はさらに、本発明のプロセスによって得られた磁
気ヘッドにも関する。
The invention further relates to a magnetic head obtained by the process of the invention.

(実施例) 第5図は本発明のプロセスの主な段階を示す。(Example) FIG. 5 shows the main steps of the process of the invention.

本発明はつぎの操作から成る。The present invention consists of the following operations.

例えばシリコンの絶縁基、板10の上に、最初の絶縁膜
12(例えば酸化シリコン)を形成する(第5図g参照
)。この絶縁膜12および基板10はモッチングされて
、その結果、最初の凹部13が形成される(第5図す参
照)。その上に最初の導電膜14が堆積され、さらに選
択的にエツチングされ、その結果第1の凹部13の底部
だけに残るようにする(第5図す参照)。導電膜14を
電極として使用する最初の電気分解によって、最初の磁
性膜16が、最初の絶縁膜12と同一平面になるように
堆積され、凹部13を埋める(第5図C参照)。このよ
うにして、当該磁性膜は基板中に埋め込まれる、すなわ
ちはめ込まれる。
A first insulating film 12 (eg, silicon oxide) is formed on an insulating substrate, plate 10, of silicon, for example (see FIG. 5g). The insulating film 12 and the substrate 10 are patterned, so that a first recess 13 is formed (see FIG. 5). A first conductive layer 14 is deposited thereon and further selectively etched so that it remains only at the bottom of the first recess 13 (see FIG. 5). By a first electrolysis using the conductive film 14 as an electrode, a first magnetic film 16 is deposited flush with the first insulating film 12 and fills the recess 13 (see FIG. 5C). In this way, the magnetic film is embedded or fitted into the substrate.

このようにしてできたものの上に第2の絶縁膜18が堆
積される(第5図C参照)。この第2の絶縁膜18中に
、電気コイル20が形成される(第5図C参照)。この
ような操作は、前述の欧州特許出願(その第3図および
第4図)中に述べられている。このコイルは側部20°
 (2つある内の一方しか示されていない)で閉じてい
るが、その側部は中心部20と同一平面上にある。コイ
ル20の両側では、第2絶縁膜18をエツチングして、
2つの開口部21および22を、それらが第1の磁性膜
16に達するように形成する(第5図C参照)。
A second insulating film 18 is deposited on the structure thus formed (see FIG. 5C). An electric coil 20 is formed in this second insulating film 18 (see FIG. 5C). Such an operation is described in the aforementioned European patent application (Figures 3 and 4 thereof). This coil has a 20° side
(only one of the two shown) is closed, but its sides are flush with the central portion 20. On both sides of the coil 20, the second insulating film 18 is etched.
Two openings 21 and 22 are formed so that they reach the first magnetic film 16 (see FIG. 5C).

第1の導電膜14を電極として2回目の電気分解を実行
することによって、これらの2つの開口部は埋められて
、磁性体の接点バッド23および24をそれぞれ形成す
るが、これら2つのバッドは第1の磁性膜16と良好な
磁気的導通性を持ち、第2の絶縁膜18と同一平面上に
ある(第5図g参照)、。
By performing a second electrolysis using the first conductive film 14 as an electrode, these two openings are filled to form magnetic contact pads 23 and 24, respectively. It has good magnetic conductivity with the first magnetic film 16 and is on the same plane as the second insulating film 18 (see FIG. 5g).

この物体の上に、例えば5i02.Al2O3、ポリイ
ミド樹脂等のような第3の絶縁@26が堆積される(第
5図り参照)。第2.第3の凹部27およびz8は。
On this object, for example 5i02. A third insulation@26, such as Al2O3, polyimide resin, etc., is deposited (see fifth diagram). Second. The third recess 27 and z8 are.

磁性体接点バッド23および24の上にあるこの第3の
絶縁膜26をエツチングして形成され、その結果これら
第2.第3の凹部の間に中央絶縁アイランド32が残存
することになる(第5図り参照)。この物体の上に、第
2の導電膜33が堆積され更に選択的にエツチングされ
、その結果この膜は、第2、第3の凹部27,28の底
部にだけ残存することになる(第5図り参照)。
This third insulating film 26 overlying the magnetic contact pads 23 and 24 is etched so that these second . A central insulating island 32 will remain between the third recesses (see Figure 5). A second conductive film 33 is deposited on this object and further selectively etched, so that this film remains only at the bottoms of the second and third recesses 27, 28 (fifth (see diagram).

第2導電膜33を電極として3回目の電気分解を実行す
ることにより、第2.第3の凹部は、第2磁性膜で埋め
られ、その結果2つの互いに分離した部分30.:11
が中央絶縁アイランド32の両側に形成されるが、この
第2磁性膜は第3の絶縁膜26と同−平面上にある(第
5図1参照)。この物体上に、第4の硬質の保護絶縁膜
34が堆積される(第5図j参照)。当該の第4の凹部
36中に、薄い磁気スペーサが中央絶縁アイランドの中
心に形成される。このようなスペーサは前述の欧州特許
出願に述べられているように、絶縁体3Bを堆積させて
それを階段状にエツチングして成形し、磁性膜40を堆
積させ(第5図に参照)、さらに、水平部分をエツチン
グして垂直な壁42を維持することによって(第5図1
参照)得ることができる。この物体の上に、第3の導電
膜43が堆積され、さらに選択的にエツチングされて、
スペーサ42の両側の第4の凹部36の底部にだけ残存
することになる(第5図1参照)。
By performing the third electrolysis using the second conductive film 33 as an electrode, the second conductive film 33 is used as an electrode. The third recess is filled with a second magnetic film, resulting in two mutually separated portions 30. :11
are formed on both sides of the central insulating island 32, and the second magnetic film is coplanar with the third insulating film 26 (see FIG. 5). A fourth hard protective insulating film 34 is deposited on this object (see FIG. 5j). A thin magnetic spacer is formed in the corresponding fourth recess 36 at the center of the central insulation island. Such a spacer is formed by depositing an insulator 3B and etching it in steps, depositing a magnetic film 40 (see FIG. 5), as described in the aforementioned European patent application. Additionally, by etching the horizontal portions to maintain vertical walls 42 (see FIG.
Reference) can be obtained. A third conductive film 43 is deposited on this object and further selectively etched.
It remains only at the bottoms of the fourth recesses 36 on both sides of the spacer 42 (see FIG. 5, 1).

第3の導電膜43を電極として第4回目の電気分解を実
行することによって、第4の凹部36が、磁気スペーサ
42の両側に位置する2つの部分46および48に分離
される第3の磁性膜で埋められるが、この第3の磁性膜
は硬質の保護膜34と同一表面上にある(第5図m参照
)。従って、先行技術と異なり、この部分を磨き仕上げ
する必要はない。
By performing a fourth electrolysis using the third conductive film 43 as an electrode, the fourth recess 36 is separated into two portions 46 and 48 located on both sides of the magnetic spacer 42. This third magnetic film is on the same surface as the hard protective film 34 (see FIG. 5m). Therefore, unlike the prior art, there is no need to polish this part.

このプロセスにおいて、導電膜14.33および43は
例えば銅、クロムまたはタングステンでもよい。磁性膜
16,23,24,30.:II、46および48は、
高い透磁率を得るためにFe:Niの比が例えば80:
20のものでもよい。磁性膜16の厚さは、1ミクロン
から5ミクロンでよい。垂直壁42の厚さは、0.05
ミクロンから1ミクロンでよい。中央接点パッド32の
厚さXは、1ミクロンから5ミクロンである(第5図1
参照)。硬質膜34の厚さは、1ミクロンから5ミクロ
ンでよい、。エツチング幅Yは5ミクロンから15ミク
ロンである(第5図j参照)。
In this process, conductive films 14.33 and 43 may be copper, chromium or tungsten, for example. Magnetic films 16, 23, 24, 30. :II, 46 and 48 are
In order to obtain high magnetic permeability, the Fe:Ni ratio is, for example, 80:
It may be 20. The thickness of the magnetic film 16 may be from 1 micron to 5 microns. The thickness of the vertical wall 42 is 0.05
A micron to 1 micron is sufficient. The thickness X of the central contact pad 32 is between 1 micron and 5 microns (FIG. 5-1).
reference). The thickness of the hard membrane 34 may be between 1 micron and 5 microns. The etching width Y is between 5 microns and 15 microns (see Figure 5j).

第6図に示すのは、その磁力線によって空気間隙の近傍
における磁束密度が識別可能であるような完全なヘッド
の断面図である。部分46および48の圧さUは約10
ミクロンであるが、コイル18の厚さは120ミクロン
と200ミクロンの間である。これによって、磁極片の
内、保護されていない部分が極めて狭くなる。
FIG. 6 shows a cross-sectional view of a complete head whose magnetic field lines allow the magnetic flux density in the vicinity of the air gap to be discerned. The pressure U in sections 46 and 48 is approximately 10
microns, but the thickness of coil 18 is between 120 and 200 microns. This makes the unprotected portion of the pole piece extremely narrow.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、すべに述べたように、垂直に取り付けられた
既知の磁気ヘッドを示す。 第2図はすでに述べたように、第1図に示すヘッドによ
フて発生する信号の波形構成を示す。 第3図は、すでに述べたように水平に取り付けられた既
知の磁気ヘッドを示す。 第4図は、すでに述べたように、水平ヘッドを製造する
既知のプロセスを示す。 第5図は、本発明による製造プロセスの13の段階(a
からmまで)を示す。 第6図は実際に得られる磁気ヘッドを示す。
FIG. 1 shows a known magnetic head mounted vertically, as mentioned above. As already mentioned, FIG. 2 shows the waveform structure of the signal generated by the head shown in FIG. FIG. 3 shows a known magnetic head mounted horizontally as already mentioned. FIG. 4 shows, as already mentioned, a known process for manufacturing horizontal heads. FIG. 5 shows the 13 steps (a) of the manufacturing process according to the invention.
to m). FIG. 6 shows the magnetic head actually obtained.

Claims (2)

【特許請求の範囲】[Claims] (1)絶縁基板上に最初の絶縁膜を形成し、この絶縁膜
および絶縁基板をエッチングして最初の凹部を形成し、
その上に最初の導電膜を堆積し更にこの最初の凹部の底
部だけに残存するように選択的にエッチングし、この導
電膜を電極として使用する最初の電気分解を実行して最
初の磁性膜を堆積し、これによってこの凹部が埋められ
、当該最初の磁性膜が最初の絶縁膜と同一平面上にあり
、この実体の上に第2の絶縁膜を堆積し、当該第2の絶
縁膜中に電気コイルを形成し、この第2の絶縁膜を、こ
のコイルの両側においてエッチングし、これによって最
初の磁性膜に達する開口部が2つ形成され、最初の導電
膜を電極として使用する第2回目の電気分解を実行して
当該2つの開口部を埋めて磁性体の接点パッドを2つ形
成し、これらパッドは最初の磁性膜と良好な磁気的導通
性を持ち更に第2の絶縁膜と同一平面上にあり、この物
体の上に第3の絶縁膜を堆積し、当該磁性体接点パッド
上にある当該第3の絶縁膜をエッチングして第2、第3
の凹部を形成し、同時にこれら第2、第3の凹部の間に
中央絶縁アイランドを残存させ、この物体の上に第2の
導電膜を堆積させ更に選択エッチングして第2、第3の
凹部の底部にだけ残存させ、この第2の導電膜を電極と
して使用する第3回目の電気分解を実行して第2、第3
の凹部を第2の磁性膜によって埋め、その結果2つの互
いに分離した部分を中央絶縁アイランドの両側に形成し
、当該絶縁膜が第3の絶縁膜と同一平面上にあり、この
物体の上に第4の硬質の保護絶縁膜を堆積し、さらにエ
ッチングして中央絶縁アイランドの上に第4の凹部を形
成しその結果第2の磁性膜に到達せしめ、当該第4の凹
部に薄い磁気スペーサを中央絶縁アイランドの中心に形
成させ、この物体の上に第3の導電膜を堆積させ更に選
択的エッチングによりこのスペーサの両側にある第4の
凹部の底部だけにこれを残存させ、この第3の導電膜を
電極として使用する第4回目の電気分解を実行して第4
の凹部を、磁気スペーサの両側に2つの部分として分離
されている第3の磁性膜で埋め、当該第3の磁性膜が硬
質の保護膜と同一表面上にあることを特徴とするプレー
ナ構造の薄膜磁気ヘッドの製造方法。
(1) forming a first insulating film on an insulating substrate, etching this insulating film and the insulating substrate to form a first recess,
A first conductive film is deposited thereon, selectively etched so that it remains only at the bottom of this first recess, and a first electrolysis is performed using this conductive film as an electrode to form a first magnetic film. depositing a second insulating film over this entity, thereby filling the recess so that the first magnetic film is coplanar with the first insulating film, and depositing a second insulating film in the second insulating film. A second insulating film is formed, forming an electrical coil, etching this second insulating film on both sides of the coil, thereby creating two openings that reach the first magnetic film, and using the first conductive film as an electrode. electrolysis to fill the two openings and form two magnetic contact pads that have good magnetic conductivity with the first magnetic film and are also identical to the second insulating film. A third insulating film is deposited on the object, and the third insulating film on the magnetic contact pad is etched to form the second and third insulating films.
At the same time, a central insulating island is left between the second and third recesses, and a second conductive film is deposited on this object and selectively etched to form the second and third recesses. A third electrolysis is performed using this second conductive film as an electrode, leaving only the bottom of the second and third conductive films.
is filled by a second magnetic film, thereby forming two mutually separated portions on either side of the central insulation island, the insulation film being coplanar with the third insulation film and on top of the object. A fourth hard protective insulating film is deposited and etched to form a fourth recess over the central insulating island to reach the second magnetic film, and a thin magnetic spacer is placed in the fourth recess. A third conductive film is formed at the center of the central insulating island, deposited on the object and selectively etched so that it remains only at the bottom of the fourth recess on each side of the spacer. Perform a fourth electrolysis using the conductive film as an electrode
of a planar structure, characterized in that the recess is filled with a third magnetic film separated in two parts on both sides of the magnetic spacer, the third magnetic film being on the same surface as the hard protective film. A method for manufacturing a thin film magnetic head.
(2)絶縁基板、この基板内に同一平面上になるように
埋め込まれた第1の磁性膜、この第1の磁性膜の両端に
存在する2つの磁性体の接点パッド、絶縁膜中にありこ
れら2つの接点パッドの回りを巻いている電気コイル、
このコイルの中心部の上に位置する絶縁アイランド、絶
縁体の接点パッドによって2つの部分に分離されている
第2の磁性膜、およびこの第2の磁性膜のこれら2つの
部分上で2つに分離されている第3の磁性膜から成り、
当該2つの部分が磁気スペーサによって分離されており
、当該第3の膜が硬質の保護絶縁膜中に埋め込まれてい
ることを特徴とするプレーナ構造の薄膜磁気ヘッド。
(2) An insulating substrate, a first magnetic film embedded in the same plane within this substrate, two magnetic contact pads present at both ends of this first magnetic film, and two magnetic contact pads located in the insulating film. An electrical coil wrapped around these two contact pads,
an insulating island located over the center of the coil, a second magnetic film separated into two parts by an insulator contact pad, and a second magnetic film separated into two parts on these two parts. consisting of a separated third magnetic film;
A thin film magnetic head having a planar structure, wherein the two parts are separated by a magnetic spacer, and the third film is embedded in a hard protective insulating film.
JP62229920A 1986-09-17 1987-09-16 Planar thin film magnetic head and method of manufacturing the same Expired - Lifetime JPH083884B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8613010A FR2604021B1 (en) 1986-09-17 1986-09-17 METHOD FOR PRODUCING MAGNETIC HEADS IN THIN FILMS AND WITH A PLANAR STRUCTURE AND HEAD OBTAINED BY THIS PROCESS
FR8613010 1986-09-17

Publications (2)

Publication Number Publication Date
JPS6383907A true JPS6383907A (en) 1988-04-14
JPH083884B2 JPH083884B2 (en) 1996-01-17

Family

ID=9339040

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62229920A Expired - Lifetime JPH083884B2 (en) 1986-09-17 1987-09-16 Planar thin film magnetic head and method of manufacturing the same

Country Status (5)

Country Link
US (2) US4837924A (en)
EP (1) EP0262028B1 (en)
JP (1) JPH083884B2 (en)
DE (1) DE3768894D1 (en)
FR (1) FR2604021B1 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63211112A (en) * 1987-02-26 1988-09-02 Nec Kansai Ltd Production of thin film magnetic head
JPH05503420A (en) * 1989-11-29 1993-06-10 センター フォー イノベイティブ テクノロジー chimeric protein
JPH07244817A (en) * 1994-03-07 1995-09-19 Internatl Business Mach Corp <Ibm> Magnetic transducer and preparation thereof

Families Citing this family (99)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2741470B1 (en) 1995-11-22 1998-01-02 Commissariat Energie Atomique METHOD FOR PRODUCING A PLANAR MAGNETIC HEAD AND HEAD OBTAINED BY THIS PROCESS
US5159511A (en) * 1987-04-01 1992-10-27 Digital Equipment Corporation Biasing conductor for MR head
FR2622336B1 (en) * 1987-10-27 1995-07-21 Europ Composants Electron MAGNETIC READING AND RECORDING HEAD
US5075956A (en) * 1988-03-16 1991-12-31 Digital Equipment Corporation Method of making recording heads with side shields
FR2630244B1 (en) * 1988-04-15 1990-07-13 Commissariat Energie Atomique WRITING AND READING DEVICE ON A MAGNETIC MEDIUM AND ITS MANUFACTURING METHOD
US5068959A (en) * 1988-07-11 1991-12-03 Digital Equipment Corporation Method of manufacturing a thin film head
JPH0782630B2 (en) * 1989-02-28 1995-09-06 三菱電機株式会社 Thin film magnetic head device
US5048175A (en) * 1989-03-03 1991-09-17 Seagate Technology, Inc. Method for grounding pole structures in thin film magnetic heads
FR2645315B1 (en) * 1989-03-29 1991-05-31 Commissariat Energie Atomique MAGNETORESISTOR READING MAGNETIC HEAD FOR PERPENDICULAR RECORDING AND METHOD FOR PRODUCING SUCH A HEAD
FR2645314B1 (en) * 1989-03-29 1991-05-31 Commissariat Energie Atomique MAGNETORESISTANCE HEAD FOR LONGITUDINAL RECORDING AND METHOD FOR PRODUCING SUCH A HEAD
US5189580A (en) * 1989-06-30 1993-02-23 Ampex Corporation Ultra small track width thin film magnetic transducer
FR2649526B1 (en) * 1989-07-04 1991-09-20 Thomson Csf METHOD FOR MANUFACTURING PLANAR MAGNETIC HEADS BY HAVING A NON-MAGNETIC WAFER, AND MAGNETIC HEADS OBTAINED BY SUCH A METHOD
FR2650127B1 (en) * 1989-07-18 1991-09-20 Thomson Csf POWER LASER PULSE GENERATOR
FR2651912B1 (en) * 1989-09-12 1991-10-31 Europ Composants Electron PROCESS FOR PRODUCING POLAR PARTS AND THE GAP OF MAGNETIC HEADS IN THIN FILMS FOR AUDIO OR VIDEO COMPUTER APPLICATION.
FR2652669B1 (en) * 1989-09-29 1992-11-20 Commissariat Energie Atomique PROCESS FOR PRODUCING A MAGNETIC RECORDING HEAD AND HEAD OBTAINED BY THIS METHOD.
US20020176210A1 (en) * 1989-11-27 2002-11-28 Hamilton Harold J. Durable, low-vibration, dynamic-contact hard disk drive system
US5483025A (en) * 1989-11-27 1996-01-09 Censtor Corporation Unitary micro-flexure structure
US5453315A (en) * 1989-11-27 1995-09-26 Censtor Corp. Unitary micro-flexure structure and method of making same
US6320725B1 (en) * 1989-11-27 2001-11-20 Censtor Corporation Hard disk drive having ring head with predominantly perpendicular media fields
US5476131A (en) * 1989-11-27 1995-12-19 Censtor Corporation Unitary micro-flexure structure and method of making same
US5041932A (en) * 1989-11-27 1991-08-20 Censtor Corp. Integrated magnetic read/write head/flexure/conductor structure
US5111351A (en) * 1989-11-27 1992-05-05 Censtor Corp. Integrated magnetic read/write head/flexure/conductor structure
US6600631B1 (en) * 1989-11-27 2003-07-29 Censtor Corp. Transducer/flexure/conductor structure for electromagnetic read/write system
US5073242A (en) * 1989-11-27 1991-12-17 Censtor Corp. Method of making integrated magnetic read/write head/flexure/conductor structure
US6493191B1 (en) * 1989-11-27 2002-12-10 Censtor Corporation Planar magnetic ring head for contact recording with a rigid disk
FR2658646B1 (en) * 1990-02-21 1995-07-13 Commissariat Energie Atomique METHOD FOR PRODUCING A MAGNETIC HEAD WITH TWO MAGNETIC MATERIALS, AND HEAD OBTAINED BY THIS METHOD.
FR2664729B1 (en) * 1990-07-11 1992-09-18 Commissariat Energie Atomique METHOD OF MANUFACTURING MAGNETIC HEAD HAVING AN AIR GAP HAVING A CONTROLLABLE AZIMUT.
US5084957A (en) * 1990-11-06 1992-02-04 Seagate Technology, Inc. Method for aligning thin film head pole tips
US5137750A (en) * 1990-11-06 1992-08-11 Seagate Technology, Inc. Method of making a thin film head with contoured pole face edges for undershoot reduction
US5256249A (en) * 1991-09-17 1993-10-26 Seagate Technology, Inc. Method of manufacturing a planarized magnetoresistive sensor
FR2683369B1 (en) * 1991-10-30 1993-12-24 Commissariat A Energie Atomique CATAMARAN FLIGHT SKATE WITH PERIPHERAL LOCKINGS.
US5267392A (en) * 1992-03-04 1993-12-07 Ampex Systems Corporation Method of manufacturing a laminated high frequency magnetic transducer
WO1994002938A1 (en) * 1992-07-17 1994-02-03 Ampex Systems Corporation Composite metal and ferrite head transducer and manufacturing method therefor
US5283942A (en) * 1992-12-29 1994-02-08 International Business Machines Corporation Sacrificial layer planarization process for fabricating a narrow thin film inductive head
US5778514A (en) * 1993-01-06 1998-07-14 Das Devices, Inc. Method for forming a transducing head
FR2700633B1 (en) * 1993-01-20 1995-03-17 Silmag Sa Method for producing a magnetic head with semiconductor field detector and head obtained by this method.
DE69424456T2 (en) * 1993-03-02 2001-01-18 Sony Corp Magnetic head and method for its manufacture
MY111205A (en) * 1993-03-22 1999-09-30 Onstream Inc Method of manufacturing a thin-film magnetic head
DE69419642T2 (en) * 1993-03-22 2000-02-17 Onstream Inc Manufacturing method of a thin film magnetic head and magnetic head produced thereafter
FR2709855B1 (en) * 1993-09-06 1995-10-20 Commissariat Energie Atomique Magnetic read and write head with magnetoresistive element compensated for writing.
US5452166A (en) * 1993-10-01 1995-09-19 Applied Magnetics Corporation Thin film magnetic recording head for minimizing undershoots and a method for manufacturing the same
EP0651374A3 (en) * 1993-11-01 1995-09-06 Hewlett Packard Co A planar magnetoresistive head.
US5393376A (en) * 1993-12-30 1995-02-28 International Business Machines Corporation Method of making pole tip structure for thin film magnetic heads
US5434733A (en) * 1994-02-18 1995-07-18 Hewlett-Packard Company Planar head having separate read and write gaps
FR2716996B1 (en) * 1994-03-07 1996-04-05 Commissariat Energie Atomique Vertical magnetic head and its production process.
US5699605A (en) * 1994-05-23 1997-12-23 Seagate Technology, Inc. Method for forming a magnetic thin film head with recessed basecoat
US5754377A (en) * 1994-08-26 1998-05-19 Aiwa Research And Development, Inc. Thin film magnetic head including an elevated gap structure
US5490028A (en) * 1994-08-26 1996-02-06 Aiwa Research And Development, Inc. Thin film magnetic head including an integral layered shield structure
US5801909A (en) * 1994-08-26 1998-09-01 Aiwa Research And Development, Inc. Thin film magnetic head including durable wear layer and non-magnetic gap structures
US5544774A (en) * 1994-08-26 1996-08-13 Aiwa Research And Development, Inc. Method of eliminating pole recession in a thin film magnetic head
US5748417A (en) * 1994-08-26 1998-05-05 Aiwa Research And Development, Inc. Thin film magnetic head including layered magnetic side poles
JPH08171712A (en) * 1994-08-26 1996-07-02 Aiwa Co Ltd Side face exposure type thin-film magnetic head and its production
US5909346A (en) * 1994-08-26 1999-06-01 Aiwa Research & Development, Inc. Thin magnetic film including multiple geometry gap structures on a common substrate
US5563754A (en) * 1994-08-26 1996-10-08 Aiwa Research And Development, Inc. Thin film magnetic head including a durable wear layer and gap structure
US5815909A (en) * 1994-08-26 1998-10-06 Aiwa Research And Development, Inc. Method of making a thin film magnetic head including protected via connections through an electrically insulative substrate
US6091581A (en) * 1994-08-26 2000-07-18 Aiwa Co., Ltd. Thin film magnetic head including a separately deposited diamond-like carbon gap structure and magnetic control wells
US5673474A (en) * 1994-08-26 1997-10-07 Aiwa Research And Development, Inc. Method of fabricating a thin film magnetic head including layered magnetic side poles
FR2724480B1 (en) * 1994-09-13 1996-12-06 Commissariat Energie Atomique MAGNETIC HEAD WITH HORIZONTAL POLAR PIECES
FR2727778B1 (en) * 1994-12-02 1997-01-03 Commissariat Energie Atomique MAGNETIC ENCODER FOR READING MARKS ON AN ASSOCIATED MAGNETIC TRACK
US5621594A (en) * 1995-02-17 1997-04-15 Aiwa Research And Development, Inc. Electroplated thin film conductor coil assembly
EP0768640A3 (en) * 1995-10-13 1998-11-11 Ampex Corporation A small core magnetic head with non-magnetic side support
US6198607B1 (en) * 1995-12-22 2001-03-06 Censtor Corporation Contact planar magnetoresistive head
US5742452A (en) * 1996-01-10 1998-04-21 International Business Machines Corporation Low mass magnetic recording head and suspension
US5926350A (en) * 1996-03-15 1999-07-20 International Business Machines Corporation Dual gap horizontal thin film inductive head
US6069015A (en) * 1996-05-20 2000-05-30 Aiwa Research And Development, Inc. Method of fabricating thin film magnetic head including durable wear layer and non-magnetic gap structure
US5831792A (en) * 1997-04-11 1998-11-03 Western Digital Corporation Slider having a debris barrier surrounding a transducer
KR100238128B1 (en) * 1997-04-21 2000-01-15 윤종용 Plamar silicon head having structure to protect over current and over voltage and manufacturing method therefor
US5768070A (en) 1997-05-14 1998-06-16 International Business Machines Corporation Horizontal thin film write, MR read head
EP0889460B1 (en) * 1997-07-04 2003-09-24 STMicroelectronics S.r.l. An electromagnetic head with magnetoresistive means connected to a magnetic core
DE69717094T2 (en) 1997-07-18 2003-08-21 St Microelectronics Srl Partial head for a disk storage
JP3611953B2 (en) * 1997-09-05 2005-01-19 富士通株式会社 Planar thin film magnetic head and method of manufacturing the same
US5978183A (en) * 1997-12-11 1999-11-02 International Business Machines Corporation High resolution lead to shield short-resistant read head
JP3576783B2 (en) * 1997-12-26 2004-10-13 Tdk株式会社 Method for manufacturing thin-film magnetic head
FR2774797B1 (en) * 1998-02-11 2000-03-10 Commissariat Energie Atomique PROCESS FOR PRODUCING AN ASSEMBLY WITH MULTIPLE MAGNETIC HEADS AND MULTIPLE HEAD ASSEMBLY OBTAINED BY THIS PROCESS
KR100264802B1 (en) * 1998-02-24 2000-09-01 윤종용 Method for formming gap in planar structure thin film magnetic head
US5871655A (en) * 1998-03-19 1999-02-16 International Business Machines Corporation Integrated conductor magnetic recording head and suspension having cross-over integrated circuits for noise reduction
US6130809A (en) 1998-04-10 2000-10-10 International Business Machines Corporation Write head before read head constructed merged magnetic head with track width and zero throat height defined by first pole tip
US6055138A (en) * 1998-05-06 2000-04-25 Read-Rite Corporation Thin film pedestal pole tips write head having narrower lower pedestal pole tip
US7130152B1 (en) 1999-04-01 2006-10-31 Storage Technology Corporation High track density magnetic recording head
US6898053B1 (en) * 1999-10-26 2005-05-24 Seagate Technology Llc Perpendicular recording head with trackwidth defined by plating thickness
US6496328B1 (en) 1999-12-30 2002-12-17 Advanced Research Corporation Low inductance, ferrite sub-gap substrate structure for surface film magnetic recording heads
US6717770B1 (en) 2000-03-24 2004-04-06 Seagate Technology Llc Recording head for applying a magnetic field perpendicular to the magnetizations within magnetic storage media
JP2001283411A (en) * 2000-03-30 2001-10-12 Toshiba Corp Magnetic head and its manufacturing method
US6501619B1 (en) 2000-04-27 2002-12-31 Shipley Company, L.L.C. Inductive magnetic recording head having inclined magnetic read/write pole and method of making same
US6417989B1 (en) 2000-06-14 2002-07-09 Aiwa Co., Ltd. Multiple-gap magnetic thin-film head with improved read/write coil arrangement
US7079354B1 (en) 2000-08-14 2006-07-18 Hitachi Global Storage Technologies Netherlands, B.V. Planar magnetic head
US8144424B2 (en) 2003-12-19 2012-03-27 Dugas Matthew P Timing-based servo verify head and magnetic media made therewith
US7800862B1 (en) * 2004-02-18 2010-09-21 Advanced Research Corporation Magnetic recording head having secondary sub-gaps
US7092209B2 (en) * 2004-03-01 2006-08-15 Hitachi Global Storage Technologies Netherlands B.V. Longitudinal magnetic recording using magnetic media with a soft underlayer
WO2005109405A1 (en) 2004-05-04 2005-11-17 Advanced Research Corporation Intergrated thin film subgap/subpole structure for arbitrary gap pattern, magnetic recording heads and method of making the same
US8014100B2 (en) * 2007-05-04 2011-09-06 International Business Machines Corporation Planar servo write head
KR20090039062A (en) * 2007-10-17 2009-04-22 삼성전자주식회사 Magnetic recording head comprising conic main pole tip and method of manufacturing the same
US8068301B2 (en) 2008-03-28 2011-11-29 Advanced Research Corporation Magnetic media formed by a thin film planar arbitrary gap pattern magnetic head
US8767331B2 (en) 2009-07-31 2014-07-01 Advanced Research Corporation Erase drive system and methods of erasure for tape data cartridge
US8351152B2 (en) 2009-08-25 2013-01-08 International Business Machines Corporation Magnetic writer structures formed using post-deposition tilting
US8240024B2 (en) * 2009-08-25 2012-08-14 International Business Machines Corporation Methods for fabricating magnetic transducers using post-deposition tilting
US8416537B2 (en) * 2009-11-06 2013-04-09 International Business Machines Corporation Recording head with tilted orientation
US8934197B2 (en) 2012-07-16 2015-01-13 Quantum Corporation Magnetic media access head with metal coating
US10170138B2 (en) * 2017-03-31 2019-01-01 International Business Machines Corporation Tape apparatus having an array of write transducers each having at least three layers of coils

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3672043A (en) * 1965-12-06 1972-06-27 Ncr Co Miniature magnetic head
JPS55135324A (en) * 1979-04-11 1980-10-22 Fujitsu Ltd Manufacture of thin-film magnetic head
FR2459595A1 (en) * 1979-06-15 1981-01-09 Telediffusion Fse ACCESS CONTROL TELEVISION SYSTEM USING A VARIABLE ELECTRONIC KEY
JPS5823316A (en) * 1981-08-04 1983-02-12 Matsushita Electric Ind Co Ltd Manufacture of thin magnetic head
JPS5996527A (en) * 1982-11-22 1984-06-04 Olympus Optical Co Ltd Production of magnetic head
FR2559293B1 (en) * 1984-02-03 1988-09-09 Commissariat Energie Atomique NOVEL MAGNETIC WRITE AND READ HEAD FOR MAGNETIC RECORDING AND MANUFACTURING METHOD THEREOF
JPS61115212A (en) * 1984-11-09 1986-06-02 Fujitsu Ltd Production of thin film magnetic head
FR2586851B1 (en) * 1985-09-04 1989-09-22 Commissariat Energie Atomique METHOD FOR PRODUCING AN UNDERGROUND HORIZONTAL MAGNETIC HEAD AND MAGNETIC HEAD OBTAINED BY THIS METHOD

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63211112A (en) * 1987-02-26 1988-09-02 Nec Kansai Ltd Production of thin film magnetic head
JPH05503420A (en) * 1989-11-29 1993-06-10 センター フォー イノベイティブ テクノロジー chimeric protein
JPH07244817A (en) * 1994-03-07 1995-09-19 Internatl Business Mach Corp <Ibm> Magnetic transducer and preparation thereof

Also Published As

Publication number Publication date
JPH083884B2 (en) 1996-01-17
US4949207A (en) 1990-08-14
US4837924A (en) 1989-06-13
DE3768894D1 (en) 1991-05-02
EP0262028B1 (en) 1991-03-27
FR2604021B1 (en) 1988-10-28
FR2604021A1 (en) 1988-03-18
EP0262028A1 (en) 1988-03-30

Similar Documents

Publication Publication Date Title
JPS6383907A (en) Thin film magnetic head of planar construction and manufacture thereof
US6173486B1 (en) Thin film magnetic head with self-aligned pole tips
US6477019B2 (en) Thin film magnetic head including nonmagnetic and magnetic layers with similar milling rates
US4195323A (en) Thin film magnetic recording heads
US5649351A (en) Method of making thin film magnetic write head
US5809636A (en) Method of making a magnetoresistive thin film magnetic head with specific shapes of leads
US6219206B1 (en) Magneto-resistive effect type head
US4321641A (en) Thin film magnetic recording heads
US5566442A (en) Method of making a vertical magnetic head with an integrated coil
US4489484A (en) Method of making thin film magnetic recording heads
JP2995170B2 (en) Thin film magnetic head and method of manufacturing the same
US6728064B2 (en) Thin-film magnetic head having two magnetic layers, one of which includes a pole portion layer and a yoke portion layer, and method of manufacturing same
JP3149851B2 (en) Thin film magnetic head
JP3421983B2 (en) Method of manufacturing composite thin film magnetic head
KR19990082505A (en) Vertical magnetic head with integrated coil and manufacturing method thereof
JPH11191204A (en) Production of thin-film magnetic head
JP2000173017A (en) Thin film magnetic head and manufacture of the same
JP2000113425A (en) Thin film magnetic head and manufacture thereof
US6671133B1 (en) Thin-film magnetic head and method of manufacturing same
JP3553393B2 (en) Method for manufacturing thin-film magnetic head
JP4006164B2 (en) Recording / reproducing type thin film head and method of manufacturing the head
US6433969B1 (en) Compound magnetoresistive head and method for manufacturing same
JP3771017B2 (en) Thin film magnetic head and manufacturing method thereof
JP2002208114A (en) Thin film magnetic head and manufacturing method therefor
JP3919926B2 (en) Manufacturing method of thin film magnetic head