JPS638291A - Apparatus for producing semiconductor single crystal - Google Patents

Apparatus for producing semiconductor single crystal

Info

Publication number
JPS638291A
JPS638291A JP15084086A JP15084086A JPS638291A JP S638291 A JPS638291 A JP S638291A JP 15084086 A JP15084086 A JP 15084086A JP 15084086 A JP15084086 A JP 15084086A JP S638291 A JPS638291 A JP S638291A
Authority
JP
Japan
Prior art keywords
melt
molten liquid
temperature
tank
upper layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15084086A
Other languages
Japanese (ja)
Other versions
JPH0688867B2 (en
Inventor
Yasushi Maita
舞田 靖司
Yoshito Abe
義人 阿部
Katsumi Ueya
植屋 勝己
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Seiryo Engineering Co Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Seiryo Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd, Seiryo Engineering Co Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP61150840A priority Critical patent/JPH0688867B2/en
Publication of JPS638291A publication Critical patent/JPS638291A/en
Publication of JPH0688867B2 publication Critical patent/JPH0688867B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To produce a semiconductor single crystal having excellent electrical uniformity, by placing a heater contacting with or slightly immersed in molten liquid of a semiconductor raw material over the whole liquid surface. CONSTITUTION:A desired semiconductor raw material is charged into a molten liquid tank 42 and melted to molten liquid 51 of a specific temperature or thereabout by electrifying an electric heater 52 and raising the temperature in the molten liquid tank 42. The electric heater 52 is switched off and the space formed by the molten liquid tank 42 and a partition wall 43 is evacuated with a vacuum pump through a line 44 to form a heat-insulation part 45 which prevents the increase of the temperature of the molten liquid 51 near the side wall of the molten liquid tank 42. Separately, an electric heater block 61 of a liquid surface heating apparatus 60 is electrified to keep the upper layer of the molten liquid 51 to a predetermined temperature in high accuracy. A semiconductor crystal 58 is pulled up and grown from the upper layer of the molten liquid 51 by slowly lifting a rotary shaft 55 under rotation keeping the above state.

Description

【発明の詳細な説明】 [産業上の利用分野〕 この発明は、融液タンクに貯留されている半導体素材融
液の上層から結晶引上げを行なう半導体単結晶製造装置
に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a semiconductor single crystal manufacturing apparatus that pulls a crystal from an upper layer of a semiconductor material melt stored in a melt tank.

[従来の技術] 一般に、この種の製造装置、例えばGaASなどの化合
物半導体の単結晶製造装置は、第2図に示すように気密
容器11を有している。容器11内には融液タンク12
が設けられ、その外側壁には、タンク12に充填された
半導体素材を高温で溶かして融液(半導体素材融液)2
1とする電気ヒータ22が設けられている。融液21は
、タンク12の下部に貯留され、その上方には融液21
のガス化を防止するカバー液23が貯留されている。
[Prior Art] Generally, this type of manufacturing apparatus, for example, a single crystal manufacturing apparatus for a compound semiconductor such as GaAS, has an airtight container 11 as shown in FIG. Inside the container 11 is a melt tank 12.
A tank 12 is provided with a melted liquid (semiconductor material melt) 2 on its outer wall by melting the semiconductor material filled in the tank 12 at high temperature.
1, an electric heater 22 is provided. The melt 21 is stored in the lower part of the tank 12, and the melt 21 is stored above it.
A cover liquid 23 is stored to prevent gasification of the liquid.

第2図の装置は、更に回転軸24.25を有している。The device of FIG. 2 further has a rotation axis 24.25.

回転軸24は容器11底部を軸シール開溝26を介して
貫通しており、その上端は融液タンク12底部に固定さ
れている。また回転軸(引上軸)25は容器11上部を
軸シール機構27を介して貫通している。
The rotating shaft 24 passes through the bottom of the container 11 via a shaft seal groove 26, and its upper end is fixed to the bottom of the melt tank 12. Further, a rotating shaft (pulling shaft) 25 passes through the upper part of the container 11 via a shaft sealing mechanism 27.

この回転軸25は、その下端に凝固付着した半導体結晶
28が繋がり同結晶28の先端が融液21の液面2つの
中央部と接触する状態で、低速度で上方に移動しながら
回転する。この結果、融液21の液面29からはその融
液21が徐々に引上られて冷却され、結晶化していく。
The rotating shaft 25 rotates while moving upward at a low speed, with the solidified semiconductor crystal 28 attached to its lower end and the tip of the crystal 28 contacting the center portions of the two liquid surfaces of the melt 21. As a result, the melt 21 is gradually pulled up from the liquid surface 29 of the melt 21, cooled, and crystallized.

[発明が解決しようとする問題点] 第2図の単結晶製造装置で製造される半導体結晶28に
は、縞状組織が若干みられる。この縞は不純物などに起
因する濃度むらであり、したがって、この種の縞状組織
を有する半導体結晶28は電気的均一性の点で問題があ
った。本発明者は、上記の縞状組織の発生が、融液タン
ク12内で対流が生じるために(結晶成長に供される)
融液21上層部での液温の不均一性或は変動を招くこと
に起因することを認識するに至った。更に本発明者は、
上記の対流発生が融液21の温度分布に起因することも
認識するに至った。即ち第2図の装置では、融液21の
温度は、融液タンク12の側壁近傍で高い。したがって
電気ビータ22で加熱された(融液タンク12側壁近傍
の)融液21は、融液タンク12内側壁に沿って上昇す
る。そして、融液タンク12の内側壁に沿う上昇流は、
融液21上層部では融液タンク12の中心軸30に向か
う半径方向の流れとなり、この半径方向の流れは中心軸
30近傍では下降流となる。
[Problems to be Solved by the Invention] The semiconductor crystal 28 manufactured by the single crystal manufacturing apparatus shown in FIG. 2 has a slight striped structure. These stripes are concentration unevenness caused by impurities, and therefore, the semiconductor crystal 28 having this kind of striped structure has a problem in terms of electrical uniformity. The present inventor believes that the above-mentioned striped structure occurs due to convection occurring within the melt tank 12 (subject to crystal growth).
It has been recognized that this is caused by non-uniformity or fluctuations in the liquid temperature in the upper layer of the melt 21. Furthermore, the inventor
It has also been recognized that the above-mentioned convection generation is caused by the temperature distribution of the melt 21. That is, in the apparatus shown in FIG. 2, the temperature of the melt 21 is high near the side wall of the melt tank 12. Therefore, the melt 21 heated by the electric beater 22 (near the side wall of the melt tank 12) rises along the inner wall of the melt tank 12. The upward flow along the inner wall of the melt tank 12 is
In the upper layer of the melt 21, the flow is radial toward the central axis 30 of the melt tank 12, and this radial flow becomes a downward flow near the central axis 30.

この結果、融液タンク12内では、第2図に破線で示す
ような対流が発生する。
As a result, convection as shown by the broken line in FIG. 2 occurs within the melt tank 12.

したがって、この発明においては、融液タンクの側壁近
傍で半導体素材融液の局所的な高温部が発生することに
起因する対流発生を防止でき、もって電気的均一性の良
好な半導体単結晶が製造できるようにすることを解決す
べき技術的課題とする。
Therefore, in this invention, it is possible to prevent the generation of convection caused by the generation of localized high-temperature parts of the semiconductor material melt near the side walls of the melt tank, thereby producing semiconductor single crystals with good electrical uniformity. The technical problem to be solved is to make it possible.

[問題点を解決するための手段] この発明は、融液タンクに貯留されている半導体素材融
液の上層部を最高温に保つための加熱装置を上記融液の
液面のほぼ全範囲でこの液面にほぼ接触または液中に僅
かに浸漬する如く設けると共に、上記融液タンクの側部
並びに底部を断熱構造としたものである。
[Means for Solving the Problems] The present invention provides a heating device for maintaining the upper layer of the semiconductor material melt stored in the melt tank at the highest temperature over almost the entire range of the surface of the melt. The melt tank is provided so as to be almost in contact with the liquid surface or slightly immersed in the liquid, and the sides and bottom of the melt tank have a heat insulating structure.

[作用] 上記の断熱構造および加熱装置により、融液タンク側壁
近傍で融液が高温となるのを防止でき融液の温度分布を
ほぼ均一にできるので、対流発生が橿力防止できる。ま
た融液上、@が加熱装置により最高温に保たれることか
ら、たとえ融液の下方部で対流が発生したとしても晴晶
成艮に供される融液上層での融液の移動は無く、融液上
層の温度の一層の均一化が図れる。
[Function] The heat insulating structure and heating device described above prevent the melt from reaching a high temperature near the side wall of the melt tank and make the temperature distribution of the melt substantially uniform, thereby preventing the generation of convection. In addition, since the @ above the melt is kept at the highest temperature by the heating device, even if convection occurs in the lower part of the melt, the movement of the melt in the upper layer of the melt that is used for clear crystal formation will not be possible. Therefore, the temperature of the upper layer of the melt can be made more uniform.

[実施例コ 第1図はこの発明の一実施例に係る半導体単結晶製造装
置を示すもので、41は気密容器である。
[Embodiment] FIG. 1 shows a semiconductor single crystal manufacturing apparatus according to an embodiment of the present invention, and 41 is an airtight container.

容器41の内部の圧力は数十に9 / ctA g程度
に保持される。容器41内には有底円筒状の融液タンク
42が設けられている。融液タンク42内には、上端部
が径大となっている有底円筒状の隔壁43が設けられて
いる。この隔壁43の上端縁は、融液タンク42の中間
部の内側壁に固定されている。融液タンク42と隔壁4
3とで閉塞された空間は、容器41を貫通する配管44
により図示せぬ真空ポンプと連通しており、同ポンプに
よる真空引きで真空状態に保たれることにより断熱部4
5を形成する。なお、この空間に、熱遮断性に優れた断
熱部材を充填することにより断熱部45を形成すること
も可能である。断熱部45には、融液タンク42内に充
填された半導体素材を高温で溶かして融液(半導体素材
融液)51とする電気ヒータ52が隔壁43を包囲する
ように設けられている。融液51は融液タンク42の下
部に貯留され、その上方には融液51のガス化を防止す
る低融点ガラス液などのカバー液53が貯留される。
The pressure inside the container 41 is maintained at about several tens of 9/ctAg. A cylindrical melt tank 42 with a bottom is provided within the container 41 . Inside the melt tank 42, there is provided a cylindrical partition wall 43 with a bottom and a larger diameter at its upper end. The upper edge of this partition wall 43 is fixed to the inner wall of the intermediate portion of the melt tank 42 . Melt tank 42 and partition wall 4
The space closed by 3 is a pipe 44 that penetrates the container 41.
The insulating part 4 is connected to a vacuum pump (not shown), and is maintained in a vacuum state by evacuation by the pump.
form 5. Note that it is also possible to form the heat insulating portion 45 by filling this space with a heat insulating member having excellent heat insulation properties. An electric heater 52 that melts the semiconductor material filled in the melt tank 42 at high temperature to form a melt (semiconductor material melt) 51 is provided in the heat insulating section 45 so as to surround the partition wall 43 . The melt 51 is stored in the lower part of the melt tank 42, and above it is stored a cover liquid 53 such as a low melting point glass liquid that prevents the melt 51 from being gasified.

54、55は回転軸である。回転軸54は、容器41底
部を軸シール機構56を介して貫通しており、その上端
は融液タンク42底部に固定され、下端は図示せぬ回転
軸駆動機構に結合されている。一方、回転軸55は容器
41上部を軸シール1構57を介して貫通しており、そ
の上端は図示せぬ回転軸駆動機構に結合されている。こ
の回転軸55は、その下端に半導体結晶58を成長させ
同結晶58を融液51の液面59より引上げるための引
上軸として用いられる。
54 and 55 are rotation axes. The rotating shaft 54 passes through the bottom of the container 41 via a shaft sealing mechanism 56, its upper end is fixed to the bottom of the melt tank 42, and its lower end is connected to a rotating shaft drive mechanism (not shown). On the other hand, the rotating shaft 55 passes through the upper part of the container 41 via a shaft seal 1 structure 57, and its upper end is connected to a rotating shaft drive mechanism (not shown). The rotating shaft 55 is used as a pulling shaft for growing a semiconductor crystal 58 at its lower end and lifting the crystal 58 above the liquid level 59 of the melt 51.

60は融液51の上層部の温度を均−且つ最高温に保つ
ために融液51の液面59の(半導体結晶58成長に供
される中央部を除く)はぼ全範囲を覆うように設けられ
る液面加熱装置である。液面加熱装置60は、環状の電
気ヒータブロック61と、この電気ヒータブロック61
の底面に固着された環状の温度平衝ブロック62とを有
している。この温度平衡ブロック62は、例えば熱伝導
性に優れたtA板を上層とし、融液タンク42と同一部
材の耐熱板を下層とする2層構造となっている。液面加
熱装置60は、半導体結晶58を包囲する円筒状の遮熱
ブロック63を更に有している。この遮熱ブロック63
は、半導体結晶58が電気ヒータブロック61により不
必襄に加熱されるのを防ぐためのもので、断熱部材で形
成されており、その下部外側壁は電気ヒータブロック6
1の内側壁に固着されている。
In order to keep the temperature of the upper layer of the melt 51 uniform and at the highest temperature, the liquid surface 59 of the melt 51 (excluding the central part where the semiconductor crystal 58 is grown) covers almost the entire range. This is a liquid level heating device provided. The liquid surface heating device 60 includes an annular electric heater block 61 and this electric heater block 61.
It has an annular temperature equalization block 62 fixed to the bottom surface of the holder. The temperature equilibrium block 62 has a two-layer structure, for example, with a tA plate having excellent thermal conductivity as an upper layer and a heat-resistant plate made of the same material as the melt tank 42 as a lower layer. The liquid surface heating device 60 further includes a cylindrical heat shield block 63 surrounding the semiconductor crystal 58. This heat shield block 63
is for preventing the semiconductor crystal 58 from being unnecessarily heated by the electric heater block 61, and is made of a heat insulating material, and its lower outer wall is connected to the electric heater block 61.
It is fixed to the inner wall of 1.

さて、この実施例では、温度平衡ブロック62を融液5
1の液面59にほぼ接触させるか、或は融液51中に僅
かに浸漬させるようにしている。但し、融液51の液面
59は、半導体結晶58の成長による融液51の液量減
少に伴って降下するため、液面加熱装置60は、融液5
1の液面降下に追従して移動できる構造となっている必
要がある。このためには、例えば液面加熱装置60を上
下方向に移動可能な構造とし、その移動量をプログラム
により、または液面59位置検出に応じて制御する手段
、或は液面加熱装置60を自己浮遊構造とする比較的簡
便な手段等を適用すればよい。なお、液面降下に追従し
て移動可能とするこの種の手段は周知であるため、詳細
な説明は省略する。
Now, in this embodiment, the temperature equilibrium block 62 is
1 or slightly immersed in the melt 51. However, since the liquid level 59 of the melt 51 decreases as the amount of the melt 51 decreases due to the growth of the semiconductor crystal 58, the liquid level heating device 60
The structure must be such that it can move following the drop in the liquid level in step 1. For this purpose, for example, the liquid level heating device 60 may be configured to be movable in the vertical direction, and the amount of movement thereof may be controlled by a program or in accordance with the detection of the position of the liquid surface 59, or the liquid surface heating device 60 may be controlled by itself. A relatively simple means of creating a floating structure may be applied. Note that this type of means for making it movable following the drop in the liquid level is well known, so detailed explanation will be omitted.

次に、第1図の構成の動作を説明する。まず、所望の半
導体素材を融液タンク42内に充填した後、電気ヒータ
52に通電して融液タンク42内を高温にすることによ
り半導体素材を溶かして融液51とし、はぼ所定の温度
とする。この後は、電気ヒータ52への通電を停止し、
融液タンク42と隔壁43とで閉塞される空間を、図示
せぬ真空ポンプで配管44含介して真空引きして真空状
態とすることにより、断熱部45を形成する。これによ
り融液51の温度が融液タンク42の側壁近傍で高くな
ることが防止できる。一方、液面加熱装置 eoI71
電気ヒータブロック61を起動して、融液51の上層部
を所定温度に精度よく保持する。以降は、この状態にて
回転軸55を低速度で上方に移動しながら回転させるこ
とにより、融液51の上層部から半導体結晶58を引上
成長させていく。
Next, the operation of the configuration shown in FIG. 1 will be explained. First, after filling the melt tank 42 with a desired semiconductor material, the electric heater 52 is energized to raise the temperature in the melt tank 42 to melt the semiconductor material into a melt 51, which is then heated to a predetermined temperature. shall be. After this, the power supply to the electric heater 52 is stopped,
A heat insulating portion 45 is formed by evacuating the space closed by the melt tank 42 and the partition wall 43 through the piping 44 using a vacuum pump (not shown). This prevents the temperature of the melt 51 from becoming high near the side wall of the melt tank 42. On the other hand, liquid surface heating device eoI71
The electric heater block 61 is activated to accurately maintain the upper layer of the melt 51 at a predetermined temperature. Thereafter, in this state, the rotating shaft 55 is rotated while moving upward at a low speed, thereby pulling and growing the semiconductor crystal 58 from the upper layer of the melt 51.

さて、半導体結晶58を引上成長させていく状態では、
融液タンク42内の融液51の温度分布は、上層部が液
面加熱装置60<の電気ヒータブロック61ンによる加
熱動作のためにR高温度を保ち、中層部。
Now, in the state where the semiconductor crystal 58 is grown by pulling,
The temperature distribution of the melt 51 in the melt tank 42 is such that the upper layer maintains a high temperature due to the heating operation by the electric heater block 61 of the liquid surface heating device 60, and the middle layer maintains a high temperature.

下層部はほぼ同程度或は下層部が若干低温となる程度で
あり、しかも各層内での温度分布はほぼ一定である。こ
のため、融液タンク42内で融液51の対流は殆んど発
生せず、たとえ発生しても微弱である。更に、この実施
例では、融液51の上層部は上記したように最高温に保
たれていることから、仮に融液51の下層で対流が生じ
たとしても、この上層部での融液51の移動は無く、融
液51上層部の中央での半導体結晶成長に下層部対流が
影響を及ぼす恐れはない。このように、この実施例によ
れば、第2図において破線で示したような液層全体に亙
る対流の発生が防止できるので、縞状組織の無い電気的
均一性の良好な半導体結晶58を製造できる。
The temperature in the lower layer is approximately the same or slightly lower, and the temperature distribution within each layer is approximately constant. Therefore, convection of the melt 51 hardly occurs within the melt tank 42, and even if it occurs, it is weak. Furthermore, in this embodiment, since the upper layer of the melt 51 is kept at the highest temperature as described above, even if convection occurs in the lower layer of the melt 51, the melt 51 in the upper layer There is no movement of the melt 51, and there is no possibility that the lower layer convection will affect the semiconductor crystal growth at the center of the upper layer of the melt 51. In this way, according to this embodiment, it is possible to prevent the occurrence of convection over the entire liquid layer as shown by the broken line in FIG. Can be manufactured.

また、この実施例では、液面加熱装置60を融液51の
液面59に接触させるようにしているので、液面59と
カバー液53との間の流体界面が無くなり、融液51の
上層部で表面張力に起因する対流現象が発生することが
防止される。更に、この実施例では、液面加熱装置60
の底部を成す温度平衡ブロック62により融液51の上
層部の温度の一層の均一化も図れる。以上により、半導
体結晶58の電気的均一性を一層良好にすることができ
る。なお、液層全体に亙る対流の発生防止を主旨とする
この発明では、温度平衡ブロックG2は必ずしも必要で
ない。
Further, in this embodiment, since the liquid surface heating device 60 is brought into contact with the liquid surface 59 of the melt 51, there is no fluid interface between the liquid surface 59 and the cover liquid 53, and the upper layer of the melt 51 is This prevents convection phenomena caused by surface tension from occurring in the area. Furthermore, in this embodiment, the liquid surface heating device 60
The temperature equilibrium block 62 forming the bottom of the melt 51 can further equalize the temperature of the upper layer of the melt 51. As a result of the above, the electrical uniformity of the semiconductor crystal 58 can be further improved. In addition, in this invention whose main purpose is to prevent the occurrence of convection over the entire liquid layer, the temperature equilibrium block G2 is not necessarily required.

また液面加熱装置60は融液51の上層部を最高温に保
つためのものであるから、液面59に近接して設けられ
るだけでもよい。
Further, since the liquid surface heating device 60 is for keeping the upper layer of the melt 51 at the highest temperature, it is sufficient to provide it only in the vicinity of the liquid surface 59.

[発明の効果1 この発明によれば、半導体素材融液の温度が融液タンク
の側壁近傍で高温となるのを防止して温度分布の均一化
を図り且つ融液上層部の温度を最高温に保つようにした
ので、液層全体に亙る対流の発生が防止でき、縞状組織
の無い電気的均一性の良好な半導体結晶を製造すること
ができる。
[Effect of the invention 1] According to the present invention, the temperature of the semiconductor material melt is prevented from becoming high near the side wall of the melt tank, and the temperature distribution is made uniform, and the temperature of the upper layer of the melt is raised to the highest temperature. Therefore, it is possible to prevent the occurrence of convection throughout the liquid layer, and it is possible to manufacture a semiconductor crystal with good electrical uniformity and no striped structure.

置を示す図である。FIG.

42・・・融液タンク、43・・・隔壁、45・・・断
熱部、51・・・融液(半導体素材融液)、52・・・
電気ヒータ、54、55・・・回転軸、58・・・半導
体結晶、60・・・液面加熱装置、61・・・電気ヒー
タブロック、62・・・温度平衡ブロック、63・・・
遮熱ブロック。
42... Melt tank, 43... Partition wall, 45... Heat insulation part, 51... Melt (semiconductor material melt), 52...
Electric heater, 54, 55...Rotating shaft, 58...Semiconductor crystal, 60...Liquid surface heating device, 61...Electric heater block, 62...Temperature equilibrium block, 63...
heat shield block.

出願人復代理人 弁理士 鈴 江 武 彦第1図Applicant Sub-Agent Patent Attorney Suzue Takehiko Figure 1

Claims (1)

【特許請求の範囲】[Claims] 融液タンクに貯留されている半導体素材融液の上層から
結晶引上げを行なう半導体単結晶製造装置において、上
記融液の上層を最高温に保つための加熱装置を上記融液
の液面のほぼ全範囲でこの液面とほぼ接触または液中に
僅かに浸漬する如く設けると共に、上記融液タンクの側
部並びに底部を断熱構造としたことを特徴とする半導体
単結晶製造装置。
In a semiconductor single crystal production device that pulls a crystal from the upper layer of a semiconductor material melt stored in a melt tank, a heating device for keeping the upper layer of the melt at the highest temperature is installed over almost the entire surface of the melt. A semiconductor single crystal production apparatus characterized in that the melt tank is provided so as to be substantially in contact with the liquid surface or slightly immersed in the liquid, and the sides and bottom of the melt tank have a heat insulating structure.
JP61150840A 1986-06-27 1986-06-27 Semiconductor single crystal manufacturing equipment Expired - Lifetime JPH0688867B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61150840A JPH0688867B2 (en) 1986-06-27 1986-06-27 Semiconductor single crystal manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61150840A JPH0688867B2 (en) 1986-06-27 1986-06-27 Semiconductor single crystal manufacturing equipment

Publications (2)

Publication Number Publication Date
JPS638291A true JPS638291A (en) 1988-01-14
JPH0688867B2 JPH0688867B2 (en) 1994-11-09

Family

ID=15505521

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61150840A Expired - Lifetime JPH0688867B2 (en) 1986-06-27 1986-06-27 Semiconductor single crystal manufacturing equipment

Country Status (1)

Country Link
JP (1) JPH0688867B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004044276A1 (en) * 2002-11-12 2004-05-27 Memc Electronic Materials, Inc. A crystal puller and method for growing a monocrystalline ingot

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5731558A (en) * 1980-08-04 1982-02-20 Hokushin Cloth Kk Interior finish material and its manufacture
JPS6027684A (en) * 1983-07-26 1985-02-12 Fujitsu Ltd Apparatus for producing single crystal
JPS60239389A (en) * 1984-05-11 1985-11-28 Sumitomo Electric Ind Ltd Pulling device for single crystal

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5731558A (en) * 1980-08-04 1982-02-20 Hokushin Cloth Kk Interior finish material and its manufacture
JPS6027684A (en) * 1983-07-26 1985-02-12 Fujitsu Ltd Apparatus for producing single crystal
JPS60239389A (en) * 1984-05-11 1985-11-28 Sumitomo Electric Ind Ltd Pulling device for single crystal

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004044276A1 (en) * 2002-11-12 2004-05-27 Memc Electronic Materials, Inc. A crystal puller and method for growing a monocrystalline ingot
US8147613B2 (en) 2002-11-12 2012-04-03 Memc Electronic Materials, Inc. Crystal puller and method for growing a monocrystalline ingot

Also Published As

Publication number Publication date
JPH0688867B2 (en) 1994-11-09

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