JPS6382455A - Photosensitive body - Google Patents
Photosensitive bodyInfo
- Publication number
- JPS6382455A JPS6382455A JP22942786A JP22942786A JPS6382455A JP S6382455 A JPS6382455 A JP S6382455A JP 22942786 A JP22942786 A JP 22942786A JP 22942786 A JP22942786 A JP 22942786A JP S6382455 A JPS6382455 A JP S6382455A
- Authority
- JP
- Japan
- Prior art keywords
- atoms
- film
- gas
- flow rate
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229910021417 amorphous silicon Inorganic materials 0.000 claims abstract description 33
- 125000004433 nitrogen atom Chemical group N* 0.000 claims abstract description 23
- 229910003481 amorphous carbon Inorganic materials 0.000 claims abstract description 13
- 108091008695 photoreceptors Proteins 0.000 claims description 82
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 24
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical group [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 21
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical group [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims description 20
- 125000004437 phosphorous atom Chemical group 0.000 claims description 18
- 239000000758 substrate Substances 0.000 abstract description 55
- 125000004429 atom Chemical group 0.000 abstract description 14
- 239000010410 layer Substances 0.000 description 116
- 239000010408 film Substances 0.000 description 114
- 239000007789 gas Substances 0.000 description 96
- 238000006243 chemical reaction Methods 0.000 description 45
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 31
- 238000004458 analytical method Methods 0.000 description 28
- 238000000034 method Methods 0.000 description 23
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 22
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 20
- 229910000077 silane Inorganic materials 0.000 description 19
- -1 hydrazone compounds Chemical class 0.000 description 17
- 238000004519 manufacturing process Methods 0.000 description 16
- 239000002994 raw material Substances 0.000 description 15
- 239000011241 protective layer Substances 0.000 description 14
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 12
- 239000000126 substance Substances 0.000 description 12
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 11
- 239000000470 constituent Substances 0.000 description 11
- 239000000463 material Substances 0.000 description 11
- KAKZBPTYRLMSJV-UHFFFAOYSA-N Butadiene Chemical compound C=CC=C KAKZBPTYRLMSJV-UHFFFAOYSA-N 0.000 description 10
- 238000000921 elemental analysis Methods 0.000 description 10
- 238000006116 polymerization reaction Methods 0.000 description 10
- 125000004432 carbon atom Chemical group C* 0.000 description 9
- 239000000969 carrier Substances 0.000 description 9
- 230000007423 decrease Effects 0.000 description 9
- 229910001873 dinitrogen Inorganic materials 0.000 description 9
- 230000000694 effects Effects 0.000 description 9
- 229930195733 hydrocarbon Natural products 0.000 description 9
- 230000002829 reductive effect Effects 0.000 description 9
- 230000015572 biosynthetic process Effects 0.000 description 8
- 150000002430 hydrocarbons Chemical class 0.000 description 8
- 229910052751 metal Inorganic materials 0.000 description 8
- 239000002184 metal Substances 0.000 description 8
- 229910052782 aluminium Inorganic materials 0.000 description 7
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 7
- 239000003607 modifier Substances 0.000 description 7
- 239000012071 phase Substances 0.000 description 7
- UAHWPYUMFXYFJY-UHFFFAOYSA-N beta-myrcene Chemical compound CC(C)=CCCC(=C)C=C UAHWPYUMFXYFJY-UHFFFAOYSA-N 0.000 description 6
- 150000001875 compounds Chemical class 0.000 description 6
- 238000007796 conventional method Methods 0.000 description 6
- 238000000354 decomposition reaction Methods 0.000 description 6
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 6
- 206010034972 Photosensitivity reaction Diseases 0.000 description 5
- 230000000903 blocking effect Effects 0.000 description 5
- 150000002291 germanium compounds Chemical class 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 5
- 230000014759 maintenance of location Effects 0.000 description 5
- 230000036211 photosensitivity Effects 0.000 description 5
- 150000003377 silicon compounds Chemical class 0.000 description 5
- 239000007790 solid phase Substances 0.000 description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- 239000004215 Carbon black (E152) Substances 0.000 description 4
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 4
- 239000012790 adhesive layer Substances 0.000 description 4
- HSFWRNGVRCDJHI-UHFFFAOYSA-N alpha-acetylene Natural products C#C HSFWRNGVRCDJHI-UHFFFAOYSA-N 0.000 description 4
- IAQRGUVFOMOMEM-UHFFFAOYSA-N but-2-ene Chemical compound CC=CC IAQRGUVFOMOMEM-UHFFFAOYSA-N 0.000 description 4
- 229910052799 carbon Inorganic materials 0.000 description 4
- 230000003247 decreasing effect Effects 0.000 description 4
- XNMQEEKYCVKGBD-UHFFFAOYSA-N dimethylacetylene Natural products CC#CC XNMQEEKYCVKGBD-UHFFFAOYSA-N 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 description 4
- 125000001153 fluoro group Chemical group F* 0.000 description 4
- 229910000078 germane Inorganic materials 0.000 description 4
- 239000012528 membrane Substances 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 229910017464 nitrogen compound Inorganic materials 0.000 description 4
- 150000002830 nitrogen compounds Chemical class 0.000 description 4
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- 229910052711 selenium Inorganic materials 0.000 description 4
- 239000011669 selenium Substances 0.000 description 4
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- 239000010409 thin film Substances 0.000 description 4
- FAMPSKZZVDUYOS-UHFFFAOYSA-N 2,6,6,9-tetramethylcycloundeca-1,4,8-triene Chemical compound CC1=CCC(C)(C)C=CCC(C)=CCC1 FAMPSKZZVDUYOS-UHFFFAOYSA-N 0.000 description 3
- GXDHCNNESPLIKD-UHFFFAOYSA-N 2-methylhexane Chemical compound CCCCC(C)C GXDHCNNESPLIKD-UHFFFAOYSA-N 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 3
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- RGSFGYAAUTVSQA-UHFFFAOYSA-N Cyclopentane Chemical compound C1CCCC1 RGSFGYAAUTVSQA-UHFFFAOYSA-N 0.000 description 3
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 3
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- AFABGHUZZDYHJO-UHFFFAOYSA-N dimethyl butane Natural products CCCC(C)C AFABGHUZZDYHJO-UHFFFAOYSA-N 0.000 description 3
- 239000007791 liquid phase Substances 0.000 description 3
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 3
- OFBQJSOFQDEBGM-UHFFFAOYSA-N n-pentane Natural products CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 150000002894 organic compounds Chemical class 0.000 description 3
- 229920000620 organic polymer Polymers 0.000 description 3
- 239000000049 pigment Substances 0.000 description 3
- CXWXQJXEFPUFDZ-UHFFFAOYSA-N tetralin Chemical compound C1=CC=C2CCCCC2=C1 CXWXQJXEFPUFDZ-UHFFFAOYSA-N 0.000 description 3
- 238000007740 vapor deposition Methods 0.000 description 3
- BFIMMTCNYPIMRN-UHFFFAOYSA-N 1,2,3,5-tetramethylbenzene Chemical compound CC1=CC(C)=C(C)C(C)=C1 BFIMMTCNYPIMRN-UHFFFAOYSA-N 0.000 description 2
- GWHJZXXIDMPWGX-UHFFFAOYSA-N 1,2,4-trimethylbenzene Chemical compound CC1=CC=C(C)C(C)=C1 GWHJZXXIDMPWGX-UHFFFAOYSA-N 0.000 description 2
- VXNZUUAINFGPBY-UHFFFAOYSA-N 1-Butene Chemical compound CCC=C VXNZUUAINFGPBY-UHFFFAOYSA-N 0.000 description 2
- ZGEGCLOFRBLKSE-UHFFFAOYSA-N 1-Heptene Chemical compound CCCCCC=C ZGEGCLOFRBLKSE-UHFFFAOYSA-N 0.000 description 2
- AFFLGGQVNFXPEV-UHFFFAOYSA-N 1-decene Chemical compound CCCCCCCCC=C AFFLGGQVNFXPEV-UHFFFAOYSA-N 0.000 description 2
- LIKMAJRDDDTEIG-UHFFFAOYSA-N 1-hexene Chemical compound CCCCC=C LIKMAJRDDDTEIG-UHFFFAOYSA-N 0.000 description 2
- JRZJOMJEPLMPRA-UHFFFAOYSA-N 1-nonene Chemical compound CCCCCCCC=C JRZJOMJEPLMPRA-UHFFFAOYSA-N 0.000 description 2
- KWKAKUADMBZCLK-UHFFFAOYSA-N 1-octene Chemical compound CCCCCCC=C KWKAKUADMBZCLK-UHFFFAOYSA-N 0.000 description 2
- YBYIRNPNPLQARY-UHFFFAOYSA-N 1H-indene Chemical compound C1=CC=C2CC=CC2=C1 YBYIRNPNPLQARY-UHFFFAOYSA-N 0.000 description 2
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- CXOWYJMDMMMMJO-UHFFFAOYSA-N 2,2-dimethylpentane Chemical compound CCCC(C)(C)C CXOWYJMDMMMMJO-UHFFFAOYSA-N 0.000 description 2
- WGLLSSPDPJPLOR-UHFFFAOYSA-N 2,3-dimethylbut-2-ene Chemical group CC(C)=C(C)C WGLLSSPDPJPLOR-UHFFFAOYSA-N 0.000 description 2
- BZHMBWZPUJHVEE-UHFFFAOYSA-N 2,4-dimethylpentane Chemical compound CC(C)CC(C)C BZHMBWZPUJHVEE-UHFFFAOYSA-N 0.000 description 2
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- IMNFDUFMRHMDMM-UHFFFAOYSA-N N-Heptane Chemical compound CCCCCCC IMNFDUFMRHMDMM-UHFFFAOYSA-N 0.000 description 2
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 2
- GQPLMRYTRLFLPF-UHFFFAOYSA-N Nitrous Oxide Chemical compound [O-][N+]#N GQPLMRYTRLFLPF-UHFFFAOYSA-N 0.000 description 2
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- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Chemical compound C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 description 2
- 239000012298 atmosphere Substances 0.000 description 2
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- LPIQUOYDBNQMRZ-UHFFFAOYSA-N cyclopentene Chemical compound C1CC=CC1 LPIQUOYDBNQMRZ-UHFFFAOYSA-N 0.000 description 2
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- KYTNZWVKKKJXFS-UHFFFAOYSA-N cycloundecane Chemical compound C1CCCCCCCCCC1 KYTNZWVKKKJXFS-UHFFFAOYSA-N 0.000 description 2
- DIOQZVSQGTUSAI-UHFFFAOYSA-N decane Chemical compound CCCCCCCCCC DIOQZVSQGTUSAI-UHFFFAOYSA-N 0.000 description 2
- 150000001993 dienes Chemical class 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
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- OTMSDBZUPAUEDD-UHFFFAOYSA-N Ethane Chemical compound CC OTMSDBZUPAUEDD-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
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- 239000011230 binding agent Substances 0.000 description 1
- 235000010290 biphenyl Nutrition 0.000 description 1
- 239000004305 biphenyl Substances 0.000 description 1
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- 239000012159 carrier gas Substances 0.000 description 1
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- 238000004140 cleaning Methods 0.000 description 1
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- 239000004914 cyclooctane Substances 0.000 description 1
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- 239000004913 cyclooctene Substances 0.000 description 1
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- 239000012895 dilution Substances 0.000 description 1
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- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- LMBMDLOSPKIWAP-UHFFFAOYSA-N embutramide Chemical compound OCCCC(=O)NCC(CC)(CC)C1=CC=CC(OC)=C1 LMBMDLOSPKIWAP-UHFFFAOYSA-N 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000003912 environmental pollution Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- BXWQUXUDAGDUOS-UHFFFAOYSA-N gamma-humulene Natural products CC1=CCCC(C)(C)C=CC(=C)CCC1 BXWQUXUDAGDUOS-UHFFFAOYSA-N 0.000 description 1
- 229910021385 hard carbon Inorganic materials 0.000 description 1
- YVXHZKKCZYLQOP-UHFFFAOYSA-N hept-1-yne Chemical compound CCCCCC#C YVXHZKKCZYLQOP-UHFFFAOYSA-N 0.000 description 1
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- AHAREKHAZNPPMI-UHFFFAOYSA-N hexa-1,3-diene Chemical compound CCC=CC=C AHAREKHAZNPPMI-UHFFFAOYSA-N 0.000 description 1
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- QBNFBHXQESNSNP-UHFFFAOYSA-N humulene Natural products CC1=CC=CC(C)(C)CC=C(/C)CCC1 QBNFBHXQESNSNP-UHFFFAOYSA-N 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 238000005984 hydrogenation reaction Methods 0.000 description 1
- 150000002484 inorganic compounds Chemical class 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
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- 150000002576 ketones Chemical class 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 235000001510 limonene Nutrition 0.000 description 1
- 229940087305 limonene Drugs 0.000 description 1
- AUHZEENZYGFFBQ-UHFFFAOYSA-N mesitylene Substances CC1=CC(C)=CC(C)=C1 AUHZEENZYGFFBQ-UHFFFAOYSA-N 0.000 description 1
- 125000001827 mesitylenyl group Chemical group [H]C1=C(C(*)=C(C([H])=C1C([H])([H])[H])C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 239000000178 monomer Substances 0.000 description 1
- 210000003205 muscle Anatomy 0.000 description 1
- YDLYQMBWCWFRAI-UHFFFAOYSA-N n-Hexatriacontane Natural products CCCCCCCCCCCCCCCCCCCCCCCCCCCCCCCCCCCC YDLYQMBWCWFRAI-UHFFFAOYSA-N 0.000 description 1
- IJDNQMDRQITEOD-UHFFFAOYSA-N n-butane Chemical compound CCCC IJDNQMDRQITEOD-UHFFFAOYSA-N 0.000 description 1
- JCXJVPUVTGWSNB-UHFFFAOYSA-N nitrogen dioxide Inorganic materials O=[N]=O JCXJVPUVTGWSNB-UHFFFAOYSA-N 0.000 description 1
- 239000001272 nitrous oxide Substances 0.000 description 1
- ZCYXXKJEDCHMGH-UHFFFAOYSA-N nonane Chemical compound CCCC[CH]CCCC ZCYXXKJEDCHMGH-UHFFFAOYSA-N 0.000 description 1
- BKIMMITUMNQMOS-UHFFFAOYSA-N normal nonane Natural products CCCCCCCCC BKIMMITUMNQMOS-UHFFFAOYSA-N 0.000 description 1
- 150000007823 ocimene derivatives Chemical class 0.000 description 1
- UMIPWJGWASORKV-UHFFFAOYSA-N oct-1-yne Chemical compound CCCCCCC#C UMIPWJGWASORKV-UHFFFAOYSA-N 0.000 description 1
- 229940038384 octadecane Drugs 0.000 description 1
- 150000004866 oxadiazoles Chemical class 0.000 description 1
- 150000002916 oxazoles Chemical class 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
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- 125000002080 perylenyl group Chemical group C1(=CC=C2C=CC=C3C4=CC=CC5=CC=CC(C1=C23)=C45)* 0.000 description 1
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- 229920000573 polyethylene Polymers 0.000 description 1
- 230000000379 polymerizing effect Effects 0.000 description 1
- 238000002203 pretreatment Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 239000001294 propane Substances 0.000 description 1
- MWWATHDPGQKSAR-UHFFFAOYSA-N propyne Chemical group CC#C MWWATHDPGQKSAR-UHFFFAOYSA-N 0.000 description 1
- 150000003219 pyrazolines Chemical class 0.000 description 1
- KKOXKGNSUHTUBV-UHFFFAOYSA-N racemic zingiberene Natural products CC(C)=CCCC(C)C1CC=C(C)C=C1 KKOXKGNSUHTUBV-UHFFFAOYSA-N 0.000 description 1
- 150000003254 radicals Chemical class 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 229930195734 saturated hydrocarbon Natural products 0.000 description 1
- VPQBJIRQUUEAFC-UHFFFAOYSA-N selinene Natural products C1CC=C(C)C2CC(C(C)C)CCC21C VPQBJIRQUUEAFC-UHFFFAOYSA-N 0.000 description 1
- 150000003598 selinene derivatives Chemical class 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 150000003431 steroids Chemical class 0.000 description 1
- PJANXHGTPQOBST-UHFFFAOYSA-N stilbene Chemical compound C=1C=CC=CC=1C=CC1=CC=CC=C1 PJANXHGTPQOBST-UHFFFAOYSA-N 0.000 description 1
- 235000021286 stilbenes Nutrition 0.000 description 1
- 125000005504 styryl group Chemical group 0.000 description 1
- XSOKHXFFCGXDJZ-UHFFFAOYSA-N telluride(2-) Chemical compound [Te-2] XSOKHXFFCGXDJZ-UHFFFAOYSA-N 0.000 description 1
- 150000003505 terpenes Chemical class 0.000 description 1
- 235000007586 terpenes Nutrition 0.000 description 1
- UOHMMEJUHBCKEE-UHFFFAOYSA-N tetramethylbenzene Natural products CC1=CC=C(C)C(C)=C1C UOHMMEJUHBCKEE-UHFFFAOYSA-N 0.000 description 1
- XJPBRODHZKDRCB-UHFFFAOYSA-N trans-alpha-ocimene Natural products CC(=C)CCC=C(C)C=C XJPBRODHZKDRCB-UHFFFAOYSA-N 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- LGWZGBCKVDSYPH-UHFFFAOYSA-N triacontane Chemical compound [CH2]CCCCCCCCCCCCCCCCCCCCCCCCCCCCC LGWZGBCKVDSYPH-UHFFFAOYSA-N 0.000 description 1
- OLTHARGIAFTREU-UHFFFAOYSA-N triacontane Natural products CCCCCCCCCCCCCCCCCCCCC(C)CCCCCCCC OLTHARGIAFTREU-UHFFFAOYSA-N 0.000 description 1
- RRBYUSWBLVXTQN-UHFFFAOYSA-N tricyclene Chemical compound C12CC3CC2C1(C)C3(C)C RRBYUSWBLVXTQN-UHFFFAOYSA-N 0.000 description 1
- RRBYUSWBLVXTQN-VZCHMASFSA-N tricyclene Natural products C([C@@H]12)C3C[C@H]1C2(C)C3(C)C RRBYUSWBLVXTQN-VZCHMASFSA-N 0.000 description 1
- ODHXBMXNKOYIBV-UHFFFAOYSA-N triphenylamine Chemical class C1=CC=CC=C1N(C=1C=CC=CC=1)C1=CC=CC=C1 ODHXBMXNKOYIBV-UHFFFAOYSA-N 0.000 description 1
- AAAQKTZKLRYKHR-UHFFFAOYSA-N triphenylmethane Chemical compound C1=CC=CC=C1C(C=1C=CC=CC=1)C1=CC=CC=C1 AAAQKTZKLRYKHR-UHFFFAOYSA-N 0.000 description 1
- 150000004961 triphenylmethanes Chemical class 0.000 description 1
- 229930195735 unsaturated hydrocarbon Natural products 0.000 description 1
- 238000009834 vaporization Methods 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
- KKOXKGNSUHTUBV-LSDHHAIUSA-N zingiberene Chemical compound CC(C)=CCC[C@H](C)[C@H]1CC=C(C)C=C1 KKOXKGNSUHTUBV-LSDHHAIUSA-N 0.000 description 1
- 229930001895 zingiberene Natural products 0.000 description 1
- VMYXUZSZMNBRCN-UHFFFAOYSA-N α-curcumene Chemical compound CC(C)=CCCC(C)C1=CC=C(C)C=C1 VMYXUZSZMNBRCN-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G5/00—Recording members for original recording by exposure, e.g. to light, to heat, to electrons; Manufacture thereof; Selection of materials therefor
- G03G5/02—Charge-receiving layers
- G03G5/04—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
- G03G5/08—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic
- G03G5/082—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic and not being incorporated in a bonding material, e.g. vacuum deposited
- G03G5/08214—Silicon-based
- G03G5/08221—Silicon-based comprising one or two silicon based layers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G5/00—Recording members for original recording by exposure, e.g. to light, to heat, to electrons; Manufacture thereof; Selection of materials therefor
- G03G5/02—Charge-receiving layers
- G03G5/04—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
- G03G5/043—Photoconductive layers characterised by having two or more layers or characterised by their composite structure
- G03G5/0433—Photoconductive layers characterised by having two or more layers or characterised by their composite structure all layers being inorganic
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G5/00—Recording members for original recording by exposure, e.g. to light, to heat, to electrons; Manufacture thereof; Selection of materials therefor
- G03G5/02—Charge-receiving layers
- G03G5/04—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
- G03G5/08—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic
- G03G5/082—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic and not being incorporated in a bonding material, e.g. vacuum deposited
- G03G5/08285—Carbon-based
Landscapes
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photoreceptors In Electrophotography (AREA)
Abstract
Description
【発明の詳細な説明】
迎車上9利里公野
本発明は、電荷発生層と電荷輸送層とを有する感光体に
関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a photoreceptor having a charge generation layer and a charge transport layer.
従来技術
カールソン法の発明以来、電子写真の応用分野は著しい
発展を続け、電子写真用感光体にも様々な材料が開発さ
れ実用化されてきた。BACKGROUND OF THE INVENTION Since the invention of the Carlson method, the application field of electrophotography has continued to make remarkable progress, and various materials have been developed and put into practical use for electrophotographic photoreceptors.
従来用いられて来た電子写真感光体材料の主なものとし
ては、非晶質セレン、セレン砒素、セレンテルル、硫化
カドミウム、酸化亜鉛、アモルファスシリコン等の無機
物質、ポリビニルカルバゾール、金属フタロシアニン、
ジスアゾ顔料、トリスアゾ顔料、ペリレン顔料、トリフ
ェニルメタン化合物、トリフェニルアミン化合物、ヒド
ラゾン化合物、スチリル化合物、ピラゾリン化合物、オ
キサゾール化合物、オキサジアゾール化合物、等の有機
物質が挙げられる。また、その構成形態としては、これ
らの物質を単体で用いる単層型構成、結着材中に分散さ
せて用いるバインダー型構成、機能別に電荷発生層と電
荷輸送層とを設ける積層型構成等が挙げられる。The main electrophotographic photoreceptor materials conventionally used include inorganic substances such as amorphous selenium, selenium arsenide, selenium telluride, cadmium sulfide, zinc oxide, amorphous silicon, polyvinyl carbazole, metal phthalocyanine,
Examples include organic substances such as disazo pigments, trisazo pigments, perylene pigments, triphenylmethane compounds, triphenylamine compounds, hydrazone compounds, styryl compounds, pyrazoline compounds, oxazole compounds, and oxadiazole compounds. In addition, the configurations include a single-layer structure in which these substances are used alone, a binder-type structure in which they are dispersed in a binder, and a laminated structure in which a charge generation layer and a charge transport layer are provided for each function. Can be mentioned.
しかしながら、従来用いられて来た電子写真感光体材料
にはそれぞれ欠点があった。その一つとして人体への有
害性が挙げられるが、前述したアモルファスシリコンを
除(無機物質においては、何れも好ましくない性質を持
つものであった。また、電子写真感光体が実際に複写機
内で用いられるためには、帯電、露光、現像、転写、除
電、清掃等の苛酷な環境条件に曝された場合においても
、常に安定な性能を維持している必要があるが、前述し
た有機物質においては、何れも耐久性に乏しく、性能面
での不安定要素が多かった。However, the electrophotographic photoreceptor materials conventionally used each have drawbacks. One of these concerns is its toxicity to the human body, but with the exception of the amorphous silicon mentioned above, all inorganic substances have unfavorable properties. In order to be used, it is necessary to maintain stable performance at all times even when exposed to harsh environmental conditions such as charging, exposure, development, transfer, static elimination, and cleaning. Both had poor durability and many unstable factors in terms of performance.
このような欠点を解消すべく、近年、有害性を改善し耐
久性に富んだ材料として、グロー放電法により生成され
るアモルファスシリコンの電子写真感光体への応用が進
んで来ている。しかし、アモルファスシリコンは、原料
としてシランガスを多量に必要とする反面、高価なガス
であることから、出来上がった電子写真感光体も従来の
感光体に比べ大幅に高価なものとなる。また、成膜速度
が遅く、成膜時間の増大に伴い爆発性を有するシラン未
分解生成物を粉塵状に発生する等、生産上の不都合も多
い。また、この粉塵が製造時に感光層中に混入した場合
には、画像品質に著しく悪影響を及ぼす。ざらに、アモ
ルファスシリコンは、元来、比誘電率が高いため帯電性
能が低く、複写機内で所定の表面電位に帯電するために
は膜厚を厚くする必要があり、高価なアモルファスシリ
コン膜を長時間堆VIきせなくてはならない。In order to eliminate such drawbacks, in recent years, amorphous silicon produced by a glow discharge method has been increasingly applied to electrophotographic photoreceptors as a material with improved toxicity and high durability. However, while amorphous silicon requires a large amount of silane gas as a raw material, it is an expensive gas, so the resulting electrophotographic photoreceptor is also significantly more expensive than a conventional photoreceptor. In addition, there are many inconveniences in production, such as the slow film formation rate and the generation of explosive silane undecomposed products in the form of dust as the film formation time increases. Furthermore, if this dust gets mixed into the photosensitive layer during manufacturing, it will have a significant negative effect on image quality. Generally, amorphous silicon has low charging performance due to its high specific dielectric constant, and in order to charge it to a predetermined surface potential in a copying machine, it is necessary to increase the thickness of the film. I have to write the timetable VI.
ところでアモルファスカーボン膜自体は、プラズマ有機
重合膜として古くより知られており、例えばジエン(M
、5hen)及びベル(A、T。By the way, the amorphous carbon film itself has been known for a long time as a plasma organic polymerized film, for example, diene (M
, 5hen) and Bell (A, T.
Be1l)により、1973年発行ののジャーナル・オ
ブ・アプライド・ポリマー・サイエンス(Journa
l of Applied P。Journal of Applied Polymer Science (Journa Be1l), published in 1973.
l of Applied P.
lymer 5cience)第17巻の第885頁
乃至第892頁において、あらゆる有機化合物のガスか
ら作製きれ得る事が、また、同著者により、1979年
のアメリカンケミカルソサエティ (America
n ChemicalSociety)発行によるプ
ラズマボリマライゼーション(Plasma Pol
ymerization)の中でもその成膜性が論じら
れている。lymer 5science), Volume 17, pages 885 to 892, the same author also reported in the 1979 American Chemical Society that all organic compounds can be produced from gases.
Plasma Pol
ymerization), its film formability has been discussed.
しかしながら従来の方法で作製したプラズマ有機重合膜
は絶縁性を前提とした用途に限ワて用いられ、即ちそれ
らの膜は通常のポリエチレン膜の如<10’6Ωcm程
度の比抵抗を有する絶縁膜と考えられ、或は、少なくと
もそのような膜であるとの認識のもとに用いられていた
。実際に電子写真感光体への用途にしても同様の認識か
ら、保護層、接着層、ブロッキング層もしくは絶縁層に
限られており、所謂アンダーコート層もしくはオーバー
コート層としてしか用いられていなかった。However, plasma organic polymer films prepared by conventional methods are used only for applications that require insulation, that is, they cannot be used as insulation films with a resistivity of about <10'6 Ωcm, like ordinary polyethylene films. or at least it was used with the recognition that it was such a membrane. Due to the same recognition, its actual use in electrophotographic photoreceptors has been limited to protective layers, adhesive layers, blocking layers, or insulating layers, and has only been used as so-called undercoat layers or overcoat layers.
例えば、特開昭59−28161号公報には、基板上に
ブロッキング層及び接着層としてプラズマ重合された網
目構造を有する高分子層を設け、その上にアモルファス
シリコン層を設けた感光体が開示されている。特開昭5
9−38753号公報には、基板上にブロッキング層及
び接着層として酸素と窒素と炭化水素の混合ガスから生
成きれる1013〜1015Ωcmの高抵抗のプラズマ
重合膜を10人〜100人設けた上にアモルファスシリ
コン層を設けた感光体が開示きれている。特開昭!59
−136742号公報には、アルミ基板上に設けたアモ
ルファスシリコン層内へ光照射時にアルミ原子が拡散す
るのを防止するための保護層として1〜5um程度の炭
素膜を基板表面に形成せしめた感光体が開示されている
。特開昭60−63541号公報には、アルミ基板とそ
の上に設けたアモルファスシリコン層との接着性を改善
するために、接着層として200人〜2μmのダイヤモ
ンド状炭素膜を中間に設けた感光体が開示きれ、残留電
荷の面からM厚は2μm以下が好ましいとされている。For example, JP-A-59-28161 discloses a photoreceptor in which a plasma-polymerized polymer layer having a network structure is provided on a substrate as a blocking layer and an adhesive layer, and an amorphous silicon layer is provided thereon. ing. Japanese Patent Application Publication No. 5
Publication No. 9-38753 discloses that 10 to 100 plasma polymerized films with high resistance of 1013 to 1015 Ωcm, which can be generated from a mixed gas of oxygen, nitrogen, and hydrocarbons, are formed on a substrate as a blocking layer and an adhesive layer, and then an amorphous film is formed. A photoreceptor provided with a silicon layer has been disclosed. Tokukai Akira! 59
Publication No. 136742 discloses a photosensitive material in which a carbon film of about 1 to 5 um is formed on the surface of the substrate as a protective layer to prevent aluminum atoms from diffusing into the amorphous silicon layer provided on the aluminum substrate during light irradiation. The body is revealed. Japanese Unexamined Patent Publication No. 60-63541 discloses a photosensitive material in which a diamond-like carbon film with a thickness of 200 to 2 μm is provided in the middle as an adhesive layer in order to improve the adhesion between an aluminum substrate and an amorphous silicon layer provided thereon. It is said that the thickness of M is preferably 2 .mu.m or less from the viewpoint of the body being fully disclosed and the residual charge.
これらの開示は、何れも基板とアモルファスシリコン層
との間に、所謂アンダーコート層を設けた発明であり、
電荷輸送性についての開示は全くなく、また、a−Si
の有する前記した本質的問題を解決するものではない。All of these disclosures are inventions in which a so-called undercoat layer is provided between the substrate and the amorphous silicon layer,
There is no disclosure regarding charge transport properties, and a-Si
However, it does not solve the above-mentioned essential problems.
また、例えば、特開昭50−20728号公報には、ポ
リビニルカルバゾール−セレン系感光体の表面に保護層
としてグロー放電重合によるポリマー膜を0.1〜1μ
m設けた感光体が開示されている。特開昭59−214
859号公報には、アモルファスシリコン感光体の表面
に保MNとしてスチレンやアセチレン等の有機炭化水素
モノマーをプラズマ重合させて5μm程度の膜を形成さ
せる技術が開示されている。特開昭60−61761号
公報には、表面保護層として、500人〜2μmのダイ
ヤモンド状炭素薄膜を設けた感光体が開示され、透光性
の面からM厚は2um以下が好ましいとされてている。For example, Japanese Patent Application Laid-Open No. 50-20728 discloses that a polymer film of 0.1 to 1 μm formed by glow discharge polymerization is applied as a protective layer on the surface of a polyvinylcarbazole-selenium photoreceptor.
A photoreceptor is disclosed. Japanese Patent Publication No. 59-214
Japanese Patent No. 859 discloses a technique for forming a film of about 5 μm on the surface of an amorphous silicon photoreceptor by plasma polymerizing an organic hydrocarbon monomer such as styrene or acetylene as a MN. JP-A-60-61761 discloses a photoreceptor provided with a diamond-like carbon thin film of 500 to 2 μm as a surface protective layer, and it is said that the thickness M is preferably 2 μm or less from the viewpoint of light transmission. ing.
特開昭60−249115号公報には、0.05〜5μ
m程度の無定形炭素または硬質炭素膜を表面保護層とし
て用いる技術が開示され、膜厚が5μmを越えると感光
体活性に悪影響が及ぶとされている。JP-A-60-249115 discloses that 0.05 to 5μ
A technique has been disclosed in which an amorphous carbon or hard carbon film with a thickness of about 5 μm is used as a surface protective layer, and it is said that if the film thickness exceeds 5 μm, the photoreceptor activity will be adversely affected.
これらの開示は、何れも感光体表面に所謂オーバーコー
ト層を設けた発明であり、電荷輸送性についての開示は
全くなく、また、a−3iの有する前記した本質的問題
を解決するものではない。All of these disclosures are inventions in which a so-called overcoat layer is provided on the surface of a photoreceptor, and there is no disclosure of charge transport properties, and they do not solve the above-mentioned essential problems of a-3i. .
また、特開昭51−46130号公報には、ポリビニル
カルバゾール系電子写真感光体の表面にグロー放電重合
を行なって0.001〜3μmのポリマー膜を形成せし
めた電子写真感光板が開示されているが、電荷輸送性に
ついては全く言及きれていないし、a−3iの持つ前記
した本質的問題を解決するものではない。Further, JP-A-51-46130 discloses an electrophotographic photosensitive plate in which a polymer film of 0.001 to 3 μm is formed on the surface of a polyvinyl carbazole electrophotographic photoreceptor by glow discharge polymerization. However, there is no mention of charge transport properties at all, and it does not solve the above-mentioned essential problems of a-3i.
一方、アモルファスシリコン膜については、スピア(W
、E、5pear)及びレコンパ(P。On the other hand, regarding the amorphous silicon film, Spear (W
, E, 5pear) and Recompa (P.
G、LeComber)により1976年発行のフイロ
ソフィカル・マガジン(Phflosophical
Magazine)第33巻の第935頁乃至第94
9頁において、極性制御が可能な材料である事が報じら
れて以来、種々の光電デバイスへの応用が試みられて来
た。感光体への応用に関しては、例えば、特開昭56−
62254号公報、特開昭57−119356号公報、
特開昭57−177147号公報、特開昭57−119
357号公報、特開昭57−177149号公報、特開
昭57−119357号公報、特開昭57−17714
6号公報、特開昭57−177148号公報、特開昭5
7−174448号公報、特開昭57−174449号
公報、特開昭57−174450号公報、等に、炭素原
子を含有したアモルファスシリコン感光体が開示されて
いるが、何れもアモルファスシリコンの光導電性を炭素
原子により調整する事を目的としたものであり、また、
アモルファスシリコン自体厚い膜を必要としている。Phflosophical Magazine published in 1976 by G. LeComber.
Magazine) Volume 33, pages 935 to 94
Since it was reported on page 9 that it is a material whose polarity can be controlled, attempts have been made to apply it to various photoelectric devices. Regarding the application to photoreceptors, for example,
No. 62254, Japanese Patent Application Laid-open No. 119356/1983,
JP-A-57-177147, JP-A-57-119
357, JP 57-177149, JP 57-119357, JP 57-17714
Publication No. 6, JP-A-57-177148, JP-A-5
Amorphous silicon photoreceptors containing carbon atoms are disclosed in JP-A No. 7-174448, JP-A-57-174449, JP-A-57-174450, etc., but all of them are amorphous silicon photoconductors. The purpose is to adjust the properties using carbon atoms, and
Amorphous silicon itself requires a thick film.
発明が 決しようとするう照点
以上のように、従来、電子写真感光体に用いら3 れて
いるプラズマ有機重合膜は所謂アンダーコート層もしく
はオーバーコート層として使用されていたが、それらは
キャリアの輸送機能を必要としない膜であって、有機重
合膜が絶縁性で有るとの判断にたって用いられている。As mentioned above, plasma organic polymer films conventionally used in electrophotographic photoreceptors have been used as so-called undercoat layers or overcoat layers; It is a membrane that does not require a transport function, and is used based on the judgment that organic polymer membranes are insulating.
従ってその膜厚も高々5μm程度の極めて薄い膜として
しか用いられず、キャリアはトンネル効果で膜中を通過
するか、トンネル効果が期待できない場合には、残留電
位の発生に関して事実上問題にならずに済む程度の薄い
股でしか用いられていない。また、従来、電子写真に用
いられているアモルファスシリコン膜は所謂厚膜で使用
されており、価格或は生産性等に、不都合な点が多い。Therefore, it can only be used as an extremely thin film with a thickness of about 5 μm at most, and carriers either pass through the film by tunneling effect, or if a tunneling effect cannot be expected, there is virtually no problem with the generation of residual potential. It is only used for thin crotches that can be used. Furthermore, amorphous silicon films conventionally used in electrophotography are so-called thick films, which have many disadvantages in terms of cost, productivity, and the like.
本発明者らは、アモルファスカーボン膜の電子写真感光
体への応用を検討しているうちに、本来絶縁性であると
考えられていた水素化アモルファスカーボン膜がシリコ
ン原子及びゲルマニウム原子のうち少なくとも一方を含
有せしめる事により、燐原子及び硼素原子のうち少なく
とも一方を含有すると共に窒素原子を含有してなる水素
化或は弗素化アモルファスシリコン膜との積層において
は電荷輸送性を有し、容易に好適な電子写真特性を示し
始める事を見出した。その理論的解釈には本発明者にお
いても不明確な点が多く詳細に亙り言及はできないが、
シリコン原子及びゲルマニウム原子のうち少なくとも一
方を含有せしめた水素化アモルファスカーボン膜中に捕
捉されている比較的不安定なエネルギー状態の電子、例
えばπ電子、不対電子、残存フリーラジカル等が形成す
るバンド構造が、燐原子及び硼素原子のうち少なくとも
一方を含有すると共に窒素原子を含有してなる水素化或
は弗素化アモルファスシリコン膜が形成するバンド構造
と電導帯もしくは荷電子帯において近似したエネルギー
準位を有するため、燐原子及び硼素原子のうち少なくと
も一方を含有すると共に窒素原子を含有してなる水素化
或は弗素化アモルファスシリコン膜中で発生したキャリ
アが容易にシリコン原子及びゲルマニウム原子のうち少
なくとも一方を含有せしめた水素化アモルファスカーボ
ン膜中へ注入され、さらに、このキャリアは前述の比較
的不安定なエネルギー状態の電子の作用によりシリコン
原子及びゲルマニウム原子のうち少なくとも一方を含有
せしめた水素化アモルファスカーボン膜中を好適に走行
し得るためと推定される。While considering the application of an amorphous carbon film to an electrophotographic photoreceptor, the present inventors discovered that a hydrogenated amorphous carbon film, which was originally thought to be insulating, was found to contain at least one of silicon atoms and germanium atoms. By containing , it has charge transport properties and is easily suitable for stacking with a hydrogenated or fluorinated amorphous silicon film containing at least one of phosphorus atoms and boron atoms and nitrogen atoms. It was discovered that the electrophotographic properties began to show certain electrophotographic properties. There are many points in the theoretical interpretation that are unclear even to the inventor, so it is not possible to discuss the details in detail.
A band formed by electrons in a relatively unstable energy state, such as π electrons, unpaired electrons, and residual free radicals, captured in a hydrogenated amorphous carbon film containing at least one of silicon atoms and germanium atoms. An energy level whose structure is similar in conduction band or valence band to the band structure formed by a hydrogenated or fluorinated amorphous silicon film containing at least one of phosphorus atoms and boron atoms and nitrogen atoms. Therefore, carriers generated in the hydrogenated or fluorinated amorphous silicon film containing at least one of phosphorus atoms and boron atoms and nitrogen atoms can easily form at least one of silicon atoms and germanium atoms. The carriers are injected into the hydrogenated amorphous carbon film containing at least one of silicon atoms and germanium atoms due to the action of the electrons in the relatively unstable energy state described above. It is presumed that this is because it can travel suitably through the membrane.
本発明はその新たな知見を利用することにより、アモル
ファスシリコン感光体の持つ前述の如き本質的問題点を
全て解消し、また従来とは全く使用目的も特性も異なる
、有機プラズマ重合膜、特にシリコン原子及びゲルマニ
ウム原子のうち少なくとも一方を含有してなる水素化ア
モルファスカーボン膜を電荷輸送層として使用し、かつ
、燐原子及び硼素原子のうち少なくとも一方を含有する
と共に窒素原子を含有してなる水素化或は弗素化アモル
ファスシリコンの薄膜を電荷発生層として使用した感光
体を提供する事を目的とする。By utilizing this new knowledge, the present invention solves all the above-mentioned essential problems of amorphous silicon photoreceptors, and also produces organic plasma polymerized films, especially silicon Hydrogenation using a hydrogenated amorphous carbon film containing at least one of atoms and germanium atoms as a charge transport layer, and containing at least one of phosphorus atoms and boron atoms as well as nitrogen atoms. Another object of the present invention is to provide a photoreceptor using a thin film of fluorinated amorphous silicon as a charge generation layer.
間”点を解決するための手P
即ち、本発明は、電荷発生層と電荷輸送層とを有する機
能分離型感光体において、該電荷輸送層がプラズマ重合
反応から生成されるシリコン原子及びゲルマニウム原子
のうち少なくとも一方を含有してなる水素化アモルファ
スカーボン膜であり、かつ、該電荷発生層が燐原子及び
硼素原子のうち少なくとも一方を含有すると共に窒素原
子を含有してなる水素化或は弗素化アモルファスシリコ
ン膜であることを特徴とする感光体に関する(以下、本
発明による電荷輸送層をa−C膜及び電荷発生層をa−
3i膜と称する)。A method for solving the problem P That is, the present invention provides a functionally separated photoreceptor having a charge generation layer and a charge transport layer, in which the charge transport layer is composed of silicon atoms and germanium atoms generated from a plasma polymerization reaction. A hydrogenated or fluorinated amorphous carbon film containing at least one of the following, and the charge generation layer containing at least one of phosphorus atoms and boron atoms as well as nitrogen atoms. Regarding a photoreceptor characterized by being an amorphous silicon film (hereinafter, the charge transport layer according to the present invention is an a-C film and the charge generation layer is an a-
3i film).
本発明は、従来のアモルファスシリコン感光体において
は、電荷発生層として優れた機能を有するアモルファス
シリコンを、電荷発生能が無くても電荷輸送能さえあれ
ば済む電荷輸送層としても併用していたため発生してい
たこれらの問題点を解決すべく成されたものである。The present invention was developed because, in conventional amorphous silicon photoreceptors, amorphous silicon, which has an excellent function as a charge generation layer, is also used as a charge transport layer, which requires only charge transport ability even if it does not have charge generation ability. This was done to solve these problems.
即ち、本発明は、電荷輸送層としてグロー放電により生
成されるシリコン原子及びゲルマニウム原子のうち少な
くとも一方を含有してなる水素化アモルファスカーボン
膜を設け、かつ、電荷発生層として同じくグロー放電に
より生成される燐原子及び硼素原子のうち少なくとも一
方を含有すると共に窒素原子を含有してなる水素化或は
弗素化アモルファスシリコン膜を設けた事を特徴とする
機能分離型感光体に関する。該電荷輸送層は、可視光も
しくは半導体レーザー光付近の波長の光に対しては明確
なる光導電性は有ざないが、好適な輸送性を有し、ざら
に、帯電能、耐久性、耐候性、耐環境汚染性等の電子写
真感光体性能に優れ、しかも透光性にも優れるため、機
能分離型感光体としての積層構造を形成する場合におい
ても極めて高い自由度が得られるものである。また、該
電荷発生層は、可視光もしくは半導体レーザー光付近の
波長の光に対して優れた光導電性を有し、しかも従来の
アモルファスシリコン感光体に比べて極めて薄い膜厚で
、その機能を活かす事ができるものである。That is, the present invention provides a hydrogenated amorphous carbon film containing at least one of silicon atoms and germanium atoms produced by glow discharge as a charge transport layer, and a hydrogenated amorphous carbon film containing at least one of silicon atoms and germanium atoms produced by glow discharge as a charge generation layer. The present invention relates to a functionally separated photoreceptor characterized by being provided with a hydrogenated or fluorinated amorphous silicon film containing at least one of phosphorus atoms and boron atoms and nitrogen atoms. Although the charge transport layer does not have clear photoconductivity for visible light or light with a wavelength near semiconductor laser light, it has suitable transport properties, and has good charging ability, durability, and weather resistance. It has excellent electrophotographic photoreceptor performance such as durability and environmental pollution resistance, and is also excellent in light transmission, so it provides an extremely high degree of freedom when forming a laminated structure as a function-separated photoreceptor. . In addition, the charge generation layer has excellent photoconductivity for visible light or light with a wavelength near semiconductor laser light, and has an extremely thin film thickness compared to conventional amorphous silicon photoreceptors. It is something that can be put to good use.
本発明においては、a−C膜を形成するために有機化合
物ガス、特に炭化水素ガスが用いられる。In the present invention, an organic compound gas, particularly a hydrocarbon gas, is used to form the a-C film.
該炭化水素における相状態は常温常圧において必ずしも
気相である必要はなく、加熱或は減圧等により溶融、蒸
発、昇華等を経て気化しうるものであれば、液相でも固
相でも使用可能である。The phase state of the hydrocarbon does not necessarily have to be a gas phase at room temperature and normal pressure; it can be used in either a liquid phase or a solid phase as long as it can be vaporized through melting, evaporation, sublimation, etc. by heating or reduced pressure. It is.
使用可能な炭化水素には種類が多いが、飽和炭化水素と
しては、例えば、メタン、エタン、プロパン、ブタン、
ペンタン、ヘキサン、ヘプタン、オクタン、ノナン、デ
カン、ウンデカン、ドデカン、トリデカン、テトラデカ
ン、ペンタデカン、ヘキサデカン、ヘプタデカン、オク
タデカン、ノナデカン、エイコサン、ヘンエイコサン、
トコサン、トリコサン、テトラコサン、ペンタコサン、
ヘキサコサン、ヘプタコサン、オクタコサン、ノナコサ
ン、トリアコンタン、トドリアコンタン、ペンタトリア
コンタン、等のノルマルパラフィン並びに、イソブタン
、イソペンタン、ネオペンタン、イソヘキサン、ネオヘ
キサン、2.3−ジメチルブタン、2−メチルヘキサン
、3−エチルペンタン、2.2−ジメチルペンタン、2
,4−ジメチルペンタン、3,3−ジメチルペンタン、
トリブタン、2−メチルへブタン、3−メチルへブタン
、2.2−ジメチルヘキサン、2.2.5−ジメチルヘ
キサン、2,2.3−)ジメチルペンタン、2.2.4
−トリメチルペンタン、2.3゜3−トリメチルペンタ
ン、2,3.4−トリメチルペンタン、イソナノン、等
のイソパラフィン、等が用いられる。不飽和炭化水素と
しては、例えば、エチレン、プロピレン、イソブチレン
、1−ブテン、2−ブテン、1−ペンテン、2−ペンテ
ン、2−メチル−1−ブテン、3−メチル−1−ブテン
、2−メチル−2−ブテン、1−ヘキセン、テトラメチ
ルエチレン、1−ヘプテン、1−オクテン、1−ノネン
、1−デセン、等のオレフィン、並びに、アレン、メチ
ルアレン、ブタジェン、ペンタジェン、ヘキサジエン、
シクロペンタジェン、等のジオレフィン、並びに、オシ
メン、アロオシメン、ミルセン、ヘキサトリエン、等の
トリオレフイン、並びに、アセチレン、ブタジイン、1
゜3−ペンタジイン、2.4−ヘキサジイン、メチルア
セチレン、1−ブチン、2−ブチン、1−ペンチン、1
−ヘキシン、1−ヘプチン、1−オクチン、1〜ノニン
、1−デシン、等が用いられる。There are many types of hydrocarbons that can be used, but examples of saturated hydrocarbons include methane, ethane, propane, butane,
Pentane, hexane, heptane, octane, nonane, decane, undecane, dodecane, tridecane, tetradecane, pentadecane, hexadecane, heptadecane, octadecane, nonadecane, eicosane, heneicosane,
tocosan, tricosane, tetracosan, pentacosan,
Normal paraffins such as hexacosane, heptacosane, octacosane, nonacosane, triacontane, todoriacontane, pentatriacontane, etc., as well as isobutane, isopentane, neopentane, isohexane, neohexane, 2.3-dimethylbutane, 2-methylhexane, 3- Ethylpentane, 2,2-dimethylpentane, 2
, 4-dimethylpentane, 3,3-dimethylpentane,
Tributane, 2-methylhebutane, 3-methylhebutane, 2.2-dimethylhexane, 2.2.5-dimethylhexane, 2,2.3-)dimethylpentane, 2.2.4
Isoparaffins such as -trimethylpentane, 2.3°3-trimethylpentane, 2,3.4-trimethylpentane, isonanone, etc. are used. Examples of unsaturated hydrocarbons include ethylene, propylene, isobutylene, 1-butene, 2-butene, 1-pentene, 2-pentene, 2-methyl-1-butene, 3-methyl-1-butene, 2-methyl -Olefins such as 2-butene, 1-hexene, tetramethylethylene, 1-heptene, 1-octene, 1-nonene, 1-decene, and allene, methylalene, butadiene, pentadiene, hexadiene,
Diolefins such as cyclopentadiene, triolefins such as ocimene, allocimene, myrcene, hexatriene, acetylene, butadiyne, etc.
゜3-pentadiyne, 2.4-hexadiyne, methylacetylene, 1-butyne, 2-butyne, 1-pentyne, 1
-Hexyne, 1-heptyne, 1-octyne, 1-nonine, 1-decyne, etc. are used.
脂環式炭化水素としては、例えば、シクロプロペン、シ
クロブタン、シクロペンタン、シクロヘキサン、シクロ
へブタン、シクロオクタン、シクロノナン、シクロデカ
ン、シクロウンデカン、シクロドデカン、シクロトリデ
カン、シクロテトラデカン、シクロペンタデカン、シク
ロヘキサデカン、等のシクロパラフィン並びに、シクロ
プロペン、シクロブテン、シクロペンテン、シクロヘキ
セン、シクロヘプテン、シクロオクテン、シクロノネン
、シクロデセン、等のシクロオレフィン並びに、リモネ
ン、テルビルン、フエランドレン、シルベストレン、ツ
エン、カレン、ピネン、ボルニレン、カシフェン、フエ
ンチェン、シクロウンデカン、トリシクレン、ピサボレ
ン、ジンギベレン、クルクメン、フムレン、カジネンセ
スキベニヘン、セリネン、カリオフィレン、サンタレン
、セドレン、カンホレン、フィロクラテン、ボドカルブ
レン、ミレン、等のテルペン並びに、ステロイド等が用
いられる。芳香族炭化水素としては、例えば、ベンゼン
、トルエン、キシレン、ヘミメリテン、プソイドクメン
、メシチレン、プレニテン、イソジュレン、ジュレン、
ペンタメチルベンゼン、ヘキサメチルベンゼン、エチル
ベンゼン、プロピルベンゼン、クメン、スチレン、ビフ
ェニル、テルフェニル、ジフェニルメタン、トリフェニ
ルメタン、ジベンジル、スチルベン、インデン、ナフタ
リン、テトラリン、アントラセン、フェナントレン、等
が用いられる。Examples of alicyclic hydrocarbons include cyclopropene, cyclobutane, cyclopentane, cyclohexane, cyclohebutane, cyclooctane, cyclononane, cyclodecane, cycloundecane, cyclododecane, cyclotridecane, cyclotetradecane, cyclopentadecane, cyclohexadecane, cycloparaffins such as cyclopropene, cyclobutene, cyclopentene, cyclohexene, cycloheptene, cyclooctene, cyclononene, cyclodecene, and cycloolefins such as limonene, tervirun, phelandrene, sylvestrene, thuene, carene, pinene, bornylene, casifene, fuenchen , cycloundecane, tricyclene, pisabolene, zingiberene, curcumene, humulene, kajinensesesquivenichen, selinene, caryophyllene, santarene, cedrene, campholene, phylloclatene, bodocarbrene, mirene, and other terpenes, steroids, and the like are used. Examples of aromatic hydrocarbons include benzene, toluene, xylene, hemimelithene, pseudocumene, mesitylene, prenitene, isodurene, durene,
Pentamethylbenzene, hexamethylbenzene, ethylbenzene, propylbenzene, cumene, styrene, biphenyl, terphenyl, diphenylmethane, triphenylmethane, dibenzyl, stilbene, indene, naphthalene, tetralin, anthracene, phenanthrene, etc. are used.
ざらに、炭化水素以外でも、例えば、アルコール類、ケ
トン類、エーテル類、エステル類、等炭素と成りうる化
合物であれば使用可能である。In general, any compound other than hydrocarbons that can be converted into carbon, such as alcohols, ketones, ethers, and esters, can be used.
本発明におけるa −C膜中に含まれる水素原子の量は
グロー放電を用いるというその製造面から必然的に定ま
るが、炭素原子と水素原子の総量に対して、概ね30乃
至60原子%含有される。ここで、炭素原子並びに水素
原子の膜中含有量は、有機元素分析の常法、例えばON
H分析を用いる事により知る事ができる。The amount of hydrogen atoms contained in the a-C film of the present invention is inevitably determined from the manufacturing aspect of using glow discharge, but it is approximately 30 to 60 atomic percent contained in the a-C film based on the total amount of carbon atoms and hydrogen atoms. Ru. Here, the content of carbon atoms and hydrogen atoms in the film is determined using a conventional method for organic elemental analysis, for example, ON.
This can be determined by using H analysis.
本発明におけるa−CM中に含まれる水素原子の量は、
成膜装置の形態並びに成膜時の条件により変化するが、
例えば、基板温度を高くする、圧力を低くする、原料炭
化水素ガスの希釈率を低くする、印加電力を高くする、
交番電界の周波数を低くする、交番電界に重畳せしめた
直流電界強度を高くする、等の手段、或は、これらの組
合せ操作は、含有水素量を低くする効果を有する。The amount of hydrogen atoms contained in a-CM in the present invention is
It varies depending on the form of the film-forming equipment and the conditions during film-forming, but
For example, increasing the substrate temperature, decreasing the pressure, decreasing the dilution rate of the raw material hydrocarbon gas, increasing the applied power,
Measures such as lowering the frequency of the alternating electric field, increasing the strength of the DC electric field superimposed on the alternating electric field, or a combination thereof have the effect of lowering the amount of hydrogen contained.
本発明における電荷輸送層としてのa −C膜の膜厚は
、通常の電子写真プロセスで用いるためには、5乃至5
0μm1特に7乃至20μmが適当であり、5umより
薄いと、帯電電位が低いため充分な複写画像濃度を得る
事ができない。また、50μmより厚いと、生産性の面
で好ましくない。The thickness of the a-C film as the charge transport layer in the present invention is 5 to 5
A suitable value is 0 μm, especially 7 to 20 μm; if it is thinner than 5 μm, the charging potential will be low, making it impossible to obtain a sufficient density of the copied image. Moreover, if it is thicker than 50 μm, it is not preferable in terms of productivity.
このa−CMは、高透光性、高暗抵抗を有するとともに
電荷輸送性に富み、膜厚を上記の様に5μm以上として
もキャリアはトラップされる事無く輸送され明減衰に寄
与する事が可能である。This a-CM has high light transmittance, high dark resistance, and is rich in charge transport properties.As mentioned above, even if the film thickness is 5 μm or more, carriers are transported without being trapped and contribute to bright attenuation. It is possible.
本発明における原料気体からa −C膜を形成する過程
としては、原料気体が、直流、低周波、高周波、或はマ
イクロ波等を用いたプラズマ法により生成されるプラズ
マ状態を経て形成される方法が最も好ましいが、その他
にも、イオン化蒸着法、或はイオンビーム蒸着法等によ
り生成されるイオン状態を経て形成されてもよいし、真
空蒸着法、或はスパッタリング法等により生成される中
性粒子から形成されてもよいし、ざらには、これらの組
み合わせにより形成されてもよい。The process of forming an a-C film from a raw material gas in the present invention is a method in which the raw material gas is formed through a plasma state generated by a plasma method using direct current, low frequency, high frequency, microwave, etc. is the most preferable, but it may also be formed through an ionic state generated by ionization vapor deposition method, ion beam vapor deposition method, etc., or neutral state produced by vacuum vapor deposition method, sputtering method, etc. It may be formed from particles or a combination thereof.
本発明においては炭化水素の他に、a −C膜中に少な
くともシリコン原子或はゲルマニウム原子を添加するた
めの原料として、シリコン化合物或はゲルマニウム化合
物が用いられる。該シリコン化合物或はゲルマニウム化
合物における相状態は常温常圧において必ずしも気相で
ある必要はなく、加熱或は減圧等により溶融、蒸発、昇
華等を経て気化しうるものであれば、液相でも固相でも
使用可能である。シリコン化合物或はゲルマニウム化合
物としては、例えば、シラン、ジシラン、弗化シラン、
ゲルマン等の無機化合物、金属フタロシアニン、金属ア
ルコラード等の有機化合物が用いられる。In the present invention, in addition to hydrocarbons, a silicon compound or a germanium compound is used as a raw material for adding at least silicon atoms or germanium atoms into the a-C film. The phase state of the silicon compound or germanium compound does not necessarily have to be a gas phase at room temperature and normal pressure, but it can be a liquid phase or a solid phase as long as it can be vaporized through melting, evaporation, sublimation, etc. by heating or reduced pressure. It can also be used in phases. Examples of silicon compounds or germanium compounds include silane, disilane, fluorinated silane,
Inorganic compounds such as germane and organic compounds such as metal phthalocyanine and metal alcoholade are used.
本発明において化学的修飾物質として含有されるシリコ
ン原子或はゲルマニウム原子の量は、全構成原子に対し
て10原子%以下である。ここで、シリコン原子或はゲ
ルマニウム原子の膜中含有量は、元素分析の常法、例え
ばオージェ分析により知る事ができる。シリコン原子或
はゲルマニウム原子を含まない場合には、好適な輸送性
が確保されず、ざらに、成膜後の経時劣化を招きやすく
なる。一方、シリコン原子の量が10原子%を越える場
合には、少量の添加では好適な輸送性を保証していたシ
リコン原子が、逆に膜の高抵抗化を招く作用を示し、感
度が低下してしまう。一方、ゲルマニウム原子の量が1
0原子%を越える場合には、少量の添加では好適な輸送
性を保証していたゲルマニウム原子が、逆に膜の低抵抗
化を招く作用を示し、帯電能が低下してしまう。従って
、本発明におけるシリコン原子或はゲルマニウム原子の
添加量範囲は重要である。In the present invention, the amount of silicon atoms or germanium atoms contained as a chemical modifier is 10 at % or less based on the total constituent atoms. Here, the content of silicon atoms or germanium atoms in the film can be determined by a conventional method of elemental analysis, such as Auger analysis. If the film does not contain silicon atoms or germanium atoms, suitable transport properties cannot be ensured, and deterioration over time after film formation is likely to occur. On the other hand, when the amount of silicon atoms exceeds 10 at %, the silicon atoms, which had ensured suitable transport properties when added in small amounts, instead exhibit an effect that increases the resistance of the film, resulting in a decrease in sensitivity. It ends up. On the other hand, the amount of germanium atoms is 1
If the amount exceeds 0 atomic %, the germanium atoms, which ensured suitable transport properties when added in small amounts, instead exhibit the effect of lowering the resistance of the film, resulting in a decrease in charging ability. Therefore, the range of the amount of silicon atoms or germanium atoms added in the present invention is important.
本発明において化学的修飾物質として含有されるシリコ
ン原子或はゲルマニウム原子の量は、主に、プラズマ反
応を行なう反応室への前述のシリコン化合物或はゲルマ
ニウム化合物の導入量を増減することにより制御するこ
とが可能である。シリコン化合物或はゲルマニウム化合
物の導入量を増大させれば、本発明によるa−C膜中へ
のシリコン原子或はゲルマニウム原子の添加量を高くす
ることが可能であり、逆にシリコン化合物或はゲルマニ
ウム化合物の導入量を減少させれば、本発明によるa−
C膜中へのシリコン原子或iゲルマニウム原子の添加量
を低くすることが可能である。In the present invention, the amount of silicon atoms or germanium atoms contained as a chemical modifier is mainly controlled by increasing or decreasing the amount of the silicon compound or germanium compound introduced into the reaction chamber in which the plasma reaction is performed. Is possible. By increasing the amount of silicon compound or germanium compound introduced, it is possible to increase the amount of silicon atoms or germanium atoms added to the a-C film according to the present invention. By reducing the amount of compound introduced, a-
It is possible to reduce the amount of silicon atoms or i-germanium atoms added to the C film.
本発明においては、a−Sivcを形成するためにシラ
ンガス、ジシランガス、或は、弗化シランガスが用いら
れる。また、化学的修飾物質として燐原子或は硼素原子
を膜中に含有せしめるための原料ガスとして、ホスフィ
ンガス或はジボランガス等が用いられる。さらに、化学
的修飾物質として窒素原子を膜中に含有せしめるための
原料ガスとして、窒素ガス、アンモニアガス、亜酸化窒
素ガス、或は、二酸化窒素ガス、等の窒素化合物ガスが
用いられる。In the present invention, silane gas, disilane gas, or fluorinated silane gas is used to form a-Sivc. Furthermore, phosphine gas, diborane gas, or the like is used as a raw material gas for incorporating phosphorus atoms or boron atoms as chemical modifiers into the film. Furthermore, a nitrogen compound gas such as nitrogen gas, ammonia gas, nitrous oxide gas, or nitrogen dioxide gas is used as a raw material gas for containing nitrogen atoms as a chemical modifier in the film.
本発明において化学的修飾物質として含有される燐原子
或は硼素原子の量は、全構成原子に対して20000原
子ppm以下である。ここで燐原子或は硼素原子の膜中
含有量は、元素分析の常法、例えばオージェ分析或はI
MA分析により知る事ができる。燐原子或は硼素原子の
膜中含有量が20000原子ppmより高い場合には、
少量の添加では好適な輸送性、或は、極性制御効果を保
証していた燐原子或は硼素原子が、逆に膜の低抵抗化を
招く作用を示し、帯電能の低下を来たす。従って、本発
明における燐原子或は硼素原子添加量の範囲は重要であ
る。In the present invention, the amount of phosphorus atoms or boron atoms contained as a chemical modifier is 20,000 atomic ppm or less based on all constituent atoms. Here, the content of phosphorus atoms or boron atoms in the film is determined by a conventional method of elemental analysis, such as Auger analysis or I
This can be known through MA analysis. When the content of phosphorus atoms or boron atoms in the film is higher than 20,000 atomic ppm,
Phosphorus atoms or boron atoms, which, when added in small amounts, ensure suitable transport properties or polarity control effects, conversely exhibit the effect of lowering the resistance of the film, resulting in a decrease in charging ability. Therefore, the range of the amount of phosphorus atoms or boron atoms added in the present invention is important.
本発明において化学的修飾物質として含有される窒素原
子の量は、全構成原子に対して0.001乃至3原子%
である。ここで窒素原子の膜中含有量は、元素分析の常
法、例えばオージェ分析或はIMA分析により知る事が
できる。窒素原子の膜中含有量が0.001原子%より
低い場合には、a−Si膜の電気抵抗値が低くなる事が
らa−3i膜にコロナ帯電等による電界がかかりにくく
なり、光励起キャリアが必ずしも効率よ<a−C膜中に
注入されなくなり感度の低下を招く。また、帯電能も低
下する。窒素原子の膜中含有量が3原子%より高い場合
には、a−5i膜の電気抵抗値が高くなりすぎ、光励起
キャリアの発生効率の低下及びキャリアの易動速度の低
下により、感度低下を招く。従って、本発明における窒
素原子添加量の範囲は重要である。In the present invention, the amount of nitrogen atoms contained as a chemical modifier is 0.001 to 3 at% based on the total constituent atoms.
It is. Here, the content of nitrogen atoms in the film can be determined by a conventional method of elemental analysis, such as Auger analysis or IMA analysis. When the content of nitrogen atoms in the film is lower than 0.001 at%, the electric resistance value of the a-Si film decreases, making it difficult for the a-3i film to be subjected to electric fields due to corona charging, etc., and photoexcited carriers are It is not necessarily efficient to inject into the aC film, resulting in a decrease in sensitivity. Furthermore, the charging ability is also reduced. If the content of nitrogen atoms in the film is higher than 3 at%, the electrical resistance value of the a-5i film becomes too high, resulting in a decrease in sensitivity due to a decrease in the generation efficiency of photoexcited carriers and a decrease in the mobility speed of carriers. invite Therefore, the range of the amount of nitrogen atoms added in the present invention is important.
本発明におけるa−3i膜中に含まれる水素原子或は弗
素原子の量はグロー放電を用いるというその製造面から
必然的に定まるが、シリコン原子と水素原子或はシリコ
ン原子と弗素原子の総量に対して、概ね10乃至35原
子%含有される。ここで、水素原子或は弗素原子の膜中
含有量は、元素分析の常法、例えばONH分析、オージ
ェ分析等を用いる事により知る事ができる。The amount of hydrogen atoms or fluorine atoms contained in the a-3i film of the present invention is necessarily determined from the manufacturing aspect of using glow discharge, but the total amount of silicon atoms and hydrogen atoms or silicon atoms and fluorine atoms On the other hand, the content is approximately 10 to 35 at%. Here, the content of hydrogen atoms or fluorine atoms in the film can be determined by using conventional methods of elemental analysis, such as ONH analysis and Auger analysis.
本発明における電荷発生層としてのa−Si膜の膜厚は
、通常の電子写真プロセスで用いるためには、0.1乃
至5μmが適当であり、0.1μmより薄いと、光吸収
が不十分となり充分な電荷発生が行なわれなくなり、感
度の低下を招く。また、5μmより厚いと、生産性の面
で好ましくない。このa−5i膜は電荷発生能に富み、
ざらに、本発明の最も特徴とするところのa−C膜との
積層構成において効率よ<a−C膜中に発生キャリアを
注入せしめ、好適な明減衰に寄与する事が可能である。The appropriate thickness of the a-Si film as the charge generation layer in the present invention is 0.1 to 5 μm for use in a normal electrophotographic process, and if it is thinner than 0.1 μm, light absorption is insufficient. As a result, sufficient charge generation is not performed, resulting in a decrease in sensitivity. Moreover, if it is thicker than 5 μm, it is not preferable in terms of productivity. This a-5i film has a rich charge generation ability,
In general, in the laminated structure with the a-C film, which is the most characteristic feature of the present invention, generated carriers can be efficiently injected into the a-C film, contributing to suitable bright attenuation.
本発明における原料気体からa−3i膜を形成する過程
は、a−C膜を形成する場合と同様にして行なわれる。The process of forming the a-3i film from the raw material gas in the present invention is carried out in the same manner as the case of forming the a-C film.
本発明において化学的修飾物質として含有される窒素原
子、燐原子、或は、硼素原子の量は、主に、プラズマ反
応を行なう反応室への前述の窒素化合物ガス、ホスフィ
ンガス、或は、ジボランガスの導入量を増減することに
より制御することが可能である。窒素化合物ガス、ホス
フィンガス、或は、ジボランガスの導入量を増大させれ
ば、本発明によるa−Si膜中への窒素原子、燐原子、
或は、硼素原子の添加量を高くすることが可能であり、
逆に窒素化合物ガス、ホスフィンガス、或は、ジボラン
ガスの導入量を減少させれば、本発明によるa−Si膜
中への窒素原子、燐原子、或は、硼素原子の添加量を低
くすることが可能である。In the present invention, the amount of nitrogen atoms, phosphorus atoms, or boron atoms contained as chemical modifiers is mainly determined by the amount of nitrogen compound gas, phosphine gas, or diborane gas introduced into the reaction chamber in which the plasma reaction is performed. It can be controlled by increasing or decreasing the amount of introduced. By increasing the amount of nitrogen compound gas, phosphine gas, or diborane gas introduced, nitrogen atoms, phosphorus atoms,
Alternatively, it is possible to increase the amount of boron atoms added,
Conversely, if the amount of nitrogen compound gas, phosphine gas, or diborane gas introduced is reduced, the amount of nitrogen atoms, phosphorus atoms, or boron atoms added to the a-Si film according to the present invention can be reduced. is possible.
本発明における感光体は、電荷発生層と電荷輸送層から
成る機能分離型の構成とするのが最適で、該電荷発生層
と該電荷輸送層の積層構成は、必要に応じて適宜選択す
ることが可能である。It is optimal for the photoreceptor in the present invention to have a functionally separated structure consisting of a charge generation layer and a charge transport layer, and the laminated structure of the charge generation layer and the charge transport layer may be appropriately selected as necessary. is possible.
第1図は、その一形態として、導電性基板(1)上に電
荷輸送層(2)と電荷発生層(3)を順次積層してなる
構成を示したものである。第2図は、別の一形態として
、導電性基板(1)上に電荷発生層(3)と電荷輸送層
(2)を順次積層してなる構成を示したものである。第
3図は、別の一形態として、導電性基板(1)上に、電
荷輸送層(2)と電荷発生層(3)と電荷輸送層(2)
を順次積層してなる構成を示したものである。FIG. 1 shows, as one embodiment, a structure in which a charge transport layer (2) and a charge generation layer (3) are sequentially laminated on a conductive substrate (1). FIG. 2 shows, as another embodiment, a structure in which a charge generation layer (3) and a charge transport layer (2) are sequentially laminated on a conductive substrate (1). FIG. 3 shows, as another embodiment, a charge transport layer (2), a charge generation layer (3), and a charge transport layer (2) on a conductive substrate (1).
This figure shows a structure in which these are sequentially laminated.
感光体表面を、例えばコロナ帯電器等により正帯電した
後、画像露光して使用する場合においては、第1図では
電荷発生層(3−)で発生した正孔が電荷輸送層(2)
中を導電性基板(1)に向は走行し、第2図では電荷発
生層(3)で発生した電子が電荷輸送層(2)中を感光
体表面に向は走行し、第3図では電荷発生層(3)で発
生した正孔が導電性基板側の電荷輸送層(2)中を導電
性基板(1)に向は走行すると共に、同時に電荷発生層
(3)で発生した電子が表面側の電荷輸送層(2)中を
感光体表面に向は走行し、好適な明減衰に保証きれた静
電潜像の形成が行なわれる。反対に感光体表面を負帯電
した後、画像露光して使用する場合においては、電子と
正孔の挙動を入れ代えて、キャリアーの走行性を解すれ
ばよい。第2図及び第3図では、画像露光用の照射光が
電荷輸送層中を通過する事になるが、本発明による電荷
輸送層は透光性に優れることから、好適な潜像形成を行
なうことが可能である。When the surface of the photoreceptor is positively charged, for example, by a corona charger, and then used for image exposure, in FIG. 1, holes generated in the charge generation layer (3-) are transferred to the charge transport layer (2).
In Figure 2, electrons generated in the charge generation layer (3) travel through the charge transport layer (2) towards the surface of the photoreceptor. Holes generated in the charge generation layer (3) travel toward the conductive substrate (1) through the charge transport layer (2) on the conductive substrate side, and at the same time, electrons generated in the charge generation layer (3) travel toward the conductive substrate (1). The charge transport layer (2) on the front side travels toward the surface of the photoreceptor, and an electrostatic latent image is formed with proper brightness attenuation. On the other hand, when the surface of the photoreceptor is negatively charged and then used for image exposure, the behavior of electrons and holes can be exchanged to understand the mobility of carriers. In FIGS. 2 and 3, the irradiation light for image exposure passes through the charge transport layer, but since the charge transport layer according to the present invention has excellent translucency, it forms a suitable latent image. Is possible.
第4図は、ざらなる一形態として、導電性基板(1)上
に電荷輸送層(2)と電荷発生層(3)と表面保護層(
4)を順次積層してなる構成を示したものである。即ち
第1図の形態に表面保護層を設けた形態に相当するが、
第1図の形態では、最表面が耐湿性に乏しいa−3il
ljで有ることから、多くの場合実用上の対湿度安定性
を確保するために表面保護層を設けることが好ましい。FIG. 4 shows a conductive substrate (1), a charge transport layer (2), a charge generation layer (3) and a surface protective layer (
4) is shown in a structure formed by sequentially stacking them. In other words, it corresponds to the form shown in Fig. 1 with a surface protective layer provided, but
In the form shown in Figure 1, the outermost surface is a-3il, which has poor moisture resistance.
lj, in many cases it is preferable to provide a surface protective layer in order to ensure practical humidity stability.
第2図及び第3図の構成の場合、最表面が耐久性に優れ
たa−C膜であるため表面保護層を設けなくてもよいが
、例えば現像剤の付着による感光体表面の汚れを防止す
るような、複写機内の各種エレメントに対する整合性を
調整する目的から、表面保護層を設けることもざらなる
一形態と成りうる。In the case of the configurations shown in FIGS. 2 and 3, since the outermost surface is a highly durable a-C film, there is no need to provide a surface protective layer. For the purpose of adjusting the consistency with respect to various elements within the copying machine, such as prevention, a surface protective layer may be provided as another form.
第5図は、ざらなる一形態として、導電性基板(1)上
に中間層(5)と電荷発生層(3)と電荷輸送層(2)
を順次積層してなる構成を示したものである。即ち第2
図の形態に中間層を設けた形態に相当するが、第2図の
形態では、導電性基板との接合面がa−5i膜である事
から、多くの場合接着性及び注入阻止効果を確保するた
めに中間層を設ける事が好ましい。第1図及び第3図の
構成の場合、導電性基板との接合面が、接着性及び注入
阻止効果に優れた、本発明による電荷輸送層であるため
、中間層を設けなくてもよいが、例えば導電性基板の前
処理方法のような、感光層形成以前の製造工程との整合
性を調整する目的から、中間層を設けることもざらなる
一形態と成りうる。FIG. 5 shows an intermediate layer (5), a charge generation layer (3), and a charge transport layer (2) on a conductive substrate (1) as a rough form.
This figure shows a structure in which these are sequentially laminated. That is, the second
This corresponds to the form shown in the figure with an intermediate layer provided, but in the form shown in Fig. 2, the bonding surface with the conductive substrate is an A-5I film, which ensures adhesiveness and injection blocking effect in most cases. It is preferable to provide an intermediate layer for this purpose. In the case of the configurations shown in FIGS. 1 and 3, since the bonding surface with the conductive substrate is the charge transport layer according to the present invention, which has excellent adhesiveness and injection blocking effect, it is not necessary to provide an intermediate layer. For example, an intermediate layer may be provided for the purpose of adjusting compatibility with a manufacturing process before forming a photosensitive layer, such as a pretreatment method for a conductive substrate.
第6図は、ざらなる一形態として、導電性基板(1)上
に中間層(5)と電荷輸送層(2)と電荷発生層(3)
と表面保護層(4)を順次積層してなる構成を示したも
のである。即ち第1図の形態に中間層と表面保護層を設
けた形態に相当する。FIG. 6 shows, as a rough form, an intermediate layer (5), a charge transport layer (2), and a charge generation layer (3) on a conductive substrate (1).
This figure shows a structure in which a surface protection layer (4) and a surface protection layer (4) are sequentially laminated. That is, it corresponds to the form shown in FIG. 1 with an intermediate layer and a surface protective layer provided.
中間層と表面保護層の設置理由は前述と同様であり、従
って第2図及び第3図の構成において中間層と表面保護
層を設けることもさらなる一形態と成りうる。The reason for providing the intermediate layer and the surface protective layer is the same as described above, and therefore, providing the intermediate layer and the surface protective layer in the configurations shown in FIGS. 2 and 3 can be a further form.
本発明において中間層と表面保護層は、材料的にも、製
法的にも、特に限定を受けるものではなく所定の目的が
達せられるものであれば、適宜選択することが可能であ
る。本発明によるa−C膜を用いてもよい。但し、用い
る材料が、例えば従来例で述べた如き絶縁性材料である
場合には、残留電位発生の防止のため膜厚は5μm以下
に留める必要がある。In the present invention, the intermediate layer and the surface protective layer are not particularly limited in terms of material or manufacturing method, and can be appropriately selected as long as a predetermined purpose can be achieved. An a-C film according to the invention may also be used. However, if the material used is, for example, an insulating material as described in the conventional example, the film thickness must be kept at 5 μm or less to prevent generation of residual potential.
本発明による感光体の電荷輸送層は、気相状態の分子を
減圧下で放電分解し、発生したプラズマ雰囲気中に含ま
れる活性中性種あるいは荷電種を基板上に拡散、電気力
、あるいは磁気力等により訪導し、基板上での再結合反
応により固相として堆積きせる、所謂プラズマ重合反応
から生成きれる事が好ましい。The charge transport layer of the photoreceptor according to the present invention decomposes molecules in a gas phase by discharge decomposition under reduced pressure, and diffuses active neutral species or charged species contained in the generated plasma atmosphere onto the substrate, using electric force or magnetic force. It is preferable that the material be generated by a so-called plasma polymerization reaction, in which the material is introduced by force or the like and deposited as a solid phase by a recombination reaction on the substrate.
第7図は本発明に係わる感光体の製造装置を示し、図中
(701)〜(706)は常温において気相状態にある
原料化合物及びキャリアガスを密封した第1乃至第6タ
ンクで、各々のタンクは第1乃至第6調節弁(707)
〜(712)と第1乃至第6流量fII制御器(713
)〜(718)に接続されている。図中(719)〜(
7211常温において液相または固相状態にある原料化
合物を封入した第1乃至第3容器で、各々の容器は気化
のため第1乃至第3温調器(722)〜(724)によ
り与熱可能であり、ざらに各々の容器は第7乃至第9調
節弁(725)〜(727)と第7乃至第9流量制都器
(728)〜(730)に接続されている。これらのガ
スは混合器(731)で混合された後、主管(732)
を介して反応室(733)に送り込まれる。途中の配管
は、常温において液相または固相状態にあった原料化合
物が気化したガスが、途中で凝結しないように、適宜配
置された配管加熱器(734)により、与熱可能とされ
ている。反応室内には接地電極(735)と電力印加電
極(736)が対向して設置され、各々の電極は電極加
熱! (737)により与熱可能とされている。電力印
加電極(736)には、高周波電力用整合器(738)
を介して高周波電源(739L低周波電力用整合器(7
40)を介して低周波電源(741)、ローパスフィル
タ(742)を介して直流電源(743)が接続されて
おり、接続選択スイッチ(744)により周波数の異な
る電力が印加可能とされている。反応室(733)内の
圧力は圧力制御弁(745)により調整可能であり、反
応室(733)内の減圧は、排気系選択弁(746)を
介して、拡散ポンプ(747) 、油回転ポンプ(74
8) 、或は、冷却除外装置(749)、メカニカルブ
ースターポンプ(750)、油回転ポンプ(748)に
より行なわれる。排ガスについては、さらに適当な除外
装置(753)により安全無害化した後、大気中に排気
される。これら排気系配管についても、常温において液
相または固相状態にあった原料化合物が気化したガスが
、途中で凝結しないように、適宜配置された配管加熱器
(734)により、与熱可能とされている。反応室(7
33)も同様の理由から反応室加熱器(751)により
与熱可能ときれ、内部に配された電極上に導電性基板(
752)が設置きれる。第7図において導電性基板(7
52)は接地型8!1(735)に固定して配きれてい
るが、電力印加電fi(736)に固定して配されても
よく、ざらに双方に配されてもよい。FIG. 7 shows a photoconductor manufacturing apparatus according to the present invention, and in the figure (701) to (706) are first to sixth tanks in which the raw material compound and carrier gas, which are in a gas phase at room temperature, are sealed, respectively. The tanks are the first to sixth control valves (707)
~ (712) and the first to sixth flow rate fII controllers (713
) to (718). In the figure (719) to (
7211 First to third containers containing raw material compounds that are in a liquid or solid state at room temperature, each container can be heated by the first to third temperature controllers (722) to (724) for vaporization. Roughly speaking, each container is connected to seventh to ninth control valves (725) to (727) and seventh to ninth flow rate regulators (728) to (730). After these gases are mixed in the mixer (731), the main pipe (732)
It is sent into the reaction chamber (733) via. The pipes along the way can be heated by appropriately placed pipe heaters (734) so that the gas, which is the vaporized raw material compound that is in a liquid or solid state at room temperature, does not condense on the way. . A ground electrode (735) and a power application electrode (736) are installed facing each other in the reaction chamber, and each electrode is heated! (737) allows for heating. A high frequency power matching device (738) is connected to the power application electrode (736).
high frequency power supply (739L low frequency power matching box (7
A low frequency power source (741) is connected through a low-frequency power source (741) and a DC power source (743) is connected through a low-pass filter (742), and power with different frequencies can be applied by a connection selection switch (744). The pressure inside the reaction chamber (733) can be adjusted by a pressure control valve (745), and the pressure inside the reaction chamber (733) can be reduced through an exhaust system selection valve (746), a diffusion pump (747), and an oil rotary valve. Pump (74
8), or by a cooling exclusion device (749), a mechanical booster pump (750), or an oil rotary pump (748). The exhaust gas is further rendered safe and harmless by an appropriate exclusion device (753) before being exhausted into the atmosphere. These exhaust system piping can also be heated by appropriately placed piping heaters (734) to prevent the vaporized gas of the raw material compound, which is in a liquid or solid phase state at room temperature, from condensing on the way. ing. Reaction chamber (7
33) can also be heated by the reaction chamber heater (751) for the same reason, and a conductive substrate (
752) can be installed. In FIG. 7, a conductive substrate (7
52) are fixedly arranged on the ground type 8!1 (735), but may be fixedly arranged on the power application fi (736), or may be arranged roughly on both sides.
第8図は本発明に係わる感光体の製造装置の別の一形態
を示し、反応室(833)内部の形態以外は、第7図に
示した本発明に係わる感光体の製造装置と同様であり、
付記された番号は、700番台のものを800番台に置
き換えて解すればよい。第8図において、反応室(83
3)内部には、第7図における接地電極(735)を兼
ねた円筒形の導電性基板(852)が設置され、内側に
は電極加熱器(837)が配きれている。導電性基板(
852)周囲には同じく円筒形状をした電力印加電極(
836)が配され、外側には電極加熱器(837)が配
されている。導電性基板(852)は、外部より駆動モ
ータ(854)を用いて自転可能となっている。FIG. 8 shows another embodiment of the photoconductor manufacturing apparatus according to the present invention, which is similar to the photoconductor manufacturing apparatus according to the present invention shown in FIG. 7 except for the internal configuration of the reaction chamber (833). can be,
The appended numbers can be understood by replacing the 700s with 800s. In FIG. 8, the reaction chamber (83
3) A cylindrical conductive substrate (852) that also serves as the ground electrode (735) in FIG. 7 is installed inside, and an electrode heater (837) is arranged inside. Conductive substrate (
852) There is also a cylindrical power application electrode (
836) is arranged, and an electrode heater (837) is arranged outside. The conductive substrate (852) is rotatable using an external drive motor (854).
感光体製造に供する反応室は、拡散ポンプにより予め1
0−4乃至1O−6Torr程度にまで減圧し、真空度
の確認と装置内部に吸着したガスの脱着を行なう。同時
に電極加熱器により、電極並びに電極に固定して配され
た導電性基板を所定の温度まで昇温する。導電性基板に
は、前述の如ぎ感光体構成の中から所望の構成を得るた
めに、必要であれば、予めアンダーコート層或は電荷発
生層を設けて置いてもよい。アンダーコート層或は電荷
発生層の設置には、本装置を用いてもよいし別装置を用
いてもよい。次いで、第1乃至第6タンク及び第1乃至
第3容器から、原料ガスを適宜第1乃至第9流量制御器
を用いて定流量化しながら反応室内に導入し、圧力調節
弁により反応室内を一定の減圧状態に保つ。ガス流量が
安定化した後、接続選択スイッチにより、例えば高周波
電源を選択し、電力印加電極に高周波電力を投入する。The reaction chamber used for photoreceptor production is preliminarily heated by a diffusion pump.
The pressure is reduced to about 0-4 to 10-6 Torr, and the degree of vacuum is confirmed and the gas adsorbed inside the device is desorbed. At the same time, an electrode heater heats the electrode and the conductive substrate fixedly disposed on the electrode to a predetermined temperature. If necessary, an undercoat layer or a charge generation layer may be provided in advance on the conductive substrate in order to obtain a desired photoreceptor structure from among those described above. The present apparatus or a separate apparatus may be used to provide the undercoat layer or the charge generation layer. Next, the raw material gases are introduced into the reaction chamber from the first to sixth tanks and the first to third containers while being kept at a constant flow rate using the first to ninth flow rate controllers, and the inside of the reaction chamber is kept constant using the pressure control valve. Maintain a reduced pressure. After the gas flow rate is stabilized, a connection selection switch is used to select, for example, a high frequency power source, and high frequency power is applied to the power application electrode.
両電極間には放電が開始され、時間と共に基板上に固相
の膜が形成される。a−3i膜或はa−C膜は、原料ガ
スを代える事により任意に形成可能である。放電を一旦
停止し、原料ガス組成を変更した後、再び放電を再開す
れば異なる組成の膜を積層する事ができる。また、放電
を持続させながら原料ガス流量だけを徐々に代え、異な
る組成の膜を勾配を持たせながら積層する事も可能であ
る。A discharge is started between the two electrodes, and a solid phase film is formed on the substrate over time. The a-3i film or the a-C film can be formed arbitrarily by changing the raw material gas. Films with different compositions can be laminated by once stopping the discharge, changing the source gas composition, and then restarting the discharge. It is also possible to gradually change only the raw material gas flow rate while sustaining the discharge, and to stack films of different compositions with a gradient.
反応時間により膜厚を制御し、所定の膜厚並びに積層構
成に達したところで放電を停止し、本発明による感光体
を得る。次いで、第1乃至第9調節弁を閉じ、反応室内
を充分に排気する。ここで所望の感光体構成が得られる
場合には反応室内の真空を破り、反応室より本発明によ
る感光体を取り出す。更に所望の感光体構成において、
電荷発生層或はオーバーコート層が必要とされる場合に
は、そのまま本装置を用いるか、或は同様に一旦真空を
破り取り出して別装置に移してこれらの層を設け、本発
明による感光体を得る。The film thickness is controlled by the reaction time, and when a predetermined film thickness and laminated structure are reached, the discharge is stopped to obtain a photoreceptor according to the present invention. Next, the first to ninth control valves are closed to sufficiently exhaust the inside of the reaction chamber. If the desired photoreceptor configuration is obtained, the vacuum in the reaction chamber is broken and the photoreceptor according to the present invention is taken out from the reaction chamber. Furthermore, in a desired photoreceptor configuration,
If a charge generation layer or an overcoat layer is required, the photoreceptor according to the present invention can be fabricated by using the present device as is, or by breaking the vacuum and transferring it to another device to provide these layers. get.
以下実施例を挙げながら、本発明を説明する。The present invention will be explained below with reference to Examples.
火旅辺上
本発明に係わる製造装置を用いて、第1図に示す如き、
導電性基板、電荷輸送層、電荷発生層をこの順に設けた
本発明感光体を作製した。By using the manufacturing apparatus according to the present invention, as shown in FIG.
A photoreceptor of the present invention was prepared in which a conductive substrate, a charge transport layer, and a charge generation layer were provided in this order.
電荷輸送層形成工程:
第7図に示すグロー放電分解装置において、まず、反応
装置(733)の内部を10−’Torr程度の高真空
にした後、第1調節弁(707)、及び第4調節弁(7
10)を解放し、第1タンク(701)より水素ガス、
及び第4タンク(704)よりゲルマンガスを各々出力
圧1.0Kg/cm2の下で第1、及び第4流量制御器
(713、及び716)内へ流入させた。同時に、第1
容器(719)よりミルセンガスを第1温調器(722
)温度70℃のもと第7流量制御器(728)内へ流入
させた。各流量制御器を用いて、水素ガスの流量を20
5CCm%ゲルマンガスの流量を5secm、及びミル
センガスの流量を5secmとなるように設定して、途
中混合器(731)を介して、主管(732)より反応
室(733)内へ流入した。各々の流量が安定した後に
、反応室(733)内の圧力が1.5Torrとなるよ
うに圧力調節弁(745)を調整した。一方、導電性基
板(752)としては、樅50×横50×厚3mmのア
ルミニウム基板を用いて、予め150℃に加熱しておき
、ガス流量及び圧力が安定した状態で、予め接続選択ス
イッチ(744)により接続しておいた低周波電源(7
41)を投入し、電力印加電極(736)に110Wa
ttの電力を周波数500KHzの下で印加して約3時
間40分プラズマ重合反応を行ない、導電性基板(75
2)上に厚ざ15μmのa−C膜を電荷輸送層として形
成した。成膜完了後は、電力印加を停止し、調節弁を閉
じ、反応室(733)内を充分に排気した。Charge transport layer forming step: In the glow discharge decomposition apparatus shown in FIG. Control valve (7
10), hydrogen gas is released from the first tank (701),
Germanic gas was flowed from the fourth tank (704) into the first and fourth flow rate controllers (713 and 716) under an output pressure of 1.0 Kg/cm2. At the same time, the first
Myrcene gas is transferred from the container (719) to the first temperature controller (722).
) was made to flow into the seventh flow rate controller (728) at a temperature of 70°C. Using each flow controller, adjust the flow rate of hydrogen gas to 20
The flow rate of 5CCm% germane gas was set to 5 sec, and the flow rate of myrcene gas was set to 5 sec, and the gas flowed into the reaction chamber (733) from the main pipe (732) via an intermediate mixer (731). After each flow rate became stable, the pressure control valve (745) was adjusted so that the pressure inside the reaction chamber (733) was 1.5 Torr. On the other hand, as the conductive substrate (752), use an aluminum substrate of 50 fir x 50 mm x 3 mm thickness, heat it to 150°C in advance, and when the gas flow rate and pressure are stable, set the connection selection switch ( 744) connected to the low frequency power supply (744).
41) and applied 110W to the power application electrode (736).
A plasma polymerization reaction was carried out for about 3 hours and 40 minutes by applying a power of 500 KHz at a frequency of 500 KHz, and the conductive substrate (75
2) An a-C film having a thickness of 15 μm was formed thereon as a charge transport layer. After the film formation was completed, power application was stopped, the control valve was closed, and the inside of the reaction chamber (733) was sufficiently evacuated.
以上のようにして得られたa−C膜につき有機元素分析
を行なったところ、含有される水素原子の量は炭素原子
と水素原子の総量に対して45原子%であフた。また、
オージェ分析より含有されるゲルマニウム原子の量は全
構成原子に対して2゜8原子%であった。Organic elemental analysis of the a-C film obtained as described above revealed that the amount of hydrogen atoms contained was 45 at % based on the total amount of carbon atoms and hydrogen atoms. Also,
According to Auger analysis, the amount of germanium atoms contained was 2.8 at % based on the total constituent atoms.
電荷発生層形成工程:
次いで、第1調節弁(707L第5調節弁(711L及
び第6調節弁(712)を解放し、第1タンク(701
)から水素ガス、第5タンク(705)から窒素ガス、
及び第6タンク(706)からシランガスを、出力圧I
Kg/am2の下で第1、第5、及び第SIf、量制御
器(713,717、及び718)内へ流入させた。同
時に、第4調節弁(710)を解放し、第4タンク(7
04)より水素ガスで1100ppに希釈きれたジボラ
ンガスを、出力圧1.5Kg/cm2の下で第4流量制
御!(716)内へ、流入させた。各流量制御器の目盛
を調整して水素ガスの流量を200secm、窒素ガス
の流量を10105e、シランガスの流量を100 s
CCm %水素ガスで1100ppに希釈されたジボ
ランガスの流量を1105CCに設定し、反応室(73
3)内に流入させた。各々の流量が安定した後に、反応
室(733)内の圧力が0.8Torrとなるように圧
力調節弁(745)を調整した。一方、a−C膜が形成
されている導電性基板(752)は、250℃に加熱し
ておき、ガス流量及び圧力が安定した状態で、高周波電
源(739)より周波数13゜56MHzの下で電力印
加電極(736)に40Wattの電力を印加し、グロ
ー放電を発生させた。この放電を5分間行ない、厚ざ0
.3μmの電荷発生層を得た。Charge generation layer forming step: Next, the first control valve (707L), the fifth control valve (711L) and the sixth control valve (712) are opened, and the first tank (701L) is opened.
) from hydrogen gas, nitrogen gas from the fifth tank (705),
and silane gas from the sixth tank (706) at an output pressure of I
The first, fifth and fifth SIf were flowed into the quantity controllers (713, 717 and 718) under Kg/am2. At the same time, the fourth control valve (710) is released and the fourth tank (710) is released.
04) Diborane gas diluted to 1100pp with hydrogen gas is subjected to the fourth flow rate control under an output pressure of 1.5Kg/cm2! (716). Adjust the scale of each flow rate controller to set the hydrogen gas flow rate to 200 sec, the nitrogen gas flow rate to 10105e, and the silane gas flow rate to 100 s.
The flow rate of diborane gas diluted to 1100 pp with CCm% hydrogen gas was set to 1105 CC, and the reaction chamber (73
3) It was allowed to flow into the interior. After each flow rate became stable, the pressure control valve (745) was adjusted so that the pressure inside the reaction chamber (733) was 0.8 Torr. On the other hand, the conductive substrate (752) on which the a-C film is formed is heated to 250°C, and with the gas flow rate and pressure stable, it is heated at a frequency of 13°56MHz from a high frequency power source (739). A power of 40 Watts was applied to the power application electrode (736) to generate glow discharge. This discharge was performed for 5 minutes, and the thickness was 0.
.. A charge generation layer of 3 μm was obtained.
得られたa−5iHRにつき、金属中ONH分析(N場
製作断裂EMGA−1300) 、オージェ分析、及び
IMA分析を行なったところ、含有される水素原子は全
構成原子に対して24原子%、硼素原子は10原子pp
m、窒素原子は1.0原子%であった。The obtained a-5iHR was subjected to in-metal ONH analysis (N-field produced fracture EMGA-1300), Auger analysis, and IMA analysis, and it was found that the hydrogen atoms contained were 24 at% and boron Atom is 10 atoms pp
m, nitrogen atoms were 1.0 at%.
特性:
得られた感光体を常用のカールソンプロセスの中で負帯
電並びに正帯電で用いたところ次の如き性能が得られた
。ここでは、正帯電時の測定値を括弧内に示すが、最高
帯電電位は一580V (+720V)で有り、即ち、
全感光体膜厚が15゜3μmであることから1μm当り
の帯電能は38■/μm(47V/μm)と極めて高く
、このことから充分な帯電性能を有する事が理解された
。Characteristics: When the obtained photoreceptor was used with both negative and positive charging in a conventional Carlson process, the following performance was obtained. Here, the measured values during positive charging are shown in parentheses, and the highest charging potential is -580V (+720V), that is,
Since the total photoreceptor film thickness was 15.degree. 3 .mu.m, the charging ability per 1 .mu.m was extremely high at 38 .mu./.mu.m (47 V/.mu.m), and from this it was understood that the photoreceptor had sufficient charging performance.
また、暗中にてVmaxからVmaXの90%の表面電
位にまで暗減衰するのに要した時間は約25秒(約32
秒)であり、このことから充分な電荷保持性能を有する
事が理解された。また、最高帯電電位に初期帯電した後
、白色光を用いて最高帯電電位の20%の表面電位にま
で明減衰させたところ必要とされた光量は4.2ルツク
ス・秒(1,8ルツクス・秒)であり、このことから充
分な光感度性能を有する事が理解された。In addition, the time required for dark decay from Vmax to 90% of Vmax in the dark was approximately 25 seconds (approximately 32
seconds), and from this it was understood that it had sufficient charge retention performance. In addition, after initial charging to the highest charging potential, the brightness was attenuated to a surface potential of 20% of the highest charging potential using white light, and the amount of light required was 4.2 lux · seconds (1.8 lux · seconds), and from this it was understood that it had sufficient photosensitivity performance.
以上より、本例に示した本発明による感光体は、感光体
として優れた性能を有するものである事が理解される。From the above, it is understood that the photoreceptor according to the present invention shown in this example has excellent performance as a photoreceptor.
また、この感光体に対して常用のカールソンプロセスの
中で、作像して転写したところ、鮮明な画像が得られた
。Further, when an image was formed and transferred to this photoreceptor using the commonly used Carlson process, a clear image was obtained.
実施例2
本発明に係わる製造装置を用いて、第1図に示す如き、
導電性基板、電荷輸送層、電荷発生層をこの順に設けた
本発明感光体を作製した。Example 2 Using the manufacturing apparatus according to the present invention, as shown in FIG.
A photoreceptor of the present invention was prepared in which a conductive substrate, a charge transport layer, and a charge generation layer were provided in this order.
電荷輸送層形成工程:
第7図に示すグロー放電分解装置において、まず、反応
装置(733)の内部を1O−6Torr程度の窩真空
にした後、第1調節弁(707)、第2調節弁(708
) 、及び第6調節弁(712)を解放し、第1タンク
(701)から水素ガス、第2タンク(702)からブ
タジエシガス、及び第6タンク(706)からシランガ
スを、各々出力圧1.OKg/am2の下で第1、第2
、及び第6流量制御器(713,714、及び718)
内へ流入きせた。各流量制御器を用いて、水素ガスの流
量を60secm1ブタジェンガスの流量を60scc
m、及びシランガスの流量を5secmとなるように設
定して、途中混合器(731)を介して、主管(732
)より反応室(733)内へ流入した。各々の流量が安
定した後に、反応室(733)内の圧力が1.8Tor
rとなるように圧力調節弁(745)を調整した。一方
、導電性基板(752)としては、樅50×横50×厚
3mmのアルミニウム基板を用いて、予め250℃に加
熱しておき、ガス流量及び圧力が安定した状態で、予め
接続選択スイッチ(744)により接続しておいた低周
波電源(741)を投入し、電力印加電極(736)に
120Wattの電力を周波数400KHzの下で印加
して約40分間プラズマ重合反応を行ない、導電性基板
(752)上に厚き15μmのa−C膜を電荷輸送層と
して形成した。成膜完了後は、電力印加を停止し、調節
弁を閉じ、反応室(733)内を充分に排気した。Charge transport layer forming step: In the glow discharge decomposition apparatus shown in FIG. 7, first, the inside of the reaction device (733) is made into a cavity vacuum of about 10-6 Torr, and then the first control valve (707) and the second control valve (708
) and the sixth control valve (712) are released, hydrogen gas is supplied from the first tank (701), butadiene gas is supplied from the second tank (702), and silane gas is supplied from the sixth tank (706), respectively, at an output pressure of 1. 1st and 2nd under OKg/am2
, and the sixth flow rate controller (713, 714, and 718)
It flowed inside. Using each flow rate controller, set the flow rate of hydrogen gas to 60 scm, and the flow rate of butadiene gas to 60 scc.
m, and the flow rate of silane gas is set to 5 seconds, and the main pipe (732
) into the reaction chamber (733). After each flow rate stabilized, the pressure inside the reaction chamber (733) reached 1.8 Torr.
The pressure regulating valve (745) was adjusted so that the temperature was r. On the other hand, as the conductive substrate (752), use an aluminum substrate of 50 fir x 50 x 3 mm thick, heat it to 250°C in advance, and when the gas flow rate and pressure are stable, set the connection selection switch ( The low-frequency power source (741) connected to the conductive substrate (744) is turned on, and 120 Watt power is applied to the power application electrode (736) at a frequency of 400 KHz to perform a plasma polymerization reaction for about 40 minutes. 752) A 15 μm thick a-C film was formed thereon as a charge transport layer. After the film formation was completed, power application was stopped, the control valve was closed, and the inside of the reaction chamber (733) was sufficiently evacuated.
以上のようにして得られたa−C膜につき有機元素分析
を行なったところ、含有される水素原子の量は炭素原子
と水素原子の総量に対して53原子%であった。また、
オージェ分析より含有されるシラン原子の量は全構成原
子に対して5.2原子%であった。When organic elemental analysis was performed on the a-C film obtained as described above, the amount of hydrogen atoms contained was 53 at % based on the total amount of carbon atoms and hydrogen atoms. Also,
According to Auger analysis, the amount of silane atoms contained was 5.2 at % based on the total constituent atoms.
電荷発生層形成工程:
次いで、第1調節弁(707)、第5調節弁(711L
及び第6調節弁(712)を解放し、第1タンク(70
1)から水素ガス、第5タンク(705)からアンモニ
アガス、及び第6タンク(706)からシランガスを、
出力圧I K g / 0m2の下で第1、第5、及び
第6流量制御器(713,717、及び718)内へ流
入させた。同時に、第4調節弁(710)を解放し、第
4タンク(704)より水素ガスでtooppmに希釈
きれたジボランガスを、出力圧1.5Kg/cm2の下
で第4流量制御器(716)内へ、流入させた。Charge generation layer forming step: Next, the first control valve (707) and the fifth control valve (711L
and the sixth control valve (712), and the first tank (70
1), hydrogen gas from the fifth tank (705), ammonia gas from the sixth tank (706), and silane gas from the sixth tank (706).
It was flowed into the first, fifth and sixth flow controllers (713, 717 and 718) under an output pressure of I K g/0 m2. At the same time, the fourth control valve (710) is opened, and diborane gas diluted to toppm with hydrogen gas is supplied from the fourth tank (704) into the fourth flow rate controller (716) under an output pressure of 1.5 kg/cm2. I let it flow.
各流量制御器の目盛を調整して水素ガスの流量を200
secm、アンモニアガスの流量を2secm、シラン
ガスの流量を101005e、水素ガスで1100pp
に希釈されたジボランガスの流量を10105eに設定
し、反応室(733)内に流入させた。各々の流量が安
定した後に、反応室(733)内の圧力が0.9Tor
rとなるように圧力調節弁(745)を調整した。一方
、a−C膜が形成されている導電性基板(752)は、
240℃に加熱しておき、ガス流量及び圧力が安定した
状態で、高周波電源(739)より周波数13.56M
Hzの下で電力印加電極(73,6) !、:45Wa
t tの電力を印加し、グロー放電を発生させた。こ
の放電を5分間行ない、厚さ0゜3μmの電荷発生層を
得た。 −得られたa−5f膜につき、金
属中ONH分析(板場製作所製EMGA−1300)
、オージェ分析、及びIMA分析を行なったところ、含
有きれる水素原子は全構成原子に対して21原子%、硼
素原子は11原子pI)m%窒素原子は0.3原子%で
あった。Adjust the scale of each flow rate controller to set the hydrogen gas flow rate to 200.
secm, ammonia gas flow rate 2sec, silane gas flow rate 101005e, hydrogen gas 1100pp
The flow rate of the diborane gas diluted to 10105e was set to 10105e, and the diborane gas was allowed to flow into the reaction chamber (733). After each flow rate stabilized, the pressure inside the reaction chamber (733) was 0.9 Torr.
The pressure regulating valve (745) was adjusted so that the temperature was r. On the other hand, the conductive substrate (752) on which the a-C film is formed is
After heating to 240℃ and with stable gas flow rate and pressure, a high frequency power source (739) is used to generate a frequency of 13.56M.
Power application electrode (73,6) under Hz! , :45Wa
A power of t t was applied to generate a glow discharge. This discharge was carried out for 5 minutes to obtain a charge generation layer having a thickness of 0.3 μm. - ONH analysis in metal for the obtained a-5f film (EMGA-1300 manufactured by Itaba Seisakusho)
, Auger analysis, and IMA analysis showed that hydrogen atoms that could be contained were 21 at %, boron atoms were 11 at pI) m%, and nitrogen atoms were 0.3 at % based on the total constituent atoms.
特性:
得られた感光体を常用のカールソンプロセスの中で負帯
電並びに正帯電で用いたところ次の如き性能が得られた
。ここでは、正帯電時の測定値を括弧内に示すが、最高
帯電電位は一860V (+940V)で有り、即ち、
全感光体膜厚が15゜3μmであることから1μm当り
の帯電能は56V/μm(61V/μm)と極めて高く
、このことから充分な帯電性能を有する事が理解された
。Characteristics: When the obtained photoreceptor was used with both negative and positive charging in a conventional Carlson process, the following performance was obtained. Here, the measured values during positive charging are shown in parentheses, and the highest charging potential is -860V (+940V), that is,
Since the total photoreceptor film thickness was 15.degree. 3 .mu.m, the charging ability per 1 .mu.m was extremely high at 56 V/.mu.m (61 V/.mu.m), and from this it was understood that the photoreceptor had sufficient charging performance.
また、暗中にてVmaxからVmaxの90%の表面電
位にまで暗減衰するのに要した時間は約34秒(約37
秒)であり、このことから充分な電荷保持性能を有する
事が理解された。また、最高帯電電位に初期帯電した後
、白色光を用いて最高帯電電位の20%の表面電位にま
で明減衰させたところ必要とされた光量は2.9ルツク
ス・秒(1,8ルツクス・秒)であり、このことから充
分な光感度性能を有する事が理解された。In addition, the time required for dark decay from Vmax to 90% of Vmax in the dark was approximately 34 seconds (approximately 37 seconds).
seconds), and from this it was understood that it had sufficient charge retention performance. Furthermore, after initial charging to the highest charging potential, white light was used to brightly attenuate the surface potential to 20% of the highest charging potential, and the amount of light required was 2.9 lux · seconds (1.8 lux · seconds), and from this it was understood that it had sufficient photosensitivity performance.
以上より、本例に示した本発明による感光体は、感光体
として優れた性能を有するものである事が理解される。From the above, it is understood that the photoreceptor according to the present invention shown in this example has excellent performance as a photoreceptor.
また、この感光体に対して常用のカールソンプロセスの
中で、作像して転写したところ、鮮明な画像が得られた
。Further, when an image was formed and transferred to this photoreceptor using the commonly used Carlson process, a clear image was obtained.
害旅鑓旦
本発明に係わる製造装置を用いて、第1図に示す如き、
導電性基板、電荷輸送層、電荷発生層をこの順に設けた
本発明感光体を作製した。Using the manufacturing apparatus according to the present invention, as shown in FIG.
A photoreceptor of the present invention was prepared in which a conductive substrate, a charge transport layer, and a charge generation layer were provided in this order.
電荷輸送層形成工程:
第7図に示すグロー放電分解装置において、まず、反応
装置(733)の内部を1o−6Torr程度の高真空
にした後、第1調節弁(707)、第2調節弁(708
) 、及び第6調節弁(712)を解放し、第1タンク
(701)から水素ガス、第2タンク(702)からエ
チレンガス、及び第6タンク(706)からシランガス
を、各々出力圧1.0Kg;’cm2の下で第1、第2
、及び第6流M制#器(713,714、及び718)
内へ流入させた。各流量制御器を用いて、水素ガスの流
量を60secm、エチレンガスの流量を6゜5 CC
rn %及びシランガスの流量を3secmとなるよう
に設定して、途中混合!(731)を介して、主管(7
32)より反応室(733)内へ流入した。各々の流量
が安定した後に、反応室(733)内の圧力が1.8T
orrとなるように圧力調節弁(745)を調整した。Charge transport layer forming step: In the glow discharge decomposition device shown in FIG. 7, first, the inside of the reaction device (733) is made into a high vacuum of about 10-6 Torr, and then the first control valve (707) and the second control valve (708
) and the sixth control valve (712) are released, hydrogen gas is supplied from the first tank (701), ethylene gas is supplied from the second tank (702), and silane gas is supplied from the sixth tank (706) to an output pressure of 1. 1st and 2nd under 0Kg;'cm2
, and 6th stream M control number device (713, 714, and 718)
It flowed inside. Using each flow rate controller, the flow rate of hydrogen gas was set to 60 sec, and the flow rate of ethylene gas was set to 6°5 cc.
Set the flow rate of rn % and silane gas to 3 seconds and mix in the middle! (731) through the main pipe (7
32) into the reaction chamber (733). After each flow rate stabilized, the pressure inside the reaction chamber (733) reached 1.8T.
The pressure control valve (745) was adjusted so that the
一方、導電性基板(752)としては、!50X横50
×厚3mmのアルミニウム基板を用いて、予め250℃
に加熱しておき、ガス流量及び圧力が安定した状態で、
予め接続選択スイッチ(744)により接続しておいた
高周波電源(739)を投入し、電力印加型tIi(7
36)に180Wattの電力を周波数13.56MH
zの下で印加して約10時間プラズマ重合反応を行ない
、導電性基板(752)上に厚き15μmのa−CMを
電荷輸送層として形成した。成膜完了後は、電力印加を
停止し、調節弁を閉じ、反応室(733)内を充分に排
気した。On the other hand, as the conductive substrate (752),! 50X horizontal 50
× Using an aluminum substrate with a thickness of 3 mm, heat the temperature at 250°C in advance.
After heating to , and with the gas flow and pressure stable,
Turn on the high frequency power supply (739) connected in advance by the connection selection switch (744), and turn on the power application type tIi (7
36) 180Watt power to frequency 13.56MH
A plasma polymerization reaction was carried out for about 10 hours by applying voltage under z, and a 15 μm thick a-CM was formed as a charge transport layer on the conductive substrate (752). After the film formation was completed, power application was stopped, the control valve was closed, and the inside of the reaction chamber (733) was sufficiently evacuated.
以上のようにして得られたa −C膜につき有機元素分
析を行なったところ、含有される水素原子の量は炭素原
子と水素原子の総量に対して45原子%であった。また
、オージェ分析より含有きれるシリコン原子の量は全構
成原子に対して0.4原子%であった。When organic elemental analysis was performed on the a-C film obtained as described above, the amount of hydrogen atoms contained was 45 at % based on the total amount of carbon atoms and hydrogen atoms. Further, according to Auger analysis, the amount of silicon atoms that could be contained was 0.4 at % based on the total constituent atoms.
電荷発生層形成工程:
次いで、第1調節弁(707) 、第3調節弁(709
)、第5調節弁(711)、及び第6調節弁(712)
!解放し、第し’;tン’y (701)から水素ガス
、第3タンク(703)から四弗化シランガス、第5タ
ンク(705)から窒素ガス、及び第6タンク(706
)からシランガスを、出力圧IKg/cm2の下で第1
、第3、第5、及び第6流量制御器(713,715,
717、及び718)内へ流入させた。同時に、第4調
節弁(710)!解放し、第4タン’y (704)
より水素ガスで1100ppに希釈されたジボランガス
を、出力圧’、5Kg/cm2の下で第4流量制御器(
716)内へ、流入きせた。各流量制御器の目盛を調整
して水素ガスの流量を200secm1四弗化シランガ
スの流量を50secm1窒素ガスの流量をlsecm
、シランガスの流量を50secm、水素ガスで110
0ppに希釈されたジボランガスの流量を101005
eとなるように設定し、反応室(733)内に流入させ
た。Charge generation layer forming step: Next, the first control valve (707) and the third control valve (709)
), the fifth control valve (711), and the sixth control valve (712)
! hydrogen gas from the third tank (701), tetrafluorosilane gas from the third tank (703), nitrogen gas from the fifth tank (705), and the sixth tank (706).
) under an output pressure of IKg/cm2.
, third, fifth, and sixth flow rate controllers (713, 715,
717 and 718). At the same time, the fourth control valve (710)! Release, 4th Tan'y (704)
Diborane gas diluted to 1100 pp with hydrogen gas was passed through the fourth flow controller (
716) Inflow began to flow inside. Adjust the scale of each flow rate controller to set the hydrogen gas flow rate to 200 sec, the tetrafluorosilane gas flow rate to 50 sec, and the nitrogen gas flow rate to 1 sec.
, the flow rate of silane gas was 50 sec, and the flow rate of hydrogen gas was 110 sec.
The flow rate of diborane gas diluted to 0pp is 101005
e to flow into the reaction chamber (733).
各々の流量が安定した後に、反応室(733)内の圧力
が0.9Torrとなるように圧力調節弁(745)を
調整した。一方、a −C膜が形成されている導電性基
板(752)は、250℃ニ加熱しておき、ガス流量及
び圧力が安定した状態で、高周波電源(739)より周
波数13.56MHzの下で電力印加型i (736)
に35Wattの電力を印加し、グロー放電を発生させ
た。この放電を5分間行ない、厚き0.3μmの電荷発
生層を得た。After each flow rate became stable, the pressure control valve (745) was adjusted so that the pressure inside the reaction chamber (733) was 0.9 Torr. On the other hand, the conductive substrate (752) on which the a-C film is formed is heated to 250°C, and is heated at a frequency of 13.56 MHz from a high frequency power source (739) while the gas flow rate and pressure are stable. Power application type i (736)
A power of 35 Watts was applied to generate a glow discharge. This discharge was carried out for 5 minutes to obtain a charge generation layer with a thickness of 0.3 μm.
得られたa−St膜につき、金属中ONH分析(板場製
作所製EMGA−1300) 、オージェ分析、及びI
MA分析を行なったところ、含有される水素原子は全構
成原子に対して22原子%、硼素原子は95原子ppm
、弗素原子は5原子%、窒素原子は0.1原子%であっ
た。The obtained a-St film was subjected to ONH analysis in metal (EMGA-1300 manufactured by Itaba Seisakusho), Auger analysis, and I
When MA analysis was performed, the hydrogen atoms contained were 22 at.% of the total constituent atoms, and the boron atoms were 95 at.ppm.
, 5 at% of fluorine atoms, and 0.1 at% of nitrogen atoms.
特性:
得られた感光体を常用のカールソンプロセスの中で負帯
電並びに正帯電で用いたところ次の如き性能が得られた
。ここでは、正帯電時の測定値を括弧内に示すが、最高
帯電電位は一740V (+710V)で有り、即ち、
全感光体膜厚が15゜3μmであることから1μm当り
の帯電能は48V/μm (46V/μm)と極めて高
く、このことから充分な帯電性能を有する事が理解され
た。Characteristics: When the obtained photoreceptor was used with both negative and positive charging in a conventional Carlson process, the following performance was obtained. Here, the measured values during positive charging are shown in parentheses, and the highest charging potential is -740V (+710V), that is,
Since the total photoreceptor film thickness was 15.degree. 3 .mu.m, the charging ability per 1 .mu.m was extremely high at 48 V/.mu.m (46 V/.mu.m), and from this it was understood that the photoreceptor had sufficient charging performance.
“また、暗中にてVmaxからVmaXの90%の表面
電位にまでII#減衰するのに要した時間は約15秒(
約16秒)であり、このことから充分な電荷保持性能を
有する事が理解された。また、最高帯電電位に初期帯電
した後、白色光を用いて最高帯電電位の20%の表面電
位にまで明減衰させたところ必要ときれた光量は2.0
ルツクス・秒(1,フルックス・秒)であり、このこと
から充、分な光感度性能を有する事が理解された。“Also, the time required for II# to decay from Vmax to 90% of Vmax in the dark is approximately 15 seconds (
(approximately 16 seconds), and from this it was understood that the battery had sufficient charge retention performance. In addition, after initial charging to the highest charging potential, the brightness was attenuated to a surface potential of 20% of the highest charging potential using white light, and the required amount of light was 2.0.
lux-second (1, flux-second), and from this it was understood that it has sufficient photosensitivity performance.
以上より、本例に示した本発明による感光体は、感光体
として優れた性能を有するものである事が理解される。From the above, it is understood that the photoreceptor according to the present invention shown in this example has excellent performance as a photoreceptor.
また、この感光体に対して常用のカールソンプロセスの
中で、作像して転写したところ、鮮明な画像が得られた
。Further, when an image was formed and transferred to this photoreceptor using the commonly used Carlson process, a clear image was obtained.
X施グ4
本発明に係わる製造装置を用いて、第1図に示す如き、
導電性基板、電荷輸送層、電荷発生層をこの順に設けた
本発明感光体を作製した。X Execution 4 Using the manufacturing apparatus according to the present invention, as shown in FIG.
A photoreceptor of the present invention was prepared in which a conductive substrate, a charge transport layer, and a charge generation layer were provided in this order.
電荷輸送層形成工程:
第7図に示すグロー放電分解装置において、まず、反応
装置(733)の内部を10”6To r r程度の高
真空にした後、第1調節弁(707)、第2調節弁(7
08) 、及び第4調節弁(710)を解放し、第1タ
ンク(701)から水素ガス、第2タンク(702)か
らアセチレンガス、及び第4タンク(704)からゲル
マンガスを、各々出力圧1.0Kg/cm 2の下で第
1、第2、及び第6流量制t2II器(713,714
、及び716)内へ流入させな。各流量制御器を用いて
、水素ガスの流量を10105se、アセチレンガスの
流量を45secm、及びゲルマンガスの流量を9sc
cmとなるように設定して、途中混合蓋(731)を介
して、主管(732)より反応室(733)内へ流入し
た。各々の流量が安定した後に、反応室(733)内の
圧力が2.0Torrとなるように圧力調節弁(745
)を調整した。一方、導電性基板(752)としては、
縦50×横50×厚3mmのアルミニウム基板を用いて
、予め190℃に加熱しておき、ガス流量及び圧力が安
定した状態で、予め接続選択スイッチ(744)により
接続しておいた高周波電源(739)を投入し、電力印
加電極(736)に90Wattの電力を周波数13.
56MHzの下で印加して約3時間20分プラズマ重合
反応を行ない、導電性基板(752)上に厚き15μm
のa−C膜を電荷輸送層として形成した。成膜完了後は
、電力印加を停止し、調節弁を閉じ、反応室(733)
内を充分に排気した。Charge transport layer forming step: In the glow discharge decomposition apparatus shown in FIG. Control valve (7
08) and the fourth control valve (710) are released, hydrogen gas is supplied from the first tank (701), acetylene gas is supplied from the second tank (702), and germane gas is supplied from the fourth tank (704), respectively at the output pressure. The first, second, and sixth flow rate controllers (713, 714
, and 716). Using each flow rate controller, set the flow rate of hydrogen gas to 10105sec, the flow rate of acetylene gas to 45sec, and the flow rate of germane gas to 9sc.
cm, and flowed into the reaction chamber (733) from the main pipe (732) via the mixing lid (731) midway. After each flow rate is stabilized, the pressure regulating valve (745) is adjusted so that the pressure in the reaction chamber (733) becomes 2.0 Torr.
) was adjusted. On the other hand, as the conductive substrate (752),
An aluminum substrate measuring 50 mm long x 50 mm wide x 3 mm thick was heated to 190°C in advance, and with the gas flow rate and pressure stable, a high-frequency power source ( 739) and applied a power of 90 Watts to the power application electrode (736) at a frequency of 13.
A plasma polymerization reaction was performed for about 3 hours and 20 minutes by applying a frequency of 56 MHz, and a 15 μm thick film was formed on the conductive substrate (752).
The a-C film was formed as a charge transport layer. After completing the film formation, stop applying power, close the control valve, and open the reaction chamber (733).
The inside was thoroughly evacuated.
以上のようにして得られたa −C膜につき有機元素分
析を行なったところ、含有される水素原子の量は炭素原
子と水素原子の総量に対して34原子%であった。また
、オージェ分析より含有されるゲルマニウム原子の量は
全構成原子に対して7゜8原子%であった。When organic elemental analysis was performed on the a-C film obtained as described above, the amount of hydrogen atoms contained was 34 at % based on the total amount of carbon atoms and hydrogen atoms. Furthermore, the amount of germanium atoms contained was found to be 7.8 at% based on the total constituent atoms according to Auger analysis.
電荷発生層形成工程:
次いで、第1調節弁(707)、第5調節弁(711)
、及び第6調節弁(712)を解放し、第1タンク(7
01)から水素ガス、第5タンク(705)から窒素ガ
ス、及び第6タンク(706)からシランガスを、出力
圧IKg/cm2の下で第1、第5、及ヒ第6流量制w
JW(713,717、及び718)内へ流入させた。Charge generation layer forming step: Next, the first control valve (707) and the fifth control valve (711)
, and the sixth control valve (712), and the first tank (7
01), nitrogen gas from the fifth tank (705), and silane gas from the sixth tank (706) at the first, fifth, and sixth flow rate controls under an output pressure of IKg/cm2.
It was made to flow into JW (713, 717, and 718).
同時に、第4調節弁(710)を解放し、第4タンク(
704)より水素ガスで1100ppに希釈されたジボ
ランガスを、出力圧1.5Kg/cm2の下で第4流量
制御器(716)内へ、流入させた。各流量制御器の目
盛を調整して水素ガスの流量を200secm、窒素ガ
スの流量を0.Olsecm。At the same time, the fourth control valve (710) is released and the fourth tank (
Diborane gas diluted to 1100 pp with hydrogen gas (704) was flowed into the fourth flow rate controller (716) under an output pressure of 1.5 Kg/cm2. Adjust the scale of each flow rate controller to set the hydrogen gas flow rate to 200 seconds and the nitrogen gas flow rate to 0. Olsecm.
シランガスの流量を1001005e水素ガスで110
0ppに希釈されたジボランガスの流量を10105e
となるように設定し、反応室(733)内に流入させた
。各々の流量が安定した後に、反応室(733)内の圧
力が0.8Torrとなるように圧力調節弁(745)
を調整した。一方、a−C膜が形成されている導電性基
板(752)は、250℃に加熱しておき、ガス流量及
び圧力が安定した状態で、高周波電源(739)より周
波数13.56MHzの下で電力印加電極(736)に
35Wattの電力を印加し、グロー放電を発生させた
。この放電を59分間行ない、厚き0゜3μmの電荷発
生層を得た。Increase the flow rate of silane gas to 1001005e and 110% with hydrogen gas.
The flow rate of diborane gas diluted to 0pp is 10105e.
was set so that it would flow into the reaction chamber (733). After each flow rate stabilizes, the pressure regulating valve (745) is adjusted so that the pressure in the reaction chamber (733) becomes 0.8 Torr.
adjusted. On the other hand, the conductive substrate (752) on which the a-C film is formed is heated to 250°C, and is heated at a frequency of 13.56 MHz from a high frequency power source (739) while the gas flow rate and pressure are stable. A power of 35 Watts was applied to the power application electrode (736) to generate glow discharge. This discharge was carried out for 59 minutes to obtain a charge generation layer with a thickness of 0.3 μm.
得られたa−3i膜につき、金属中ONH分析(板場製
作所製EMGA−1300) 、オージェ分析、及びI
MA分析を行なったところ、含有される水素原子は全構
成原子に対して25原子%、硼素原子は10原子pI’
ms窒素原子は0.001原子%であった。The obtained a-3i film was subjected to ONH analysis in metal (EMGA-1300 manufactured by Itaba Seisakusho), Auger analysis, and I
When MA analysis was performed, the hydrogen atoms contained were 25 at% of the total constituent atoms, and the boron atoms were 10 at pI'
The ms nitrogen atom was 0.001 at.%.
特性:
得られた感光体を常用のカールソンプロセスの中で負帯
電並びに正帯電で用いたところ次の如き性能が得られた
。ここでは、正帯電時の測定値を括弧内に示すが、最高
帯電電位は一840V (+865V)で有り、即ち、
全感光体膜厚が15゜3μmであることから1μm当り
の帯電能は55V/μm(57V/μm)と極めて高く
、このことから充分な帯電性能を有する事が理解された
。Characteristics: When the obtained photoreceptor was used with both negative and positive charging in a conventional Carlson process, the following performance was obtained. Here, the measured values during positive charging are shown in parentheses, and the highest charging potential is -840V (+865V), that is,
Since the total photoreceptor film thickness was 15.degree. 3 .mu.m, the charging ability per 1 .mu.m was extremely high at 55 V/.mu.m (57 V/.mu.m), and from this it was understood that the photoreceptor had sufficient charging performance.
また、暗中にてVmaxからVmaxの90%の表面電
位にまで暗減衰するのに要した時間は約40秒(約38
秒)であり、このことから充分な電荷保持性能を有する
事が理解された。また、最高帯電電位に初期帯電した後
、白色光を用いて最高帯電電位の20%の表面電位にま
で明減衰させたとこる必要とされた光量は4.5ルツク
ス・秒(4,4ルツクス・秒)であり、このことから充
分な光感度性能を有する事が理解された。In addition, the time required for dark decay from Vmax to 90% of Vmax in the dark was approximately 40 seconds (approximately 38
seconds), and from this it was understood that it had sufficient charge retention performance. In addition, after initial charging to the highest charging potential, white light was used to brightly attenuate the surface potential to 20% of the highest charging potential.The amount of light required was 4.5 lux seconds (4.4 lux・seconds), and from this it was understood that it had sufficient photosensitivity performance.
以上より、本例に示した本発明による感光体は、感光体
として優れた性能を有するものである事が理M8れる。From the above, it can be concluded that the photoreceptor according to the present invention shown in this example has excellent performance as a photoreceptor.
また、この感光体に対して常用のカールソンプロセスの
中で、作像して転写したところ、鮮明な画像が得られた
。Further, when an image was formed and transferred to this photoreceptor using the commonly used Carlson process, a clear image was obtained.
実施例5
本発明に係わる製造装置を用いて、第1図に示す如き、
導電性基板、電荷輸送層、電荷発生層をこの順に設けた
本発明感光体を作製した。Example 5 Using the manufacturing apparatus according to the present invention, as shown in FIG.
A photoreceptor of the present invention was prepared in which a conductive substrate, a charge transport layer, and a charge generation layer were provided in this order.
電荷輸送層形成工程:
第7図に示すグロー放電分解装置において、まず、反応
装置(733)の内部を10−’To r r程度の高
真空にした後、第1調節弁(707)、第2調節弁(7
08) 、及び第6調節弁(712)を解放し、第1タ
ンク(701)から水素ガス、第2タンク(702)か
らブタジインガス、及び第6タンク(706)からシラ
ンガスを、各々出力圧1.0Kg/am2の下で第1、
第2、及び第6流量制御器(713,714、及び71
8)内へ流入させた。各流量制御器を用いて、水素ガス
の流量を60secm、ブタジインガスの流量を60s
ecm、及びシランガスの流量を10105eとなるよ
うに設定して、途中混合器(731)を介して、主管(
732)より反応室(733)内へ流入した。各々の流
量が安定した後に、反応室(733)内の圧力が2.0
Torrとなるように圧力調節弁(745)を調整した
。一方、導電性基板(752)としては、樅50X横5
0×厚3mmのアルミニウム基板を用いて、予め130
℃に加熱しておき、ガス流量及び圧力が安定した状態で
、予め接続選択スイッチ(744)により接続しておい
た低周波電源(741)を投入し、電力印加電極(73
6)に180Wattの電力を周波数100KHzの下
で印加して約30分間プラズマ重合反応を行ない、導電
性基板(752)上に厚さ15μmのa−C膜を電荷輸
送層として形成した。成膜完了後は、電力印加を停止し
、調筋弁を閉じ、反応室(733)内を充分に排気した
。Charge transport layer forming step: In the glow discharge decomposition apparatus shown in FIG. 2 control valves (7
08) and the sixth control valve (712) are released, hydrogen gas is supplied from the first tank (701), butadiene gas is supplied from the second tank (702), and silane gas is supplied from the sixth tank (706) to an output pressure of 1. 1st under 0Kg/am2,
Second and sixth flow controllers (713, 714, and 71
8) It was allowed to flow into the interior. Using each flow rate controller, set the flow rate of hydrogen gas to 60 seconds and the flow rate of butadiene gas to 60 seconds.
ecm and the flow rate of silane gas are set to 10105e, and the main pipe (
732) into the reaction chamber (733). After each flow rate stabilizes, the pressure inside the reaction chamber (733) is 2.0.
The pressure control valve (745) was adjusted so that the pressure was Torr. On the other hand, as a conductive substrate (752),
130 mm in advance using an aluminum substrate with a thickness of 3 mm.
℃, and with the gas flow rate and pressure stable, turn on the low frequency power supply (741) that was previously connected using the connection selection switch (744), and connect the power application electrode (73).
6), a plasma polymerization reaction was carried out for about 30 minutes by applying a power of 180 Watts at a frequency of 100 KHz to form a 15 μm thick a-C film as a charge transport layer on the conductive substrate (752). After the film formation was completed, power application was stopped, the muscle adjustment valve was closed, and the inside of the reaction chamber (733) was sufficiently evacuated.
以上のようにして得られたa −C膜につき有機元素分
析を行なったところ、含有される水素原子の量は炭素原
子と水素原子の総量に対して40原子%であった。また
、オージェ分析より含有されるシリコン原子の量は全構
成原子に対して9.4原子%であった。When organic elemental analysis was performed on the a-C film obtained as described above, the amount of hydrogen atoms contained was 40 at % based on the total amount of carbon atoms and hydrogen atoms. Moreover, the amount of silicon atoms contained was 9.4 at % based on the total constituent atoms according to Auger analysis.
電荷発生層形成工程:
次いで、第1調節弁(707)、第5調節弁(711L
及び第6調節弁(712)を解放し、第1タンク(70
1)から水素ガス、第5タンク(705)から窒素ガス
、及び第6タンク(706)からシランガスを、出力圧
IKg/am2の下で第1、第5、及び第6流量制陣器
(713,717、及び718)内へ流入させた。同時
に、第4調節弁(710)を解放し、第4タンク(70
4)より水素ガスで10ppmに希釈されたホスフィン
ガスを、出力圧1.5Kg/cm2の下で第4流量制御
器(716)内へ、流入させた。各流量制御器の目盛を
調整して水素ガスの流量を200secm、窒素ガスの
流量を3 s e c m %シランガスの流量を20
0secm、水素ガスで1100ppに希釈されたホス
フィンガスの流量を10105eに設定し、反応室(7
33)内に流入させた。各々の流量が安定した後に、反
応室(733)内の圧力が0.9Torrとなるように
圧力調節弁(745)を調整した。一方、a−C膜が形
成されている導電性基板(752)は、250℃に加熱
しておき、ガス流量及び圧力が安定した状態で、高周波
電源(739)より周波数13゜56MHzの下で電力
印加電極(736)に35Wattの電力を印加し、グ
ロー放電を発生させた。この放電を5分間行ない、厚き
0.3μmの電荷発生層を得た。Charge generation layer forming step: Next, the first control valve (707) and the fifth control valve (711L
and the sixth control valve (712), and the first tank (70
Hydrogen gas from 1), nitrogen gas from the fifth tank (705), and silane gas from the sixth tank (706) are supplied to the first, fifth, and sixth flow rate controllers (713) under an output pressure of IKg/am2. , 717, and 718). At the same time, the fourth control valve (710) is released and the fourth tank (70
4) Phosphine gas diluted to 10 ppm with hydrogen gas was flowed into the fourth flow rate controller (716) under an output pressure of 1.5 Kg/cm2. Adjust the scale of each flow rate controller to set the hydrogen gas flow rate to 200 sec, the nitrogen gas flow rate to 3 sec cm%, and the silane gas flow rate to 20 sec.
Set the flow rate of phosphine gas diluted to 1100 pp with hydrogen gas to 10105e,
33). After each flow rate became stable, the pressure control valve (745) was adjusted so that the pressure inside the reaction chamber (733) was 0.9 Torr. On the other hand, the conductive substrate (752) on which the a-C film is formed is heated to 250°C, and with the gas flow rate and pressure stable, it is heated at a frequency of 13°56MHz from a high frequency power source (739). A power of 35 Watts was applied to the power application electrode (736) to generate glow discharge. This discharge was carried out for 5 minutes to obtain a charge generation layer with a thickness of 0.3 μm.
得られたa−St膜につき、金属中ONH分析(板場製
作所製EMGA−1300) 、オージェ分析、及びI
MA分析を行なったところ、含有される水素原子は全構
成原子に対して18原子%、燐原子は12原子ppm、
窒素原子は0.3原子%であった。The obtained a-St film was subjected to ONH analysis in metal (EMGA-1300 manufactured by Itaba Seisakusho), Auger analysis, and I
When MA analysis was performed, the hydrogen atoms contained were 18 at %, the phosphorus atoms were 12 at ppm,
The nitrogen atom content was 0.3 at.%.
特性:
得られた感光体を常用のカールソンプロセスの中で負帯
電並びに正帯電で用いたところ次の如き性能が得られた
。ここでは、正帯電時の測定値を括弧内に示すが、最高
帯電電位は一800V (+950V)で有り、即ち、
全感光体膜厚が15゜3μmであることから1μm当り
の帯電能は52V/μm(62V/μm)と極めて高く
、このことから充分な帯電性能を有する事が理解きれた
。Characteristics: When the obtained photoreceptor was used with both negative and positive charging in a conventional Carlson process, the following performance was obtained. Here, the measured values during positive charging are shown in parentheses, and the highest charging potential is -800V (+950V), that is,
Since the total photoreceptor film thickness was 15.degree. 3 .mu.m, the charging ability per 1 .mu.m was extremely high at 52 V/.mu.m (62 V/.mu.m), and from this it was understood that the photoreceptor had sufficient charging performance.
また、暗中にてVmaxからVmaxの90%の表面電
位にまで暗減衰するのに要した時間は約38秒(約42
秒)であり、このことから充分な電荷保持性能を有する
事が理解された。また、最高帯電電位に初期帯電した後
、白色光を用いて最高帯電電位の20%の表面電位にま
で明減衰させたところ必要ときれた光量は2.6ルツク
ス・秒(9,2ルツクス・秒)であり、このことから充
分な光感度性能を有する事が理解された。In addition, the time required for dark decay from Vmax to 90% of Vmax in the dark was approximately 38 seconds (approximately 42 seconds).
seconds), and from this it was understood that it had sufficient charge retention performance. Furthermore, after initial charging to the highest charging potential, white light was used to brightly attenuate the surface potential to 20% of the highest charging potential, and the required amount of light was 2.6 lux · seconds (9.2 lux · seconds), and from this it was understood that it had sufficient photosensitivity performance.
以上より、本例に示した本発明による感光体は、感光体
として優れた性能を有するものである事が理解される。From the above, it is understood that the photoreceptor according to the present invention shown in this example has excellent performance as a photoreceptor.
また、この感光体に対して常用のカールソンプロセスの
中で、作像して転写したところ、鮮明な画像が得られた
。Further, when an image was formed and transferred to this photoreceptor using the commonly used Carlson process, a clear image was obtained.
第1図乃至第6図は本発明感光体の構成を示す図面、第
7図乃至第8図は本発明に係わる感光体の製造装置を示
す図面である。
第1図
第2図
第4図
第6図
手続補正書
昭和62年10月21日1 to 6 are drawings showing the structure of a photoreceptor according to the present invention, and FIGS. 7 to 8 are drawings showing an apparatus for manufacturing a photoreceptor according to the invention. Figure 1 Figure 2 Figure 4 Figure 6 Procedural amendment dated October 21, 1986
Claims (1)
おいて、該電荷輸送層はシリコン原子及びゲルマニウム
原子のうち少なくとも一方を含有してなる水素化アモル
ファスカーボン膜であり、かつ、該電荷発生層は窒素原
子を含有すると共に燐原子及び硼素原子のうち少なくと
も一方を含有してなる水素化アモルファスシリコン膜或
は窒素原子を含有すると共に燐原子及び硼素原子のうち
少なくとも一方を含有してなる弗素化アモルファスシリ
コン膜であることを特徴とする感光体。In a functionally separated photoreceptor having a charge generation layer and a charge transport layer, the charge transport layer is a hydrogenated amorphous carbon film containing at least one of silicon atoms and germanium atoms, and the charge generation layer is a hydrogenated amorphous silicon film containing nitrogen atoms and at least one of phosphorus atoms and boron atoms, or a fluorinated amorphous silicon film containing nitrogen atoms and at least one of phosphorus atoms and boron atoms. A photoreceptor characterized by being an amorphous silicon film.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22942786A JPS6382455A (en) | 1986-09-26 | 1986-09-26 | Photosensitive body |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22942786A JPS6382455A (en) | 1986-09-26 | 1986-09-26 | Photosensitive body |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6382455A true JPS6382455A (en) | 1988-04-13 |
Family
ID=16892056
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22942786A Pending JPS6382455A (en) | 1986-09-26 | 1986-09-26 | Photosensitive body |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6382455A (en) |
-
1986
- 1986-09-26 JP JP22942786A patent/JPS6382455A/en active Pending
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