JPS6377887A - Purifying method for organosilicon compound - Google Patents
Purifying method for organosilicon compoundInfo
- Publication number
- JPS6377887A JPS6377887A JP22156886A JP22156886A JPS6377887A JP S6377887 A JPS6377887 A JP S6377887A JP 22156886 A JP22156886 A JP 22156886A JP 22156886 A JP22156886 A JP 22156886A JP S6377887 A JPS6377887 A JP S6377887A
- Authority
- JP
- Japan
- Prior art keywords
- organosilicon compound
- impurities
- chloride
- compound
- organosilicon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 150000003961 organosilicon compounds Chemical class 0.000 title claims abstract description 23
- 238000000034 method Methods 0.000 title claims description 9
- 239000012535 impurity Substances 0.000 claims abstract description 12
- 150000002901 organomagnesium compounds Chemical class 0.000 claims abstract description 9
- MVPPADPHJFYWMZ-UHFFFAOYSA-N chlorobenzene Chemical compound ClC1=CC=CC=C1 MVPPADPHJFYWMZ-UHFFFAOYSA-N 0.000 abstract description 10
- 150000004795 grignard reagents Chemical class 0.000 abstract description 10
- 239000007818 Grignard reagent Substances 0.000 abstract description 6
- 150000002896 organic halogen compounds Chemical class 0.000 abstract description 6
- NEHMKBQYUWJMIP-NJFSPNSNSA-N chloro(114C)methane Chemical compound [14CH3]Cl NEHMKBQYUWJMIP-NJFSPNSNSA-N 0.000 abstract description 3
- RDHPKYGYEGBMSE-UHFFFAOYSA-N bromoethane Chemical compound CCBr RDHPKYGYEGBMSE-UHFFFAOYSA-N 0.000 abstract description 2
- DMDPKUWXJUYFKO-UHFFFAOYSA-N 1,1'-biphenyl;hydrochloride Chemical compound Cl.C1=CC=CC=C1C1=CC=CC=C1 DMDPKUWXJUYFKO-UHFFFAOYSA-N 0.000 abstract 1
- 239000011541 reaction mixture Substances 0.000 abstract 1
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 12
- -1 siloxanes Chemical class 0.000 description 12
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 10
- 229910052710 silicon Inorganic materials 0.000 description 10
- 239000010703 silicon Substances 0.000 description 10
- 239000000243 solution Substances 0.000 description 10
- OSXYHAQZDCICNX-UHFFFAOYSA-N dichloro(diphenyl)silane Chemical group C=1C=CC=CC=1[Si](Cl)(Cl)C1=CC=CC=C1 OSXYHAQZDCICNX-UHFFFAOYSA-N 0.000 description 9
- 238000004821 distillation Methods 0.000 description 9
- CXQXSVUQTKDNFP-UHFFFAOYSA-N octamethyltrisiloxane Chemical compound C[Si](C)(C)O[Si](C)(C)O[Si](C)(C)C CXQXSVUQTKDNFP-UHFFFAOYSA-N 0.000 description 9
- 239000000758 substrate Substances 0.000 description 9
- QARVLSVVCXYDNA-UHFFFAOYSA-N bromobenzene Chemical compound BrC1=CC=CC=C1 QARVLSVVCXYDNA-UHFFFAOYSA-N 0.000 description 8
- 239000000706 filtrate Substances 0.000 description 8
- 238000003756 stirring Methods 0.000 description 8
- 235000012431 wafers Nutrition 0.000 description 8
- 238000004458 analytical method Methods 0.000 description 7
- 238000004817 gas chromatography Methods 0.000 description 7
- 239000011521 glass Substances 0.000 description 7
- 239000002244 precipitate Substances 0.000 description 7
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 6
- AHUXYBVKTIBBJW-UHFFFAOYSA-N dimethoxy(diphenyl)silane Chemical compound C=1C=CC=CC=1[Si](OC)(OC)C1=CC=CC=C1 AHUXYBVKTIBBJW-UHFFFAOYSA-N 0.000 description 5
- LIKFHECYJZWXFJ-UHFFFAOYSA-N dimethyldichlorosilane Chemical compound C[Si](C)(Cl)Cl LIKFHECYJZWXFJ-UHFFFAOYSA-N 0.000 description 5
- JCVQKRGIASEUKR-UHFFFAOYSA-N triethoxy(phenyl)silane Chemical compound CCO[Si](OCC)(OCC)C1=CC=CC=C1 JCVQKRGIASEUKR-UHFFFAOYSA-N 0.000 description 5
- LINXHFKHZLOLEI-UHFFFAOYSA-N trimethyl-[phenyl-bis(trimethylsilyloxy)silyl]oxysilane Chemical group C[Si](C)(C)O[Si](O[Si](C)(C)C)(O[Si](C)(C)C)C1=CC=CC=C1 LINXHFKHZLOLEI-UHFFFAOYSA-N 0.000 description 5
- KTADSLDAUJLZGL-UHFFFAOYSA-N 1-bromo-2-phenylbenzene Chemical group BrC1=CC=CC=C1C1=CC=CC=C1 KTADSLDAUJLZGL-UHFFFAOYSA-N 0.000 description 4
- GZUXJHMPEANEGY-UHFFFAOYSA-N bromomethane Chemical compound BrC GZUXJHMPEANEGY-UHFFFAOYSA-N 0.000 description 4
- NEHMKBQYUWJMIP-UHFFFAOYSA-N chloromethane Chemical compound ClC NEHMKBQYUWJMIP-UHFFFAOYSA-N 0.000 description 4
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N diphenyl Chemical group C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 4
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 4
- 150000004756 silanes Chemical class 0.000 description 4
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 125000000217 alkyl group Chemical group 0.000 description 3
- IWCVDCOJSPWGRW-UHFFFAOYSA-M magnesium;benzene;chloride Chemical compound [Mg+2].[Cl-].C1=CC=[C-]C=C1 IWCVDCOJSPWGRW-UHFFFAOYSA-M 0.000 description 3
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 3
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- DURPTKYDGMDSBL-UHFFFAOYSA-N 1-butoxybutane Chemical compound CCCCOCCCC DURPTKYDGMDSBL-UHFFFAOYSA-N 0.000 description 2
- QFUYDAGNUJWBSM-UHFFFAOYSA-N 1-iodo-2-phenylbenzene Chemical group IC1=CC=CC=C1C1=CC=CC=C1 QFUYDAGNUJWBSM-UHFFFAOYSA-N 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 2
- SNIYGPDAYLBEMK-UHFFFAOYSA-M [I-].[Mg+]C1=CC=CC=C1 Chemical compound [I-].[Mg+]C1=CC=CC=C1 SNIYGPDAYLBEMK-UHFFFAOYSA-M 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- DCFKHNIGBAHNSS-UHFFFAOYSA-N chloro(triethyl)silane Chemical compound CC[Si](Cl)(CC)CC DCFKHNIGBAHNSS-UHFFFAOYSA-N 0.000 description 2
- IJOOHPMOJXWVHK-UHFFFAOYSA-N chlorotrimethylsilane Chemical compound C[Si](C)(C)Cl IJOOHPMOJXWVHK-UHFFFAOYSA-N 0.000 description 2
- BYLOHCRAPOSXLY-UHFFFAOYSA-N dichloro(diethyl)silane Chemical compound CC[Si](Cl)(Cl)CC BYLOHCRAPOSXLY-UHFFFAOYSA-N 0.000 description 2
- NXPHGHWWQRMDIA-UHFFFAOYSA-M magnesium;carbanide;bromide Chemical compound [CH3-].[Mg+2].[Br-] NXPHGHWWQRMDIA-UHFFFAOYSA-M 0.000 description 2
- CCERQOYLJJULMD-UHFFFAOYSA-M magnesium;carbanide;chloride Chemical compound [CH3-].[Mg+2].[Cl-] CCERQOYLJJULMD-UHFFFAOYSA-M 0.000 description 2
- VXWPONVCMVLXBW-UHFFFAOYSA-M magnesium;carbanide;iodide Chemical compound [CH3-].[Mg+2].[I-] VXWPONVCMVLXBW-UHFFFAOYSA-M 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 229940102396 methyl bromide Drugs 0.000 description 2
- 229940050176 methyl chloride Drugs 0.000 description 2
- 150000001282 organosilanes Chemical class 0.000 description 2
- 125000005375 organosiloxane group Chemical group 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- LAXBNTIAOJWAOP-UHFFFAOYSA-N 2-chlorobiphenyl Chemical group ClC1=CC=CC=C1C1=CC=CC=C1 LAXBNTIAOJWAOP-UHFFFAOYSA-N 0.000 description 1
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 1
- CPELXLSAUQHCOX-UHFFFAOYSA-M Bromide Chemical compound [Br-] CPELXLSAUQHCOX-UHFFFAOYSA-M 0.000 description 1
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical compound [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- 239000005046 Chlorosilane Substances 0.000 description 1
- XMSXQFUHVRWGNA-UHFFFAOYSA-N Decamethylcyclopentasiloxane Chemical compound C[Si]1(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O1 XMSXQFUHVRWGNA-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- WMJMABVHDMRMJA-UHFFFAOYSA-M [Cl-].[Mg+]C1CCCCC1 Chemical compound [Cl-].[Mg+]C1CCCCC1 WMJMABVHDMRMJA-UHFFFAOYSA-M 0.000 description 1
- YFCGDEUVHLPRCZ-UHFFFAOYSA-N [dimethyl(trimethylsilyloxy)silyl]oxy-dimethyl-trimethylsilyloxysilane Chemical compound C[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)C YFCGDEUVHLPRCZ-UHFFFAOYSA-N 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 239000003125 aqueous solvent Substances 0.000 description 1
- 125000003118 aryl group Chemical group 0.000 description 1
- YCOXTKKNXUZSKD-UHFFFAOYSA-N as-o-xylenol Natural products CC1=CC=C(O)C=C1C YCOXTKKNXUZSKD-UHFFFAOYSA-N 0.000 description 1
- 235000010290 biphenyl Nutrition 0.000 description 1
- 239000004305 biphenyl Substances 0.000 description 1
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 description 1
- 229910052794 bromium Inorganic materials 0.000 description 1
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- MNKYQPOFRKPUAE-UHFFFAOYSA-N chloro(triphenyl)silane Chemical compound C=1C=CC=CC=1[Si](C=1C=CC=CC=1)(Cl)C1=CC=CC=C1 MNKYQPOFRKPUAE-UHFFFAOYSA-N 0.000 description 1
- HRYZWHHZPQKTII-UHFFFAOYSA-N chloroethane Chemical compound CCCl HRYZWHHZPQKTII-UHFFFAOYSA-N 0.000 description 1
- KOPOQZFJUQMUML-UHFFFAOYSA-N chlorosilane Chemical class Cl[SiH3] KOPOQZFJUQMUML-UHFFFAOYSA-N 0.000 description 1
- 125000000753 cycloalkyl group Chemical group 0.000 description 1
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 1
- 125000004177 diethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- VSYLGGHSEIWGJV-UHFFFAOYSA-N diethyl(dimethoxy)silane Chemical compound CC[Si](CC)(OC)OC VSYLGGHSEIWGJV-UHFFFAOYSA-N 0.000 description 1
- JJQZDUKDJDQPMQ-UHFFFAOYSA-N dimethoxy(dimethyl)silane Chemical compound CO[Si](C)(C)OC JJQZDUKDJDQPMQ-UHFFFAOYSA-N 0.000 description 1
- KZLUHGRPVSRSHI-UHFFFAOYSA-N dimethylmagnesium Chemical compound C[Mg]C KZLUHGRPVSRSHI-UHFFFAOYSA-N 0.000 description 1
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- ZVJXKUWNRVOUTI-UHFFFAOYSA-N ethoxy(triphenyl)silane Chemical compound C=1C=CC=CC=1[Si](C=1C=CC=CC=1)(OCC)C1=CC=CC=C1 ZVJXKUWNRVOUTI-UHFFFAOYSA-N 0.000 description 1
- 229960003750 ethyl chloride Drugs 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- SBRXLTRZCJVAPH-UHFFFAOYSA-N ethyl(trimethoxy)silane Chemical compound CC[Si](OC)(OC)OC SBRXLTRZCJVAPH-UHFFFAOYSA-N 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 125000005843 halogen group Chemical group 0.000 description 1
- HTDJPCNNEPUOOQ-UHFFFAOYSA-N hexamethylcyclotrisiloxane Chemical group C[Si]1(C)O[Si](C)(C)O[Si](C)(C)O1 HTDJPCNNEPUOOQ-UHFFFAOYSA-N 0.000 description 1
- UQEAIHBTYFGYIE-UHFFFAOYSA-N hexamethyldisiloxane Chemical compound C[Si](C)(C)O[Si](C)(C)C UQEAIHBTYFGYIE-UHFFFAOYSA-N 0.000 description 1
- 150000002430 hydrocarbons Chemical group 0.000 description 1
- 239000012770 industrial material Substances 0.000 description 1
- 229910052740 iodine Inorganic materials 0.000 description 1
- 239000011630 iodine Substances 0.000 description 1
- SNHMUERNLJLMHN-UHFFFAOYSA-N iodobenzene Chemical compound IC1=CC=CC=C1 SNHMUERNLJLMHN-UHFFFAOYSA-N 0.000 description 1
- HVTICUPFWKNHNG-UHFFFAOYSA-N iodoethane Chemical compound CCI HVTICUPFWKNHNG-UHFFFAOYSA-N 0.000 description 1
- 150000002681 magnesium compounds Chemical class 0.000 description 1
- UKZCGMDMXDLAGZ-UHFFFAOYSA-M magnesium;2-methylpropane;bromide Chemical compound [Mg+2].[Br-].C[C-](C)C UKZCGMDMXDLAGZ-UHFFFAOYSA-M 0.000 description 1
- CQRPUKWAZPZXTO-UHFFFAOYSA-M magnesium;2-methylpropane;chloride Chemical compound [Mg+2].[Cl-].C[C-](C)C CQRPUKWAZPZXTO-UHFFFAOYSA-M 0.000 description 1
- WRYKIHMRDIOPSI-UHFFFAOYSA-N magnesium;benzene Chemical compound [Mg+2].C1=CC=[C-]C=C1.C1=CC=[C-]C=C1 WRYKIHMRDIOPSI-UHFFFAOYSA-N 0.000 description 1
- DLPASUVGCQPFFO-UHFFFAOYSA-N magnesium;ethane Chemical compound [Mg+2].[CH2-]C.[CH2-]C DLPASUVGCQPFFO-UHFFFAOYSA-N 0.000 description 1
- FRIJBUGBVQZNTB-UHFFFAOYSA-M magnesium;ethane;bromide Chemical compound [Mg+2].[Br-].[CH2-]C FRIJBUGBVQZNTB-UHFFFAOYSA-M 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- BKXVGDZNDSIUAI-UHFFFAOYSA-N methoxy(triphenyl)silane Chemical compound C=1C=CC=CC=1[Si](C=1C=CC=CC=1)(OC)C1=CC=CC=C1 BKXVGDZNDSIUAI-UHFFFAOYSA-N 0.000 description 1
- 239000005055 methyl trichlorosilane Substances 0.000 description 1
- JPQBRSQJGWOTGC-UHFFFAOYSA-N methyl(silyloxysilyloxy)silane Chemical group C[SiH2]O[SiH2]O[SiH3] JPQBRSQJGWOTGC-UHFFFAOYSA-N 0.000 description 1
- JLUFWMXJHAVVNN-UHFFFAOYSA-N methyltrichlorosilane Chemical compound C[Si](Cl)(Cl)Cl JLUFWMXJHAVVNN-UHFFFAOYSA-N 0.000 description 1
- BFXIKLCIZHOAAZ-UHFFFAOYSA-N methyltrimethoxysilane Chemical compound CO[Si](C)(OC)OC BFXIKLCIZHOAAZ-UHFFFAOYSA-N 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 125000000740 n-pentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- HMMGMWAXVFQUOA-UHFFFAOYSA-N octamethylcyclotetrasiloxane Chemical compound C[Si]1(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O1 HMMGMWAXVFQUOA-UHFFFAOYSA-N 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- ANRQGKOBLBYXFM-UHFFFAOYSA-M phenylmagnesium bromide Chemical compound Br[Mg]C1=CC=CC=C1 ANRQGKOBLBYXFM-UHFFFAOYSA-M 0.000 description 1
- 239000005054 phenyltrichlorosilane Substances 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 125000003944 tolyl group Chemical group 0.000 description 1
- ZOYFEXPFPVDYIS-UHFFFAOYSA-N trichloro(ethyl)silane Chemical compound CC[Si](Cl)(Cl)Cl ZOYFEXPFPVDYIS-UHFFFAOYSA-N 0.000 description 1
- ORVMIVQULIKXCP-UHFFFAOYSA-N trichloro(phenyl)silane Chemical compound Cl[Si](Cl)(Cl)C1=CC=CC=C1 ORVMIVQULIKXCP-UHFFFAOYSA-N 0.000 description 1
- DENFJSAFJTVPJR-UHFFFAOYSA-N triethoxy(ethyl)silane Chemical compound CCO[Si](CC)(OCC)OCC DENFJSAFJTVPJR-UHFFFAOYSA-N 0.000 description 1
- QQQSFSZALRVCSZ-UHFFFAOYSA-N triethoxysilane Chemical compound CCO[SiH](OCC)OCC QQQSFSZALRVCSZ-UHFFFAOYSA-N 0.000 description 1
- WILBTFWIBAOWLN-UHFFFAOYSA-N triethyl(triethylsilyloxy)silane Chemical compound CC[Si](CC)(CC)O[Si](CC)(CC)CC WILBTFWIBAOWLN-UHFFFAOYSA-N 0.000 description 1
- ZNOCGWVLWPVKAO-UHFFFAOYSA-N trimethoxy(phenyl)silane Chemical compound CO[Si](OC)(OC)C1=CC=CC=C1 ZNOCGWVLWPVKAO-UHFFFAOYSA-N 0.000 description 1
- 239000005051 trimethylchlorosilane Substances 0.000 description 1
- IVZTVZJLMIHPEY-UHFFFAOYSA-N triphenyl(triphenylsilyloxy)silane Chemical compound C=1C=CC=CC=1[Si](C=1C=CC=CC=1)(C=1C=CC=CC=1)O[Si](C=1C=CC=CC=1)(C=1C=CC=CC=1)C1=CC=CC=C1 IVZTVZJLMIHPEY-UHFFFAOYSA-N 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Landscapes
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、シラン類、シロキサン類のような有機ケイ素
化合物の精製方法に関する。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a method for purifying organosilicon compounds such as silanes and siloxanes.
近年、半導体工業用材料としてシラン類及びシロキサン
類の利用が進むにつれて、その中に不純物として含まれ
る微量のメチルクロライド、メチルブロマイド、クロロ
ベンゼン、ブロモベンゼン。In recent years, as the use of silanes and siloxanes as materials for the semiconductor industry has progressed, trace amounts of methyl chloride, methyl bromide, chlorobenzene, and bromobenzene are contained as impurities.
クロロビフェニル、ブロモビフェニルのようなハロゲン
化有機化合物がシリコンウェハーなどの半導体基板を侵
し、材料トラブルを起すことが明らかになってきた。It has become clear that halogenated organic compounds such as chlorobiphenyl and bromobiphenyl attack semiconductor substrates such as silicon wafers, causing material problems.
そこで、本発明は、簡便かつ効率的に不純物であるハロ
ゲン化有機化合物などを有機ケイ素化合物から分離し、
精製する方法を提供することを目的とするものである。Therefore, the present invention simply and efficiently separates impurities such as halogenated organic compounds from organosilicon compounds, and
The purpose of this invention is to provide a method for purification.
c問題点を解決するための手段〕
本発明者らは、次の方法により、前記目的を達成し、有
機ケイ素化合物を精製し得ることを見出した。c. Means for Solving Problems] The present inventors have found that the above object can be achieved and an organosilicon compound can be purified by the following method.
すなわち、本発明は、不純物を含有する有機ケイ素化合
物を有機マグネシウム化合物と接触させた後、有機ケイ
素化合物を分離することからなる有機ケイ素化合物の精
製方法を提供するものである。That is, the present invention provides a method for purifying an organosilicon compound, which comprises contacting an organosilicon compound containing impurities with an organomagnesium compound and then separating the organosilicon compound.
本発明における精製の対象となる有機ケイ素化合物とし
ては、オルガノシラン類、オルガノシロキサン類が挙げ
られる。オルガノシラン類としては、例えばジメチルジ
クロロシラン、ジエチルジクロロシラン、メチルトリク
ロロシラン、エチルトリクロロシラン、トリメチルクロ
ロシラン、トリエチルクロロシランのようなアルキルク
ロロシラン類;ジメチルジメトキシシラン、ジメチルジ
ェトキシシラン、メチルトリメトキシシラン、メチルト
リエトキシシラン、ジエチルジメトキシシラン、ジエチ
ルジェトキシシラン、エチルトリメトキシシラン、エチ
ルトリエトキシシランのようなアルキルアルコキシシラ
ン類;ジフェニルジクロロシラン、フェニルトリクロロ
シラン、トリフェニルクロロシランのようなフェニル基
を持つクロロシラン類;ジフェニルジメトキシシラン、
フェニルトリメトキシシラン、トリフェニルメトキシシ
ラン、ジフェニルジェトキシシラン、フェニルトリエト
キシシラン、トリフェニルエトキシシランのようなフェ
ニルアルコキシシラン類;オルガノシロキサンとしては
、例えば、ヘキサメチルジシロキサン、ヘキサエチルジ
シロキサン、オクタメチルトリシロキサン、デカメチル
テトラシロキサンのよよなアルキル基を持つ鎖状シロキ
サン類;ヘキサメチルシクロトリシロキサン、オクタメ
チルシクロテトラシロキサン、デカメチルシクロペンタ
シロキサンのようなアルキル基を持つ環、状シロキサン
類;ヘキサフェニルジシロキサン。Organosilicon compounds to be purified in the present invention include organosilanes and organosiloxanes. Examples of organosilanes include alkylchlorosilanes such as dimethyldichlorosilane, diethyldichlorosilane, methyltrichlorosilane, ethyltrichlorosilane, trimethylchlorosilane, and triethylchlorosilane; dimethyldimethoxysilane, dimethyljethoxysilane, methyltrimethoxysilane, and methyl Alkylalkoxysilanes such as triethoxysilane, diethyldimethoxysilane, diethyljethoxysilane, ethyltrimethoxysilane, and ethyltriethoxysilane; chlorosilanes with phenyl groups such as diphenyldichlorosilane, phenyltrichlorosilane, and triphenylchlorosilane ; diphenyldimethoxysilane,
Phenylalkoxysilanes such as phenyltrimethoxysilane, triphenylmethoxysilane, diphenyljethoxysilane, phenyltriethoxysilane, and triphenylethoxysilane; examples of organosiloxane include hexamethyldisiloxane, hexaethyldisiloxane, octa Chain siloxanes with alkyl groups such as methyltrisiloxane and decamethyltetrasiloxane; cyclic siloxanes with alkyl groups such as hexamethylcyclotrisiloxane, octamethylcyclotetrasiloxane, and decamethylcyclopentasiloxane ;Hexaphenyldisiloxane.
オクタフェニルトリシロキサン、デカフェニルテトラシ
ロキサンのようなフェニル基を持つ鎖状シロキサン、及
びフェニルトリス(トリメチルシロキシ)シランのよう
なメチル基及びフェニル基を持つ分岐状シロキサンが挙
げられる。Examples include linear siloxanes having phenyl groups such as octaphenyltrisiloxane and decaffenytetrasiloxane, and branched siloxanes having methyl and phenyl groups such as phenyltris(trimethylsiloxy)silane.
本発明に使用される有機マグネシウム化合物としては、
例えば、一般式:
〔式中、Rはメチル、工°チル、プロピル、ブチル。The organomagnesium compounds used in the present invention include:
For example, the general formula: [wherein R is methyl, ethyl, propyl, or butyl.
アミル等のアルキル基、シクロヘキシル、メチルシクロ
ヘキシル等のシクロアルキル基、フェニル。Alkyl groups such as amyl, cycloalkyl groups such as cyclohexyl and methylcyclohexyl, and phenyl.
トリル、エチルフェニル等のアリール基などの炭化水素
基であり、
Xは、塩素、臭素、ヨウ素等のハロゲン原子である。〕
で表されるグリニヤール試薬、及びジメチルマグネシウ
ム、ジエチルマグネシウム、ジフェニルマグネシウム等
の有機マグネシウム化合物が挙げられ、グリニヤール試
薬が特に好ましい。It is a hydrocarbon group such as an aryl group such as tolyl or ethylphenyl, and X is a halogen atom such as chlorine, bromine, or iodine. ] Grignard reagents represented by these and organic magnesium compounds such as dimethylmagnesium, diethylmagnesium, and diphenylmagnesium are mentioned, and Grignard reagents are particularly preferred.
前記のグリニヤール試薬の具体例としては、次のような
ものがある。即ち、メチルマグネシウムクロライド、
tert−ブチルマグネシウムクロライド、メチルマグ
ネシウムブロマイド、エチルマグネシウムブロマイド、
tert−ブチルマグネシウムブロマイド、メチルマ
グネシウムアイオダイド。Specific examples of the Grignard reagent mentioned above include the following. That is, methylmagnesium chloride,
tert-butylmagnesium chloride, methylmagnesium bromide, ethylmagnesium bromide,
tert-butylmagnesium bromide, methylmagnesium iodide.
フェニルマグネシウムクロライド、フェニルマグネシウ
ムブロマイド、フェニルマグネシウムアイオダイド、シ
クロヘキシルマグネシウムクロライド等である。These include phenylmagnesium chloride, phenylmagnesium bromide, phenylmagnesium iodide, and cyclohexylmagnesium chloride.
本発明の方法により除去される不純物としては、例えば
前述のようにハロゲン化有機化合物が挙げられるが、こ
れに限定されるものではない。除去されるハロゲン化有
機化合物としては、メチルクロライド、メチルブロマイ
ド、エチルクロライド。Examples of impurities removed by the method of the present invention include, but are not limited to, halogenated organic compounds as described above. The halogenated organic compounds to be removed include methyl chloride, methyl bromide, and ethyl chloride.
エチルブロマイド、エチルアイオダイド、クロロベンゼ
ン、ブロモベンゼン、ヨードベンゼン、塩化ビフェニル
、臭化ビフェニル、ヨウ化ビフェニル等が挙げられる。Examples include ethyl bromide, ethyl iodide, chlorobenzene, bromobenzene, iodobenzene, chlorinated biphenyl, brominated biphenyl, iodized biphenyl, and the like.
グリニヤール試薬等の有機マグネシウム化合物を不純物
を含有する有機ケイ素化合物と接触させるには、グリニ
ヤール試薬等を適当な有a溶媒溶液として有機ケイ素化
合物に加え、好ましくは一70〜100℃、特に好まし
くは一70〜50℃において攪拌等を行なえばよい。こ
のとき、使用するグリニヤール試薬等の有機マグネシウ
ム化合物の量は、不純物として含まれているハロゲン化
有機化合物等の1〜1000倍モル量が好ましく、特に
1〜100倍モル量が好ましい。また、グリニヤール試
薬を溶かす溶媒としては、エチルエーテル、ブチルエー
テル、テトラヒドロフランのようなエーテル類が好まし
い。また、この種のエーテル類と併用して、ベンゼン、
トルエン、キシレン、ヘキサンのようなグリニヤール試
薬に対して不活性な溶媒も利用できる。接触処理時間は
比較的短時間でもよいが、通常は1時間から10時間程
度が望ましい。処理後混合物を濾過し、濾液を蒸留する
か、或は水洗後、水溶液層を分離した後に、蒸留すれば
目的の精製シランや精製シロキサンが得られる。To bring an organomagnesium compound such as a Grignard reagent into contact with an organosilicon compound containing impurities, the Grignard reagent or the like is added to the organosilicon compound as a solution in a suitable aqueous solvent, preferably at -70 to 100°C, particularly preferably at -100°C. Stirring etc. may be performed at 70 to 50°C. At this time, the amount of the organomagnesium compound such as the Grignard reagent used is preferably 1 to 1000 times the molar amount of the halogenated organic compound contained as an impurity, particularly preferably 1 to 100 times the molar amount. Moreover, as a solvent for dissolving the Grignard reagent, ethers such as ethyl ether, butyl ether, and tetrahydrofuran are preferable. In addition, benzene,
Solvents that are inert to Grignard reagents such as toluene, xylene, and hexane are also available. Although the contact treatment time may be relatively short, it is usually desirably about 1 hour to 10 hours. The target purified silane or purified siloxane can be obtained by filtering the treated mixture and distilling the filtrate, or by washing with water, separating the aqueous solution layer, and then distilling it.
本発明の方法により不純物を容易に分離することができ
る真の理由は明らかではないが、シラン類やシロキサン
類の有機ケイ素化合物中の不純物がグリニヤール試薬等
の有機マグネシウム化合物に吸着されるか、或いは有機
ケイ素化合物と有機マグネシウム化合物との反応生成物
に吸着される結果、分離が容易になるためと推定される
。The true reason why impurities can be easily separated by the method of the present invention is not clear, but the reason is that impurities in organosilicon compounds such as silanes and siloxanes are adsorbed to organomagnesium compounds such as Grignard reagents, or It is presumed that this is because separation becomes easier as a result of adsorption to the reaction product of the organosilicon compound and the organomagnesium compound.
次に本発明を実施例により具体的に説明する。 Next, the present invention will be specifically explained using examples.
実施例1
分析により0.05モルのフェニルブロマイドを含むこ
とが判明しているオクタメチルトリシロキサン5000
g中に、テトラヒドロフランに溶かしたメチルマグネ
シウムクロライドの溶液(濃度1モル)を温度60℃に
加温して加えた。6時間攪拌し、接触させた後に、沈殿
物をガラスフィルターを用いて濾過した。濾液を蒸留し
たところ、4500gのオクタメチルトリシロキサンが
得られた。このオクタメチルトリシロキサン中のフェニ
ルブロマイドを、ガスクロマトグラフィーにより分析し
たところ濃度は9.01ppm以下であった。Example 1 Octamethyltrisiloxane 5000 found by analysis to contain 0.05 moles of phenyl bromide
A solution of methylmagnesium chloride (concentration: 1 mol) dissolved in tetrahydrofuran was added to the solution at a temperature of 60°C. After stirring and contacting for 6 hours, the precipitate was filtered using a glass filter. Distillation of the filtrate yielded 4500 g of octamethyltrisiloxane. When the phenyl bromide in this octamethyltrisiloxane was analyzed by gas chromatography, the concentration was found to be 9.01 ppm or less.
未精製のオクタメチルトリシロキサン(A)、上記で精
製したオクタメチルトリシロキサン(B)及び未精製オ
クタメチルトリシロキサンを単に1回更に蒸留したオク
タメチルトリシロキサン(C)の3種について、シリコ
ンウェハーを用いて、次のように基板テストを行なった
。Three types of octamethyltrisiloxane (A), unpurified octamethyltrisiloxane (B) purified above, and octamethyltrisiloxane (C) obtained by further distilling the unpurified octamethyltrisiloxane once, were prepared on a silicon wafer. A board test was conducted using the following.
シリコン基板テストの方法:
301(長さ)X30m(幅)X5n(厚さ)のシリコ
ン基板表面上に試料のオクタメチルトリシロキサンを乾
燥厚0.1μmに塗り風乾させた。Silicon substrate test method: A sample of octamethyltrisiloxane was applied to a dry thickness of 0.1 μm on the surface of a silicon substrate measuring 301 m (length) x 30 m (width) x 5 n (thickness) and air-dried.
引き続いて20重量%濃度のHF水溶液を表面上に流し
、オクタメチルトリシロキサンを分解除去した。次いで
X線光電子分析(XPS)によりCI3電子によるスペ
クトルを分析して表面状態を調べた。Subsequently, a 20% strength by weight aqueous HF solution was passed over the surface to decompose and remove the octamethyltrisiloxane. Next, the spectrum due to CI3 electrons was analyzed by X-ray photoelectron spectroscopy (XPS) to examine the surface state.
結果は次のとおりであった。The results were as follows.
A(未精製) ・・・炭素が残った。A (unrefined)... Carbon remained.
C(1回蒸留) ・・・炭素が残った。C (single distillation)...Carbon remained.
実施例2
分析によす0.1モルのプロモビフェニルヲ含むことが
判明しているフェニルトリス(トリメチルシロキシ)シ
ラン5000 gの中に、テトラヒドロフランに溶かし
たフェニルマグネシウムクロライドの溶液(濃度1モル
)を温度O℃にて加えた。2時間攪拌し、接触させた後
に、沈殿物をガラスフィルターを用いて濾過した。濾液
を蒸留したところ、4600 gのフェニルトリス(ト
リメチルシロキシ)シランが得られた。このフェニルト
リス(トリメチルシロキシ)シラン中のブロモビフェニ
ルをガスクロマトグラフィーにより分析したところ、そ
の温度はQ、O1ppm以下であった。シリコンウェハ
ーを用いた基板テストを実施例1と同様に未精製、精製
及び1回のみ蒸留の3種のフェニルトリス(トリメチル
シロキシ)シランについて行なった。実施例1と同様の
結果が得られた。Example 2 A solution of phenylmagnesium chloride (concentration 1 mol) in tetrahydrofuran was added to 5000 g of phenyltris(trimethylsiloxy)silane, which was found to contain 0.1 mol of promobiphenyl by analysis. It was added at a temperature of 0°C. After stirring and contacting for 2 hours, the precipitate was filtered using a glass filter. Distillation of the filtrate yielded 4600 g of phenyltris(trimethylsiloxy)silane. When the bromobiphenyl in this phenyltris(trimethylsiloxy)silane was analyzed by gas chromatography, the temperature was found to be below 1 ppm of Q,O. Substrate tests using silicon wafers were conducted in the same manner as in Example 1 for three types of phenyltris(trimethylsiloxy)silane: unpurified, purified, and once distilled. Results similar to those in Example 1 were obtained.
実施例3
分析により0.1モルのフロロビフェニルを含むことが
判明しているフェニルトリエトキシシラン5000 g
中に、テトラヒドロフランに溶かしたメチルマグネシウ
ムブロマイドの溶液(濃度1モル)を温度40℃にて加
えた。10時間攪拌し、接触させた後、沈殿物をガラス
フィルターを用いて濾過した。濾液を1留したところ、
4200 gのフェニルトリエトキシシランが得られた
。このフェニルトリエトキシシラン中のフロロビフェニ
ルをガスクロマトグラフィーで分析したところ、その濃
度は0.01ppm以下であった。シリコンウェハーを
用いた基板テストを実施例1と同様にして未精製。Example 3 5000 g of phenyltriethoxysilane analyzed to contain 0.1 mole of fluorobiphenyl
A solution of methylmagnesium bromide (1 mol concentration) dissolved in tetrahydrofuran was added thereto at a temperature of 40°C. After stirring and contacting for 10 hours, the precipitate was filtered using a glass filter. When one distillate of the filtrate was collected,
4200 g of phenyltriethoxysilane were obtained. Analysis of fluorobiphenyl in this phenyltriethoxysilane by gas chromatography revealed that its concentration was 0.01 ppm or less. A substrate test using a silicon wafer was performed in the same manner as in Example 1, and the product was unpurified.
精製及び1回蒸留のみの3種のフェニルトリエトキシシ
ランについて行なった。実施例1と同様の結果が得られ
た。This study was conducted on three types of phenyltriethoxysilanes that were purified and distilled only once. Results similar to those in Example 1 were obtained.
実施例4
分析によす0.1モルのヨードビフェニルヲ含むことが
判明しているジフェニルジメトキシシラン5000 g
中に、ジブチルエーテル中に)容かしたメチルマグネシ
ウムアイオダイドの?容’f夜(?tr1度1モル)を
、温度30℃にて加えた。7時間攪拌し、接触させた後
、沈殿物をガラスフィルターを用いて濾過した。濾液を
蒸留したところ、4300 gのジフェニルジメトキシ
シランが得られた。このジフェニルジメトキシシラン中
のヨードビフェニルをガスクロマトグラフィーで分析し
たところ、その濃度は0.01ppm以下であった。Example 4 5000 g of diphenyldimethoxysilane, which was found by analysis to contain 0.1 mole of iodobiphenyl.
of methylmagnesium iodide (in dibutyl ether)? The solution was added at a temperature of 30° C. (1 mole per degree). After stirring and contacting for 7 hours, the precipitate was filtered using a glass filter. Distillation of the filtrate yielded 4300 g of diphenyldimethoxysilane. When the iodobiphenyl in this diphenyldimethoxysilane was analyzed by gas chromatography, its concentration was 0.01 ppm or less.
シリコンウェハーを用いた基板テストを実施例1と同様
にして未精製、精製及び1回蒸留のみの3種のジフェニ
ルジメトキシシランについて行なった。実施例1と同様
の結果が得られた。A substrate test using a silicon wafer was conducted in the same manner as in Example 1 for three types of diphenyldimethoxysilane: unpurified, purified, and single distillation only. Results similar to those in Example 1 were obtained.
実施例5
分析により0.1モルのブロモビフェニルを含むことが
判明しているジフェニルジクロロシラン50QOg中に
、テトラヒドロフランに溶かしたフェニルマグネシウム
アイオダイドの溶液(濃度1モル)を、温度10℃にて
加えた。10時間攪拌し、接触させた後に沈殿物をガラ
スフィルターを用いて濾過した。濾液を蒸留したところ
、4370 gのジフェニルジクロロシランが得られた
。このジフェニルジクロロシラン中のブロモビフェニル
をガスクロマトグラフィーにより分析したところ、その
濃度はQ、Qlppm以下であった。Example 5 A solution of phenylmagnesium iodide (concentration: 1 mol) dissolved in tetrahydrofuran was added to 50 QOg of diphenyldichlorosilane, which was found to contain 0.1 mol of bromobiphenyl by analysis, at a temperature of 10°C. Ta. After stirring and contacting for 10 hours, the precipitate was filtered using a glass filter. Distillation of the filtrate yielded 4370 g of diphenyldichlorosilane. When the bromobiphenyl in this diphenyldichlorosilane was analyzed by gas chromatography, its concentration was below Q, Ql ppm.
シリコンウェハーを用いた基板テストを実施例1と同様
にして未精製、精製及び1回蒸留のみの3種のジフェニ
ルジクロロシランについて行なった。実施例1と同様の
結果が得られた。A substrate test using a silicon wafer was conducted in the same manner as in Example 1 for three types of diphenyldichlorosilane: unpurified, purified, and single distillation only. Results similar to those in Example 1 were obtained.
実施例6
分析により0.1モルのクロロベンゼンを含むことが判
明しているジフェニルジクロロシラン5000gの中に
、テトラヒドロフランに溶解させたフェニルマグネシウ
ムクロライド溶液(濃度1モル)を、温度−10℃にて
加えた。3時間攪拌し、接触させた後、ガラスフィルタ
ーを用いて沈殿物を濾過した。濾液を蒸留したところ、
4400 gのジフェニルジクロロシランが得られた。Example 6 A phenylmagnesium chloride solution (concentration 1 mol) dissolved in tetrahydrofuran was added to 5000 g of diphenyldichlorosilane, which was found to contain 0.1 mol of chlorobenzene by analysis, at a temperature of -10°C. Ta. After stirring and contacting for 3 hours, the precipitate was filtered using a glass filter. When the filtrate was distilled,
4400 g of diphenyldichlorosilane were obtained.
このジフェニルジクロロシラン中のクロロベンゼンをガ
スクロマトグラフィーで分析したところ、その温度は0
.01pp清以下であった。When the chlorobenzene in this diphenyldichlorosilane was analyzed by gas chromatography, its temperature was found to be 0.
.. It was less than 0.01 pp clear.
シリコンウェハーを用いた基板テストを実施例1と同様
にして未精製、精製及び1回蒸留のみの3種のジフェニ
ルジクロロシランについて行なった。実施例1と同様の
結果が得られた。A substrate test using a silicon wafer was conducted in the same manner as in Example 1 for three types of diphenyldichlorosilane: unpurified, purified, and single distillation only. Results similar to those in Example 1 were obtained.
実施例7
分析により0.1モルのメチルクロライドを含むことが
判明しているジメチルジクロロシラン5000gの中に
、ジエチルエーテル
グネシウムブロマイドの溶液(濃度1モル)を温度−2
0℃にて加えた。1時間攪拌し、接触させた後に、沈殿
物をガラスフィルターを用いて濾過した。濾液を蒸留し
たところ、4500 gのジメチルジクロロシランが得
られた。このジメチルジクロロシラン中のメチルクロラ
イドをガスクロマトグラフィーで分析したところ、その
濃度は0.01ppm以下であった。Example 7 A solution of diethyl ethergnesium bromide (concentration 1 mol) was added to 5000 g of dimethyldichlorosilane, which was found to contain 0.1 mol of methyl chloride by analysis, at a temperature of -2
Added at 0°C. After stirring and contacting for 1 hour, the precipitate was filtered using a glass filter. Distillation of the filtrate yielded 4500 g of dimethyldichlorosilane. When the methyl chloride in this dimethyldichlorosilane was analyzed by gas chromatography, its concentration was 0.01 ppm or less.
シリコンウェハーを用いた基板テストを実施例1と同様
にして未精製,精製及び1回蒸留のみの3種のジメチル
ジクロロシランについて行なった。A substrate test using a silicon wafer was conducted in the same manner as in Example 1 for three types of dimethyldichlorosilane: unpurified, purified, and single-distilled.
実施例工と同様の結果が得られた。Results similar to those of the example were obtained.
本発明の方法によると、シラン類,シロキサン類等の有
機ケイ素化合物に含まれている微量のハロゲン化有機化
合物を筒便,効率よく除去し、高純度の有機ケイ素化合
物を容易に得ることができる。こうして得られる高純度
の有機ケイ素化合物は半導体工業材料として極めて有用
である。According to the method of the present invention, trace amounts of halogenated organic compounds contained in organosilicon compounds such as silanes and siloxanes can be effectively removed, and highly pure organosilicon compounds can be easily obtained. . The highly purified organosilicon compound thus obtained is extremely useful as a semiconductor industrial material.
Claims (1)
化合物と接触させた後、有機ケイ素化合物を分離するこ
とからなる有機ケイ素化合物の精製方法。A method for purifying an organosilicon compound comprising contacting an organosilicon compound containing impurities with an organomagnesium compound and then separating the organosilicon compound.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22156886A JPS6377887A (en) | 1986-09-19 | 1986-09-19 | Purifying method for organosilicon compound |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22156886A JPS6377887A (en) | 1986-09-19 | 1986-09-19 | Purifying method for organosilicon compound |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6377887A true JPS6377887A (en) | 1988-04-08 |
JPH0344079B2 JPH0344079B2 (en) | 1991-07-04 |
Family
ID=16768769
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22156886A Granted JPS6377887A (en) | 1986-09-19 | 1986-09-19 | Purifying method for organosilicon compound |
Country Status (1)
Country | Link |
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JP (1) | JPS6377887A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0267230A (en) * | 1988-09-02 | 1990-03-07 | Toyo Stauffer Chem Co | Purification of organometallic compound |
JPH02235887A (en) * | 1989-03-09 | 1990-09-18 | Tonen Corp | Removal of chlorine in alkoxysilane |
JP2000128887A (en) * | 1998-10-26 | 2000-05-09 | Degussa Huels Ag | Neutralization and decreasing of remaining halogen content in alkoxysilane or composition consisting essentially of alkoxysilane |
-
1986
- 1986-09-19 JP JP22156886A patent/JPS6377887A/en active Granted
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0267230A (en) * | 1988-09-02 | 1990-03-07 | Toyo Stauffer Chem Co | Purification of organometallic compound |
JPH0529371B2 (en) * | 1988-09-02 | 1993-04-30 | Tosoo Akuzo Kk | |
JPH02235887A (en) * | 1989-03-09 | 1990-09-18 | Tonen Corp | Removal of chlorine in alkoxysilane |
JP2000128887A (en) * | 1998-10-26 | 2000-05-09 | Degussa Huels Ag | Neutralization and decreasing of remaining halogen content in alkoxysilane or composition consisting essentially of alkoxysilane |
Also Published As
Publication number | Publication date |
---|---|
JPH0344079B2 (en) | 1991-07-04 |
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