JPS6371681A - 粒子線入射位置検出装置 - Google Patents

粒子線入射位置検出装置

Info

Publication number
JPS6371681A
JPS6371681A JP61215400A JP21540086A JPS6371681A JP S6371681 A JPS6371681 A JP S6371681A JP 61215400 A JP61215400 A JP 61215400A JP 21540086 A JP21540086 A JP 21540086A JP S6371681 A JPS6371681 A JP S6371681A
Authority
JP
Japan
Prior art keywords
microchannel plate
strip conductor
incident position
plate
position detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61215400A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0518393B2 (https=
Inventor
Koichiro Oba
大庭　弘一郎
Shieepusu Uirufuriido
ウィルフリード，シェープス
Takuu Dabitsudo
ダビッド，タクー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority to JP61215400A priority Critical patent/JPS6371681A/ja
Priority to US07/095,262 priority patent/US4882480A/en
Publication of JPS6371681A publication Critical patent/JPS6371681A/ja
Publication of JPH0518393B2 publication Critical patent/JPH0518393B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
    • H01J43/04—Electron multipliers
    • H01J43/06—Electrode arrangements
    • H01J43/18—Electrode arrangements using essentially more than one dynode
    • H01J43/24—Dynodes having potential gradient along their surfaces
    • H01J43/246—Microchannel plates [MCP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
    • H01J43/04—Electron multipliers
    • H01J43/045—Position sensitive electron multipliers

Landscapes

  • Measurement Of Radiation (AREA)
JP61215400A 1986-09-12 1986-09-12 粒子線入射位置検出装置 Granted JPS6371681A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP61215400A JPS6371681A (ja) 1986-09-12 1986-09-12 粒子線入射位置検出装置
US07/095,262 US4882480A (en) 1986-09-12 1987-09-11 Apparatus for detecting the position of incidence of particle beams including a microchannel plate having a strip conductor with combed teeth

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61215400A JPS6371681A (ja) 1986-09-12 1986-09-12 粒子線入射位置検出装置

Publications (2)

Publication Number Publication Date
JPS6371681A true JPS6371681A (ja) 1988-04-01
JPH0518393B2 JPH0518393B2 (https=) 1993-03-11

Family

ID=16671696

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61215400A Granted JPS6371681A (ja) 1986-09-12 1986-09-12 粒子線入射位置検出装置

Country Status (2)

Country Link
US (1) US4882480A (https=)
JP (1) JPS6371681A (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002543573A (ja) * 1999-04-30 2002-12-17 エックスカウンター アーベー 固体コンバーターを備えたｘ線検出ユニット
JP2012033370A (ja) * 2010-07-30 2012-02-16 Tohoku Univ Ｘ線検出システム

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0365882A (ja) * 1989-08-04 1991-03-20 Hamamatsu Photonics Kk 超高速ゲート装置
ES2366291B1 (es) * 2010-02-12 2012-08-30 Consejo Superior De Investigaciones Científicas (Csic) Detector de radiación ionizante sensible a la posicion 2d.

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4024390A (en) * 1976-04-09 1977-05-17 The United States Of America As Represented By The Secretary Of The Army Two microchannel plate picture element array image intensifier tube and system
US4086486A (en) * 1976-06-08 1978-04-25 Richard Lee Bybee One dimensional photon-counting detector array
US4051468A (en) * 1976-07-28 1977-09-27 Rca Corporation Apparatus and method for modulating a flat panel display device
US4109178A (en) * 1977-05-05 1978-08-22 Rca Corporation Electron multiplier with switchable beam confinement structure
US4184069A (en) * 1978-03-28 1980-01-15 The United States Of America As Represented By The Secretary Of The Army Orthogonal array faceplate wafer tube display
GB2124017B (en) * 1982-06-16 1985-10-16 Philips Electronic Associated A deflection colour selection system for a single beam channel plate display tube
US4555731A (en) * 1984-04-30 1985-11-26 Polaroid Corporation Electronic imaging camera with microchannel plate
JPS6286656A (ja) * 1985-10-11 1987-04-21 Murata Mfg Co Ltd チヤネルプレ−トの製造方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002543573A (ja) * 1999-04-30 2002-12-17 エックスカウンター アーベー 固体コンバーターを備えたｘ線検出ユニット
JP2012033370A (ja) * 2010-07-30 2012-02-16 Tohoku Univ Ｘ線検出システム

Also Published As

Publication number Publication date
US4882480A (en) 1989-11-21
JPH0518393B2 (https=) 1993-03-11

Similar Documents

Publication Publication Date Title
US7141785B2 (en) Ion detector
US5644128A (en) Fast timing position sensitive detector
EP0602982A1 (en) Focused electron-bombarded detector
EP1640712B1 (en) Time-resolved measurement device and position-sensitive electron multiplier tube
Odland et al. A fast position sensitive microchannel plate detector for ray-tracing of charged particles
JP2009289693A (ja) 荷電粒子検出器
JPS5917500B2 (ja) 中性粒子検出装置
US6906318B2 (en) Ion detector
US3240931A (en) Spatial discriminator for particle beams
US4217489A (en) Device for location-sensitive detection of photon and/or particle radiation
JPS6371681A (ja) 粒子線入射位置検出装置
Knibbeler et al. Novel two‐dimensional position‐sensitive detection system
US5453609A (en) Non cross talk multi-channel photomultiplier using guided electron multipliers
US3965354A (en) Resistive anode image converter
Leskovar et al. Time resolution performance studies of contemporary high speed photomultipliers
Boutot et al. Ultrahigh-speed microchannel photomultiplier
Burroughs Collection efficiency of continuous dynode electron multiple arrays
CN114520141A (zh) 用于检测荷电粒子或光的检测器
US3601612A (en) Wire spark chamber with magnetostrictive readout
US3184633A (en) Semiconductive electron multiplier
US3941997A (en) Method and a device for localizing a light impact on the photocathode of a photomultiplier
Kerns Improved time response in scintillation counting
Lapington et al. The capacitive division image readout: a novel imaging device for microchannel plate detectors
US3413479A (en) Radiation detector and amplifier having an input axial slot
CN111508800B (zh) 应用于穿越辐射探测器的放大单元的制备方法