JPS6367672B2 - - Google Patents

Info

Publication number
JPS6367672B2
JPS6367672B2 JP15744580A JP15744580A JPS6367672B2 JP S6367672 B2 JPS6367672 B2 JP S6367672B2 JP 15744580 A JP15744580 A JP 15744580A JP 15744580 A JP15744580 A JP 15744580A JP S6367672 B2 JPS6367672 B2 JP S6367672B2
Authority
JP
Japan
Prior art keywords
partial discharge
voltage
dielectric breakdown
pulse
insulation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP15744580A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5780576A (en
Inventor
Isao Tani
Kyoshi Otozaki
Makoto Tsukiji
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP15744580A priority Critical patent/JPS5780576A/ja
Publication of JPS5780576A publication Critical patent/JPS5780576A/ja
Publication of JPS6367672B2 publication Critical patent/JPS6367672B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Relating To Insulation (AREA)
JP15744580A 1980-11-07 1980-11-07 Detecting method for dielectric breakdown Granted JPS5780576A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15744580A JPS5780576A (en) 1980-11-07 1980-11-07 Detecting method for dielectric breakdown

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15744580A JPS5780576A (en) 1980-11-07 1980-11-07 Detecting method for dielectric breakdown

Publications (2)

Publication Number Publication Date
JPS5780576A JPS5780576A (en) 1982-05-20
JPS6367672B2 true JPS6367672B2 (de) 1988-12-27

Family

ID=15649806

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15744580A Granted JPS5780576A (en) 1980-11-07 1980-11-07 Detecting method for dielectric breakdown

Country Status (1)

Country Link
JP (1) JPS5780576A (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009168474A (ja) * 2008-01-10 2009-07-30 Nippon Technart Inc 絶縁耐電圧試験方法及び装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62106168U (de) * 1985-12-24 1987-07-07

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009168474A (ja) * 2008-01-10 2009-07-30 Nippon Technart Inc 絶縁耐電圧試験方法及び装置

Also Published As

Publication number Publication date
JPS5780576A (en) 1982-05-20

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