JPS6363868B2 - - Google Patents
Info
- Publication number
- JPS6363868B2 JPS6363868B2 JP55083595A JP8359580A JPS6363868B2 JP S6363868 B2 JPS6363868 B2 JP S6363868B2 JP 55083595 A JP55083595 A JP 55083595A JP 8359580 A JP8359580 A JP 8359580A JP S6363868 B2 JPS6363868 B2 JP S6363868B2
- Authority
- JP
- Japan
- Prior art keywords
- dropping
- current
- test liquid
- opposing electrodes
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 43
- 239000007788 liquid Substances 0.000 claims description 20
- 230000015556 catabolic process Effects 0.000 description 16
- 239000000463 material Substances 0.000 description 8
- 239000011810 insulating material Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 238000011156 evaluation Methods 0.000 description 5
- 239000000428 dust Substances 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Relating To Insulation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8359580A JPS578465A (en) | 1980-06-19 | 1980-06-19 | Testing device for tracking resistance property |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8359580A JPS578465A (en) | 1980-06-19 | 1980-06-19 | Testing device for tracking resistance property |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS578465A JPS578465A (en) | 1982-01-16 |
| JPS6363868B2 true JPS6363868B2 (enrdf_load_html_response) | 1988-12-08 |
Family
ID=13806836
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8359580A Granted JPS578465A (en) | 1980-06-19 | 1980-06-19 | Testing device for tracking resistance property |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS578465A (enrdf_load_html_response) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01306949A (ja) * | 1988-06-03 | 1989-12-11 | Sharp Corp | カレンダー機能付電子機器 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5847595B2 (ja) * | 2012-01-16 | 2016-01-27 | 株式会社アドバンテスト | 検出装置および検出方法 |
-
1980
- 1980-06-19 JP JP8359580A patent/JPS578465A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01306949A (ja) * | 1988-06-03 | 1989-12-11 | Sharp Corp | カレンダー機能付電子機器 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS578465A (en) | 1982-01-16 |
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