JPS6361971A - Test head rack - Google Patents

Test head rack

Info

Publication number
JPS6361971A
JPS6361971A JP61207489A JP20748986A JPS6361971A JP S6361971 A JPS6361971 A JP S6361971A JP 61207489 A JP61207489 A JP 61207489A JP 20748986 A JP20748986 A JP 20748986A JP S6361971 A JPS6361971 A JP S6361971A
Authority
JP
Japan
Prior art keywords
test head
ball
socket
supporter
fixing jig
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61207489A
Other languages
Japanese (ja)
Other versions
JPH0797126B2 (en
Inventor
Yukihiro Tominaga
冨永　幸弘
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP61207489A priority Critical patent/JPH0797126B2/en
Publication of JPS6361971A publication Critical patent/JPS6361971A/en
Publication of JPH0797126B2 publication Critical patent/JPH0797126B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To shorten the loss of time due to a fine adjustment of an automatic machine which is connected by providing a ball universal supporter where a test head is mounted so that the angle of an IC socket provided to the test head is freely varied. CONSTITUTION:The rack consists of the IC socket 2 mounted on the test head 1, a test head fixing jig 4 as a ball part where the test head 1 is stored and fixed, the ball universal supporter 5a where the fixing jig 4 is supported rotatably, and a base 3 where the supporter 5a is fixed. Then when an adjustment is so made that the surface of the IC socket 2 is perpendicular to the pin of an automatic machine measurement part, the angle is corrected by moving the spherical surface of the ball-shaped fixing jig 4 fixed rotatably to the supporter 5a along the reverse surface of the supporter 5a. Consequently, the angle of the IC socket 2 is easily and finely adjusted without lifting the test head rack by a human hand.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、自動機等の被テスト装置をテストするため
のテストヘッドを該被テスト装置に接続可能な状態に支
持するための支持具に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a support for supporting a test head for testing a device under test such as an automatic machine so that it can be connected to the device under test. It is something.

〔従来の技術〕[Conventional technology]

第２図は従来のテストヘッド架台を示す外観図であり、
図において、３は支持台、５は支持台３に装着されたテ
ストヘッド固定治具、１はテストヘッド固定治具５によ
り固定されたテストヘッド、２はテストヘッド１に装着
されたＩＣソケットである。第３図は第２図に示す従来
例の使用時の様子を示す図であり、図において、６はＩ
Ｃソケット２に脱着自在に取り付けられた被テスト装置
である自動機の測定部、７は該自ｌＪＪ機測定部６が収
納された自動機本体である。FIG. 2 is an external view showing a conventional test head mount.
In the figure, 3 is a support stand, 5 is a test head fixing jig attached to the support stand 3, 1 is a test head fixed by the test head fixing jig 5, and 2 is an IC socket attached to the test head 1. be. FIG. 3 is a diagram showing how the conventional example shown in FIG. 2 is used, and in the diagram, 6 is an I
The measurement section 7 of the automatic machine, which is the device under test, is detachably attached to the C socket 2, and 7 is the main body of the automatic machine in which the IJJ machine measurement section 6 is housed.

次に動作について説明する。第３図に示すように、自動
機をテストする際にＩＣソケット２のソケット面は自動
機測定部６のビンに対して、垂直を形成してビンを挿入
する必要がある。この従来のテストヘッド架台では、床
面の凹凸によってソケット面が自動機測定部６のビンに
対して垂直とならない場合、その垂直を形成する動作を
支持台３を人の手で持ち上げ、移動することにより行っ
ていた。Next, the operation will be explained. As shown in FIG. 3, when testing an automatic machine, the socket surface of the IC socket 2 must be perpendicular to the bin of the automatic machine measuring section 6 when inserting the bottle. In this conventional test head mount, when the socket surface is not perpendicular to the bin of the automatic measuring unit 6 due to unevenness of the floor surface, the operation to make it perpendicular is to manually lift and move the support stand 3. I was doing it because of this.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

従来のテストヘッド架台は、以上のように構成されてい
るので、設置場所の床面の水平度や接続する自動機測定
部の交換時の微調整に長く時間を取られるという問題点
があった。Conventional test head mounts are configured as described above, which has the problem of taking a long time to make fine adjustments to the levelness of the floor surface where the test head is installed and when replacing the connected automatic measuring device. .

この発明は、上記のような問題点を解消するためになさ
れたもので、接続する自動機の微調整による時間のロス
を短縮させるテストヘッド架台を得ることを目的とする
。The present invention has been made to solve the above-mentioned problems, and an object of the present invention is to provide a test head mount that reduces time loss due to fine adjustment of connected automatic machines.

〔問題点を解決するための手段〕[Means for solving problems]

この発明に係るテストヘッド架台は、テストヘッドに設
けられるＩＣソケットの角度を可変自在なように上記テ
ストへソドを搭載する角度可変支持具を備えたものであ
る。The test head mount according to the present invention is provided with a variable angle support for mounting the test head on the test head so that the angle of the IC socket provided on the test head can be varied.

〔作用〕[Effect]

この発明におけるテストヘッド架台は、テストヘッドに
設けられたＩＣソケットの角度を可変自在なように上記
テストヘッドを搭載することのできる角度可変支持具を
備えたから、テストヘッド部を角度調整のために自在に
動かせる。The test head mount according to the present invention is provided with a variable angle support on which the test head can be mounted so that the angle of the IC socket provided on the test head can be freely changed. Can be moved freely.

〔実施例〕〔Example〕

以下、この発明の一実施例を図について説明する。第１
図は本発明の一実施例によるテストヘッド架台を示す外
観図であり、図において、１はテストヘッド、２はテス
トヘッド１に装着されたＩＣソケット、４はテストヘッ
ド１を収納固定するボール部であるテストヘッド固定治
具、５ａはテストヘッド固定治具４を回転自在に支持す
るボール自在支持具、３はボール自在支持具５ａを固定
す°る支持台である。An embodiment of the present invention will be described below with reference to the drawings. 1st
The figure is an external view showing a test head mount according to an embodiment of the present invention. In the figure, 1 is a test head, 2 is an IC socket attached to the test head 1, and 4 is a ball part for storing and fixing the test head 1. The test head fixing jig 5a is a ball free support that rotatably supports the test head fixing jig 4, and 3 is a support base that fixes the ball free support 5a.

次に動作について説明する。第１図において、ＩＣソケ
ット２の面が第３図に示す自動機測定部６のビンに対し
て、垂直を形成するように調整する場合、第１図のボー
ル自在支持具５ａに回転自在に固定されたボール状のテ
ストヘッド固定治具４の表球面をボール自在支持具５ａ
の裏面にそって動かすことにより、角度修正を行う。Next, the operation will be explained. In FIG. 1, when the surface of the IC socket 2 is adjusted to be perpendicular to the bin of the automatic measuring unit 6 shown in FIG. The spherical surface of the fixed ball-shaped test head fixing jig 4 is attached to the ball flexible support 5a.
Adjust the angle by moving it along the back side of the

以上のように、本実施例においては、テストヘッド１を
ボール状のテストヘッド固定治具４に固定し、該ボール
状のテストヘッド固定治具４をこれを回転自在に固定す
るボール自在支持具５ａで回転自在に支持するように構
成したから、ＩＣソケット２の角度の微調整がテストヘ
ッド架台を人の手で持ち上げて行うことなく簡単にでき
る。As described above, in this embodiment, the test head 1 is fixed to the ball-shaped test head fixing jig 4, and the ball-shaped test head fixing jig 4 is fixed to the ball-shaped test head fixing jig 4 with a ball-shaped flexible support that rotatably fixes the test head 1. Since it is configured to be rotatably supported by the test head 5a, the angle of the IC socket 2 can be easily finely adjusted without lifting the test head stand manually.

なお、上記実施例では第２図でボール状テストヘッド固
定治具４はその自動機側のみ切り取った形としたが、該
治具は微調整部分であるため、ボール自在支持具５ａの
支持する強度が許す限り、そのボール自在支持具５ａ、
及びボール状テストヘッド固定治具７輪方向の削り込み
を行ってもよい。In the above embodiment, only the automatic machine side of the ball-shaped test head fixing jig 4 is cut out in FIG. As far as strength allows, the ball flexible support 5a,
Alternatively, cutting may be performed in the direction of the seven wheels of the ball-shaped test head fixing jig.

またボール自在支持具は第１図に示すものに限るもので
はなく、例えば第４図に示すものであってもよく、さら
に他の形状であってもよい。Further, the ball flexible support is not limited to the one shown in FIG. 1, but may be one shown in FIG. 4, for example, or may have other shapes.

また、上記実施例では手動によってボール状テストヘッ
ド固定治具４を動かす例を示したが、これにマニピュレ
ータ等の電動装置を付け、作業をより簡単化することも
可能である。Further, in the above embodiment, an example was shown in which the ball-shaped test head fixing jig 4 was moved manually, but it is also possible to attach an electric device such as a manipulator to this to further simplify the work.

〔発明の効果〕〔Effect of the invention〕

以上のように、この発明によれば、テストヘッド架台に
おいて、テストヘッドに取り付けられるヘッドを搭載す
る角度可変支持具を備え、ＩＣソケットの角度を自在に
変えることが可能なように構成したので、角度調整の作
業時間が短縮され、また、精度の高いものが得られる効
果がある。As described above, according to the present invention, the test head mount is provided with a variable angle support on which the head attached to the test head is mounted, so that the angle of the IC socket can be freely changed. This has the effect of shortening the work time for angle adjustment and providing highly accurate results.

【図面の簡単な説明】[Brief explanation of the drawing]

第１図はこの発明の一実施例によるテストヘッド架台の
見取図、第２図はこの発明の従来のテストヘッド架台の
見取図、第３図はＩＣソケットと自動機との接続の様子
を示す側面図、第４図は本発明の他の実施例によるテス
トヘッド架台の見取図である。 １はテストヘッド、２はＩＣソケット、３は支持台、４
はボール状テストヘッド固定治具、５はテストヘッド固
定治具、５ａはボール自在支持具、６は被テスト装置測
定部、７は被テスト装置本体。 なお図中同一符号は同−又は相当部分を示す。FIG. 1 is a sketch of a test head mount according to an embodiment of the present invention, FIG. 2 is a sketch of a conventional test head mount of this invention, and FIG. 3 is a side view showing how an IC socket is connected to an automatic machine. , FIG. 4 is a sketch of a test head mount according to another embodiment of the present invention. 1 is a test head, 2 is an IC socket, 3 is a support stand, 4
5 is a ball-shaped test head fixing jig, 5 is a test head fixing jig, 5a is a ball flexible support, 6 is a measuring section of the device to be tested, and 7 is the main body of the device to be tested. Note that the same reference numerals in the figures indicate the same or equivalent parts.

Claims (2)

【特許請求の範囲】[Claims] （１）被テスト装置に対する、テストヘッドに設けられ
るＩＣソケットの角度を可変自在なように上記テストヘ
ッドを搭載する角度可変支持具を備えたことを特徴とす
るテストヘッド架台。(1) A test head mount comprising a variable angle support on which the test head is mounted so that the angle of an IC socket provided on the test head can be freely changed with respect to a device under test. （２）上記角度可変支持具は、テストヘッド部を収納固
定するボール部と、、そのボール部を回転自在に支持す
るボール自在支持具とからなることを特徴とする特許請
求の範囲第１項記載のテストヘッド架台。(2) The variable angle support comprises a ball portion that houses and fixes the test head portion, and a flexible ball support that rotatably supports the ball portion. Test head mount as described.
JP61207489A 1986-09-03 1986-09-03 Test head mount Expired - Lifetime JPH0797126B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61207489A JPH0797126B2 (en) 1986-09-03 1986-09-03 Test head mount

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61207489A JPH0797126B2 (en) 1986-09-03 1986-09-03 Test head mount

Publications (2)

Publication Number Publication Date
JPS6361971A true JPS6361971A (en) 1988-03-18
JPH0797126B2 JPH0797126B2 (en) 1995-10-18

Family

ID=16540576

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61207489A Expired - Lifetime JPH0797126B2 (en) 1986-09-03 1986-09-03 Test head mount

Country Status (1)

Country Link
JP (1) JPH0797126B2 (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6035271U (en) * 1983-08-19 1985-03-11 日立電子エンジニアリング株式会社 Flexible joint mechanism of connection board

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6035271U (en) * 1983-08-19 1985-03-11 日立電子エンジニアリング株式会社 Flexible joint mechanism of connection board

Also Published As

Publication number Publication date
JPH0797126B2 (en) 1995-10-18

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