JPS6361788U - - Google Patents
Info
- Publication number
- JPS6361788U JPS6361788U JP15744086U JP15744086U JPS6361788U JP S6361788 U JPS6361788 U JP S6361788U JP 15744086 U JP15744086 U JP 15744086U JP 15744086 U JP15744086 U JP 15744086U JP S6361788 U JPS6361788 U JP S6361788U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- socket
- probe
- terminals
- bent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 12
- 238000005452 bending Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Connecting Device With Holders (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986157440U JPH0537437Y2 (en:Method) | 1986-10-14 | 1986-10-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986157440U JPH0537437Y2 (en:Method) | 1986-10-14 | 1986-10-14 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6361788U true JPS6361788U (en:Method) | 1988-04-23 |
| JPH0537437Y2 JPH0537437Y2 (en:Method) | 1993-09-21 |
Family
ID=31079988
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1986157440U Expired - Lifetime JPH0537437Y2 (en:Method) | 1986-10-14 | 1986-10-14 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0537437Y2 (en:Method) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1998033248A1 (en) * | 1997-01-29 | 1998-07-30 | The Furukawa Electric Co., Ltd. | Ic socket |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS593029A (ja) * | 1982-06-23 | 1984-01-09 | Hitachi Cable Ltd | 偏波面保存光フアイバのプリフオ−ム製造方法 |
| JPS6029373U (ja) * | 1983-07-30 | 1985-02-27 | 日本電気ホームエレクトロニクス株式会社 | コンタクトプロ−ブピン |
| US4508405A (en) * | 1982-04-29 | 1985-04-02 | Augat Inc. | Electronic socket having spring probe contacts |
| JPS60142529A (ja) * | 1983-12-28 | 1985-07-27 | Yokowo Mfg Co Ltd | 回路基板等の検査装置 |
-
1986
- 1986-10-14 JP JP1986157440U patent/JPH0537437Y2/ja not_active Expired - Lifetime
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4508405A (en) * | 1982-04-29 | 1985-04-02 | Augat Inc. | Electronic socket having spring probe contacts |
| JPS593029A (ja) * | 1982-06-23 | 1984-01-09 | Hitachi Cable Ltd | 偏波面保存光フアイバのプリフオ−ム製造方法 |
| JPS6029373U (ja) * | 1983-07-30 | 1985-02-27 | 日本電気ホームエレクトロニクス株式会社 | コンタクトプロ−ブピン |
| JPS60142529A (ja) * | 1983-12-28 | 1985-07-27 | Yokowo Mfg Co Ltd | 回路基板等の検査装置 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1998033248A1 (en) * | 1997-01-29 | 1998-07-30 | The Furukawa Electric Co., Ltd. | Ic socket |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0537437Y2 (en:Method) | 1993-09-21 |