JPS6361151A - Apparatus for measuring contamination of insulator - Google Patents

Abstract

PURPOSE:To reduce the cost required in the measurement of the contamination of an insulator, in an apparatus irradiating the insulator with ultraviolet rays to receive the reflected light from said insulator, by operating the reflectivity ratio of received lights to the different wavelength of ultraviolet rays to compare the same with that of a normal insulator. CONSTITUTION:The ultraviolet rays from a light source 1 are allowed to pass through a modulator 3 to be separated into ultraviolet rays and disturbance light to irradiate an insulator 4. The reflected light from the insulator 4 is received by a semipermeable mirror 6 and the transmitted light from said mirror 6 is allowed to pass through a filter 7 to be received by a light receiver 9 and the reflected light therefrom is allowed to pass through a filter 8 to be received by a light receiver 10. Wavelength lambda0, lambda1 of ultraviolet rays are received by the filters 7, 8 and converted to electric signals corresponding to the reception of light by the light receivers 9, 10 to be sent to amplifiers 11, 12. Said electric signals are further sent to an arithmetic processor 13 to operate the ratio I0/I1 of light receiving intensities and the reflectivity ratio of the received lights is compared with that of a normal insulator to measure the degree of contamination. Since the reflectivity ratio of the different wavelengths of ultraviolet rays is calculated, the contamination of the actually used insulator can be measured from a long distance and measuring cost can be reduced.

Description

DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to an insulator fouling measuring device that can measure the adhesion of fouling substances such as salt, soil, and soot to insulators.

(Conventional technology) Conventionally, ground faults occur when fouling substances such as salt, soil, soot, etc. adhere to insulators. Treatments such as removing contaminants from the insulator are carried out to prevent ground faults from occurring.

By the way, as a means to measure the degree of adhesion of the contaminants to the insulator, conventional methods include: (1) Installing an insulator for contamination measurement in a substation, etc., separately from the insulator for actual operation; A means of washing off the contaminants using a brush or the like while running water, storing an aqueous solution containing the contaminants in a container, and analyzing the aqueous solution to measure the degree of contamination of the insulator;
A contamination measurement insulator with the contamination substance attached is moistened with water vapor, etc., and a high voltage is applied between the electrodes of the insulator, and the contamination measurement is detected based on the current flowing through the insulator. Means for measuring the degree are known.

(Problems to be solved by the invention) However, the conventionally known means of ■ and ■
In both cases, a contamination measurement insulator separate from the actual use insulator is used, and the degree of contamination of the contamination measurement insulator is regarded as the degree of contamination of the actual use insulator. The problem is that it cannot be measured.

In addition, separate pollution measurement insulators must be installed at each substation, each power plant, and each power transmission tower, etc., separately from the actual operation insulators, which poses the problem of high costs and remote control. There is also the problem that it is not possible to measure the contamination of actually used insulators.

(Object of the Invention) Therefore, an object of the present invention is to measure insulator contamination, which can reduce the cost of measuring contamination of actually used insulators, and which can also measure contamination of actually used insulators from a distance. The goal is to provide equipment.

(Means for Solving the Problems) The present invention provides that when contaminants such as salt, soil, and soot adhere to an insulator, the reflectance curve of ultraviolet light reflected by the actually used insulator to which the contaminant has adhered changes. This was done by focusing on the phenomenon that the reflectance curve of ultraviolet light reflected by a sound insulator to which no fouling substances are attached is different, and is a feature of the insulator fouling measuring device according to the present invention. consists of an irradiation optical system that irradiates ultraviolet light toward the insulator, a light receiving optical system that receives the ultraviolet light reflected by the insulator, and a light receiving optical system that receives the ultraviolet light reflected by the insulator. and an arithmetic processing unit that calculates the ratio of each reflectance at different ultraviolet wavelengths, and determines whether each of the mutually different ultraviolet wavelengths is a sound insulator or a contaminated insulator based on the calculation result of the arithmetic processing unit. The location was selected so that it could be determined whether or not.

(Function) According to the insulator contamination measuring device according to the present invention, when ultraviolet irradiation light is irradiated toward the actual insulator from the irradiation optical system, the ultraviolet irradiation light is reflected by the actual insulator and is received by the light receiving optical system. be done. If the actual insulator is contaminated with a contaminant, the ratio of each reflectance at different ultraviolet wavelengths of the ultraviolet irradiation light is the ratio of each reflectance of the actual insulator that is not contaminated with the contaminant. significantly different from the ratio. Therefore, it is possible to determine whether or not the actual insulator is contaminated with a contaminating substance from the difference in the reflectance ratio based on the arithmetic processing result of the arithmetic processing section.

(Example) Hereinafter, an example of the insulator stain measuring device according to the present invention will be described with reference to the drawings.

FIG. 2 is a diagram showing a reflectance curve with respect to wavelength using insulator stain as a parameter in order to explain the principle of the insulator stain measuring device according to the present invention. In FIG. 2, the horizontal axis is the wavelength WL of light, The vertical axis is the reflectance T, where the symbol A is the reflectance curve of a sound insulator with no fouling substances attached, the symbol B is the reflectance curve of an insulator with salt attached as a fouling substance, and the symbol C is the reflectance curve of an insulator with salt attached as a fouling substance. The reflectance curve of an insulator with soil and salt attached to it, and the sign shown is the reflectance curve of an insulator with soot attached as a contaminant.

As is clear from this Figure 2, the ultraviolet wavelength is approximately 320
nm or less, the ultraviolet reflectance T is approximately constant regardless of whether it is a sound insulator or a contaminated insulator, and in the case of a contaminated insulator that has fouling substances such as salt, soil, and soot attached. It can be seen that the ultraviolet reflectance T of the insulator is larger than that of a sound insulator to which no contaminants are attached. This difference in the ultraviolet reflectance T is related to the intensity of the reflected ultraviolet light, so if there is a healthy insulator near a contaminated insulator, ultraviolet irradiation light with a wavelength of 320 nm or less is applied to the contaminated insulator and the healthy insulator, respectively. By comparing the intensity of the ultraviolet light reflected from the contaminated insulator with the intensity of the ultraviolet light reflected from the sound insulator, it is possible to measure the contamination of the insulator. - Since the sound insulator to be compared is not necessarily located near the actually used insulator, it is not possible to measure the contamination of the actually used insulator through this comparison.

It is conceivable to simply irradiate an actual insulator with ultraviolet light with a wavelength of 320 nm or less and measure the contamination of the actual insulator based on the intensity of the reflected light, without comparing with a healthy insulator, but in the case of remote measurement, There is absorption of ultraviolet irradiation light by the atmosphere, and the reflectance due to the staining of the insulator includes this absorption due to the atmosphere, and it is not possible to conclude that the reflectance obtained by measurement is the reflectance due to the staining of the insulator. Therefore, it is also not possible to simply irradiate a practical insulator with ultraviolet light having a wavelength of 320 nm or less and measure the staining of the practical insulator based on the intensity of the reflected light.

By the way, if the insulator is contaminated, the wavelength of 320 nm ~
Even in the 400nn+ ultraviolet range, the reflectance curves B and C
, D are different from the reflectance curve A of the sound insulator.

In other words, regardless of whether the insulator is a sound insulator or a contaminated insulator, the reflectance T attenuates as the wavelength of ultraviolet rays becomes shorter, but the manner of attenuation differs between a sound insulator and a soiled insulator. The ultraviolet wavelength λ is below 320 nm. and ultraviolet wavelength λ within the range of ultraviolet wavelength 320 nm to 400 nm, and each ultraviolet wavelength λ. , the reflectance at λ1 is To, T, and the ratio of the reflectance at each ultraviolet wavelength is X=To/T,
Considering this, it is expected that there will be a large difference between the case of a sound insulator and the case of a contaminated insulator. In fact, a mercury lamp is used as a light source for ultraviolet irradiation light, and the spectral line λ of the mercury lamp is λ, = 254r+n+, as the ultraviolet wavelength for measurement.
When λ1=365 nm is selected, the reflectance ratio of the sound insulator is X=T.

/T□ was 0.16, whereas in the case of a soiled insulator with salt adhesion, X = 0.30, in the case of a soiled insulator with soil and salt adhesion, X = 0.5, and soot adhesion. In the case of the soiled insulator, X=0.63. This is a sufficiently large difference to determine whether the insulator is sound or contaminated.

Here, the ultraviolet wavelength λ. It is desirable to select 220 nm or more to avoid wavelength dependence of ultraviolet absorption in the atmosphere as much as possible.

Therefore, the ultraviolet wavelength λ. , λ1, the irradiation intensity of the ultraviolet irradiation light is 80, Sl, the ultraviolet wavelength λ. , λ, the absorption rate of ultraviolet light in each atmosphere is 80. al, and the actual insulator is measured from a distance Y apart, the intensity of the reflected light of the ultraviolet irradiation I0,
))2. ,,++■I,=S□・T1・(1-exp
(-al・Y))2... ・=■, and assuming that the ultraviolet absorption rate is constant regardless of the wavelength, a o= a
Since it is 1, it is engineering. /T□=X-S, /S engineering...
・Equation 0 holds true.

Therefore, by appropriately selecting different ultraviolet wavelengths from the ultraviolet irradiation light, the intensity ratio S of the ultraviolet irradiation light at that time,
/If the S process is known, it is a process to strengthen the reflected ultraviolet light. /I
By measuring the reflectance, it is possible to find the ratio X of each reflectance at different ultraviolet wavelengths. Therefore, the insulator contamination measurement device is connected to an irradiation optical system that irradiates ultraviolet rays toward the insulator and the insulator. A light receiving optical system that receives the reflected ultraviolet irradiation light, and a mutually different ultraviolet wavelength λ of the ultraviolet irradiation light based on the reception result of the ultraviolet irradiation light. , and an arithmetic processing unit that calculates the reflectance T0 at λ1, and the ratio X of T, and the respective ultraviolet wavelengths λ that are different from each other. , λ1 are selected in such a way that it is possible to determine whether the insulator is a sound insulator or a contaminated insulator based on the calculation result of the calculation processing section, it is possible to measure the staining of an actual insulator.

In addition, we know in advance the types of contaminants that can adhere to insulators depending on the location, such as soot and salt being more likely to adhere to insulators in factories, salt being more likely to adhere to coastal areas, and soil being more likely to adhere to quarries. The degree of adhesion of the contaminant to the insulator can also be determined by the value of the ratio X of 1 reflectance.

An embodiment of the contamination measuring device will be described below with reference to FIG.

In FIG. 1, 1 is a light source for ultraviolet irradiation light. Here, a mercury lamp is used as the light source 1, but a laser light source with good directivity may also be used as the light source 1 in consideration of remote measurement. The light from this light source 1 is made into a parallel beam by a lens 2, and is irradiated as ultraviolet irradiation light toward an insulator 4 via a modulator 3. The light source 1, lens 2, and modulator 3 It functions as an irradiation optical system that irradiates toward the insulator 4. This ultraviolet ray irradiation is carried out by targeting the insulator to be measured using a telescope or the like (not shown). Note that here, the ultraviolet irradiation light is converted into a parallel light beam using the lens 2 and is irradiated onto the insulator 4, but the ultraviolet irradiation light may be imaged on the surface of the insulator 4 using the lens 2. .

In order to distinguish between disturbance light and ultraviolet irradiation light, the modulator 3
It has a function of modulating the ultraviolet irradiation light, and an optical chopper or the like is used as the modulator 3. The ultraviolet light reflected by the insulator 4 is condensed by a lens 5, passes through a semi-transparent mirror 6, is guided to a filter 7, is reflected by the semi-transparent mirror 6, and is guided to a filter 8. Filter 7 has ultraviolet wavelength λ. It has a function of selectively transmitting ultraviolet rays, and a light receiver 9 is provided facing the filter 7. The filter 8 has a function of selectively transmitting ultraviolet light having an ultraviolet wavelength λ1, and a light receiver 10 is provided facing the filter 8.

The receiver 9.10 has a lens 5. Semi-transparent mirror 6, filter 7.
Together with 8, it constitutes a light receiving optical system that receives the ultraviolet irradiation light reflected by the insulator 4, and the light receiver 9 has an ultraviolet light of wavelength λ. The light receiver 10 outputs an electrical signal corresponding to the received intensity of ultraviolet rays having an ultraviolet wavelength λ, and the light receiver 10 outputs an electric signal corresponding to the received intensity of ultraviolet rays having an ultraviolet wavelength λ.

, λ, is each ultraviolet wavelength λ based on the result of receiving the ultraviolet irradiation light. , λ, reflectance T11. It is selected so that it can be determined whether the insulator is a contaminated insulator or a sound insulator by the calculation of the arithmetic processing unit that calculates the ratio X of T1, and here, λ. = 254 nm, λ1 = 365 nm.

The arithmetic processing section here consists of a synchronous amplifier 11.12 and an arithmetic unit 13. Electrical signals from the photoreceivers 9 and 10 are input to the synchronous amplifier 11.12, and the synchronous amplifier 11.12 modulates the signal. The electrical signals outputted from the light receivers 9 and 10 are respectively amplified in synchronization with the receiver 3, and the arithmetic unit 13
The arithmetic unit 13 calculates the ratio I0/L of the received light intensity based on each amplified output, and since the ratio S0/S1 of the intensity of the ultraviolet irradiation light is known, based on this The output signal corresponding to the reflectance ratio X is displayed on the display unit 1.
This is what is output to 4. The display unit 14 is the arithmetic unit 1
Based on the output of step 3, the reflectance ratio X of the insulator in actual use is displayed. By visually observing this reflectance ratio X, it is possible to determine whether the actual insulator is contaminated.

Note that the spectral characteristics of the light source 1 and the spectral characteristics of optical components such as lenses and filters are corrected in advance during measurement.

Although the embodiments have been described above, since sunlight contains ultraviolet rays, sunlight can also be used as the ultraviolet irradiation light. In this case, the light receiver 9.10 will receive the reflected light of the unmodulated ultraviolet irradiation light. Furthermore, a television camera can be used as the light receiver 9.10, and in this case, the reflectance ratio X is measured for each pixel of the television camera. The adhesion distribution can be displayed as an image. moreover,
In the embodiment, the optical axis of the light-receiving optical system was made oblique to the optical axis of the irradiation optical system, but the optical axis of the irradiation optical system and the optical axis of the light-receiving optical system were made the same, and the light source 1 and Photoreceiver9.
10 may also be integrated.

(Effects of the Invention) Since the insulator contamination measurement device according to the present invention is configured as described above, it has the effect of being able to remotely measure the contamination of an actually used insulator.

Further, since there is no need to provide a dedicated insulator for stain measurement, the cost required for the measurement can be significantly reduced.

[Brief explanation of drawings]

FIG. 1 is a block diagram showing an embodiment of a soiled insulator measuring device according to the present invention, and FIG. 2 is a diagram showing a reflectance curve for explaining the principle of soiling measurement of the insulator. 1...Light source, 2...Lens, 3...
・Modulator, 4...Insulator, 5...Lens,
7, 8...Filter 9.10...Photodetector, 11.12...Synchronous amplifier, 13...
Arithmetic unit, X... Ratio of reflectance. T...Reflectance, λ. , λ□...Ultraviolet wavelength. Figure 1 Figure 2 WL (nm)

Claims (1)

[Claims] (1) An irradiation optical system that irradiates ultraviolet irradiation light toward the insulator; a light receiving optical system that receives the ultraviolet irradiation light reflected by the insulator; It has an arithmetic processing unit that calculates the ratio of each reflectance at mutually different ultraviolet wavelengths,
An insulator contamination measuring device, wherein each of the mutually different ultraviolet wavelengths is selected such that it is possible to determine whether the insulator is a sound insulator or a contaminated insulator based on the calculation result of the arithmetic processing section.