JPS6357745U - - Google Patents

Info

Publication number
JPS6357745U
JPS6357745U JP15101186U JP15101186U JPS6357745U JP S6357745 U JPS6357745 U JP S6357745U JP 15101186 U JP15101186 U JP 15101186U JP 15101186 U JP15101186 U JP 15101186U JP S6357745 U JPS6357745 U JP S6357745U
Authority
JP
Japan
Prior art keywords
probe
card
probe card
needles
rows
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15101186U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15101186U priority Critical patent/JPS6357745U/ja
Publication of JPS6357745U publication Critical patent/JPS6357745U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP15101186U 1986-09-30 1986-09-30 Pending JPS6357745U (US20100268047A1-20101021-C00003.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15101186U JPS6357745U (US20100268047A1-20101021-C00003.png) 1986-09-30 1986-09-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15101186U JPS6357745U (US20100268047A1-20101021-C00003.png) 1986-09-30 1986-09-30

Publications (1)

Publication Number Publication Date
JPS6357745U true JPS6357745U (US20100268047A1-20101021-C00003.png) 1988-04-18

Family

ID=31067679

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15101186U Pending JPS6357745U (US20100268047A1-20101021-C00003.png) 1986-09-30 1986-09-30

Country Status (1)

Country Link
JP (1) JPS6357745U (US20100268047A1-20101021-C00003.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002082528A1 (fr) * 2001-04-04 2002-10-17 Fujitsu Limited Appareil contacteur pour dispositif semi-conducteur et procede de test dudit dispositif semi-conducteur

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002082528A1 (fr) * 2001-04-04 2002-10-17 Fujitsu Limited Appareil contacteur pour dispositif semi-conducteur et procede de test dudit dispositif semi-conducteur

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