JPS6351707A - High frequency amplifier - Google Patents

High frequency amplifier

Info

Publication number
JPS6351707A
JPS6351707A JP61195951A JP19595186A JPS6351707A JP S6351707 A JPS6351707 A JP S6351707A JP 61195951 A JP61195951 A JP 61195951A JP 19595186 A JP19595186 A JP 19595186A JP S6351707 A JPS6351707 A JP S6351707A
Authority
JP
Japan
Prior art keywords
high frequency
variable attenuator
pin diode
diode variable
frequency amplifier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61195951A
Other languages
Japanese (ja)
Inventor
Tatsuhiro Oba
大場 達博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP61195951A priority Critical patent/JPS6351707A/en
Publication of JPS6351707A publication Critical patent/JPS6351707A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To perform temperature compensation without using a temperature detector, by detecting the quantity of a main bias signal to a semiconductor amplifying element, and compensating the temperature characteristic of the gain of the semiconductor amplifying element by controlling a variable attenuator by the detecting signal. CONSTITUTION:A high frequency signal inputted through a high frequency signal input terminal 1, is attenuated by a PIN diode variable attenuator 4, and is amplified by a high frequency amplifying part 3, and is outputted from a high frequency signal output terminal 2. At this time, a bias current to the PIN diode variable attenuator 4 is controlled corresponding to the value of a drain current detected at a resistor 6. In other words, the bias current of the PIN diode variable attenuator 4 is controlled so that the more the total quantity of the drain current increased, the more the attenuated quantity of the PIN diode variable attenuator 4 increased, and the less the total quantity of the drain current decreased, the less the attenuated quantity of the PIN diode variable attenuator 4 decreased. In this way, it is possible to perform the temperature compensation of the high frequence gain in the whole of the high frequency amplifier.

Description

【発明の詳細な説明】 [M業上の利用分野] この発明は、例えば電界効果ト・ランジスタ(FET)
を増幅素子とする高周波増幅器に関するものである。
[Detailed Description of the Invention] [Field of Application in M Industry] This invention is applicable to field effect transistors (FETs), for example.
The present invention relates to a high-frequency amplifier using an amplifying element.

[従来の技術] 第3図は従来の高周波増幅器の構成図であり、図におい
て、1は高周波信号入力端子、2は高周波信号出力端子
、3は電界効果トランジスタを増幅素子とする高周波増
幅部、4はPINダイオード可変減衰器、5は高周波増
幅部3のトレイン電源、7はPINダイオード可変減衰
器4のバイアス電流制御回路、8は高周波増幅部3近傍
の温度を検出する温度検出器である。
[Prior Art] FIG. 3 is a block diagram of a conventional high-frequency amplifier. In the figure, 1 is a high-frequency signal input terminal, 2 is a high-frequency signal output terminal, 3 is a high-frequency amplification section using a field-effect transistor as an amplification element, 4 is a PIN diode variable attenuator, 5 is a train power supply for the high frequency amplifier section 3, 7 is a bias current control circuit for the PIN diode variable attenuator 4, and 8 is a temperature detector for detecting the temperature near the high frequency amplifier section 3.

次に動作について説明する。高周波信号入力端子1を通
じて入力された高周波信号は、PINダイオード可変減
衰器4により減衰され、高周波増幅部3により増幅され
て、高周波信号出力端子2から出力される。ここで、高
周波増幅部3としては、電界効果トランジスタ等の半導
体増幅素子が広く用いられているが、特に電界効果トラ
ンジスタの場合には、一般的に周囲温度が低いと高周波
利得が増加し、周囲温度が高くなると高周波利得が減少
する特性がある。この利得変動を軽減する目的で、高周
波増幅部3近傍の周囲温度変化をサーミスタや熱電対等
の温度検出器8を用いて検出し、周囲温度が高くなると
、PINダイオード可変減衰器4の減衰量が大きくなる
ようバイアス電流制御回路7がPINダイオード可変減
衰器4のバイアス電流を制御し、高周波増幅器全体の利
得の温度補償を行なっている。
Next, the operation will be explained. A high frequency signal input through the high frequency signal input terminal 1 is attenuated by the PIN diode variable attenuator 4, amplified by the high frequency amplification section 3, and outputted from the high frequency signal output terminal 2. Here, semiconductor amplification elements such as field-effect transistors are widely used as the high-frequency amplification section 3, but especially in the case of field-effect transistors, the high-frequency gain generally increases when the ambient temperature is low; There is a characteristic that the high frequency gain decreases as the temperature increases. In order to reduce this gain fluctuation, a temperature detector 8 such as a thermistor or thermocouple is used to detect changes in the ambient temperature near the high frequency amplification section 3. When the ambient temperature increases, the amount of attenuation of the PIN diode variable attenuator 4 increases. The bias current control circuit 7 controls the bias current of the PIN diode variable attenuator 4 so that the bias current increases, thereby performing temperature compensation for the gain of the entire high frequency amplifier.

[発明が解決しようとする問題点コ 従来の高周波増幅器は以上のように構成されているので
1例えば−306C〜+50°Cのごとき広い周囲温度
範囲ではサーミスタ等の安価な温度検出器8を使用する
と、検出器自体の直線性の劣化や特性のバラツキにより
、充分な温度補償効果が得られず、このためリニアライ
ズ回路を付加したり、特性のそろった温度検出器を選定
する必要がある等の問題点があった。
[Problems to be Solved by the Invention] Conventional high-frequency amplifiers are configured as described above, so 1. In a wide ambient temperature range such as -306C to +50°C, an inexpensive temperature detector 8 such as a thermistor is used. Then, due to deterioration in the linearity of the detector itself and variations in its characteristics, a sufficient temperature compensation effect cannot be obtained. Therefore, it is necessary to add a linearization circuit or to select a temperature detector with uniform characteristics. There was a problem.

この発明は上記のような問題点を解消するためになされ
たもので、温度検出器を用いずに温度補償を行なえるよ
うにした高周波増幅器を得ることを目的とする。
The present invention was made to solve the above-mentioned problems, and an object of the present invention is to provide a high frequency amplifier that can perform temperature compensation without using a temperature detector.

c問題点を解決するための手段] この発明に係る高周波増幅器は、半導体増幅素子への主
バイアス信号量を検出し、その検出信号にて可変減衰器
を制御し、半導体増幅素子の利得の温度特性を補償する
ように構成したものである。
Means for Solving Problem c] The high frequency amplifier according to the present invention detects the amount of the main bias signal to the semiconductor amplification element, controls the variable attenuator with the detection signal, and adjusts the temperature of the gain of the semiconductor amplification element. It is configured to compensate for the characteristics.

[作 用コ この発明における高周波増幅器は、半導体増幅素子への
主バイアス信号量が増加すると可変減衰器の減衰量を増
加させる一方、半導体増幅素子への主バイアス信号量が
減少すると可変減衰器の減衰量を減少させるよう動作す
る。
[Function] The high-frequency amplifier of the present invention increases the attenuation of the variable attenuator when the amount of the main bias signal to the semiconductor amplification element increases, and increases the amount of attenuation of the variable attenuator when the amount of the main bias signal to the semiconductor amplification element decreases. It operates to reduce the amount of attenuation.

[発明の実施例コ 以下、この発明の一実施例を図について説明する。第1
図はこの発明の一実施例としての高周波増幅器を示す構
成図であるが、この第1図において、高周波信号入力端
子1.高周波信号出力端子2、半導体増幅素子としての
電界効果トランジスタから成る高周波増幅部3.PIN
ダイオード可変減衰器4および電界効果トランジスタヘ
トレイン電流(主バイアス信号)を供給するドレイン電
源5は、第3図に示した従来例と同一である。6はドレ
イン電源線に直列に接続された抵抗であり。
[Embodiment of the Invention] An embodiment of the invention will be described below with reference to the drawings. 1st
FIG. 1 is a block diagram showing a high frequency amplifier as an embodiment of the present invention. In FIG. 1, high frequency signal input terminals 1. A high frequency amplification section 3 consisting of a high frequency signal output terminal 2 and a field effect transistor as a semiconductor amplification element. PIN
The diode variable attenuator 4 and the drain power supply 5 for supplying the field effect transistor train current (main bias signal) are the same as in the conventional example shown in FIG. 6 is a resistor connected in series to the drain power supply line.

この抵抗6がドレイン電流aを検出する検出部として機
能する。7は上記の従来例と同様にPINダイオード可
変減衰器4のバイアス電流制御回路であるが1水高周波
増幅器においては、抵抗6にて検出されたドレイン電流
値に応じPINダイオード可変減衰器4へのバイアス電
流を制御する。
This resistor 6 functions as a detection section that detects the drain current a. 7 is a bias current control circuit for the PIN diode variable attenuator 4 as in the above conventional example; Control bias current.

次に実施例の動作について説明する。第2図は140H
2?iFにて動作する高周波増幅器(この高周波増幅器
は5段のソース接地形電界効果トランジスタを有する)
の総ドレイン電流および小信号利得の温度特性を示す一
例である。この第2図から次のことがわかる。即ち総ド
レイン電流は周囲温度が高くなると減少し、周囲温度が
低くなると増加する傾向があり、小信号利得の温度特性
と強い相関が認められる。したがって総ドレイン電流を
検出し、総ドレイン電流が増加すれば、PINダイオー
ド可変減衰器4の減衰量を大きくし、総ドレイン電流が
減少すれば、PINダイオード可変減衰器4の減衰量を
小さくするよう、PINダイオード可変減衰器4のバイ
アス電流を制御することにより、高周波増幅器全体の高
周波利得の温度補償を行なうことができるのである。
Next, the operation of the embodiment will be explained. Figure 2 is 140H
2? High frequency amplifier operating at iF (this high frequency amplifier has 5 stages of grounded source field effect transistors)
This is an example showing the temperature characteristics of the total drain current and small signal gain of . The following can be seen from this Figure 2. That is, the total drain current tends to decrease as the ambient temperature increases, and increases as the ambient temperature decreases, and a strong correlation with the temperature characteristics of the small signal gain is recognized. Therefore, the total drain current is detected, and if the total drain current increases, the attenuation amount of the PIN diode variable attenuator 4 is increased, and if the total drain current decreases, the attenuation amount of the PIN diode variable attenuator 4 is decreased. By controlling the bias current of the PIN diode variable attenuator 4, temperature compensation of the high frequency gain of the entire high frequency amplifier can be performed.

なお、上記実施例では高周波増幅部を構成する半導体増
幅素子として電界効果トランジスタを使用したものを示
したが、主バイアス電流値が電界効果トランジスタと同
様の温度特性を示す他の半導体素子でもよい。
Note that although the above embodiment uses a field effect transistor as the semiconductor amplification element constituting the high frequency amplification section, other semiconductor elements whose main bias current value exhibits temperature characteristics similar to those of the field effect transistor may be used.

[発明の効果] 以上のようにこの発明によれば、従来のように温度検出
器を用いずに高周波増幅器の利得の温度特性を補償する
ことができるように構成したので。
[Effects of the Invention] As described above, according to the present invention, the structure is such that the temperature characteristics of the gain of the high frequency amplifier can be compensated for without using a temperature detector as in the conventional case.

温度検出器を用いる場合に必要なリニアライズ回路や部
品選定等を必要とせず、これにより装置を安価に提供で
きる効果がある。
There is no need for a linearization circuit, component selection, etc., which are required when using a temperature detector, and this has the effect that the device can be provided at a low cost.

【図面の簡単な説明】 第1図はこの発明の一実施例による高周波増幅器の構成
図、第2図は電界効果トランジスタを使用した高周波増
幅器の総ドレイン電流および高周波利得の温度特性の一
例を示す図であり、第3図は従来の高周波増幅器の構成
図である。 図において、1−高周波信号入力端子、2−高周波信号
出力端子、3−電界効果トランジスタ増幅素子を使用し
た高周波増幅部、4− P I Nダイオード可変減衰
器、5−ドレイン電源、6−ドレイン電流検出用抵抗、
7−PINダイオード可変減衰器のバイアス電流制御回
路。 なお、図中、同一符号は同一、又は相当部分を示す。
[Brief Description of the Drawings] Fig. 1 is a block diagram of a high-frequency amplifier according to an embodiment of the present invention, and Fig. 2 shows an example of the temperature characteristics of the total drain current and high-frequency gain of a high-frequency amplifier using field-effect transistors. FIG. 3 is a configuration diagram of a conventional high frequency amplifier. In the figure, 1 - high frequency signal input terminal, 2 - high frequency signal output terminal, 3 - high frequency amplification section using a field effect transistor amplification element, 4 - PIN diode variable attenuator, 5 - drain power supply, 6 - drain current Detection resistor,
7-PIN diode variable attenuator bias current control circuit. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.

Claims (1)

【特許請求の範囲】[Claims] 高周波入力信号を減衰させ且つその減衰量を変更しうる
可変減衰器と、同可変減衰器からの出力を増幅すべく半
導体増幅素子から成る高周波増幅部とをそなえるととも
に、上記の高周波増幅部の半導体増幅素子へ主バイアス
信号を供給する電源をそなえ、上記主バイアス信号量を
検出する検出部と、同検出部からの検出信号に基づき上
記可変減衰器での減衰量を制御する制御部とが設けられ
たことを特徴とする高周波増幅器。
A variable attenuator capable of attenuating a high frequency input signal and changing the amount of attenuation, and a high frequency amplification section made of a semiconductor amplification element to amplify the output from the variable attenuator, and a semiconductor of the high frequency amplification section. A detection section that includes a power supply that supplies a main bias signal to the amplification element and detects the amount of the main bias signal, and a control section that controls the amount of attenuation in the variable attenuator based on the detection signal from the detection section. A high frequency amplifier characterized by:
JP61195951A 1986-08-21 1986-08-21 High frequency amplifier Pending JPS6351707A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61195951A JPS6351707A (en) 1986-08-21 1986-08-21 High frequency amplifier

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61195951A JPS6351707A (en) 1986-08-21 1986-08-21 High frequency amplifier

Publications (1)

Publication Number Publication Date
JPS6351707A true JPS6351707A (en) 1988-03-04

Family

ID=16349688

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61195951A Pending JPS6351707A (en) 1986-08-21 1986-08-21 High frequency amplifier

Country Status (1)

Country Link
JP (1) JPS6351707A (en)

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