JPS63503243A - Method and apparatus for identifying particulate matter - Google Patents
Method and apparatus for identifying particulate matterInfo
- Publication number
- JPS63503243A JPS63503243A JP62502313A JP50231387A JPS63503243A JP S63503243 A JPS63503243 A JP S63503243A JP 62502313 A JP62502313 A JP 62502313A JP 50231387 A JP50231387 A JP 50231387A JP S63503243 A JPS63503243 A JP S63503243A
- Authority
- JP
- Japan
- Prior art keywords
- focal plane
- particulate matter
- plane array
- focusing
- array
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
- G01N15/0606—Investigating concentration of particle suspensions by collecting particles on a support
- G01N15/0612—Optical scan of the deposits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
- G01N15/0227—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging using imaging, e.g. a projected image of suspension; using holography
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4711—Multiangle measurement
- G01N2021/4721—Multiangle measurement using a PSD
Abstract
(57)【要約】本公報は電子出願前の出願データであるため要約のデータは記録されません。 (57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】 本発明は表面の粒子状汚染物を識別する方法および装置に関し、より詳細には、 そのような表面の粒子状汚染物の同時識別および証明に関する。[Detailed description of the invention] The present invention relates to a method and apparatus for identifying particulate contaminants on surfaces, and more particularly to: Concerning the simultaneous identification and verification of particulate contaminants on such surfaces.
光学システムにおいて汚染が無いことまたは清潔であることは検知および検出さ れたものの品質に比例する。組立てに先だって、構成要素および部品は通常、流 出ソルベントの収集に備えて配設された特殊なスプレー装置内で洗浄される。The absence or cleanliness of contamination in optical systems is detected and detected. It is proportional to the quality of the product. Prior to assembly, components and parts are typically Cleaning is carried out in special spray equipment arranged to collect the outflow solvent.
ソルベントはその後、残余粒子を収集して光学的に計数すべくろ過される。The solvent is then filtered to collect and optically count residual particles.
小構成の装置は複雑なアッセンブリよりも洗浄がより簡単だが、刃状構造等の複 雑なアッセンブリに対しては他の方法があり、それにはウィットネスプレートが 使用され、例えば1平方フイートのKap t onが光学素子に添えられる。Small-configuration devices are easier to clean than complex assemblies, but complex devices such as blade structures There are other options for rough assemblies, including witness plates. For example, one square foot of Kapt on is used to attach the optical element.
上記の洗浄方法がこのウィットネスサンプルに適用される。1−インチまたはそ れ以上の小さな光学ミラーまたは黒色ガラスを使用するウィットネスプレート方 法によれば、5aab光度計等によってダストを光学的に計数することができ、 ダストによって覆われたcommuni t ive領域に概して比例する集積 的散乱が得られる。実験的装置においては、特殊なすれすれの入射光を使い専用 カメラによって被写された高解像写真のウィットネスプレートを使用する。The cleaning method described above is applied to this witness sample. 1-inch or so Witness plate method using a smaller optical mirror or black glass According to the law, dust can be counted optically using a 5aab photometer etc. Accumulation generally proportional to the community area covered by the dust Target scattering is obtained. In experimental equipment, special grazing incident light is used to Using a high-resolution photo witness plate taken by a camera.
5aab光度計の場合、1つの電気的読取り結果が得られるのみでありダスト粒 子の大きさ分布に関する情報は得られない。In the case of the 5aab photometer, only one electrical reading is obtained and the dust particles No information is available regarding offspring size distribution.
他の方法の一番大きな欠点の1つは処理が遅いことである。One of the biggest drawbacks of other methods is that they are slow.
ウイットネスミラーまたはウイットネスシート上のダストを完全に読取る場合、 直接光学装置を使用しても洗浄して洗浄物を分析してもかなりの時間を要する。If you want to completely read the dust on the witness mirror or witness sheet, Even if a direct optical device is used or the washed product is analyzed after washing, it takes a considerable amount of time.
最終的な計数は写真用ネガまたは特殊なろ紙の上で手動で行われる。The final count is done manually on a photographic negative or on special filter paper.
それゆえ、どの方法もその場での瞬間的なモニタができず、大きさによって汚染 物の種類を完全に検出することができない。Therefore, none of the methods allows instantaneous monitoring on the spot, and contamination due to size. The type of object cannot be completely detected.
さらに、従来の装置は可動部品を使用しており、複雑となり設計、組立て、およ び操作上厄介である。ある装置においては、ウィットネスプレートを1方向に移 動させ、レーザビームが他の方向に沿って前後するラスク内でサンプルを掃引す る。その後、光学システムおよび積分球によって光を捕えて検出する。他の装置 においては、レコードプレーヤのレコードに類似した円形ウィットネスプレート を使用している。Additionally, traditional equipment uses moving parts, making it complex and difficult to design, assemble, and It is difficult to use and operate. In some devices, the witness plate can be moved in one direction. the laser beam sweeps the sample in the rask back and forth along the other direction. Ru. The light is then captured and detected by an optical system and an integrating sphere. other equipment , a circular witness plate similar to a record on a record player are using.
このプレートは装置内で回転し、集束ビームがプレートの小さな点を照射する。The plate rotates within the device and a focused beam illuminates a small spot on the plate.
すなわち、レコード針がレコードの溝を追従するのと同じようにビームがプレー トを追跡する。そのような装置はいくつかの可動部品から形成され、複雑であり 、設計、組立て、操作上厄介である。さらに小部品および複雑さのため使いにく く誤動作しやすく、おまけに比較的高価である。In other words, the beam follows the grooves of a record in the same way that a record stylus follows the grooves of a record. Track your goals. Such devices are formed from several moving parts, are complex and , cumbersome in design, assembly, and operation. Additionally, small parts and complexity make them difficult to use. They are prone to malfunctions and are relatively expensive.
するのに使用されるウィットネスプレートを提供することによって、これらのお よび他の問題を克服かつ避けることができる。光学的撮像装置が照射された汚染 物を電荷結合検出器アレイなどの焦平面に集束する。検出された情報は汚染物の 総数および大きさ等の識別を提供すべくプログラムされたコンピュータによって 処理される。We support these customers by providing witness plates that are used to and other problems can be overcome and avoided. Contamination exposed to optical imaging equipment Focusing an object onto a focal plane, such as a charge-coupled detector array. The detected information is the contaminant by a computer programmed to provide identification such as total number and size It is processed.
この構成から様々な利点が得られる。僅かの部品が可動するので本発明の構成お よび使用が簡単となり、誤動作が少なくなり、おまけに安価である。特定された 汚染物の識別は、大きさおよび総数が直ちに識別されるので直接的でありかつ遅 滞なく自動的に提供される。他の目的および利点さらに本発明のより完全な理解 は、模範的な実施例の次の説明と添附の図面から明白になる。Various advantages can be obtained from this configuration. Since only a few parts are movable, the structure of the present invention is It is easier to read and use, has fewer malfunctions, and is less expensive. identified Identification of contaminants is both direct and slow as size and total number are immediately identified. Provided automatically and without delay. Other objects and advantages as well as a more complete understanding of the invention will become apparent from the following description of an exemplary embodiment and the accompanying drawings.
図面の簡単な説明 図面はただ1つでありそれは、ウイットホスミラー上の粒子状汚染物を自動的に 計数する装置の図である。Brief description of the drawing There is only one drawing and it automatically removes particulate contaminants on the Witphos mirror. FIG. 2 is a diagram of a counting device.
好ましい実施例の説明 従って、ダスト等の粒子状汚染物を観察する装置10が、汚染物が付着するウィ ットネスプレート12を観察すべく配置される。前記ウィットネスプレート12 は光学装置内にかつ光学装置に隣接して配置され、そこで汚染物が監視される。Description of the preferred embodiment Therefore, the device 10 for observing particulate contaminants such as dust can is placed to observe the fitness plate 12. The witness plate 12 is located within and adjacent to the optical device where contaminants are monitored.
前記ウィットネスプレート上に落下する粒子状汚染物を照射するために光源14 が配設され光線16を前記ライ・ットネスプレートに関しである視射角で先導す ることによって粒子だけがよ(照射される。前記装置10は、ベローなどの調節 可能な接続部22によってハウジング20に固定された高解像レンズ系18を含 む。通常構成を有する電荷結合デバイス(CCD)アレイ24が前記ハウジング 20の最終端部に配設され焦平面25を規定する。前記ベロー22は粒子状汚染 物の像を鮮明に前記焦点平面アレイ24上に集束すべく調節される。a light source 14 for illuminating particulate contaminants falling onto the witness plate; is arranged to guide the light beam 16 at a glancing angle with respect to the lightness plate. Only the particles are irradiated by the including a high-resolution lens system 18 secured to the housing 20 by a possible connection 22; nothing. A charge-coupled device (CCD) array 24 having a conventional configuration is provided in the housing. 20 and defines a focal plane 25. The bellows 22 is free from particulate contamination. Adjustments are made to sharply focus the image of the object onto the focal plane array 24.
この調節は点28の回りに枢動可能なフリップミラー26を使用することによっ てなされ、これによって前記汚染物がスクリーン30上に集束される。このよう なフォーカシングは従来のものであり、−眼レフレックスカメラに使用されてい るものに類似する。鮮明なフォーカシングが前記スクリーン30上に規定されれ ば前記ミラー30が枢動して像が前記電荷結合デバイス24の焦平面に集束され る。This adjustment is accomplished by using a flip mirror 26 that is pivotable about point 28. the contaminants are focused onto the screen 30. like this Focusing is conventional - used in ocular reflex cameras. Similar to sharp focusing is defined on said screen 30; If the mirror 30 pivots, the image is focused onto the focal plane of the charge coupled device 24. Ru.
前記アレイ24で検知された像は Hewlett Packard 98B6などの従来のコンピュータ32に電 気的に伝導される。前記コンピュータに ・よって粒子状汚染物の大きさおよび 総数を素早く計算され、計算結果および識別結果が表示されるかまたはグラフで 表わされる。The image detected by the array 24 is A conventional computer 32 such as a Hewlett Packard 98B6 Conducted by air. The computer determines the size and size of particulate contaminants. The total count is quickly calculated and the calculation and identification results are displayed or graphically displayed. expressed.
焦平面は好ましくはCCDアレイであり、さらに言えば静止アレイかまたは前記 プレート12から像を掃引するライン状アレイであり、これは商業上使用されて いる。このような現在使用されているユニットはライン上に約1600の画素を 提供し2000位置を自動的に掃引する。The focal plane is preferably a CCD array, more specifically a stationary array or A linear array that sweeps the image from plate 12, which is used commercially. There is. Such units currently in use have approximately 1600 pixels on a line. Provides 2000 positions and sweeps automatically.
本発明は特定された実施例に関して説明されたが本発明の□意図および範囲から 離脱せずに様々な変化および変更が可能である。Although the present invention has been described with respect to specific embodiments, the intent and scope of the invention Various changes and changes are possible without leaving.
国際調査報告 +、l+e−−++am+avmc++:o−we、?CT7US 87100 652ANNEX To THE INTERNATION、”J、5EARC HREPORT ONinternational search report +,l+e--++am+avmc++:o-we,? CT7US 87100 652ANNEX To THE INTERNATION, “J, 5EARC HREPORT ON
Claims (8)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US85956486A | 1986-05-05 | 1986-05-05 | |
US859,564 | 1986-05-05 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63503243A true JPS63503243A (en) | 1988-11-24 |
Family
ID=25331216
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62502313A Pending JPS63503243A (en) | 1986-05-05 | 1987-03-27 | Method and apparatus for identifying particulate matter |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0264427A1 (en) |
JP (1) | JPS63503243A (en) |
IL (1) | IL82107A0 (en) |
WO (1) | WO1987007024A1 (en) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DK163538C (en) * | 1990-03-22 | 1992-08-03 | Abk Bygge & Miljoeteknik | PROCEDURE AND CLEANING CONTROL MEASUREMENT |
GB2249829A (en) * | 1990-11-13 | 1992-05-20 | Powergen Public Limited Compan | Measurement of carbon in ash |
FR2753531B1 (en) * | 1996-09-19 | 1998-10-16 | Snecma | METHOD FOR ADJUSTING THE ILLUMINATION LEVEL OF A SAMPLE IN A GRANULOMETRY SYSTEM BY IMAGE ANALYSIS |
GB9717658D0 (en) * | 1997-08-21 | 1997-10-22 | Tioxide Group Services Ltd | Particle dispersion determination |
FR2770296B1 (en) * | 1997-10-29 | 2000-01-07 | Lorraine Laminage | METHOD FOR ANALYZING ATMOSPHERIC PARTICLES AND APPARATUS FOR ANALYZING ATMOSPHERIC PARTICLES FOR CARRYING OUT SUCH A METHOD |
FR2795516B1 (en) * | 1999-06-28 | 2003-08-08 | Univ Henri Poincare Nancy I | AUTOMATIC OBJECT ANALYSIS AND COUNTING DEVICE AND DATA PROCESSING METHOD |
DE10016832C2 (en) * | 2000-04-03 | 2002-06-20 | Winfried Labuda | Substrate for the visualization of particles and / or layers of material attached to it |
WO2002044693A1 (en) * | 2000-11-28 | 2002-06-06 | Imeco Automazioni S.R.L. | Apparatus for analyzing ground products |
JP2007304065A (en) * | 2006-05-15 | 2007-11-22 | Omron Corp | Foreign substance detector, foreign substance detecting method, foreign substance detecting program, and recording medium with the program stored |
GB2449312B (en) * | 2007-05-18 | 2012-03-14 | Malvern Instr Ltd | Method and apparatus for dispersing a sample of particulate material |
FR2922019B1 (en) * | 2007-10-09 | 2009-11-27 | Novacyt | AUTOMATED CELL DENSITY ADJUSTMENT METHOD FOR REALIZING AN ANALYTICAL PLATE |
US10739241B2 (en) | 2014-12-17 | 2020-08-11 | Schlumberger Technology Corporation | Test apparatus for estimating liquid droplet fallout |
CN109932292A (en) * | 2019-03-29 | 2019-06-25 | 苏州精濑光电有限公司 | A kind of dust fall detection method |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4890590A (en) * | 1972-03-03 | 1973-11-26 | ||
JPS50123395A (en) * | 1974-03-14 | 1975-09-27 | ||
JPS5293380A (en) * | 1976-02-02 | 1977-08-05 | Teijin Ltd | Image discriminator |
JPS52156694A (en) * | 1976-06-22 | 1977-12-27 | Tetsuo Yoshida | Apparatus for grain size measurements |
JPS55136936A (en) * | 1979-04-12 | 1980-10-25 | Shimadzu Corp | Method for automatic measurement of grain-size distribution |
JPS5876740A (en) * | 1981-10-15 | 1983-05-09 | インタ−ナシヨナル・リモ−ト・イメ−ジング・システムズ | Method of analyzing grain of dilute liquid sample |
JPS5915807A (en) * | 1982-07-20 | 1984-01-26 | Furukawa Electric Co Ltd:The | Measuring method for surface of object |
JPS59184840A (en) * | 1983-04-06 | 1984-10-20 | Mitsubishi Chem Ind Ltd | Method and device for measuring dust in liquid |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1384115A (en) * | 1963-11-22 | 1965-01-04 | Commissariat Energie Atomique | Liquid particle detector entrained by circulating gas |
SE315760B (en) * | 1966-04-27 | 1969-10-06 | Saab Ab | |
US4075462A (en) * | 1975-01-08 | 1978-02-21 | William Guy Rowe | Particle analyzer apparatus employing light-sensitive electronic detector array |
JPS56162037A (en) * | 1980-05-19 | 1981-12-12 | Nec Corp | Detection for foreign matter on surface |
JPS5912342A (en) * | 1982-07-13 | 1984-01-23 | Hitachi Ltd | Device for detecting foreign matter |
-
1987
- 1987-03-27 WO PCT/US1987/000652 patent/WO1987007024A1/en not_active Application Discontinuation
- 1987-03-27 JP JP62502313A patent/JPS63503243A/en active Pending
- 1987-03-27 EP EP87902951A patent/EP0264427A1/en not_active Withdrawn
- 1987-04-03 IL IL82107A patent/IL82107A0/en unknown
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4890590A (en) * | 1972-03-03 | 1973-11-26 | ||
JPS50123395A (en) * | 1974-03-14 | 1975-09-27 | ||
JPS5293380A (en) * | 1976-02-02 | 1977-08-05 | Teijin Ltd | Image discriminator |
JPS52156694A (en) * | 1976-06-22 | 1977-12-27 | Tetsuo Yoshida | Apparatus for grain size measurements |
JPS55136936A (en) * | 1979-04-12 | 1980-10-25 | Shimadzu Corp | Method for automatic measurement of grain-size distribution |
JPS5876740A (en) * | 1981-10-15 | 1983-05-09 | インタ−ナシヨナル・リモ−ト・イメ−ジング・システムズ | Method of analyzing grain of dilute liquid sample |
JPS5915807A (en) * | 1982-07-20 | 1984-01-26 | Furukawa Electric Co Ltd:The | Measuring method for surface of object |
JPS59184840A (en) * | 1983-04-06 | 1984-10-20 | Mitsubishi Chem Ind Ltd | Method and device for measuring dust in liquid |
Also Published As
Publication number | Publication date |
---|---|
IL82107A0 (en) | 1987-10-30 |
WO1987007024A1 (en) | 1987-11-19 |
EP0264427A1 (en) | 1988-04-27 |
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