JPS6346381B2 - - Google Patents

Info

Publication number
JPS6346381B2
JPS6346381B2 JP57233751A JP23375182A JPS6346381B2 JP S6346381 B2 JPS6346381 B2 JP S6346381B2 JP 57233751 A JP57233751 A JP 57233751A JP 23375182 A JP23375182 A JP 23375182A JP S6346381 B2 JPS6346381 B2 JP S6346381B2
Authority
JP
Japan
Prior art keywords
reverse bias
collector current
fall time
base
bias breakdown
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57233751A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59125079A (ja
Inventor
Yasutaka Nakatani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP23375182A priority Critical patent/JPS59125079A/ja
Publication of JPS59125079A publication Critical patent/JPS59125079A/ja
Publication of JPS6346381B2 publication Critical patent/JPS6346381B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors
    • G01R31/261—Circuits therefor for testing bipolar transistors for measuring break-down voltage or punch through voltage therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP23375182A 1982-12-29 1982-12-29 トランジスタの測定方法 Granted JPS59125079A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23375182A JPS59125079A (ja) 1982-12-29 1982-12-29 トランジスタの測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23375182A JPS59125079A (ja) 1982-12-29 1982-12-29 トランジスタの測定方法

Publications (2)

Publication Number Publication Date
JPS59125079A JPS59125079A (ja) 1984-07-19
JPS6346381B2 true JPS6346381B2 (US06566495-20030520-M00011.png) 1988-09-14

Family

ID=16960002

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23375182A Granted JPS59125079A (ja) 1982-12-29 1982-12-29 トランジスタの測定方法

Country Status (1)

Country Link
JP (1) JPS59125079A (US06566495-20030520-M00011.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0223381U (US06566495-20030520-M00011.png) * 1988-07-29 1990-02-15

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6238372A (ja) * 1985-08-13 1987-02-19 Mitsubishi Electric Corp トランジスタの測定方法
JPH0322321Y2 (US06566495-20030520-M00011.png) * 1987-09-26 1991-05-15
US6541993B2 (en) * 2000-12-26 2003-04-01 Ericsson, Inc. Transistor device testing employing virtual device fixturing

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51111078A (en) * 1975-03-26 1976-10-01 Hitachi Ltd Transistor testing device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51111078A (en) * 1975-03-26 1976-10-01 Hitachi Ltd Transistor testing device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0223381U (US06566495-20030520-M00011.png) * 1988-07-29 1990-02-15

Also Published As

Publication number Publication date
JPS59125079A (ja) 1984-07-19

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