JPS63455A - Vapor deposition device for thin film - Google Patents

Vapor deposition device for thin film

Info

Publication number
JPS63455A
JPS63455A JP14219786A JP14219786A JPS63455A JP S63455 A JPS63455 A JP S63455A JP 14219786 A JP14219786 A JP 14219786A JP 14219786 A JP14219786 A JP 14219786A JP S63455 A JPS63455 A JP S63455A
Authority
JP
Japan
Prior art keywords
vapor deposition
thin film
grid
substrate
filament
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14219786A
Other languages
Japanese (ja)
Other versions
JPH0765165B2 (en
Inventor
Mikio Kinoshita
幹夫 木下
Wasaburo Oota
太田 和三郎
Tadao Katsuragawa
忠雄 桂川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP61142197A priority Critical patent/JPH0765165B2/en
Priority to DE19873790317 priority patent/DE3790317T/de
Priority to US07/167,850 priority patent/US4854265A/en
Priority to PCT/JP1987/000398 priority patent/WO1987007916A1/en
Priority to DE3790317A priority patent/DE3790317C2/de
Priority to GB8803148A priority patent/GB2204596B/en
Publication of JPS63455A publication Critical patent/JPS63455A/en
Publication of JPH0765165B2 publication Critical patent/JPH0765165B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Physical Vapour Deposition (AREA)

Abstract

PURPOSE:To efficiently form the thin film of a vapor deposition material at a high yield on the surface of a substrate for vapor deposition by providing a thermion generating filament for ionization of a vapor deposition material on the substrate side of a grid in a vacuum vessel of a vapor deposition device for the thin film. CONSTITUTION:The vapor deposition material (for example, Al, Au, other metals) is held in a resistance heating type vapor deposition source 24 consisting of a coil made of a high melting metal such as W, or Mo in the vacuum vessel 14. After the inside of the vacuum vessel 14 is evacuated, an inert gas such as Ar or active gas such as O2, H2S or NH3 is supplied therein. The vapor deposition source 24 is electrically heated by an AC power source 32 and the Al or other metal held therein is evaporated. The pulverized evaporating particles splash toward the substrate 100 for vapor deposition and pass the grid 26. Thermions are generated by the energization of the W filament 28 provided between the grid 26 and the substrate 100, by which the pulverized evaporating particles of Al, etc., are converted to cations and are accelerated toward the substrate 100 connected to a negative electrode by a DC power source 36 and the thin film of Al, etc., is formed at a good yield. The thin compd. film of the oxide, sulfide, nitride, etc., of the vapor deposition material held in the vapor deposition source 24 is freely deposited by evaporation on the substrate according to the kind of the active gas in the vacuum vessel 14.

Description

【発明の詳細な説明】 (技術分野) 本発明は、薄膜蒸着装置に関する。[Detailed description of the invention] (Technical field) The present invention relates to a thin film deposition apparatus.

(従来技術) 薄膜蒸着装置としては従来、多種多様のものが提案せら
れ、矧られている。これら種々の薄膜蒸着装置のうちに
、基!に対するぢ層性のよい薄膜を形成でき、なおかつ
、基板として、耐%性のないプラスチック基板をも用い
5る装置が知られ℃いる。
(Prior Art) A wide variety of thin film deposition apparatuses have been proposed and limited in the past. Among these various thin film deposition devices, there are several types of thin film deposition equipment. There is an apparatus known that can form a thin film with good dilatability against heat and also uses a plastic substrate with no % resistance as a substrate.

この薄膜蒸着装置では、被蒸着基板を保持する対電極と
、−これに対向する蒸発源との間にグリッドが介設され
る。そして、このグリ、7ドは対蝿ホに対して正電位と
される。さらに、グリッドと蒸発源との間には熱電子発
生用のフィラメントが配備される。
In this thin film deposition apparatus, a grid is interposed between a counter electrode that holds a substrate to be deposited and an evaporation source that faces the counter electrode. And, this grid 7 is made to have a positive potential with respect to the fly fly. Furthermore, a filament for thermionic generation is arranged between the grid and the evaporation source.

蒸発源から蒸発した蒸着物質は、フィラメントから放出
される熱電子により陽イオン化される。
The vaporized substance evaporated from the evaporation source is positively ionized by thermionic electrons emitted from the filament.

この陽イオンは、グリッドを通過すると、グリッドから
対電極へと向う電界の作用により加速され非蒸溜基板に
衝突し、密着性の艮い薄Iメを形成する。
When the positive ions pass through the grid, they are accelerated by the action of the electric field from the grid to the counter electrode and collide with the non-distilled substrate, forming a thin film with good adhesion.

このような薄膜蒸着装置rcおける問題点は、陽イオン
が王として、グリッドより蒸発源側で発生するため、グ
リッドの正電位のため、相当量の陽イオンかグリッドを
通過できず、このため、薄膜形成に与る陽イオンの数、
が少くなって、薄膜形成の能率か必らすしも良くないこ
とである。
The problem with such a thin film deposition apparatus RC is that cations are mainly generated on the evaporation source side of the grid, and due to the positive potential of the grid, a considerable amount of cations cannot pass through the grid. The number of cations that participate in thin film formation,
This decreases the efficiency of thin film formation, which is not necessarily good.

(目 的) 不発明は、上述した事情に鑑みてなされたものであって
、その目的とするところは、上述の薄膜蒸着装置をさら
番で改良し、薄膜形成を能率よく行ない5る新規な薄膜
蒸着装置の提共にある。
(Purpose) The invention was made in view of the above-mentioned circumstances, and its purpose is to improve the above-mentioned thin film deposition apparatus by counter-rolling, to form a thin film efficiently, and to create a new method. Along with the provision of thin film deposition equipment.

(悔 成〕 以下、不発明を説明する。(Repentance accomplished) Non-invention will be explained below.

不発明の薄2摸蒸溜装貨は、真空槽と、蒸発源と。The uninvented two-piece distillation package includes a vacuum chamber and an evaporation source.

対電極と、フィラメントと、グリッドと、電源手段と、
導電手段とを有する。
a counter electrode, a filament, a grid, a power supply means,
and conductive means.

真空槽は、その内部空間に活性ガスあるいは不活性ガス
、もしくは活性ガスと不活性ガスの混合ガスを導入しう
ろようになっており、蒸発源、対電極、フィラメント、
グリッドは、真空槽内に配備される。
A vacuum chamber is designed to introduce an active gas, an inert gas, or a mixed gas of an active gas and an inert gas into its internal space, and contains an evaporation source, a counter electrode, a filament,
The grid is placed within a vacuum chamber.

対電極と蒸発源とは、互いに対向するよつVC配備され
る。対電極は、その蒸発源と対向する側、て、被蒸着基
板を保持しうるようになっている。蒸発源は、蒸着物質
を蒸発させるための手段である。
The counter electrode and the evaporation source are arranged in VC such that they face each other. The counter electrode is adapted to hold a substrate to be evaporated on its side facing the evaporation source. An evaporation source is a means for evaporating a deposited substance.

グリッドは、蒸発源と対電極との間に介設され、電源手
段により、対電極に対し正電位にされる。
The grid is interposed between the evaporation source and the counter electrode and is brought to a positive potential with respect to the counter electrode by power supply means.

従って、蒸着時には、発生する電界はグリッドから対電
極へと向う。勿論グリッドは蒸発したM’7W物質を通
過させうるものである。
Therefore, during deposition, the electric field generated is directed from the grid to the counter electrode. Of course, the grid is capable of passing vaporized M'7W material.

フィラメントは熱電子発生用であって、グリッドと対電
極との間に配備される。
The filament is for thermionic generation and is placed between the grid and the counter electrode.

゛電源手段は、真空僧門に所定の電気的状態に人現する
ための手段であり、この電源手段と真空槽内部が、導電
手段により電気的に連結される。
``The power source means is a means for bringing the vacuum chamber into a predetermined electrical state, and the power source means and the inside of the vacuum chamber are electrically connected by a conductive means.

このように、本発明の薄膜蒸着装置では、フィラメント
が、グリッドの対電極側にあるので、熱電子による。蒸
着物質、導入ガスの陽イオンは、王として、グリ、yド
の対電極側で発生−jる。
In this manner, in the thin film deposition apparatus of the present invention, since the filament is located on the counter electrode side of the grid, thermal electrons are used. The cations of the vapor deposited substance and the introduced gas are mainly generated on the counter electrode side of the electrode.

以下、図面を参照しながら説明する。This will be explained below with reference to the drawings.

図は、本発明の1実施例を示している。The figure shows one embodiment of the invention.

図にお(・て、符号10はベースプレート、符号12は
バッキング、符号14はペルジャーを、それぞれ示ス。
In the figure, reference numeral 10 indicates a base plate, reference numeral 12 indicates a backing, and reference numeral 14 indicates a Pelger.

ペルジャー14とベースプレート10とはバッキング1
2により一体化され″′C真空槽な購成し、内わ6仝間
には公知の適宜の方法で、活性ガスおよび/または不f
i性ガス?等入できるようになっている。ベースプレー
ト比の中央部に穿設された孔10Aは、図示されない頁
仝系に連結されている。
Pelger 14 and base plate 10 are backing 1
2 is integrated into a ``'C vacuum chamber, and the inner 6 chambers are filled with active gas and/or infusible gas by an appropriate method known in the art.
i-sexual gas? etc. can be entered. A hole 10A drilled in the center of the base plate is connected to a page system (not shown).

ベースプレート10には、江空慴内部の気密性を保チ、
かつベースグレート10との電気絶縁性を保ちつつ、叉
侍本をジにねた電トメ16.18.20.22か置設さ
れている。
The base plate 10 maintains the airtightness of the interior of the air conditioner.
In addition, electric tomes 16, 18, 20, and 22 are placed on the base plate 10 while maintaining electrical insulation with the base plate 10.

これら1ヒ唖16.18.2U、22は、真空1曹内側
と外i、1:jとY ?i気ηンて連浩するものであっ
て、他の配俵具とともに、導電手取ケ陶成する。
These 1 h 16, 18, 2 U, 22 are vacuum 1 inside and outside i, 1:j and Y? It is designed to be used as a conductive handle along with other bale handling tools.

1対の電516の間には、タングステン、モリブテン等
の合間をコイル状に形成した。抵抗加熱式の蒸発ぷ24
が支持さユている。蒸発源の形状は、コイル状に代えて
ボート状としてもよい。また、抵抗加熱式の蒸発源のか
わりに、電子ビーム蒸発源等、従来の真空蒸着方式で用
いられている蒸発源を適宜用いることができる。
Between the pair of electrodes 516, a gap made of tungsten, molybdenum, or the like was formed in a coil shape. Resistance heating type evaporator 24
is supported. The shape of the evaporation source may be a boat shape instead of a coil shape. Further, instead of the resistance heating type evaporation source, an evaporation source used in a conventional vacuum evaporation method, such as an electron beam evaporation source, can be used as appropriate.

また、1対の電極20の間には、タングステン等による
熱電子発生用のフィラメント28が支持されている。こ
のフィラメント28の形状は、複数本のフィラメントケ
平行に配列したり、網目状にしたりするなどして、蒸発
源から蒸発した蒸発物質の粒子の拡がり2カバーするよ
) iで定めら匙でいる。
Further, between the pair of electrodes 20, a filament 28 made of tungsten or the like for generating thermoelectrons is supported. The shape of the filament 28 is such that it covers the spread of the particles of the evaporated substance evaporated from the evaporation source by arranging multiple filaments in parallel or forming a mesh. .

電極18にはグリッド26か支持されている。このグリ
ッドは、蒸発した蒸涜物負ヲフィラメント28側へ通過
させ5る形状に形状を定められるのであるが、この例に
おいては、網目状である。
A grid 26 is supported on the electrode 18 . This grid is shaped to allow the evaporated effluent to pass through to the filament 28 side, and in this example it is in the form of a mesh.

電極22の先海部に)よ、対電極30が支持さn、この
対電極60の、蒸発源24に対向する供11の囲゛:で
、被蒸渚基板100が適宜の方法で林持される。
A counter electrode 30 is supported by the front part of the electrode 22), and the substrate 100 to be evaporated is supported by an appropriate method in the enclosure 11 of the counter electrode 60 facing the evaporation source 24. Ru.

蒸発源24を支持する電極16は、加熱用の交流電音6
2に接伏さnている。
The electrode 16 supporting the evaporation source 24 is connected to an AC electric sound 6 for heating.
2.

また、電極18は、直流電圧電源66の正−グ側に接続
され、同電源66の負極側には、電極22が接続されて
いる。従って、グリッド26は、対電極60に対して正
電位となり、グリッド26.対電極60間で、電界はグ
リッド26から、対電極60へ向う。
Further, the electrode 18 is connected to the positive and negative sides of a DC voltage power source 66, and the electrode 22 is connected to the negative side of the power source 66. Therefore, grid 26 is at a positive potential with respect to counter electrode 60, and grid 26. Between the counter electrodes 60, the electric field is directed from the grid 26 to the counter electrodes 60.

さらに、1対の電極20は、電源34に接続されている
Further, the pair of electrodes 20 are connected to a power source 34.

従って、この実施例において、電源62.34.36は
電源手段を構成する。なお、図中における接地は、必ら
ずしも必要ない。
Therefore, in this embodiment, the power supplies 62, 34, 36 constitute power supply means. Note that the grounding shown in the figure is not necessarily necessary.

実線には、上記電気的接続は種々のスイッチ(導電手段
の一部を構成する)を含入、これらスイッチの操作によ
り蒸着プロセスを実行するのであるが、これらスイッチ
は図示を省略され℃いる。
In solid lines, the electrical connections include various switches (constituting part of the conductive means), and the operation of these switches executes the deposition process, but these switches are omitted from the drawing.

以下、この装置例による薄膜?4着につぎ説明する。Below is a thin film using this equipment example? I will explain about the 4th place.

被蒸N基板100を図の如く対電極60に保持させて、
蒸着物質を、蒸着源24に保持させる。蒸着物質は、も
ちろん、どのような薄膜を形成するかに応じて定まる。
The N substrate 100 to be evaporated is held by the counter electrode 60 as shown in the figure,
The deposition material is held in the deposition source 24. The material to be deposited will, of course, be determined depending on what kind of thin film is to be formed.

例えば、アルミニウムや金のような金属、あるいは金属
の酸化物、フッ化物、硫化物、あるいは合金等である。
For example, it is a metal such as aluminum or gold, or a metal oxide, fluoride, sulfide, or alloy.

また、真空槽内には、予め活性ガスもしくは不活性ガス
、あるいは、これらの混合ガスが10−2〜IQ  T
orrの圧力で導入される。さしあたっての説明では、
この導入ガスを、例えばアルゴン等の不活性ガスである
とする。
In addition, in the vacuum chamber, active gas, inert gas, or a mixed gas thereof is preliminarily charged at a temperature of 10-2 to IQ T
It is introduced at a pressure of orr. For the time being,
Assume that this introduced gas is, for example, an inert gas such as argon.

この状態において装#を作動させると、蒸発源24 V
Cよる加熱により、蒸発源24Vc保持された蒸着物質
が蒸発する。この蒸発物質、すなわち2型着物質の粒子
は、被蒸着基板100へ向って、狐がりつつ飛行し、グ
リッド26を通過する。
When the device is operated in this state, the evaporation source 24 V
By heating with C, the evaporation material held in the evaporation source 24Vc is evaporated. The evaporated material, that is, the particles of type 2 deposited material, fly toward the deposition target substrate 100 in a creeping manner and pass through the grid 26 .

一方、フィラメント28からは熱電子が放出されるが、
発生した熱電子は、グリッド26と幻1襲0との間の電
′!¥により加速されつつグリッド26へ向って飛行し
、グリッド26を通過してきた蒸着物質粒子に衝突する
と同粒子を陽イオンしてイオン化する。
On the other hand, thermoelectrons are emitted from the filament 28,
The generated thermoelectrons are the electric current between grid 26 and phantom 1 attack 0! The particles fly toward the grid 26 while being accelerated by ¥, and when they collide with the vapor deposition material particles that have passed through the grid 26, the particles are positively ionized and ionized.

イオン化された蒸着物質は、グリッド28から別電極6
0へ向う電界の作用により加速されつつ、飛行し、高速
で被蒸着基板100に衝突し、かくして被蒸着基板10
0上に、所望の薄膜を形成する。この薄膜は基板への密
着性にすぐれ、結晶性、配向性がよい。これは、蒸着物
質のイオンfヒによるものである。
The ionized vapor deposition material is transferred from the grid 28 to another electrode 6.
The target substrate 100 flies while being accelerated by the action of the electric field toward 0, and collides with the deposition target substrate 100 at high speed.
A desired thin film is formed on 0. This thin film has excellent adhesion to the substrate, and has good crystallinity and orientation. This is due to ions f of the vapor deposited material.

本発明の薄膜蒸着装置では、蒸発した蒸着物質のイオン
化率が賜いため、真空槽内に活性ガスを単独で、あるい
は不活性ガスととも[4人して蒸着を行うことにより、
蒸発物質と活性ガスとを化合させ、この化合物により薄
膜を形成する場合にも、所望の物性を有する薄j漠を容
易に得ることができる。
In the thin film deposition apparatus of the present invention, since the ionization rate of the evaporated deposition substance is high, the active gas can be used alone or together with an inert gas in the vacuum chamber [by performing the deposition with four people].
Even when a vaporized substance and an active gas are combined and a thin film is formed from this compound, a thin film having desired physical properties can be easily obtained.

例えば、不活性ガスとしてアルゴン、活性ガスとして酸
素ケ導入し1圧力を10 〜1[J  Torrに調整
し、蒸発物質としてアルミニウムを選択すると、被蒸着
全板上にAe203の薄膜を得ることができ、蒸発物質
として、In、Znを選べば、それぞれ、In2O5,
ZnOのン1」腿が得られる。
For example, if argon is introduced as an inert gas and oxygen is introduced as an active gas, the pressure is adjusted to 10 to 1 J Torr, and aluminum is selected as the evaporator, a thin film of Ae203 can be obtained on the entire plate to be evaporated. , if In and Zn are selected as evaporative substances, In2O5,
One inch of ZnO is obtained.

父、活性ガスとして、H2S、蒸発物質としてCd を
選べば、CdSの薄膜が得られる。さらに、活性ガスと
してアンモニアを、アルゴンとともに用い、蒸発!+′
/lJ質としてTi、Taを選べば、TiN 。
If H2S is selected as the active gas and Cd is selected as the evaporative substance, a thin film of CdS can be obtained. Furthermore, ammonia is used as an active gas along with argon to evaporate! +′
/lJ If you choose Ti or Ta as the quality, you will get TiN.

TaNなどの薄膜を得ることか可能であるみ蒸発物質及
び導入ガスのイオン化には、熱電子が有効に寄与するた
め、IQ  Torr以上の高度の真空下で蒸着を行う
ことがd1龍で夛)す、薄膜中へのガス分子のとり込み
を傷めて少なくすることができるため、高純度の薄膜な
傳る・二とができる。
Although it is possible to obtain a thin film of TaN, etc., thermionic electrons effectively contribute to the ionization of the evaporated substance and the introduced gas, so it is necessary to perform the deposition under a high vacuum of IQ Torr or higher). Since it is possible to damage and reduce the incorporation of gas molecules into the thin film, it is possible to create a highly pure thin film.

すなわち、不発明の薄膜蒸着装置は、IC,LSI等を
構成する半導体薄膜や、その電極としての高純度金属薄
膜の形成に適している。
That is, the uninvented thin film deposition apparatus is suitable for forming semiconductor thin films constituting ICs, LSIs, etc., and high-purity metal thin films as electrodes thereof.

(効 果) 以上、本発明によれば新規な薄′;処盗シコ装置を尿供
できる。この装置では、薄;漠形成に与るイオンが、グ
リッドの被蒸着基板側1で発生するので発生したイオン
を有効に薄膜形成に参与させることかでき、薄膜形成を
能羊的5C行うことができる。
(Effects) As described above, according to the present invention, it is possible to provide a novel urination device. In this device, the ions that participate in thin film formation are generated on the deposition substrate side 1 of the grid, so the generated ions can effectively participate in thin film formation, and thin film formation can be performed in an efficient 5C manner. can.

【図面の簡単な説明】[Brief explanation of drawings]

図は、本発明の1実流例を示す一部Di面正面図である
。 10・・・ベースプレート、14・・・ペルジャー、2
4・・・蒸発源、26・・・グリッド、2B・・・フィ
ラメント、30・・・対電極、10口・・・被蒸着基板
The figure is a partially Di-plane front view showing one actual flow example of the present invention. 10...Base plate, 14...Pelger, 2
4... Evaporation source, 26... Grid, 2B... Filament, 30... Counter electrode, 10 ports... Deposition target substrate

Claims (1)

【特許請求の範囲】  活性ガスおよび/または不活性ガスを導入しうる真空
槽と、 この真空槽内に配備された蒸発源と、 上記真空槽内において上記蒸発源と対向するように配備
され、被蒸着基板を保持する対電極と、これら蒸発源と
対電極との間に配備された熱電子発生用のフィラメント
と、 このフィラメントと上記蒸発源との間に配備され、蒸着
物質を通過させうるグリッドと、 真空槽内に所定の電気的状態を実現するための電源手段
と、 真空槽内と上記電源手段とを電気的に連結する導電手段
と、を有し、 上記対電極に対し、上記グリッドが正電位となるように
したことを特徴とする、薄膜蒸着装置。
[Scope of Claims] A vacuum chamber into which an active gas and/or an inert gas can be introduced; an evaporation source disposed within the vacuum chamber; disposed so as to face the evaporation source within the vacuum chamber; a counter electrode that holds the substrate to be evaporated; a filament for generating thermionic electrons that is disposed between these evaporation sources and the counter electrode; and a filament that is disposed between this filament and the evaporation source and that allows the evaporation material to pass through. a grid, a power supply means for achieving a predetermined electrical state in the vacuum chamber, and a conductive means for electrically connecting the inside of the vacuum chamber and the power supply means, and for the counter electrode, the A thin film deposition apparatus characterized in that a grid has a positive potential.
JP61142197A 1986-06-18 1986-06-18 Thin film deposition equipment Expired - Lifetime JPH0765165B2 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP61142197A JPH0765165B2 (en) 1986-06-18 1986-06-18 Thin film deposition equipment
DE19873790317 DE3790317T (en) 1986-06-18 1987-06-18
US07/167,850 US4854265A (en) 1986-06-18 1987-06-18 Thin film forming apparatus
PCT/JP1987/000398 WO1987007916A1 (en) 1986-06-18 1987-06-18 Thin film forming apparatus
DE3790317A DE3790317C2 (en) 1986-06-18 1987-06-18
GB8803148A GB2204596B (en) 1986-06-18 1987-06-18 Thin film forming apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61142197A JPH0765165B2 (en) 1986-06-18 1986-06-18 Thin film deposition equipment

Publications (2)

Publication Number Publication Date
JPS63455A true JPS63455A (en) 1988-01-05
JPH0765165B2 JPH0765165B2 (en) 1995-07-12

Family

ID=15309648

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61142197A Expired - Lifetime JPH0765165B2 (en) 1986-06-18 1986-06-18 Thin film deposition equipment

Country Status (1)

Country Link
JP (1) JPH0765165B2 (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5989763A (en) * 1983-09-28 1984-05-24 Ricoh Co Ltd Vapor deposition device for thin film

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5989763A (en) * 1983-09-28 1984-05-24 Ricoh Co Ltd Vapor deposition device for thin film

Also Published As

Publication number Publication date
JPH0765165B2 (en) 1995-07-12

Similar Documents

Publication Publication Date Title
US5133849A (en) Thin film forming apparatus
US4854265A (en) Thin film forming apparatus
JPH0153351B2 (en)
JPS61143579A (en) Method for feeding plasma ion
JPS63455A (en) Vapor deposition device for thin film
JPH0216380B2 (en)
JP2716715B2 (en) Thin film forming equipment
JPH0250954A (en) Thin film-forming equipment
JP2768960B2 (en) Thin film forming equipment
JPS63310963A (en) Thin film forming device
JP2594949B2 (en) Thin film forming equipment
JP2549398B2 (en) Method for forming thin film of silicon dioxide
JPS63192862A (en) Thin film forming device
JPH01180972A (en) Thin film forming device
JP3174313B2 (en) Thin film forming equipment
JPH0254759A (en) Thin film-forming equipment
JP2905512B2 (en) Thin film forming equipment
JPH0788571B2 (en) Thin film forming equipment
JP2971541B2 (en) Thin film forming equipment
JP2774541B2 (en) Thin film forming equipment
JPH03153866A (en) Thin film forming device
JPH01180971A (en) Thin film forming device
JPH04154962A (en) Thin film forming device
JP3081259B2 (en) Thin film forming equipment
JPH01177366A (en) Thin film forming device