JPS6341782U - - Google Patents
Info
- Publication number
- JPS6341782U JPS6341782U JP13579486U JP13579486U JPS6341782U JP S6341782 U JPS6341782 U JP S6341782U JP 13579486 U JP13579486 U JP 13579486U JP 13579486 U JP13579486 U JP 13579486U JP S6341782 U JPS6341782 U JP S6341782U
- Authority
- JP
- Japan
- Prior art keywords
- burn
- door
- test
- automatic opening
- opening device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010438 heat treatment Methods 0.000 claims 2
- 239000004065 semiconductor Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第1図は本考案の恒温槽の正面図、第2図は自
動開放装置の動作説明図である。
1:恒温槽、2:扉、3:自動開放装置、4:
ロツク装置。
FIG. 1 is a front view of the thermostatic chamber of the present invention, and FIG. 2 is an explanatory diagram of the operation of the automatic opening device. 1: Constant temperature chamber, 2: Door, 3: Automatic opening device, 4:
Locking device.
Claims (1)
扉を自動的に開放する自動開放装置と、この自動
開放装置の開放力に抗して扉の閉塞を保持するロ
ツク装置とを設け、前記ロツク装置にはバーイン
試験の開始時に加温電源を接にすると同時にロツ
クし、バーイン試験終了時に加温電源を断にする
と同時にロツク解除する機構を設けたことを特徴
とする自動開放装置付恒温槽扉。 In a constant temperature chamber that performs semiconductor burn-in tests,
An automatic opening device that automatically opens the door and a locking device that holds the door closed against the opening force of the automatic opening device are provided, and a heating power source is connected to the locking device at the start of the burn-in test. A thermostatic chamber door with an automatic opening device, characterized in that it is equipped with a mechanism that locks the door at the same time as the burn-in test is completed, and releases the lock at the same time as the heating power is turned off at the end of the burn-in test.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13579486U JPS6341782U (en) | 1986-09-03 | 1986-09-03 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13579486U JPS6341782U (en) | 1986-09-03 | 1986-09-03 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6341782U true JPS6341782U (en) | 1988-03-18 |
Family
ID=31038319
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13579486U Pending JPS6341782U (en) | 1986-09-03 | 1986-09-03 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6341782U (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5928347A (en) * | 1982-08-09 | 1984-02-15 | Nec Corp | Screening device for semiconductor device |
JPS6157875B2 (en) * | 1978-03-30 | 1986-12-09 | Kao Corp |
-
1986
- 1986-09-03 JP JP13579486U patent/JPS6341782U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6157875B2 (en) * | 1978-03-30 | 1986-12-09 | Kao Corp | |
JPS5928347A (en) * | 1982-08-09 | 1984-02-15 | Nec Corp | Screening device for semiconductor device |
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