JPS6333097B2 - - Google Patents
Info
- Publication number
- JPS6333097B2 JPS6333097B2 JP54011482A JP1148279A JPS6333097B2 JP S6333097 B2 JPS6333097 B2 JP S6333097B2 JP 54011482 A JP54011482 A JP 54011482A JP 1148279 A JP1148279 A JP 1148279A JP S6333097 B2 JPS6333097 B2 JP S6333097B2
- Authority
- JP
- Japan
- Prior art keywords
- ray
- incident
- detector
- rays
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 12
- 238000002441 X-ray diffraction Methods 0.000 claims description 3
- 239000013078 crystal Substances 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 238000005162 X-ray Laue diffraction Methods 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000001151 other effect Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1148279A JPS55104747A (en) | 1979-02-05 | 1979-02-05 | X-ray diffraction divice |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1148279A JPS55104747A (en) | 1979-02-05 | 1979-02-05 | X-ray diffraction divice |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS55104747A JPS55104747A (en) | 1980-08-11 |
| JPS6333097B2 true JPS6333097B2 (index.php) | 1988-07-04 |
Family
ID=11779264
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1148279A Granted JPS55104747A (en) | 1979-02-05 | 1979-02-05 | X-ray diffraction divice |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55104747A (index.php) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2584187B1 (fr) * | 1985-07-01 | 1987-11-13 | Centre Nat Rech Scient | Procede pour l'etude de la structure cristalline de monocristaux et dispositif pour la mise en oeuvre de ce procede |
| FR2587805B1 (fr) * | 1985-09-24 | 1988-01-15 | Univ Metz | Procede et dispositif de determination de la texture cristallographique d'un materiau polycristallin |
| US4910758A (en) * | 1988-08-09 | 1990-03-20 | Amoco Corporation | X-ray diffraction method for generating mineralogy record of whole core |
-
1979
- 1979-02-05 JP JP1148279A patent/JPS55104747A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS55104747A (en) | 1980-08-11 |
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