JPS6332349A - Vacuum fading testing machine - Google Patents
Vacuum fading testing machineInfo
- Publication number
- JPS6332349A JPS6332349A JP17634186A JP17634186A JPS6332349A JP S6332349 A JPS6332349 A JP S6332349A JP 17634186 A JP17634186 A JP 17634186A JP 17634186 A JP17634186 A JP 17634186A JP S6332349 A JPS6332349 A JP S6332349A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- vacuum
- light
- test
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 47
- 238000005562 fading Methods 0.000 title 1
- 239000000498 cooling water Substances 0.000 claims description 13
- 238000001073 sample cooling Methods 0.000 claims description 6
- 238000001816 cooling Methods 0.000 claims description 5
- 239000011521 glass Substances 0.000 claims description 4
- 230000006866 deterioration Effects 0.000 abstract description 9
- 230000001678 irradiating effect Effects 0.000 abstract description 2
- 239000007789 gas Substances 0.000 description 6
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 235000012489 doughnuts Nutrition 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明は紫外線を発する光源を使用した耐光試験機にお
いて、光に暴露される試料の環境を真空状態にし、光と
温度のみによる劣化試験を行うことのできる真空耐光試
験機に関する。[Detailed Description of the Invention] Industrial Application Field The present invention is a light resistance tester that uses a light source that emits ultraviolet rays, and the environment of the sample exposed to light is made into a vacuum state, and a deterioration test is performed only by light and temperature. This article relates to a vacuum lightfastness tester that can perform
従来の技術
従来の耐光試験機は第５図に示すものが一般的であり、
試験槽１内の光源１０を中心として、その回りを試料１
１を取付けた試料回転枠４ａが回転し、試料１１を照射
し、劣化させるものである。Conventional technology A conventional light resistance tester is generally shown in Fig. 5.
The sample 1 is placed around the light source 10 in the test chamber 1.
The sample rotation frame 4a to which sample 1 is attached rotates to irradiate the sample 11 and cause it to deteriorate.
尚、第５図において４ｂは試料回転台、６は回転軸受、
８は試料回転モータ、１６は循環送風機、１７ａ、１７
ｂは加熱３．１８ａは冷却器、１８ｂは冷凍機、１９は
排気ファンである。In addition, in Fig. 5, 4b is a sample rotating table, 6 is a rotating bearing,
8 is a sample rotation motor, 16 is a circulation blower, 17a, 17
18a is a cooler, 18b is a refrigerator, and 19 is an exhaust fan.
発明が解決しようとする問題点
従来の耐光試験機において試料は、大気中の酸素やカス
又は試料から放出されるガス等の雰囲気に常におかれて
おり、光照射と試験槽内温度による劣化のみでなく、こ
れら雰囲気の影響も受けている。Problems to be Solved by the Invention In conventional light resistance testing machines, samples are always placed in an atmosphere containing atmospheric oxygen, dust, or gases released from the sample, and degradation only occurs due to light irradiation and the temperature inside the test chamber. It is also influenced by these atmospheres.
ところで耐光試験においては、試料が純粋の光と温度に
よる影響を受けて劣化する状態を試験することが前提と
されており、光と温度以外の雰囲気の影響を受けたので
は、正確な劣化試験を行うことができない。By the way, in a light resistance test, the premise is to test the state in which the sample deteriorates due to the influence of pure light and temperature. can't do it.
このため、光と温度以外の雰囲気を排除し、純粋に光照
射と槽内温度だけにより劣化試験を行うことのできる耐
光試験機の開発が強く要請されていた。For this reason, there has been a strong demand for the development of a light resistance tester that can perform deterioration tests using only light irradiation and bath temperature, excluding any atmosphere other than light and temperature.
発明の概要
本発明は上記要請に応えるためになされたものであり、
試料を真空の試験槽内に設置し、試験槽外に設置した光
源により試料を照射し、光と温度のみによる真の劣化試
験を行うことのできる真空耐光試験機を得ることを目的
とする。Summary of the Invention The present invention has been made in response to the above requirements.
The purpose of this project is to obtain a vacuum light resistance tester that can perform true deterioration tests using only light and temperature by placing a sample in a vacuum test chamber and irradiating the sample with a light source installed outside the test chamber.
問題点を解決するための手段
本発明は上記問題点を解決するために以下の手段を採用
する。Means for Solving the Problems The present invention employs the following means to solve the above problems.
真空の試験槽ｌに試料回転枠４ａを回転自在に設け、こ
の試料回転枠４ａに試料冷却水ジャケット等の冷却装置
３ａを設けて試料１１を冷却自在とし、前記試験槽１の
壁面又は壁面近傍に加熱器３ｂを設けると共に試験槽ｌ
に光源１０を設けたことを特徴とする。A sample rotating frame 4a is rotatably provided in a vacuum test chamber 1, and a cooling device 3a such as a sample cooling water jacket is provided on this sample rotating frame 4a to freely cool the sample 11. A heater 3b is installed in the test tank l.
It is characterized in that a light source 10 is provided.
作用
本発明は上記のように構成したことにより、劣化試験を
行うに際し、先ず試料回転枠４ａに試料１１を取付けた
後、真空ポンプ１４を作動させて、試験槽１内を真空状
態とし１次いで光源１０を点灯すると共に試料回転枠４
ａを回転させて所望の劣化試験を行う。Function The present invention is configured as described above, so that when performing a deterioration test, first, the sample 11 is attached to the sample rotating frame 4a, and then the vacuum pump 14 is operated to bring the inside of the test chamber 1 into a vacuum state. The light source 10 is turned on and the sample rotation frame 4 is turned on.
A is rotated to perform the desired deterioration test.
試ＮＩＬは光源１０からの光照射を受けて劣化すると同
時に試験槽ｌ内の温度は測温体２ａを介して設定温度に
保持され、この設定温度の状態で試料１１は劣化してい
く。The test NIL deteriorates upon being irradiated with light from the light source 10, and at the same time the temperature inside the test chamber 1 is maintained at a set temperature via the temperature measuring element 2a, and the sample 11 deteriorates at this set temperature.
試料１１が設置された試験槽ｌ内は、真空ポンプ１４の
作動で常時真空状態とされており、試料１１から放出さ
れるガスは、この真空ポンプ１４で吸引され、試験槽１
内の試料１１は、空気中のガス及び化合生成ガスによる
影響を一切受けることなく、純粋に光照射と槽内温度に
よる彩πだけを受けて劣化が進行する。The inside of the test chamber l in which the sample 11 is installed is kept in a vacuum state at all times by the operation of the vacuum pump 14, and the gas released from the sample 11 is sucked by this vacuum pump 14, and the inside of the test chamber 1 is kept in a vacuum state.
The sample 11 in the tank is not affected by the gas in the air or the gas produced by the combination, and its deterioration progresses as it is purely exposed to light irradiation and the color π caused by the temperature inside the tank.
前記槽内温度の保持は、加熱器３ｂの作動及び試料冷却
水ジャケット等の冷却装置３ａへの冷却水の送給を調節
することによりなされる。The temperature inside the tank is maintained by adjusting the operation of the heater 3b and the supply of cooling water to the cooling device 3a such as a sample cooling water jacket.
実施例 以下本発明の実施例を図面にもとづいて説明する。Example Embodiments of the present invention will be described below based on the drawings.
第１図において、試験槽ｌには真空ポンプ１４が槽底部
に連絡されており、試験槽１内は真空に保持されている
。In FIG. 1, a vacuum pump 14 is connected to the bottom of the test tank 1, and the inside of the test tank 1 is maintained in a vacuum.
前記試験槽ｌには試料回転枠４ａが回転自在に設けられ
ており、試料１１は該回転枠４ａの中心に対して外向き
、すなわち、該回転枠４ａの外周側に取外し自在に取付
けられている。A sample rotating frame 4a is rotatably provided in the test chamber 1, and the sample 11 is removably mounted facing outward with respect to the center of the rotating frame 4a, that is, on the outer circumferential side of the rotating frame 4a. There is.
ドーナツ状の試料冷却水ジャケット等の冷却装置３ａは
、試料１１の裏面を冷却するために試料１１の裏面に位
置するように試料回転枠４ａに取付けられている。この
シャケ７ ト３ａには冷却水入ロバイブ５ｂ及び冷却水
出ロバイブ５ａが取付けられて、ジャケット３ａ内の冷
却水は循環自在とされている。A cooling device 3a such as a doughnut-shaped sample cooling water jacket is attached to the sample rotating frame 4a so as to be located on the back surface of the sample 11 in order to cool the back surface of the sample 11. A cooling water inlet pipe 5b and a cooling water outlet pipe 5a are attached to this jacket 7a, so that the cooling water in the jacket 3a can be freely circulated.
試験槽１の一側部には紫外線透過ガラスからなる光取入
窓１２が設けられており、語意１２の後方、すなわち試
験槽１外に光源１０が設けられている。A light intake window 12 made of ultraviolet-transmitting glass is provided on one side of the test chamber 1, and a light source 10 is provided behind the test chamber 12, that is, outside the test chamber 1.
第１図において、２ｂは回転接点機構、２ａは測温体で
あり、試験槽ｌ内の温度をＪ１１定して冷却水の循環を
調節し又は第２図に示す加熱器３ｂを操作して試験槽１
内の温度を所定温度に保持する作用を有する。In Fig. 1, 2b is a rotating contact mechanism, 2a is a temperature measuring element, and is used to maintain the temperature in the test chamber l and adjust the circulation of cooling water, or to operate the heater 3b shown in Fig. 2. Test tank 1
It has the function of maintaining the internal temperature at a predetermined temperature.
４ｂは試料回転台、６は回転軸受、７は通水回転軸、８
は試料回転モータ、９はロータリージヨイント、１３は
送風機、２２は冷却水入口、２３は冷却水出口である。4b is a sample rotating table, 6 is a rotating bearing, 7 is a water flow rotating shaft, 8
1 is a sample rotating motor, 9 is a rotary joint, 13 is a blower, 22 is a cooling water inlet, and 23 is a cooling water outlet.
第４図に示すものは本発明の他の実施例を示すもので、
試験槽ｌの中央部及び試料回転枠４ａの中央部に円筒室
２０が形成され、この円筒室２０内に光源１０が設置さ
れている。What is shown in FIG. 4 shows another embodiment of the present invention.
A cylindrical chamber 20 is formed in the center of the test chamber 1 and the center of the sample rotating frame 4a, and a light source 10 is installed within this cylindrical chamber 20.
この実施例においては、光源１０が試料回転枠４ａの中
央部に設置されており、それに応じて試料１１及び測温
体２ａは、該回転枠４ａの内側に取付けられると共に試
料冷却水ジャケット等の冷却装置３ａは試料１１の外側
に設置されている。In this embodiment, the light source 10 is installed in the center of the sample rotating frame 4a, and accordingly, the sample 11 and the temperature measuring element 2a are installed inside the rotating frame 4a, and a sample cooling water jacket, etc. The cooling device 3a is installed outside the sample 11.
この実施例における試験槽ｌは、あたかもドーナツ型に
形成して円筒室２０が形成されており、該円筒室２０の
内壁２１は、紫外線透過ガラスで形成されて、光源１０
の光照射を試験槽ｌ内へ透過自在としている。The test chamber l in this embodiment has a cylindrical chamber 20 formed in the shape of a doughnut, and an inner wall 21 of the cylindrical chamber 20 is made of ultraviolet-transmissive glass.
The light irradiation can be transmitted freely into the test chamber l.
発明の効果
本発明は上記のように構成されていることにより、試験
槽内は真空に保持され、大気中の酸素やガスは一切排除
されると共に試料から放出されるガスも同時に除去する
ことができ、試料は純粋に光と温度のみによる真の劣化
を行うことができるものであり、正確な耐光試験を行う
ことができるものである。Effects of the Invention By having the above-described structure of the present invention, the inside of the test chamber is kept in a vacuum, and all oxygen and gases in the atmosphere are removed, as well as gases released from the sample. The sample can be truly degraded purely by light and temperature, and accurate light resistance tests can be performed.
第１図は本発明の縦断正面図、第２図は同上の横断平面
図、第３図は試料冷却水ジャケット及び試お１の取付は
状態を示す斜面図、第４図は本発明の他′の実施例を示
す縦断正面図、第５図は従来の耐光試験機を示す縦断正
面図である。
１・・・・・・試験槽Fig. 1 is a vertical sectional front view of the present invention, Fig. 2 is a cross-sectional plan view of the same as above, Fig. 3 is a perspective view showing the installation state of the sample cooling water jacket and the test tube 1, and Fig. 4 is a cross-sectional view of the present invention. FIG. 5 is a vertical front view showing the conventional light resistance tester. 1...Test tank
Claims (1)
在に設け、この試料回転枠（４ａ）に試料冷却水ジャケ
ット等の冷却装置（３ａ）を設けて試料（１１）を冷却
自在とし、前記試験槽（１）の壁面又は壁面近傍に加熱
器（３ｂ）を設けると共に試験槽（１）に光源（１０）
を設けたことを特徴とする真空耐光試験機。 ２）試料回転枠（４ａ）の外側に試料（１１）を取付け
たことを特徴とする特許請求の範囲第１項記載の真空耐
光試験機。 ３）試験槽（１）の一側部に紫外線透過ガラスからなる
光取入窓（１２）を設け、該窓（１２）の後方に光源（
１０）を設けたことを特徴とする特許請求の範囲第１項
又は第２項記載の真空耐光試験機。 ４）試料回転枠（４ａ）の内側に試料（１１）を取付け
たことを特徴とする特許請求の範囲第１項記載の真空耐
光試験機。 ５）試験槽（１）の中央部及び試料回転枠（４ａ）の中
央部に円筒室（２０）を形成し、この円筒室（２０）内
に光源（１０）を設置したことを特徴とする特許請求の
範囲第１項又は第４項記載の真空耐光試験機。 ６）円筒室（２０）の内壁（２１）を紫外線透過ガラス
で形成したことを特徴とする特許請求の範囲第１項、第
４項又第５項記載の真空耐光試験機。[Claims] 1) A sample rotation frame (4a) is rotatably provided in a vacuum test chamber (1), and a cooling device (3a) such as a sample cooling water jacket is provided on this sample rotation frame (4a). The sample (11) can be cooled freely, a heater (3b) is provided on or near the wall of the test tank (1), and a light source (10) is provided in the test tank (1).
A vacuum lightfastness tester characterized by being equipped with. 2) The vacuum light fastness tester according to claim 1, characterized in that the sample (11) is attached to the outside of the sample rotating frame (4a). 3) A light intake window (12) made of ultraviolet-transmitting glass is provided on one side of the test chamber (1), and a light source (
10) The vacuum light resistance tester according to claim 1 or 2, characterized in that it is provided with: 4) The vacuum light fastness tester according to claim 1, characterized in that the sample (11) is mounted inside the sample rotating frame (4a). 5) A cylindrical chamber (20) is formed in the center of the test tank (1) and the center of the sample rotating frame (4a), and a light source (10) is installed in this cylindrical chamber (20). A vacuum light resistance tester according to claim 1 or 4. 6) The vacuum light resistance tester according to claim 1, 4, or 5, characterized in that the inner wall (21) of the cylindrical chamber (20) is made of ultraviolet-transmitting glass.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17634186A JPS6332349A (en) | 1986-07-25 | 1986-07-25 | Vacuum fading testing machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17634186A JPS6332349A (en) | 1986-07-25 | 1986-07-25 | Vacuum fading testing machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6332349A true JPS6332349A (en) | 1988-02-12 |
Family
ID=16011889
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17634186A Pending JPS6332349A (en) | 1986-07-25 | 1986-07-25 | Vacuum fading testing machine |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6332349A (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4932359A (en) * | 1972-07-27 | 1974-03-25 | ||
| JPS55136700A (en) * | 1979-04-06 | 1980-10-24 | Mitsubishi Electric Corp | Space simulation test method |
| JPS5948643A (en) * | 1982-09-14 | 1984-03-19 | Ueshima Seisakusho:Kk | Artificially promoted tester for fastness to light |
| JPS6168535A (en) * | 1984-09-12 | 1986-04-08 | Hitachi Ltd | Vacuum environment tester |
-
1986
- 1986-07-25 JP JP17634186A patent/JPS6332349A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4932359A (en) * | 1972-07-27 | 1974-03-25 | ||
| JPS55136700A (en) * | 1979-04-06 | 1980-10-24 | Mitsubishi Electric Corp | Space simulation test method |
| JPS5948643A (en) * | 1982-09-14 | 1984-03-19 | Ueshima Seisakusho:Kk | Artificially promoted tester for fastness to light |
| JPS6168535A (en) * | 1984-09-12 | 1986-04-08 | Hitachi Ltd | Vacuum environment tester |
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