CN217981743U

CN217981743U - Chip high-low temperature testing mechanism

Info

Publication number: CN217981743U
Application number: CN202222285901.2U
Authority: CN
Inventors: 李勇; 刘湘鹏; 刘振华
Original assignee: Shenzhen Juxinli Technology Co ltd
Current assignee: Shenzhen Juxinli Technology Co ltd
Priority date: 2022-08-29
Filing date: 2022-08-29
Publication date: 2022-12-06
Anticipated expiration: 2032-08-29

Abstract

The utility model relates to the high and low temperature testing field, in particular to a chip high and low temperature testing mechanism, which comprises a base, a shell, a heat preservation cover, a connecting bracket, a blower, a rotating door, a rotating connecting rod, a sliding bracket and a tray; the top of the base is connected with the shell; the outer end face of the shell is connected with the heat-insulating cover; the side surface of the shell is connected with the connecting bracket; one end of the connecting bracket, which is far away from the shell, is connected with the control box; the side surface of the shell is connected with the blower; the side surface of the shell is rotationally connected with the rotating door; the rotating door is provided with an observation window; the inner wall of the rotating door is connected with the rotating connecting rod; the rotating connecting rod is connected with the inner wall of the shell in a sliding way; the utility model discloses a this device can be effectual the improvement to the temperature control precision of chip in the time practiced thrift the energy that control changes the temperature, the dust in the middle of the air can be prevented to the filter screen on the air-blower simultaneously and get into, has reduced the inside air particulate matter concentration of casing when having avoided static to produce the influence to the chip and can make this device inside temperature more even.

Description

Chip high-low temperature testing mechanism

Technical Field

The utility model relates to a high low temperature test technical field especially relates to a high low temperature test mechanism of chip.

Background

With the rapid development of the semiconductor industry, chips are widely applied to various aspects of life, some chips need to work in high and low temperature environments, and therefore the chips must have the capability of normally working in the high and low temperature environments, whether the chips can normally work in the high and low temperature environments needs to be verified after the chips are designed and produced, and a device for testing the chips at high and low temperatures is absent in the industry at present, so that the chips cannot be tested and verified in the high and low temperature environments.

The Chinese patent with the granted publication number of CN114047428A discloses a chip high and low temperature testing device, which comprises a box body, a first material bearing disc, a second material bearing disc, a supporting mechanism and a sealing element, wherein the box body is used for accommodating a chip and heating or cooling the chip, and a material taking and placing hole is formed in one side wall of the box body; the first material bearing disc and the second material bearing disc are used for bearing chips, and the first material bearing disc and the second material bearing disc can be inserted into the box body or pulled out of the box body through the material taking and placing hole; the supporting mechanism is arranged in the box body, and the first material bearing disc and the second material bearing disc are supported on the supporting mechanism when being inserted into the material taking and placing hole; the sealing member can seal get and put the material hole, and it has can heat or cool down the chip on the first material bearing disc, and then after accomplishing the chip test on the second material bearing disc, can directly test the chip of first material bearing disc to improve chip test efficiency, save test time etc. and have a bit.

However, the above-mentioned known solutions have the following disadvantages: above-mentioned scheme has shell structure too simply to lead to inside temperature to run off fastly in the middle of the in-service use to reduced the accuracy of high low temperature test, had the influence of the particulate matter that contains in the middle of the air among the discharge test process in the above-mentioned device simultaneously.

SUMMERY OF THE UTILITY MODEL

The utility model aims at the technical problem who exists among the background art, the utility model provides a high low temperature test mechanism of chip, the utility model discloses a this device can practice thrift the energy that the control changes the temperature when the temperature control precision of chip by effectual improvement, and the filter screen on the air-blower can prevent that the dust in the middle of the air from getting into simultaneously, has reduced the inside air particulate matter concentration of casing when having avoided static to produce the influence to the chip and can make this device inside temperature more even.

The utility model provides a chip high and low temperature testing mechanism, which comprises a base, a shell, a heat preservation cover, a connecting bracket, a control box, an air blower, a rotating door, a rotating connecting rod, a sliding bracket and a tray;

the top of the base is connected with the shell; the outer end face of the shell is connected with the heat-insulating cover; the side surface of the shell is connected with the connecting bracket; one end of the connecting bracket, which is far away from the shell, is connected with the control box; the side surface of the shell is connected with the blower; the side surface of the shell is rotationally connected with the rotating door; the rotating door is provided with an observation window; the inner wall of the rotating door is connected with the rotating connecting rod; the rotating connecting rod is connected with the inner wall of the shell in a sliding way; the side surface of the inner wall of the shell is connected with the sliding support; the sliding support is connected with the tray in a sliding manner; a handle is arranged on the outer end surface of the rotating door; the bottom of the inner wall of the shell is provided with a compressor and a heating element, the outer end face of the side face of the shell is provided with a display screen, the side face of the inner side of the shell is provided with a temperature sensor, and the temperature sensor is in communication connection with the display screen.

Preferably, the rotating door is provided with a sealing element, and the sealing element is contacted and pressed with the side seam of the shell.

Preferably, be equipped with control knob on the control box, control knob and compressor control connection, control knob and heating member control connection.

Preferably, a filter screen is arranged on the air blower and arranged at an air inlet of the air blower.

Preferably, a sliding groove is formed in the shell, the sliding groove is connected with the rotating connecting rod in a sliding mode, and a blocking piece is arranged at one end, far away from the rotating door, of the rotating connecting rod.

Preferably, a sliding rail is arranged on the top of the sliding support, a sliding block is arranged on the bottom of the tray, and the sliding rail is connected with the sliding block in a sliding mode.

Preferably, a plurality of groups of vent holes distributed in a matrix manner are formed in the tray, and a plurality of groups of sliding brackets and the tray are distributed in the shell at equal intervals.

Preferably, the bottom of the base is provided with a plurality of groups of fixing threaded holes which are distributed around the bottom of the base.

The above technical scheme of the utility model has following profitable technological effect:

the utility model discloses an this device can be effectual the improvement to the temperature control precision of chip the time practiced thrift the energy that control changes the temperature, filter screen on the air-blower can prevent that the dust in the middle of the air from getting into simultaneously, it can make this device inside temperature more even to have reduced the inside air particulate matter concentration of casing when having avoided static to exert an influence to the chip, the rotational stability of this device can effectually be improved through the combination of revolving door and rotation connecting rod, this device that has avoided excessive rotation to lead to takes place to damage, the state of chip when the staff can be convenient for survey current temperature in real time through the observation window, the combination of while sliding support and tray can make the chip be heated or cool down more evenly when improving this device casing inside space utilization's tray that simultaneously has the mesh.

Drawings

Fig. 1 is a schematic structural diagram of an embodiment of a chip high and low temperature testing mechanism according to the present invention;

fig. 2 is a side view of a chip high and low temperature testing mechanism provided by the present invention;

fig. 3 is a front view of a chip high and low temperature testing mechanism provided by the present invention;

reference numerals: 1. a base; 2. a housing; 3. a heat-preserving cover; 4. connecting a bracket; 5. a control box; 6. a blower; 7. rotating the door; 8. rotating the connecting rod; 9. an observation window; 10. a sliding support; 11. a tray.

Detailed Description

Example one

As shown in fig. 1-3, the chip high and low temperature testing mechanism provided by the present invention comprises a base 1, a housing 2, a heat preservation cover 3, a connecting bracket 4, a control box 5, an air blower 6, a rotating door 7, a rotating connecting rod 8, a sliding bracket 10 and a tray 11;

the top of the base 1 is connected with the shell 2; the outer end face of the shell 2 is connected with the heat-insulating cover 3; the side surface of the shell 2 is connected with a connecting bracket 4; one end of the connecting bracket 4 far away from the shell 2 is connected with the control box 5; the side surface of the shell 2 is connected with a blower 6; the side surface of the shell 2 is rotationally connected with a rotating door 7; an observation window 9 is arranged on the rotating door 7; the inner wall of the rotating door 7 is connected with a rotating connecting rod 8; the rotating connecting rod 8 is connected with the inner wall of the shell 2 in a sliding way; the side surface of the inner wall of the shell 2 is connected with a sliding bracket 10; the sliding support 10 is connected with the tray 11 in a sliding manner; a handle is arranged on the outer end surface of the rotating door 7; the bottom of the inner wall of the shell 2 is provided with a compressor and a heating element, the outer end face of the side face of the shell 2 is provided with a display screen, the side face inside the shell 2 is provided with a temperature sensor, and the temperature sensor is in communication connection with the display screen; a sealing element is arranged on the rotating door 7 and is in contact extrusion with the seam of the side surface of the shell 2; a filter screen is arranged on the blower 6 and is arranged at an air inlet of the blower 6; a slide rail is arranged on the top of the sliding support 10, a slide block is arranged on the bottom of the tray 11, and the slide rail is connected with the slide block in a sliding manner; a plurality of groups of vent holes distributed in a matrix form are arranged on the tray 11, and a plurality of groups of sliding supports 10 and the tray 11 are distributed in the shell 2 at equal intervals; the bottom of the base 1 is provided with a plurality of groups of fixing threaded holes which are distributed around the bottom of the base 1.

In this embodiment, can effectual improvement be to chip operating condition's detection efficiency and detection precision under different temperatures through this device, the structure of cover 3 that keeps warm can reduce the heat exchange efficiency between this device inner space and the external environment, thereby the save time of this device inner space has been improved, the operating power of compressor and heating member has been reduced, simultaneously through the combination of the display screen of side and temperature sensor can the effectual temperature control precision that improves this device, thereby staff's test accuracy has been guaranteed, the combination of air-blower 6 and the filter screen through the side can reduce the inside dust concentration of this device in the middle of the process of taking a breath to this device inner space, thereby the static condition takes place under the low temperature state has been avoided, the stability of chip work has been guaranteed, the sealing member structure of revolving door 7 can avoid opening and shutting the edge to take place the temperature and reveal simultaneously, the inside constancy of temperature effect of this device has been improved.

Example two

As shown in fig. 2-3, compared with the first embodiment, in the first embodiment, the chip high and low temperature testing mechanism provided by the present invention has a control knob on the control box 5, the control knob is connected to the compressor, and the control knob is connected to the heating element; be equipped with the slip recess on the casing 2 inside, slip recess and rotation connecting rod 8 sliding connection, rotation connecting rod 8 is kept away from rotating door 7 and is served and be equipped with the piece that blocks.

The utility model discloses an in the embodiment, the staff of being convenient for of control knob's structure is controlled this device internal temperature, can prevent through blockking that the revolving door 7 from taking place excessive rotation.

The embodiments of the present invention have been described in detail with reference to the drawings, but the present invention is not limited thereto, and various changes can be made without departing from the gist of the present invention within the knowledge of those skilled in the art.

Claims

1. A chip high and low temperature testing mechanism is characterized by comprising a base (1), a shell (2), a heat-insulating cover (3), a connecting support (4), a control box (5), a blower (6), a rotating door (7), a rotating connecting rod (8), a sliding support (10) and a tray (11);

the top of the base (1) is connected with the shell (2); the outer end face of the shell (2) is connected with the heat-insulating cover (3); the side surface of the shell (2) is connected with the connecting bracket (4); one end of the connecting bracket (4) far away from the shell (2) is connected with the control box (5); the side surface of the shell (2) is connected with a blower (6); the side surface of the shell (2) is rotationally connected with the rotating door (7); an observation window (9) is arranged on the rotating door (7); the inner wall of the rotating door (7) is connected with a rotating connecting rod (8); the rotating connecting rod (8) is connected with the inner wall of the shell (2) in a sliding way; the side surface of the inner wall of the shell (2) is connected with the sliding support (10); the sliding support (10) is connected with the tray (11) in a sliding way; a handle is arranged on the outer end surface of the rotating door (7); the compressor and the heating element are arranged on the bottom of the inner wall of the shell (2), the display screen is arranged on the outer end face of the side face of the shell (2), the temperature sensor is arranged on the side face inside the shell (2), and the temperature sensor is in communication connection with the display screen.

2. The chip high and low temperature testing mechanism according to claim 1, wherein the rotating door (7) is provided with a sealing member, and the sealing member is contacted and pressed with the side seam of the shell (2).

3. The chip high and low temperature test mechanism according to claim 1, wherein the control box (5) is provided with a control knob, the control knob is connected with the compressor control, and the control knob is connected with the heating element control.

4. The chip high and low temperature testing mechanism according to claim 1, wherein a filter screen is arranged on the blower (6), and the filter screen is arranged at an air inlet of the blower (6).

5. The chip high and low temperature testing mechanism according to claim 1, wherein a sliding groove is formed in the housing (2), the sliding groove is slidably connected with the rotating connecting rod (8), and a blocking member is arranged at one end of the rotating connecting rod (8) far away from the rotating door (7).

6. The high and low temperature chip testing mechanism according to claim 1, wherein a slide rail is provided on the top of the sliding support (10), a slider is provided on the bottom of the tray (11), and the slide rail is slidably connected to the slider.

7. The high and low temperature chip testing mechanism according to claim 1, wherein the tray (11) has a plurality of sets of matrix-type ventilation holes, and the plurality of sets of sliding brackets (10) and the tray (11) are equally spaced inside the housing (2).

8. The high and low temperature chip testing mechanism according to claim 1, wherein a plurality of sets of fixing threaded holes are formed in the bottom of the base (1), and the plurality of sets of fixing threaded holes are distributed around the bottom of the base (1).