JPS63315922A - Spectral photometric device - Google Patents
Spectral photometric deviceInfo
- Publication number
- JPS63315922A JPS63315922A JP15118587A JP15118587A JPS63315922A JP S63315922 A JPS63315922 A JP S63315922A JP 15118587 A JP15118587 A JP 15118587A JP 15118587 A JP15118587 A JP 15118587A JP S63315922 A JPS63315922 A JP S63315922A
- Authority
- JP
- Japan
- Prior art keywords
- light
- order
- diffracted light
- diffraction grating
- diffracted
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003595 spectral effect Effects 0.000 title abstract description 6
- 102100027340 Slit homolog 2 protein Human genes 0.000 abstract description 2
- 101710133576 Slit homolog 2 protein Proteins 0.000 abstract description 2
- 238000005375 photometry Methods 0.000 abstract description 2
- 230000015572 biosynthetic process Effects 0.000 abstract 2
- 230000003287 optical effect Effects 0.000 description 10
- 238000004611 spectroscopical analysis Methods 0.000 description 5
- 238000001228 spectrum Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000000701 chemical imaging Methods 0.000 description 2
- 240000004050 Pentaglottis sempervirens Species 0.000 description 1
- 235000004522 Pentaglottis sempervirens Nutrition 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は分光i11’l光装置に係り、特にアレー形検
知)!:(を有する分光11111光装置に使用するの
に好適な分光8+11光装置に関するものである。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a spectroscopic optical device, particularly for array type detection)! :(This relates to a spectroscopy 8+11 optical device suitable for use in a spectroscopy 11111 optical device.
従来のこの種装置は、特開昭59−131123号公報
記載のように、アレー形検知器(固体撮像素子)上に結
像するスペクトル像の高次除去用に検知器前面所定位置
に高次光カットフィルタを設置することにより1本来の
回折光と高次回折光を分離検出するようになっていた。Conventional devices of this type have a high-order light cut at a predetermined position in front of the detector to remove high-order spectral images formed on an array type detector (solid-state image pickup device), as described in Japanese Patent Application Laid-Open No. 59-131123. By installing a filter, the original diffracted light and the higher-order diffracted light can be detected separately.
しかし、この方法では、フィルタの装着された部分と装
着されない部分の境界部における光線の屈折、散乱によ
るスペクトル像の乱れに関しては配慮されていなかった
。However, this method does not take into consideration the disturbance of the spectral image due to refraction and scattering of light rays at the boundary between the portion where the filter is attached and the portion where the filter is not attached.
分光研究 第32巻 第3号(1983年)の第173
頁から第182頁の喜多敏昭検の「フラットフィールド
・ポリクロメータ用機械刻線収着補正凹面回折格の開発
」と題する文献は、本発明の理論的背景をなすものであ
るが、高次回折光が重畳するような広い波長範囲に亘る
分光d11光装置に関しては配慮されていない。Spectroscopy Research Vol. 32 No. 3 (1983) No. 173
The document titled ``Development of Mechanically Scored Sorption-Corrected Concave Diffraction Grating for Flat-Field Polychromators'' by Toshiaki Kita on pages 182 to 182 forms the theoretical background of the present invention. No consideration has been given to a spectroscopy d11 optical device covering a wide wavelength range in which the wavelengths overlap.
上記従来技術による光学配置図は第3図に示すようしこ
入射スリン1へ72を通った入射光71は、凹面回折格
子74で分散回折され、アレー形検知器76に検知され
る。このとき回折光に重畳される高次回折光は、高次光
カットフィルタ77を所定位置に設定することにより除
去していた。The optical arrangement according to the above-mentioned prior art is shown in FIG. 3. Incoming light 71 that passes through 72 into the thin-input sulin 1 is dispersed and diffracted by a concave diffraction grating 74, and detected by an array type detector 76. At this time, the high-order diffracted light superimposed on the diffracted light was removed by setting the high-order light cut filter 77 at a predetermined position.
上1忙従来技術においては、連続スペクトルを検出する
場合に関しては配慮されておらず、高次光カットフィル
タの端部でスペクトルに段差が生ずるという問題があっ
た。また、分光研究による報告では、スペクトル結像位
置に関しては詳細に開示されているが、波長範囲が狭く
、広い範囲に亘る連続スペク1〜ルを得る目的の分光d
111光装置としては使用できない。In the above-mentioned prior art, no consideration was given to the case of detecting a continuous spectrum, and there was a problem in that a step difference occurred in the spectrum at the end of the high-order light cut filter. In addition, reports on spectroscopic research disclose details regarding the spectral imaging position, but the wavelength range is narrow and the spectral d for the purpose of obtaining continuous spectra over a wide range.
It cannot be used as an 111 optical device.
本発明の目的は、アレー形検知器を複数個使用し、検知
器毎に高次光カットフィルタを独立に設定することによ
り、m−検知器内でのフィルタ切換部をなくし、連続で
広範囲に亘る分光測光ができる分光測光装置を提供する
ことにある。The purpose of the present invention is to use a plurality of array-type detectors and independently set a high-order light cut filter for each detector, thereby eliminating the filter switching section within the m-detector and achieving continuous spectroscopy over a wide range. An object of the present invention is to provide a spectrophotometric device capable of photometry.
」二記目的は、波長範囲に応じて回折次数の異なる回折
光を複数のアレー形検知器で検出する構成として達成す
るようにした。The second object is achieved by using a configuration in which a plurality of array type detectors detect diffracted light having different orders of diffraction depending on the wavelength range.
一般的に同性時の高次回折光は、広い波長範囲をとると
重畳するような位置となってくるが、異符号の回折光は
O次回折光を境界として別れた位置に現れる。よって各
々別のフィルタを独立に装着することができ、検知器内
部におけるフィルタの切換部をなくし、連続なスペクト
ルを得るようにした。In general, high-order diffracted lights of the same gender will overlap in a wide wavelength range, but diffracted lights of opposite signs will appear in separate positions with the O-order diffracted light as a boundary. Therefore, different filters can be installed independently, and a continuous spectrum can be obtained by eliminating the need for a filter switching section inside the detector.
以下本発明を第1図に示した実施例及び第2図を用いて
詳細に説明する。The present invention will be described in detail below with reference to the embodiment shown in FIG. 1 and FIG. 2.
第1図は本発明の分光測光装置の一実施例を示す光学系
統図である。第1図において、1は入射光、2は入射ス
リット、3は凹面回折格子で、入射スリット2を入射す
る入射光1は凹面回折格子3で分解回折される。この回
折光は凹面回折格子3の結像性によりスペクトル結像位
置曲線20に示されるような位置に波長毎に結像する。FIG. 1 is an optical system diagram showing an embodiment of the spectrophotometric device of the present invention. In FIG. 1, 1 is an incident light, 2 is an entrance slit, and 3 is a concave diffraction grating. The incident light 1 entering the entrance slit 2 is separated and diffracted by the concave diffraction grating 3. This diffracted light is imaged at a position shown by a spectral imaging position curve 20 for each wavelength due to the imaging property of the concave diffraction grating 3.
O次回折光12を境として十次数側回折光と一部数側回
折光は別々の位置に結像する。いま、波長範囲が340
nmから900nmのような分光測光装置について考え
る。この波長域においては、340nmから450nm
の+2次回折光は680nI11から900nmの+1
次回折光と重畳した位置に呪われる。よって600nm
から900nmの波長の光は、600nm以下をカット
する高次光カットフィルタ5を通して+1次回折光11
の位置でアレー検知器4で検知する。With the O-order diffracted light 12 as a boundary, the 10th-order diffracted light and the partial several-order diffracted light form images at different positions. Currently, the wavelength range is 340
Consider a spectrophotometer such as nm to 900 nm. In this wavelength range, from 340nm to 450nm
The +2nd order diffracted light of +1 of 900nm from 680nI11
It is cursed by the position where it overlaps with the next diffracted light. Therefore, 600nm
The light with a wavelength of 900 nm from
It is detected by the array detector 4 at the position.
340nmから600nmの波長域での一1次回折光1
3に対する一2次回折光は、170nmから300nm
の波長の光が重なることになるが、通常の白熱燈におい
ては、この領域にエネルギーを持たないので、アレー形
検知器4で直に受ける。1st order diffracted light 1 in the wavelength range from 340nm to 600nm
The primary and secondary diffracted light for 3 is from 170 nm to 300 nm.
The wavelengths of light overlap, but since a normal incandescent lamp does not have energy in this region, it is directly received by the array detector 4.
このような配置によって1つのアレー形検知器4の内部
では、フィルタの切換えろ部分をなくすことができ、フ
ィルタ端部における光学的不連続を解消した連続スペク
)ヘルを得ることができる。With such an arrangement, it is possible to eliminate a filter switching section within one array type detector 4, and it is possible to obtain a continuous spectrum that eliminates optical discontinuity at the ends of the filter.
第2図は凹面回折格子の拡大模式図である。本発明の実
施例によれば、波長範囲に応じてアレー形検知器4を独
立に使用するので、第2図に示すように各々の回折光方
向に+1次回折光ブレーズ30と一1次回折光ブレーズ
31を独立に設けることにより、それぞれブレーズされ
た回折光を得ることができる。このときブレーズ面面積
をそれぞれの光量がバランスするように刻線しておけば
、各々のアレー形検知器4においてエネルギー的にもバ
ランスの採れた分光測光装置とすることもできる。FIG. 2 is an enlarged schematic diagram of a concave diffraction grating. According to the embodiment of the present invention, since the array type detector 4 is used independently depending on the wavelength range, a +1st order diffracted light blaze 30 and a 11st order diffracted light blaze 30 are used in each diffracted light direction as shown in FIG. By providing 31 independently, blazed diffracted light can be obtained from each. At this time, if the area of the blazed surface is marked with lines so that the respective amounts of light are balanced, it is possible to obtain a spectrophotometric device in which each array type detector 4 is energy-balanced.
以」ユ説明した本発明によれば、1つのアレー形検知器
に対し、1つのフィルタで対応できるので、フィルタ端
部における光学的ショックをなくすことができるという
効果がある。According to the present invention as described above, one filter can be used for one array type detector, so there is an effect that optical shock at the ends of the filter can be eliminated.
第1図は本発明の分光測光装置の一実施例を示す光学系
統図、第2図は凹面回折格子の拡大模式図、第3図は従
来の分光ル1す光装置の鳥峨図である。
1・・入射光、2・・入射スリット、3・・・凹面回折
格子、4・・アレー形検知器、5・・・高次光カットフ
ィルタ。Fig. 1 is an optical system diagram showing an embodiment of the spectrophotometric device of the present invention, Fig. 2 is an enlarged schematic diagram of a concave diffraction grating, and Fig. 3 is a bird's-eye view of a conventional spectrophotometric device. . 1...Incoming light, 2...Incoming slit, 3...Concave diffraction grating, 4...Array type detector, 5...High-order light cut filter.
Claims (1)
フィルタとよりなる分光測光装置において、波長範囲に
応じて回折次数の異なる回折光を複数の前記アレー形検
知器で検知する構成としたことを特徴とする分光測光装
置。 2、前記回折次数として+1次と−1次を選んである特
許請求の範囲第1項記載の分光測光装置。 3、前記凹面回折格子は、格子面を+1次回折光と−1
次回折光にブレーズするように刻線した構成としてある
特許請求の範囲第1項または第2項記載の分光測光装置
。 4、前記それぞれのブレーズ面面積を回折光量が均衡す
るように配分してある特許請求の範囲第3項記載の分光
測光装置。[Claims] 1. In a spectrophotometer comprising a concave diffraction grating, an array type detector, and a high-order light cut filter, diffracted light having different orders of diffraction depending on the wavelength range is detected by a plurality of the array type detectors. A spectrophotometric device characterized by having a configuration for detecting. 2. The spectrophotometric device according to claim 1, wherein the +1st order and -1st order are selected as the diffraction orders. 3. The concave diffraction grating has a grating surface that separates the +1st-order diffracted light and the -1st-order diffraction light.
The spectrophotometric device according to claim 1 or 2, wherein the spectrophotometer has a structure in which the lines are scored so as to blaze the next diffracted light. 4. The spectrophotometer according to claim 3, wherein the areas of the respective blazed surfaces are distributed so that the amount of diffracted light is balanced.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15118587A JPS63315922A (en) | 1987-06-19 | 1987-06-19 | Spectral photometric device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15118587A JPS63315922A (en) | 1987-06-19 | 1987-06-19 | Spectral photometric device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63315922A true JPS63315922A (en) | 1988-12-23 |
Family
ID=15513139
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15118587A Pending JPS63315922A (en) | 1987-06-19 | 1987-06-19 | Spectral photometric device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63315922A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5493393A (en) * | 1989-03-17 | 1996-02-20 | The Boeing Company | Planar waveguide spectrograph |
-
1987
- 1987-06-19 JP JP15118587A patent/JPS63315922A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5493393A (en) * | 1989-03-17 | 1996-02-20 | The Boeing Company | Planar waveguide spectrograph |
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