JPS63304464A - Running resting instrument for fdd mechanism - Google Patents

Abstract

PURPOSE:To simultaneously attain a temperature test and a voltage margin test, when a floppy disk driving mechanism is tested by arranging the plural mechanisms in a thermostatic chamber, and impressing a programmable DC voltage to them while controlling a disk by a disk drive controlling mechanism. CONSTITUTION:In a test room 5, a central processing unit 51 and the floppy disk drive controlling mechanism 52 are placed, and in a room 6 to be tested, the thermostatic chamber 2 and a programmable DC power supply 61 are placed. Besides, the mechanism 52 and the thermostatic chamber 2 are connected by using a cable 41, and the mechanism 52 and the power supply 61 are connected by the cable 43. A test device is constituted in such a way, and a signal is transmitted to the room 6 to be tested, by the mechanism 52, and in the room 6 to be tested, a variable voltage from the power supply 61 is impressed to the drive mechanisms 11-1n in the thermostatic chamber 2, and a voltage margin is tested. Thus, a read test and a write test are executed for the driving mechanisms 11-1n under a condition that the test of variable temperature and the test of the voltage margin are combined.

Description

[Detailed Description of the Invention] [Summary] The present invention effectively performs running tests (continuous and long-term operation tests) on FDD (floppy disk drive) mechanisms.
This is a running test device that simultaneously performs a read/write test from the central processing unit and a voltage margin test on the FDD mechanism installed in a constant temperature oven while changing the temperature.

[Industrial Application Field] The present invention relates to an apparatus for effectively performing read/write tests and temperature change tests on FDD mechanisms.

The FDD mechanism is a storage device that undergoes repeated read/write tests, and unlike other input/output devices, high reliability is strictly required. Therefore, even when temperature change tests are performed continuously for a long time,
It is required that no errors occur in the read/write data. In addition, with conventional running test equipment, it is necessary to conduct voltage margin tests and temperature tests separately, and in addition, FDD
The device was complex and large-scale, requiring as many testers as mechanisms. Therefore, there was a need to develop a device that was simple and capable of conducting tests in a short period of time.

[Prior Art] FIG. 4 is a diagram showing the configuration of a device for performing a running test regarding the temperature of a conventional FDD mechanism.

The FDD mechanism 11.12-1n is housed in the thermostatic chamber 2,
FDD testers 31, 32-3n and corresponding cables 41. 42. FDDi structure 11,
The 12-4n has a built-in 7-pin disk. The cable 41 is used to send and receive signals for reading/writing a floppy disk, for example, to and from the tester, and the cable 42 sends, for example, 5V and 12V DC power. The FDD testers 31, 32-3n require complicated operations when performing tests. The tester has a large number of setting buttons on its console panel, which are used to set each condition and send read/write signals and operating power.

In the temperature test of the FDD mechanism, the temperature of the constant temperature bath was changed from room temperature to 45
Reading/writing tests were repeated while raising and lowering the temperature in stages to about ℃. In addition, when testing when the power supply voltage is increased or decreased by ±10%, the F
The DD mechanism was removed from the thermostatic chamber and connected to a variable DC voltage power source indoors.

[Problems to be Solved by the Invention] The test device shown in FIG. 4 cannot perform a voltage margin test directly, so it does not perform a read/write test by combining a temperature test and a voltage margin test. . Therefore F
An effective running test of the DDi structure was not possible. Further, since only one FDD tester can drive an FDD mechanism, when there are many FDD mechanisms to be tested, it is necessary to prepare a large number of FDD testers, resulting in a large-scale and complicated device.

In addition, a personal computer was sometimes used instead of an FDD tester, but even at that time, the FDD
The mechanism could only accommodate a maximum of four units, and could not be adapted to a mass production line.

When FDD mechanisms are housed in current commercially available thermostats, they tend to interfere with each other and generate noise, sometimes resulting in malfunctions.

SUMMARY OF THE INVENTION An object of the present invention is to improve the above-mentioned drawbacks and to provide an apparatus that is capable of performing a running test that combines a temperature test and a voltage margin test with a relatively simple configuration.

[Means for Solving the Problems] FIG. 1 is a diagram showing the basic configuration of the present invention. In FIG. 1, 11 and 12-4n are FDD mechanisms, 2 is a constant temperature chamber, 5 is an FDD test chamber, 6 is a test chamber, 41.43 is a cable, 51 is a central processing unit, and 52 is a floppy disk drive control. The mechanism 61 indicates a programmable DC power supply.

The present invention has the following configuration in a running test device for an FDD mechanism that performs a running test on the FDD mechanisms 11 and 12-4n in a constant temperature bath 2 under the control of the central processing unit 51. That is, the central processing unit 51, the floppy disk drive control mechanism 5
A cable 41.43 is led from the test chamber 5 configured as shown in FIG.
, 12-4 H is provided with a built-in programmable DC power supply 61 as a power supply.

[Operation] The test chamber 5 for the FDD mechanism has a central processing unit 51, and a cable 41.
43. In the test chamber 6, the temperature is constant P!
A variable voltage is sent to the FDD mechanism in 2 by a power supply 61 so that a voltage margin test is performed. A read/write test is performed on the FDD mechanisms 11 and 12-4n under conditions in which a variable temperature test and a voltage margin test are combined.

[Example] FIG. 2 is a diagram specifically showing the configuration of the test chamber/test chamber of the present invention. Each room consists of four blocks of similar configuration. One block consisting of five test chambers includes a floppy disk drive control mechanism 52. Bus extension 53. Hasofa 54. One block on the side of the test chamber 6, which has an input/output device 55, is a constant temperature bath 2. Input/output device 62. It has an instruction section 63. The inside of the constant temperature bath 2 has a structure shown in FIG. 3, which will be described later.

16-bit personal computer with central processing unit 5
16 FDs because it is convenient to use them as one
The Da structure is controlled one block at a time and four blocks are repeated. Therefore, one central processing unit can control 64 FDD mechanisms as a system.

On the side of the testing room 5, a path extension section 53 and a buffer 54 are used to ensure data transmission between the central processing unit 51 and the drive control mechanism 52.

For read/write control of the central processing unit 51, after data is written from the central processing unit to the drive control mechanism 52, a command is given to the drive control mechanism 52, and the data is written to the designated FDDffl structure via the instruction unit 63. Further, when reading data from a designated FDD mechanism, a command is given to the drive control mechanism 52. Error detection is performed by reading/writing and comparing data.

The voltage margin test is performed from the central processing unit to the input/output device 55.
This is done by controlling the programmable power supply 61 via the power supply 62.

The power supply voltage is automatically switched by changing voltages such as +10% and -5% under the control of the central processing unit, and is repeatedly applied to the FDD mechanism in the thermostatic oven.

Next, as shown in Fig. 3, in the thermostatic chamber 2, 21 shield plates, 22 guide rails, 23 positioning mechanisms with guide bins, and 24 pull-out mechanisms with take-out levers are connected to one FDD mechanism. It is set up. By providing the shield plate 21, the FDD mechanism is prevented from receiving mutual interference due to the influence of noise. Actually, it is attached to the positioning mechanism 23. In addition, by attaching a take-out lever to the tension take-out mechanism 24, the FD
The D mechanism can be inserted and removed in a so-called one-button operation.

[Effects of the Invention] Thus, according to the present invention, a programmable power supply and a constant temperature chamber are provided on the test chamber side, and by combining a temperature test and a voltage margin test, an effective running test of a large number of FDD mechanisms can be performed. . Therefore, in mass production equipment, FDD
The cost performance for the mechanism is high.

[Brief explanation of the drawing]

Fig. 1 is a diagram showing the principle configuration of the present invention, Fig. 2 is a diagram showing the configuration of an embodiment of the invention, and Fig. 3 is a diagram showing the configuration of the embodiment of the present invention.
In the figure, the internal configuration of the constant temperature chamber is shown in particular. FIG. 4 is a diagram showing the configuration of a temperature testing device that differs from the conventional FDD mechanism. 11, 12--4 n-...FDD mechanism 2-Thermostatic chamber 41, 42. 43-Cable 5-Test chamber 51-Central processing unit 52-Prosoppy disk drive control mechanism 6-Test chamber 61--Programmable DC power supply Patent applicant Fujitsu Ltd. Representative Patent attorney Eisuke Suzuki Implementation 4Pj, 'Nee 20 Ability admiration E-acts Figure 3

Claims (1)

[Claims] Under the control of the central processing unit (51), F.
In the FDD mechanism running test equipment that performs running tests on the DD mechanisms (11), (12), ... (1n), Cable (41
) (43) to the test chamber (6), and on the test chamber (6) side, a plurality of FDD mechanisms (11), (12)...(1n) housed in a thermostatic chamber (2), and each FD
A running test device for an FDD mechanism, characterized by having a built-in programmable DC power supply (61) that serves as a power source for the D mechanisms (11), (12), . . . (1n).