JPS6329251Y2 - - Google Patents
Info
- Publication number
- JPS6329251Y2 JPS6329251Y2 JP17177980U JP17177980U JPS6329251Y2 JP S6329251 Y2 JPS6329251 Y2 JP S6329251Y2 JP 17177980 U JP17177980 U JP 17177980U JP 17177980 U JP17177980 U JP 17177980U JP S6329251 Y2 JPS6329251 Y2 JP S6329251Y2
- Authority
- JP
- Japan
- Prior art keywords
- error
- calibration
- value
- comparator
- analyzer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims 1
- 238000004904 shortening Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000013074 reference sample Substances 0.000 description 1
Description
【考案の詳細な説明】
この考案は連続分析装置の補助装置として使用
され、適当な基準量を用いて分析装置のゼロ点ド
リフトやスパンドリフトを自動的に補正する自動
校正装置に関する。[Detailed Description of the Invention] This invention relates to an automatic calibration device that is used as an auxiliary device for a continuous analyzer and automatically corrects the zero point drift and span drift of the analyzer using an appropriate reference quantity.
従来の自動校正装置は誤差の検出とその補助動
作を一定の周期で繰り返しておこなつており、ド
リフトが設定周期以上継続して生じる場合は十分
な補正がおこなえず、ドリフトが緩慢な場合でも
自動的に一定の設定周期で校正動作をおこなうの
で、フローセル形の分析装置では基準試料が無駄
に消費される欠点があつた。 Conventional automatic calibration equipment repeatedly detects errors and performs auxiliary operations at regular intervals, and if drift continues for longer than the set interval, sufficient correction cannot be made, and even if the drift is slow, it cannot be automatically corrected. Since the calibration operation is performed at a fixed set period, the flow cell type analyzer has the disadvantage that the reference sample is wasted.
この考案は上記の不都合を解消した自動校正装
置を提供しようとするもので、以下この考案を図
面の実施例装置によつて説明する。 This invention aims to provide an automatic calibration device that eliminates the above-mentioned disadvantages, and this invention will be explained below with reference to an embodiment of the device shown in the drawings.
図面は連続ガス分析計に組み込まれた自動校正
装置のブロツク図で、1は分析計でこの出力は自
動校正装置の基準値比較器2に入る。基準比較器
2では、校正のために分析計1へ導入されるゼロ
点用ガスまたは既知濃度のスパン用の試料ガスの
基準量に対応した基準値が設定された基準値設定
器3の出力と分析計1からの校正時の出力値とが
比較され、その差または比が誤差検出器4で検出
され、この検出信号により分析計1の出力は補正
値出力器5で補正(校正)されて外部に出され
る。 The figure is a block diagram of an automatic calibration device built into a continuous gas analyzer, where 1 is an analyzer and its output goes into a reference value comparator 2 of the automatic calibration device. The reference comparator 2 compares the output of the reference value setter 3 with the reference value set corresponding to the reference amount of zero point gas or span sample gas of known concentration introduced into the analyzer 1 for calibration. The output value from the analyzer 1 during calibration is compared, the difference or ratio is detected by the error detector 4, and the output of the analyzer 1 is corrected (calibrated) by the correction value output device 5 based on this detection signal. taken outside.
他方、誤差記憶器6では、前回の校正時の誤差
の値を記憶し、記憶器7では今回の校正時の補正
値を記憶する。これら両者の差を誤差比較器8で
検出し、この差の値と、分析計精度上からの許容
値との比を演算して次回の校正時の時間間隔(周
期)が校正周期自動演算器9で決定される。この
決定された校正周期により校正時信号発生器10
から分析計1および自動校正系内の次回校正開始
信号を出力する。すなわちガス分析計の場合はゼ
ロ点またはスパン校正基準量の試料ガスの導入と
共に自動校正系の動作を開始させる。 On the other hand, the error storage 6 stores the error value from the previous calibration, and the storage 7 stores the correction value from the current calibration. The difference between these two is detected by the error comparator 8, and the ratio between the value of this difference and the allowable value based on the accuracy of the analyzer is calculated, and the time interval (cycle) for the next calibration is calculated using the automatic calibration cycle calculator. Determined by 9. According to this determined calibration period, the signal generator 10 at the time of calibration
outputs the next calibration start signal for analyzer 1 and the automatic calibration system. In other words, in the case of a gas analyzer, the operation of the automatic calibration system is started upon introduction of a reference amount of sample gas for zero point or span calibration.
一般に分析計においては、高精度の補正をおこ
なうためにデジタル方式によつて補正をおこなつ
ており、上記の実施例のものは前回の誤差信号値
と、今回の誤差信号値とをそれぞれ記憶し、その
差によつて校正周期を制御しているが、アナログ
的に補正する場合は、前回の誤差信号値のみを記
憶し、今回の誤差信号値との差を直接検出して、
その積分値によつて校正開始指令を発することが
できる。 Analyzers generally perform correction using a digital method in order to perform highly accurate correction, and the above example stores the previous error signal value and the current error signal value, respectively. The calibration cycle is controlled based on the difference, but when correcting in an analog way, only the previous error signal value is memorized and the difference with the current error signal value is directly detected.
A calibration start command can be issued based on the integral value.
この考案によれば、校正周期が自動的に決定さ
れることにより、分析計のドリフトの大小にかか
わらず精度が保たれ、さらにフローセルを用いた
分析計にあつてはドリフトが小さい場合に自動的
に校正周期が長くなり基準試料の消費も少なくす
ることができるものである。 According to this idea, by automatically determining the calibration period, accuracy is maintained regardless of the magnitude of the analyzer's drift, and in the case of analyzers using flow cells, the calibration interval is automatically determined when the drift is small. This allows the calibration cycle to be extended and the consumption of reference samples to be reduced.
第1図はこの考案の一実施例の自動校正装置の
ブロツク図である。
1:分析計、2:基準値比較器、3:基準値設
定器、4:誤差検出器、5:補正値出力器、6:
誤差記憶器、7:記憶器、8:誤差比較器、9:
校正周期自動演算器、10:校正時信号発生器。
FIG. 1 is a block diagram of an automatic calibration device according to an embodiment of this invention. 1: Analyzer, 2: Reference value comparator, 3: Reference value setter, 4: Error detector, 5: Correction value output device, 6:
Error storage, 7: Storage, 8: Error comparator, 9:
Calibration cycle automatic calculator, 10: Calibration signal generator.
Claims (1)
際の出力値と予め設定した基準値との誤差を検出
し、その誤差に応じて測定出力値を周期的に校正
する装置において、前回の誤差の値を記憶する誤
差記憶器と、この記憶値と今回の誤差値とを比較
する誤差比較器と、この比較器の出力によつて校
正周期を決定する演算器と、この演算器出力によ
り次回の校正指令信号を発する手段とを備え、基
準量の試料に対する誤差に応じて校正周期を短縮
あるいは延長するようにしたことを特徴とする自
動校正装置。 A device that periodically switches to a reference amount of sample during measurement, detects an error between the output value at that time and a preset reference value, and periodically calibrates the measured output value according to the error. An error storage device that stores the error value, an error comparator that compares this stored value with the current error value, an arithmetic unit that determines the calibration period based on the output of this comparator, and a What is claimed is: 1. An automatic calibration device comprising means for issuing a next calibration command signal, and shortening or extending a calibration cycle depending on an error in a reference amount of a sample.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17177980U JPS6329251Y2 (en) | 1980-11-28 | 1980-11-28 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17177980U JPS6329251Y2 (en) | 1980-11-28 | 1980-11-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5793858U JPS5793858U (en) | 1982-06-09 |
JPS6329251Y2 true JPS6329251Y2 (en) | 1988-08-05 |
Family
ID=29530121
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17177980U Expired JPS6329251Y2 (en) | 1980-11-28 | 1980-11-28 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6329251Y2 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6311633Y2 (en) * | 1981-05-22 | 1988-04-05 | ||
JPS5973715A (en) * | 1982-10-20 | 1984-04-26 | Fujitsu Ten Ltd | Sensor processing system |
EP0387031A3 (en) * | 1989-03-08 | 1991-04-10 | Westinghouse Electric Corporation | Automatic transducer excitation source testing system |
JP4591105B2 (en) * | 2004-05-31 | 2010-12-01 | 横河電機株式会社 | Calibration method |
JP2021001768A (en) * | 2019-06-20 | 2021-01-07 | 株式会社アプリクス | Chemical analyzer calibration method |
-
1980
- 1980-11-28 JP JP17177980U patent/JPS6329251Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS5793858U (en) | 1982-06-09 |
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