JPS63291890A - Method for removing nosing occurring in zone melting of raw material polycrystal - Google Patents

Method for removing nosing occurring in zone melting of raw material polycrystal

Info

Publication number
JPS63291890A
JPS63291890A JP12580587A JP12580587A JPS63291890A JP S63291890 A JPS63291890 A JP S63291890A JP 12580587 A JP12580587 A JP 12580587A JP 12580587 A JP12580587 A JP 12580587A JP S63291890 A JPS63291890 A JP S63291890A
Authority
JP
Japan
Prior art keywords
discharge
raw material
nasal
nosing
polycrystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12580587A
Other languages
Japanese (ja)
Other versions
JPH0481549B2 (en
Inventor
Yasuhiro Ikeda
泰弘 池田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Handotai Co Ltd
Original Assignee
Shin Etsu Handotai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Handotai Co Ltd filed Critical Shin Etsu Handotai Co Ltd
Priority to JP12580587A priority Critical patent/JPS63291890A/en
Publication of JPS63291890A publication Critical patent/JPS63291890A/en
Publication of JPH0481549B2 publication Critical patent/JPH0481549B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE:To completely remove the titled nosing without giving bad influence to obtained semiconductor, by arranging a cathode formed using a specific material closely near nosing arising when a raw material polycrystal is melted by a floating zone melting process and carrying out arc discharge. CONSTITUTION:A cathode 11 formed using a material containing an element having <=1 segregation coefficient, preferably W or Mo is arranged closely near nosing 5 occurring when rolling convection 3 of a protecting gas arising near a zone melting area 2 in melting of a raw material polycrystal by a floating zone melting process passes through a slit gap 10a between both ends of a heat coil 10 and collides with a shoulder part 1a of the polycrystal 1 and then arc discharge is carried out to melt and remove the titled nosing 5.

Description

【発明の詳細な説明】 「産業上の利用分野」 本発明は、原料多結晶を浮遊帯域溶融法(以下FZ法と
いう)により帯域溶融する際に、原料多結晶中に存在す
る異物又は局部的な冷却等に起因して発生する「鼻出」
除去方法に関する。
Detailed Description of the Invention "Industrial Field of Application" The present invention is directed to the treatment of foreign matter or local "Nose discharge" that occurs due to excessive cooling, etc.
Regarding the removal method.

「従来の技術」 従来より、周囲に囲繞した高周波誘導加熱コイルにより
棒状原料多結晶を帯域溶融させながら、該多結晶の精製
又は単結晶の成長を行うFZ法は公知であり、かかる溶
融法は一般にアルゴンガスその他の保護ガス雰囲気下で
行われる為に、i1図に示すように、原料多結晶1の帯
状溶融域2近傍で前記保護ガスの巻き込み対流3が生じ
、該巻き込み対流3が前記加熱コイル10両端部間に形
成されるスリット空隙10aを通過して多結晶の肩部1
aにぶつかり、該肩部1aが局部的に冷却されて未溶融
が出来る場合がある。
"Prior Art" The FZ method is conventionally known, in which a rod-shaped raw material polycrystal is zone-melted using a surrounding high-frequency induction heating coil, and the polycrystal is purified or a single crystal is grown. Generally, the process is carried out in an atmosphere of argon gas or other protective gas, so as shown in Figure i1, an entrainment convection 3 of the protective gas occurs near the belt-shaped melting zone 2 of the polycrystalline raw material 1, and the entrainment convection 3 causes the heating The polycrystalline shoulder 1 passes through the slit gap 10a formed between both ends of the coil 10.
a, the shoulder portion 1a may be locally cooled and unmelted.

そして前記FZ法においては、加熱コイル10の一相対
回転毎に順次リング状に帯状溶融域2を形成する構成を
採る為に、前記のような未溶融部分が発生すると、前記
加熱溶融の進行に従って未溶融部分が取残されてつらら
状のいわゆる「鼻出」5が発生する事となる。
In the FZ method, a ring-shaped belt-shaped melting zone 2 is sequentially formed every relative rotation of the heating coil 10. Therefore, when an unmelted portion as described above occurs, the melting zone 2 is formed as a result of the progress of heating and melting. Unmelted portions are left behind, resulting in icicle-like so-called "nose discharges" 5.

又このような「鼻出」5は前記のような巻込対流3によ
る局部的な冷却以外にも、原料多結晶1の中にクラック
が存在したり、或いは表面形状が真円でない場合、主に
多結晶下端に該結晶の一部が未溶融部分として残り、「
鼻出」5が発生する場合がある。
In addition to the local cooling caused by entrainment convection 3 as described above, such "nose discharge" 5 is mainly caused when cracks exist in raw material polycrystal 1 or when the surface shape is not a perfect circle. A part of the crystal remains as an unmelted part at the lower end of the polycrystal, and
Nasal discharge"5 may occur.

そしてこのような「鼻出」5が生じると、前記加熱コイ
ル10は、加熱エネルギーを帯状溶融域2に集中して付
加せんとする為に、その内径を多結晶外径より小に形成
している為に、前記コイル10を原料多結晶1多結晶加
熱域4側に相対移動させた場合前記加熱コイル10が「
鼻出」5先端に衝突し該コイルlOを通過させるのが不
可能になり、結果としてその位置で製造を中止せざるを
得ないという問題が生じる。
When such a "nosing" 5 occurs, the heating coil 10 is formed so that its inner diameter is smaller than the polycrystalline outer diameter in order to concentrate the heating energy on the belt-shaped melting zone 2. Therefore, when the coil 10 is relatively moved toward the raw material polycrystal 1 polycrystal heating area 4 side, the heating coil 10 is
A problem arises in that the coil 10 collides with the tip of the nose protrusion 5, making it impossible to pass the coil 10 through it, and as a result, production has to be stopped at that position.

この為従来においては、前記「鼻出」5をマジックハン
ド等で折断して対処していたが、かかる機械的な除去方
法では、前記「鼻出」5の根元部が残存し、該根元部分
より「鼻出」5が再発生し易く、前記問題を完全に解決
する事は出来なかった。
For this reason, in the past, the "nose bulge" 5 was broken off with a magic hand or the like, but in this mechanical removal method, the root part of the "nose bulge" 5 remains, and the root part "Nose discharge" 5 is more likely to occur again, and the problem could not be completely solved.

本発明はかかる従来技術の欠点に鑑み、製造すべき半導
体に悪影響を及ぼす車なく、前記「鼻出」を完全に除去
し得る「鼻出」除去方法を提供する事にある。
SUMMARY OF THE INVENTION In view of the drawbacks of the prior art, it is an object of the present invention to provide a method for removing ``snot'' that can completely remove the ``snot'' without adversely affecting semiconductors to be manufactured.

r問題点を解決する為の手段」 本発明は、FZ法による原料多結晶1の溶融が、一般に
放電の容易なアルゴンガス雰囲気下で行われる事に着目
して、タングステン又はモリブデン等の偏析係数が1よ
り小さい元素を含む材料を用いて陰電極11を形成する
とともに、該陰電極】】を前記「鼻出」5部分に近接配
置してアーク放電を行い、該アーク放電により前記「鼻
出」5を溶融除去するようにした点を要旨とする。
The present invention focuses on the fact that the raw material polycrystal 1 is melted by the FZ method in an argon gas atmosphere where discharge is easy, and the segregation coefficient of tungsten or molybdenum, etc. The cathode 11 is formed using a material containing an element with a smaller than 1, and the cathode 11 is placed close to the 5 portions of the nose to generate an arc discharge. The main point is that ``5'' is removed by melting.

この場合、前記原料多結晶1の構成材料であるシリコン
又はゲルマニウム等は所定温度以上で導体となる為に、
「鼻出」5側を陽極とし、前記陰電極11と「鼻出」5
間でなされるアーク放電により前記「鼻出」5を溶融除
去するように構成してもよく、又前記「鼻出」5部分を
挟む如く、陰電極11と陽電極12かもなる二つの電極
とを配置し、両電極11.12間でなされるアーク放電
により前記「鼻出]5を溶融除去するようにしてもよい
In this case, since silicon, germanium, etc. which are the constituent materials of the raw material polycrystal 1 become conductors at a predetermined temperature or higher,
The "nose" 5 side is an anode, and the negative electrode 11 and the "nose" 5 are connected as an anode.
The configuration may be such that the "nose bulge" 5 is melted and removed by an arc discharge between the two electrodes, a negative electrode 11 and a positive electrode 12, sandwiching the "nose bulge" 5 portion. may be arranged, and the "nose discharge" 5 may be melted and removed by arc discharge generated between both electrodes 11 and 12.

尚、本発明の好ましい実施例によれば、前記アーク放電
後、少なくとも前記−の電極11を速やかに退避させる
か、アーク電圧を速やかに降下又は切電させるようにす
るのがよい。
According to a preferred embodiment of the present invention, after the arc discharge, it is preferable that at least the negative electrode 11 is quickly evacuated or the arc voltage is quickly lowered or cut off.

「作用」 かかる技術手段によれば、前記「鼻出」5は針状の微小
直径のものがつらら状に伸びているものである為に、前
記アーク放電により「鼻出」5が瞬時に根元まで溶融さ
れ、前記従来技術の欠点が完全に解消される。
"Function" According to this technical means, since the "nasal bulge" 5 is a needle-like microdiameter extending like an icicle, the "nasal bulge" 5 is instantly moved to the root by the arc discharge. The disadvantages of the prior art described above are completely eliminated.

この際、前記アーク放電により、陰電極11から陰極物
質が放出され、該陰極物質が溶融帯域又は単結晶成長域
に付着するが、該陰電極11を構成するタングステンや
モリブデン等は、偏析係数が1より小さく、半導体単結
晶中に採り込まれにくい元素である為に半導体毒となる
事がなく、製造された単結晶の品質に同等悪影響を及ぼ
さない。
At this time, the cathode material is discharged from the cathode 11 due to the arc discharge, and the cathode material adheres to the melting zone or single crystal growth region, but the tungsten, molybdenum, etc. that constitute the cathode 11 have a segregation coefficient. Since it is an element smaller than 1 and difficult to incorporate into semiconductor single crystals, it does not poison semiconductors and does not have the same adverse effect on the quality of manufactured single crystals.

尚、該陰極構成材料は高純度のタングステンやモリブデ
ンを用いて形成した方が好ましい事は、出該技術分野に
おける当業者ならば当然に理解される事である。
It should be noted that those skilled in the art will naturally understand that it is preferable for the cathode constituent material to be formed using high-purity tungsten or molybdenum.

更に前記アーク放電による「鼻出」5の除去は、瞬時に
行われる為に加熱コイルlOの誘導電波に特に悪影響を
及ぼす、!ISがな”い為に、帯域2への加熱温度が変
動する事もない。
Furthermore, since the removal of the "nose discharge" 5 by the arc discharge is instantaneous, it has a particularly bad effect on the induction radio waves of the heating coil IO! Since there is no IS, the heating temperature to zone 2 does not fluctuate.

「実施例」 以下、図面を参照して本発明の好適な実施例を例示的に
詳しく説明する。ただしこの実施例に記載されている構
成部品の寸法、材質、形状、その相対配置などは特に特
定的な記載がない限りは、この発明の範囲をそれのみに
限定する趣旨ではなく、単なる説明例に過ぎない。
"Embodiments" Hereinafter, preferred embodiments of the present invention will be described in detail by way of example with reference to the drawings. However, unless otherwise specified, the dimensions, materials, shapes, and relative arrangements of the components described in this example are not intended to limit the scope of this invention, but are merely illustrative examples. It's nothing more than that.

第1図及び第2図は本発明の実施例に係る「鼻出」除去
装置を組込んだシリコン単結晶製造装置で、公知のよう
にアルゴンガスが流入可能な炉a内に、導電性の上軸6
と下軸7とを同期して回転可能に装着するとともに、該
両軸6,7間を軸方向に移動可使に単巻偏平加熱コイル
10を配置し、該コイル10に図示しない高周波電源よ
り高周波誘導電流が循環可能に構成する。一方炉8外に
は電圧調整可能な直流電源9が配置され、そのe端子側
を前記上軸6に、又e端子側を駆動機構13を介して、
炉8内に収納された、先端針状のタングステン電極11
と夫々接続する。尚前記駆動機構13は「鼻出」5が生
じた際に、タングステン電極11をその近傍に移動させ
るもので、例えば炉8外から移動制御可能な多間箇軸等
で構成されている。
FIGS. 1 and 2 show a silicon single crystal manufacturing apparatus incorporating a "snot discharge" removing apparatus according to an embodiment of the present invention. Upper shaft 6
A single-turn flat heating coil 10 is arranged to be movable in the axial direction between the two shafts 6 and 7, and a high-frequency power source (not shown) is connected to the coil 10. It is configured to allow high frequency induced current to circulate. On the other hand, a voltage-adjustable DC power supply 9 is arranged outside the furnace 8, with its e-terminal side connected to the upper shaft 6, and its e-terminal side connected to the drive mechanism 13.
A needle-shaped tungsten electrode 11 housed in the furnace 8
Connect to each. The drive mechanism 13 moves the tungsten electrode 11 to the vicinity of the tungsten electrode 11 when the "bleep" 5 occurs, and is composed of, for example, a multi-column shaft whose movement can be controlled from outside the furnace 8.

かかる装置によれば、先ず上軸6に棒状原料多結晶lを
、下軸7に直径の小さい単結晶の種を保持し、その周囲
に囲繞した加熱コイル10により先ず多結晶1の一端を
溶融し前記種結晶IAに融着して種付けした後、種絞り
により無転移化しつつ前記多結晶lを回転させながらコ
イル10を軸線方向に上昇させる事により原料多結晶1
を帯域溶融させ、半導体単結晶の製造を行う。
According to this device, first, a rod-shaped raw material polycrystalline l is held in the upper shaft 6, a single crystal seed with a small diameter is held in the lower shaft 7, and one end of the polycrystalline 1 is first melted by a heating coil 10 surrounded by the rod-shaped raw material polycrystal l. After fusing and seeding the seed crystal IA, the raw material polycrystal 1 is made non-dislocated by seed squeezing, and the coil 10 is raised in the axial direction while rotating the polycrystal 1.
is zone-melted to produce semiconductor single crystals.

そして前記帯域溶融中に原料多結晶l中の異物の存在又
局部的な加熱により、「鼻出」5が生じた場合は、タン
グステン電極11をその近傍に移動させて前記直流電源
9より20V程度の電源を印加する。この際、前記「鼻
出」5は原料多結晶!及び上軸Bを介して直流電源8の
■端子側と接続されており、又炉8内は放電が容易なア
ルゴンガス雰囲気下である為に、前記タングステン電極
11と「鼻出」5間にアーク放電が発生し、該アーク放
電により前記「鼻出」5が瞬時に溶融除去される。そし
て該溶融除去後直流電源8の電圧を降下させる。
If a "bleep" 5 occurs due to the presence of foreign matter in the polycrystalline raw material or local heating during the zone melting, the tungsten electrode 11 is moved to the vicinity of the tungsten electrode 11 and the DC power source 9 is applied to the Apply power. At this time, the above-mentioned "nade" 5 is a polycrystalline raw material! It is connected to the ■ terminal side of the DC power supply 8 via the upper shaft B, and since the inside of the furnace 8 is under an argon gas atmosphere where discharge is easy, there is no connection between the tungsten electrode 11 and the "nose" 5. Arc discharge occurs, and the "nose discharge" 5 is instantly melted and removed by the arc discharge. After the melting and removal, the voltage of the DC power source 8 is lowered.

尚、シリコン多結晶等の原料多結晶1においては温度が
高い場合は導体として機催し、前記アーク放電が円滑に
作用するが、前記原料多結晶1に長尺物を用いた場合は
上軸6近傍の原料多結晶1温度が低くなり、その部分の
抵抗が大きくなる為に、前記アーク放電が円滑にいかな
い場合がる。
Note that when the temperature is high in the raw material polycrystal 1 such as silicon polycrystal, it acts as a conductor and the arc discharge acts smoothly, but when a long material is used as the raw material polycrystal 1, the upper axis 6 Since the temperature of the raw material polycrystal 1 in the vicinity becomes low and the resistance of that part increases, the arc discharge may not proceed smoothly.

このような場合は第3図に示す如く、前記「鼻出」5部
分を挟む如く、直流型1!A9の■端子側に接続した他
の電極12をタングステン電極11の反対側に配置し、
両電極11.12間でアーク放電を行うように構成すれ
ばよい。
In such a case, as shown in Fig. 3, the DC type 1! Another electrode 12 connected to the ■terminal side of A9 is placed on the opposite side of the tungsten electrode 11,
What is necessary is just to arrange so that an arc discharge may be performed between both electrodes 11 and 12.

「発明の効果」 以上記載の如く本発明によれば、製造すべき半導体に悪
影響を及ぼす事なく、簡単な構成で前記「鼻出」を完全
に除去する事が出来、該「鼻出」が発生した場合にも、
円滑に多結晶の精製や単結晶の製造を行う事が出来る。
"Effects of the Invention" As described above, according to the present invention, the "nasal bleed" can be completely removed with a simple structure without adversely affecting the semiconductor to be manufactured, and the "nasal bleed" can be completely removed. Even if it occurs,
It is possible to smoothly purify polycrystals and manufacture single crystals.

等の種々の著効を有す。It has various effects such as

【図面の簡単な説明】[Brief explanation of drawings]

第1図及び第2図は本発明の実施例に係る「鼻出」除去
装置を組込んだシリコン単結晶製造装置で、第2図はそ
の全体図、第1図はその要部拡大図である。 第3図は他の変形例を示す要部拡大図である。 第1図 第3図 第2図 手続嗜l正書(自発) 昭和62年7月30日
Figures 1 and 2 show a silicon single crystal manufacturing apparatus incorporating a "nasal bleed" removal device according to an embodiment of the present invention, and Figure 2 is an overall view of the device, and Figure 1 is an enlarged view of its main parts. be. FIG. 3 is an enlarged view of main parts showing another modification. Fig. 1 Fig. 3 Fig. 2 Procedures Manual (spontaneous) July 30, 1988

Claims (1)

【特許請求の範囲】 1)浮遊帯域溶融法により原料多結晶を溶融する際に発
生する「鼻出」除去方法において、偏析係数が1より小
さい元素を含む材料を用いて陰電極を形成するとともに
、該陰電極を前記「鼻出」部分に近接配置してアーク放
電を行い、該アーク放電により前記「鼻出」を溶融除去
するようにした事を特徴とする「鼻出」除去方法 2)前記陰電極がタングステン又はモリブデンを含む材
料で形成されている特許請求の範囲第1項記載の「鼻出
」除去方法 3)前記「鼻出」側を陽極とし、前記陰電極と「鼻出」
間でなされるアーク放電により「鼻出」を溶融除去する
ようにした特許請求の範囲第1項又は第2項記載の「鼻
出」除去方法 4)前記「鼻出」部分を挟む如く、陰電極と陽電極から
なる二つの電極とを配置し、両電極間でなされるアーク
放電により「鼻出」を溶融除去するようにした特許請求
の範囲第1項又は第2項記載の「鼻出」除去方法 5)前記アーク放電後、少なくとも前記一の電極を速や
かに退避させるようにした特許請求の範囲第1項から第
3項までのいずれか1項記載の「鼻出」除去方法 5)前記アーク放電後、アーク電圧を速やかに降下又は
切電するようした特許請求の範囲第1項から第3項まで
のいずれか1項記載の「鼻出」除去方法
[Claims] 1) In a method for removing "snot" that occurs when melting a raw material polycrystal by a floating zone melting method, a negative electrode is formed using a material containing an element with a segregation coefficient of less than 1, and 2) A method for removing nasal discharge, characterized in that the cathode is placed close to the nasal discharge and arc discharge is performed, and the arc discharge melts and removes the nasal discharge. 3) A method for removing a "nasal bleed" according to claim 1, wherein the negative electrode is formed of a material containing tungsten or molybdenum.
4) A method for removing a "nasal bleed" according to claim 1 or 2, in which the "nasal bleed" is melted and removed by arc discharge between The "nasal discharge" according to claim 1 or 2, wherein two electrodes consisting of an electrode and a positive electrode are arranged, and the "nasal discharge" is melted and removed by arc discharge generated between both electrodes. "Removal method 5) "Nose discharge" removal method 5) according to any one of claims 1 to 3, wherein at least the one electrode is immediately evacuated after the arc discharge. The method for removing "nasal discharge" according to any one of claims 1 to 3, wherein the arc voltage is quickly lowered or cut off after the arc discharge.
JP12580587A 1987-05-25 1987-05-25 Method for removing nosing occurring in zone melting of raw material polycrystal Granted JPS63291890A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12580587A JPS63291890A (en) 1987-05-25 1987-05-25 Method for removing nosing occurring in zone melting of raw material polycrystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12580587A JPS63291890A (en) 1987-05-25 1987-05-25 Method for removing nosing occurring in zone melting of raw material polycrystal

Publications (2)

Publication Number Publication Date
JPS63291890A true JPS63291890A (en) 1988-11-29
JPH0481549B2 JPH0481549B2 (en) 1992-12-24

Family

ID=14919344

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12580587A Granted JPS63291890A (en) 1987-05-25 1987-05-25 Method for removing nosing occurring in zone melting of raw material polycrystal

Country Status (1)

Country Link
JP (1) JPS63291890A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106702474A (en) * 2015-07-20 2017-05-24 有研半导体材料有限公司 Technology for eliminating polycrystalline thorns in FZ silicon growth

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106702474A (en) * 2015-07-20 2017-05-24 有研半导体材料有限公司 Technology for eliminating polycrystalline thorns in FZ silicon growth

Also Published As

Publication number Publication date
JPH0481549B2 (en) 1992-12-24

Similar Documents

Publication Publication Date Title
KR19980018538A (en) How to control the thermal history of Czochralski grown silicon
JP2009049428A (en) Buffered substrate foe semiconductor element
JP4567192B2 (en) Electric resistance heater for crystal growth apparatus and method of using the same
EP0292920B1 (en) Rf induction heating apparatus
WO2001027360A1 (en) Electrical resistance heater for crystal growing apparatus
JP2754163B2 (en) High frequency induction heating coil
JPH1036190A (en) Production of single crystal and apparatus therefor
JPS63291890A (en) Method for removing nosing occurring in zone melting of raw material polycrystal
JP4654875B2 (en) Single crystal manufacturing apparatus and single crystal manufacturing method
JP2833478B2 (en) Silicon single crystal growth method
US6238477B1 (en) Process and device for the production of a single crystal
JP4604700B2 (en) Single crystal manufacturing apparatus and single crystal manufacturing method
US5660752A (en) Heating element and process for heating crucibles
JP2759604B2 (en) Induction heating coil
JP3207573B2 (en) Method and apparatus for producing single crystal
JPH0415598B2 (en)
JPS63291888A (en) Production device for semiconductor single crystal
WO2019142493A1 (en) Graphite heater for production of monocrystal, and monocrystal pulling device
JP2833462B2 (en) Semiconductor single crystal growth equipment
EP1201795B1 (en) Semiconductor single crystal pulling apparatus
JP2021091557A (en) Induction heating coil and apparatus for manufacturing single crystal using the same
JP2015218076A (en) Manufacturing method for single crystal and single crystal manufacturing apparatus
JP2008260671A (en) Single crystal pulling apparatus
JPH0534316B2 (en)
JP7428122B2 (en) Induction heating coil and single crystal manufacturing equipment using the same