JPS63261509A - Production of thin film magnetic head - Google Patents

Production of thin film magnetic head

Info

Publication number
JPS63261509A
JPS63261509A JP9518887A JP9518887A JPS63261509A JP S63261509 A JPS63261509 A JP S63261509A JP 9518887 A JP9518887 A JP 9518887A JP 9518887 A JP9518887 A JP 9518887A JP S63261509 A JPS63261509 A JP S63261509A
Authority
JP
Japan
Prior art keywords
polishing
magnetic
layer
gap
magnetic head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9518887A
Other languages
Japanese (ja)
Inventor
Hisanori Hayashi
林 久範
Shuzo Abiko
安彦 修三
Hiroichi Goto
博一 後藤
Hideto Sano
佐野 秀人
Takeshi Osato
毅 大里
Mitsuo Nakabashi
中橋 光男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Electronics Inc
Original Assignee
Canon Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Electronics Inc filed Critical Canon Electronics Inc
Priority to JP9518887A priority Critical patent/JPS63261509A/en
Publication of JPS63261509A publication Critical patent/JPS63261509A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To easily control the grinding value by utilizing a notched part of a prescribed pattern formed previously to a gap member layer forming a magnetic gap of a head in a stage where a rubbing surface is finished with grinding. CONSTITUTION:A gap member layer 3 is formed on a lower magnetic layer 2 provided on a substrate 1 for production of a magnetic gap. In this case, the layer 3 has a triangular notched part 3a in an area sandwiched between the layer 2 and an upper magnetic layer 6. A cutting work is carried out for each head chip and the rubbing surface of a magnetic recording medium is finished with grinding as a worked surface up to a finishing line X-X'. The grinding value of the rubbing surface is controlled by means of the part 3a. Thus it is possible to accurately control the grinding value of the rubbing surface and to obtain the highly accurate gap depth.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は磁気記録媒体に情報の記録又は再生を行なう誘
導型の薄膜磁気ヘッドの製造方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method of manufacturing an inductive thin film magnetic head for recording or reproducing information on a magnetic recording medium.

[従来の技術] 近年高密度磁気記録用の磁気ヘッドとして薄膜磁気ヘッ
ドが注目されており、例えば高密度記録を行なうフロッ
ピーディスクドライブ装置やスチルビデオ装置等に用い
られている。
[Prior Art] In recent years, thin film magnetic heads have attracted attention as magnetic heads for high-density magnetic recording, and are used, for example, in floppy disk drive devices, still video devices, etc. that perform high-density recording.

第5図はこのような誘導型の薄膜磁気ヘッドの従来の製
造方法を説明するものであり、薄膜磁気ヘッドの製造途
中の仕掛り品の斜視図である。
FIG. 5 explains a conventional manufacturing method of such an inductive thin film magnetic head, and is a perspective view of a work-in-progress product in the process of manufacturing a thin film magnetic head.

従来の薄膜磁気ヘッドの製造工程では、まず第5図に符
号1で示すフェライトやガラス等から成る基板上にパー
マロイやセンダストから成る下部磁性層2を蒸着やスパ
ッタリング等により所定の形状に形成する。
In the manufacturing process of a conventional thin-film magnetic head, first, a lower magnetic layer 2 made of permalloy or sendust is formed into a predetermined shape by vapor deposition, sputtering, etc. on a substrate made of ferrite, glass, etc., shown by reference numeral 1 in FIG.

次に下部磁性層上2に5IO2等の非磁性体から成り、
ra%ギャップを構成するギャップ材層3を形成する。
Next, on the lower magnetic layer 2 is made of a non-magnetic material such as 5IO2,
A gap material layer 3 constituting a ra% gap is formed.

次にCuやA見等から成る電極コイル4のパターンを形
成する、 次に電極コイル4を覆うS!02等から成る絶縁層5を
形成した後、更にこの上に上部磁性層6を形成する。こ
の上部磁性層6と下部磁性層2はギャップ材層3を介し
て対向して磁気回路を構成する。
Next, form the pattern of the electrode coil 4 consisting of Cu, A, etc. Next, cover the electrode coil 4 with S! After forming the insulating layer 5 made of 02 or the like, an upper magnetic layer 6 is further formed thereon. The upper magnetic layer 6 and the lower magnetic layer 2 face each other with the gap material layer 3 in between to form a magnetic circuit.

続いてこれらの素子パターンを保護するために、基板1
上のこれらのパターンの上に絶縁性の接着剤を介して保
護板を貼り合わせ、ダイシングソー等でヘッドの1チツ
プ毎に切り出し、第6図に示す形状にカッティング加工
する。第6図において符号8が上記の絶縁性の接着剤で
あり、符号9が保護板である。
Next, in order to protect these element patterns, the substrate 1 is
A protective plate is pasted onto these patterns above with an insulating adhesive, and each chip of the head is cut out using a dicing saw or the like to form the shape shown in FIG. In FIG. 6, reference numeral 8 is the above-mentioned insulating adhesive, and reference numeral 9 is a protection plate.

次に第6図中のチップの上面を磁気記録媒体摺動面とし
て第5図中筒号x−x ′で示す仕上げラインまでラッ
プなどにより研摩し、球面形など所定形状に仕トげる。
Next, the upper surface of the chip in FIG. 6 is used as a sliding surface for the magnetic recording medium and is polished by lapping or the like to the finishing line indicated by cylinder number x-x' in FIG. 5 to give it a predetermined shape such as a spherical shape.

即ち磁気ギャップの深さいわゆるギャップデプスが所定
となる迄摺動面を研摩する。このように薄膜磁気ヘッド
が完成となる。
That is, the sliding surface is polished until the depth of the magnetic gap, so-called gap depth, becomes a predetermined value. In this way, the thin film magnetic head is completed.

ところで薄膜磁気ヘッドの記録再生効率等の諸特性はギ
ャップデプスに大きく左右される。そして薄膜磁気ヘッ
ドのギャップデプスは数μm程度と非常に小さいので、
薄膜磁気ヘッドのギャップデプスを決める磁気記録媒体
摺動面の研摩量は極めて高精度に管理する必要がある。
By the way, various characteristics such as recording and reproducing efficiency of a thin film magnetic head are greatly influenced by the gap depth. And since the gap depth of a thin film magnetic head is very small, on the order of several μm,
The amount of polishing of the sliding surface of the magnetic recording medium, which determines the gap depth of the thin-film magnetic head, must be controlled with extremely high precision.

そこで従来より研S量を管理するため研摩マークと呼ば
れる所定パターンの層をヘッドの磁気回路のパターンに
並べて設け、磁気記録媒体摺動面の研摩時に研摩面を顕
微鏡を用いて目視により観察して研摩マークの有無や大
きさによりギャップデプスを間接的にΔIII定し、研
摩量を管理する方法が採用されている。
Therefore, conventionally, in order to control the amount of polishing S, a layer with a predetermined pattern called a polishing mark is arranged in line with the pattern of the magnetic circuit of the head, and when the sliding surface of the magnetic recording medium is polished, the polished surface is visually observed using a microscope. A method is adopted in which the gap depth is indirectly determined by ΔIII based on the presence or absence and size of the polishing mark, and the amount of polishing is managed.

例えば研摩マークは第5図に符号7で示すように逆三角
形の金属1模パターンとして形成され、研摩時に摺動面
に現われる研摩マーク7の幅を観測してギャップデプス
を推定し、研摩量を管理することができる。
For example, the polishing mark is formed as an inverted triangular pattern of metal 1, as shown by reference numeral 7 in FIG. can be managed.

[発明が解決しようとする問題点] ところで特に高密度フロッピーディスクドライブ装置や
スチルビデオ装置に用いられる薄膜磁気ヘッドでは、ヘ
ッドタッチを良くするなどのために磁気記録媒体摺動面
の面積が極めて小さくとられる。しかしながら摺動面の
面積を小さくしようとすると、先述の研摩マークを設け
るスペースが無くなるという問題点がある。
[Problems to be Solved by the Invention] In particular, in thin-film magnetic heads used in high-density floppy disk drives and still video devices, the area of the sliding surface of the magnetic recording medium is extremely small in order to improve head touch. Be taken. However, if an attempt is made to reduce the area of the sliding surface, there is a problem that there is no space for providing the above-mentioned polishing marks.

倒えばスチルビデオ装置用の薄膜磁気ヘッドの場合には
、トラック幅が60μmのチャンネルが40gmの間隔
で2チヤンネル並設され、この2チヤンネルが200〜
300#Lm平方の極めて狭い媒体摺動面の中に収めら
れるため、製造工程において研摩マークを配置できるス
ペースは40〜14OJLma度の幅の極めて狭いスペ
ースとなってしまう。
In the case of a thin film magnetic head for still video equipment, two channels with a track width of 60 μm are arranged side by side at an interval of 40 gm, and these two channels are
Since the media is accommodated within an extremely narrow 300 #Lm square sliding surface, the space in which polishing marks can be placed during the manufacturing process is extremely narrow, with a width of 40 to 14 OJLma degrees.

このように従来の方法では薄膜磁気ヘッドの磁気記録媒
体摺動面の面積を小さくしようとすると研摩マークを設
けるスペースが無くなり、研摩量の管理が困難になると
いう問題があった。
As described above, in the conventional method, when attempting to reduce the area of the sliding surface of the magnetic recording medium of a thin film magnetic head, there is no space for providing polishing marks, which makes it difficult to control the amount of polishing.

E問題点を解決するための手段] このような問題点を解決するため本発明による薄膜磁気
ヘッドの製造方法においては、薄ll5I磁気ヘッドの
磁気記録媒体摺動面を研摩して仕上げる工程を有し、該
工程において前記ヘッドの磁気ギャップを構成するギャ
ップ材層に予め形成した所定パターンの切り欠き部を利
用して研摩量の管理を行なう構成を採用した。
Means for Solving Problem E] In order to solve these problems, the method for manufacturing a thin film magnetic head according to the present invention includes a step of polishing and finishing the sliding surface of the magnetic recording medium of the thin 115I magnetic head. However, in this process, a configuration was adopted in which the amount of polishing was controlled using cutouts in a predetermined pattern formed in advance in the gap material layer constituting the magnetic gap of the head.

[作 用] このような方法によれば研摩量を管理するだめの所定パ
ターンはギャップ材層に形成されるので、従来の研摩マ
ークが形成されなかった磁気回路を構成する上部磁性層
と下部磁性層に挟まれる領域を含むギャップ材層の全領
域を利用して形成することができる。即ち上記所定パタ
ーンを形成するためのスペースは充分に確保でき、また
ギャップ材層に切り欠き部を設ける構成にすれば磁気ギ
ャップとなる部分と別途にギャップ材層を形成すること
もなく、従来の′NF摩マークのために要したスペース
は不要になる。
[Function] According to this method, a predetermined pattern for controlling the amount of polishing is formed in the gap material layer, so that the upper magnetic layer and the lower magnetic layer constituting the magnetic circuit, where conventional polishing marks were not formed, are formed in the gap material layer. The gap material layer can be formed using the entire area of the gap material layer including the area sandwiched between the layers. In other words, a sufficient space can be secured for forming the above-mentioned predetermined pattern, and if the gap material layer is provided with a notch, there is no need to form a gap material layer separately from the part that will become the magnetic gap. 'The space required for the NF rub mark is no longer needed.

[実施例] 以下第1図〜第4図を参照して本発明の実施例の詳細を
説明する。
[Embodiments] Details of embodiments of the present invention will be described below with reference to FIGS. 1 to 4.

1上皇11 第1図は本発明の第1実施例による薄膜磁気ヘッドの製
造方法を説明するものであり、磁気記録媒体摺動面を研
摩する前の状態の薄膜磁気ヘッドを一部透視した状態で
示している。同図において従来例の第5図及び第6図中
と共通する部分には同一符号が付しである。以下の本実
施例の製造方法の説明において従来と共通する部分は簡
単に触れるだけにし、異なる部分を詳細に説明する(第
2実施例についても同様とする)。
1 Retired Emperor 11 FIG. 1 explains a method for manufacturing a thin film magnetic head according to a first embodiment of the present invention, and shows a partially transparent view of the thin film magnetic head before the sliding surface of a magnetic recording medium is polished. It is shown in In this figure, parts common to those in FIGS. 5 and 6 of the conventional example are given the same reference numerals. In the following explanation of the manufacturing method of this embodiment, parts common to the conventional method will be briefly mentioned, and different parts will be explained in detail (the same applies to the second embodiment).

本実施例による薄膜磁気ヘッドの製造工程ではまず第1
図に示す基板l上に従来と同様に下部磁性層2を形成す
る。
In the manufacturing process of the thin film magnetic head according to this embodiment, the first
A lower magnetic layer 2 is formed on a substrate 1 shown in the figure in the same manner as in the prior art.

次に下部磁性層2上に磁気ギャップを構成するギャップ
材層3を形成する。ここで従来と異なる点として本実施
例ではギャップ材層3は下部磁性層2と上部磁性層6に
挟まれる領域に三角形の切り欠き部3aを有して形状に
形成する。
Next, a gap material layer 3 constituting a magnetic gap is formed on the lower magnetic layer 2. Here, in this embodiment, the gap material layer 3 is formed in a shape having a triangular notch 3a in a region sandwiched between the lower magnetic layer 2 and the upper magnetic layer 6, as a difference from the conventional one.

次に従来と同様に電極コイル4を形成し、それを覆って
絶縁層5を形成し、更にその上に上部磁性層6を形成す
る。
Next, an electrode coil 4 is formed in the same manner as in the conventional method, an insulating layer 5 is formed covering it, and an upper magnetic layer 6 is further formed thereon.

次にこれらのパターン上に絶縁性の接着剤8により保護
板9を貼り合わせる。
Next, a protective plate 9 is pasted onto these patterns using an insulating adhesive 8.

次に従来例の場合と同様にヘッドlチップ毎にカッティ
ング加工を行なった後、pjS1図中の手前側の面を磁
気記録媒体摺動面の加工面として符号x−x”で示す仕
上げラインまでこれを研摩して仕上げる。
Next, as in the case of the conventional example, cutting is performed for each head l chip, and then the surface on the near side in the pjS1 diagram is used as the processed surface of the sliding surface of the magnetic recording medium to the finishing line indicated by the symbol x-x''. Polish and finish this.

ここで本実施例では従来と異なる点として摺動面の研摩
量の管理はギャップ材層のνJり欠き部3aを利用して
行なう、即ち摺動面を研摩していくに従って第2図(A
)に示す研片面に現われる切り欠き部3aの幅Wは小さ
くなる。切り欠き部3aの三角形の頂点の位置を摺動面
の仕上げラインのx−x ’線上かそれよりわずか手前
側に位fこするようにしておけば、研摩面が仕上げライ
ンに達するかあるいはその直前に切り欠き部3aの幅W
がOとなり、第2図(B)に示すように切り欠き部3a
が消失する。このようにしておき、研摩時に切り欠き部
3aの幅Wを顕微鏡で目視により観測して研摩量を管理
することが可能になる。
Here, in this embodiment, the difference from the conventional method is that the amount of polishing of the sliding surface is controlled by using the νJ notch 3a of the gap material layer, that is, as the sliding surface is polished, as shown in FIG.
) The width W of the notch 3a appearing on the surface of the polishing piece becomes smaller. If the position of the triangular apex of the notch 3a is rubbed on the x-x' line of the finishing line of the sliding surface or slightly in front of it, the polished surface will reach the finishing line or just below it. Width W of notch 3a just before
becomes O, and as shown in FIG. 2(B), the notch 3a
disappears. By doing so, it becomes possible to manage the amount of polishing by visually observing the width W of the notch portion 3a using a microscope during polishing.

このように研摩を行なって摺動面を仕上げ薄11り磁気
ヘッドが完成する。
By polishing in this manner, the sliding surface is finished with a thin layer 11, and the magnetic head is completed.

以上のように本実施例によれば、摺動面の研摩量を管理
するために従来の研摩マークを設けず、その代りにギャ
ップ材層3に切り欠き部3aを設け、これを利用して研
摩量の管理を行なっている。切り欠き部3aは従来の研
摩マークが設けられなかった上部磁性層6と下部磁性F
92に挟まれる領域に設けられるので、それを設けるた
めのスペースを充分に確保することができる。従来の研
摩マークに要したスペースを不要として、磁気記録媒体
摺動面の面桔を小さくできる。そして本実施例によれば
切り欠き部3aを利用して摺動面の#F摩量の管理を正
確に行なえ、ギャップデプスを高精度に出すことができ
、薄膜磁気ヘッドの諸特性の向上と均一化が図れる。
As described above, according to this embodiment, in order to control the amount of polishing of the sliding surface, the conventional polishing mark is not provided, but instead, the notch 3a is provided in the gap material layer 3, and this is utilized. The amount of polishing is controlled. The cutout portion 3a is located between the upper magnetic layer 6 and the lower magnetic layer F, which are not provided with conventional polishing marks.
Since it is provided in the area sandwiched by 92, a sufficient space for providing it can be secured. The space required for conventional polishing marks is no longer required, and the surface area of the sliding surface of the magnetic recording medium can be made smaller. According to this embodiment, the #F wear amount on the sliding surface can be accurately controlled by using the notch 3a, and the gap depth can be determined with high precision, which improves various characteristics of the thin-film magnetic head. Uniformity can be achieved.

また本実施例ではギャップ材層3の厚さが例えばlpm
以下と極めて商〈、その端面が傾斜面にならないため、
切り欠き部3aの幅Wの観測は読み取り誤差が少なく、
正確に行なえるという利点がある。
Further, in this embodiment, the thickness of the gap material layer 3 is, for example, lpm.
The following is an extremely quotient〈, since the end surface is not an inclined surface,
Observation of the width W of the notch 3a has little reading error;
It has the advantage of being accurate.

なお変形例として、切り欠き部3aと共に、従来例の研
摩マークを設けたスペースに他の方式の研摩マークとし
て例えば研摩量を段階的に管理するためのクシの歯状の
研摩マークを設け、この研摩マークをギャップ材層3の
切り欠き部3aと併用して研摩量の管理を行なえば、研
JI!管理をより正確に行なうことができる。
As a modified example, in addition to the notch 3a, another type of polishing mark, such as a comb tooth-shaped polishing mark for controlling the polishing amount in stages, is provided in the space where the conventional polishing mark is provided. If you manage the amount of polishing by using the polishing mark together with the notch 3a of the gap material layer 3, you can polish JI! Management can be performed more accurately.

11裏11 次に第3図は本発明の第2実施例による薄膜磁気ヘッド
の製造方法を説明するものであり、摺動面研摩前の薄膜
磁気ヘッドの構造を一部透視して示す斜視図である。
11 Back 11 Next, FIG. 3 is a perspective view for explaining a method of manufacturing a thin film magnetic head according to a second embodiment of the present invention, showing a partially transparent structure of the thin film magnetic head before sliding surface polishing. It is.

図示のように本実施例ではギャップ材層3に形成する切
り欠き部3aの形状が第1実施例と異なり、切り欠き部
3aは矩形に形成され、ギャップ材層3において薄11
La気ヘッドの目的とするギャップデプスd、に対応す
る位置まで切り欠かれて形成されている。
As shown in the figure, in this embodiment, the shape of the notch 3a formed in the gap material layer 3 is different from that in the first embodiment, and the notch 3a is formed in a rectangular shape.
It is cut out to a position corresponding to the target gap depth d of the La air head.

本実施例ではこのような切り欠き部3aを形成しておき
、摺動面の研摩時において研摩量にょる薄膜磁気ヘッド
のインダクタンスの変化を観測して研摩の終点を検出す
るものとする。
In this embodiment, such a notch 3a is formed and the end point of the polishing is detected by observing the change in inductance of the thin film magnetic head depending on the amount of polishing during polishing of the sliding surface.

即ち第3図のνJり欠き部3aを設けたヘッドでは研摩
量に対応するギャップデプスの大きさに応じてヘッドの
インダクタンスがi4図のように変化する。即ち切り欠
き部3aの領域を研摩している間は研摩に応じて下部磁
性層2と上部磁性層6の接触面積が徐々に減少し、両磁
性層2.6から成る磁気回路の磁気抵抗が徐々に増加し
、第4図の符号Aの領域に示すようにヘッドのインダク
タンスLは一定の傾きで徐々に減少する。
That is, in the head provided with the νJ notch 3a shown in FIG. 3, the inductance of the head changes as shown in FIG. i4 depending on the size of the gap depth corresponding to the amount of polishing. That is, while the region of the notch 3a is being polished, the contact area between the lower magnetic layer 2 and the upper magnetic layer 6 gradually decreases in accordance with the polishing, and the magnetic resistance of the magnetic circuit consisting of both magnetic layers 2.6 increases. The inductance L of the head gradually increases, and as shown in the region A in FIG. 4, the inductance L of the head gradually decreases at a constant slope.

ところが更に研摩が進行してギャップデプスがd!に達
すると、磁性層2.6のギャップ材層3側での接触面積
は0になるので、磁気抵抗が急激に増加し、第4図に示
すようにインダクタンスLが急激に低下する。その後は
研摩するにつれて領域Bに示すようにインダクタンスL
は領域Aにおけるよりもやや緩やかな傾きで徐々に低下
してゆ〈 。
However, as the polishing progressed further, the gap depth became d! When the contact area of the magnetic layer 2.6 on the gap material layer 3 side becomes 0, the magnetic resistance increases rapidly and the inductance L decreases rapidly as shown in FIG. After that, as the polishing progresses, the inductance L increases as shown in area B.
gradually decreases with a slightly gentler slope than in region A.

従ってインダクタンスLを連続的に観測し、インダクタ
ンスLが急激に低下する点を検出することにより、ギャ
ップデプスdlのポイントを検出することができる。
Therefore, by continuously observing the inductance L and detecting the point where the inductance L suddenly decreases, the point of the gap depth dl can be detected.

このように本実施例によれば薄膜磁気ヘッドのインダク
タンスLが変化することを利用して、研摩量の管理を顕
微鏡を用いた目視によるJ11定によらずに電気的な検
出で管理することができる。そしてインダクタンスLの
変化を電気信号に変え、ギャップデプスd1の検出信号
を取り出し、この検出信号を研摩機のオフスイッチとし
て用いることにより、研摩工程を自動化することもでき
る。
In this way, according to this embodiment, by utilizing the fact that the inductance L of the thin film magnetic head changes, the amount of polishing can be managed by electrical detection instead of J11 constant by visual observation using a microscope. can. The polishing process can also be automated by converting the change in inductance L into an electrical signal, extracting a detection signal of the gap depth d1, and using this detection signal as an off switch for the polishing machine.

尚、本実施例によれば第1実施例の場合と同様の理由で
同様の作用効果が得られるのは勿論である。6 [発明の効果] 以上の説明から明らかなように、本発明による薄膜磁気
ヘッドの製造方法においては、薄膜磁気ヘッドの磁気記
録媒体摺動面を研摩して仕上げる工程を有し、該工程に
おいて前記ヘッドの磁気ギャップを構成するギャップ材
層に予め形成した所定パターンの切り欠き部を利用して
研摩量の管理を行なう構成を採用したので、上記所定パ
ターンを設けるためのスペースを充分に確保でき、薄膜
磁気ヘッドの媒体摺動面の面積を小さくできるとともに
、研摩量の管理を正確に行なえ、ギャップデプスを高精
度に出すことができ、薄膜磁気ヘッドの品持性の向上と
均一化が図れるという優れた効果が得られる。
It goes without saying that according to this embodiment, similar effects can be obtained for the same reasons as in the case of the first embodiment. 6 [Effects of the Invention] As is clear from the above description, the method for manufacturing a thin film magnetic head according to the present invention includes a step of polishing and finishing the magnetic recording medium sliding surface of the thin film magnetic head, and in this step, Since a configuration is adopted in which the amount of polishing is controlled using cutouts in a predetermined pattern formed in advance in the gap material layer constituting the magnetic gap of the head, a sufficient space can be secured for providing the predetermined pattern. , the area of the media sliding surface of the thin film magnetic head can be reduced, the amount of polishing can be accurately controlled, the gap depth can be determined with high accuracy, and the quality of the thin film magnetic head can be improved and uniformed. This excellent effect can be obtained.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の第1実施例を説明する摺動面研摩前の
薄膜磁気ヘッドの構造を一部透視した状態で示す斜視図
、第2図(A)、(B)はそれぞれ同実施例による摺動
面研摩量の管理方法の説明図、第3図は本発明の第2実
施例を説明する摺動面研摩前の薄膜磁気ヘッドの構造を
一部透視した状態で示す斜視図、第4図は第3図のヘッ
ドにおける摺動面研摩量によるギャップデプスとヘッド
のインダクタンスとの関係を示す線図、第5図は従来の
薄n!2磁気ヘッドの製造方法を説明する保護板接合前
の薄膜磁気ヘッドの斜視図、第6図は完成した状態の薄
膜磁気ヘッドの斜視図である。 l・・・基板      2・・・下部磁性層3・・・
ギャップ材層  3a・・・切り欠き部4・・・電極コ
イル   5・・・絶縁層6・・・上部磁性層   8
・・・接着剤9・・・保護板
FIG. 1 is a partially transparent perspective view of the structure of a thin-film magnetic head before sliding surface polishing to explain the first embodiment of the present invention, and FIGS. 2(A) and 2(B) show the same embodiment An explanatory diagram of a method for controlling the amount of sliding surface polishing according to an example; FIG. 3 is a perspective view showing a partially transparent structure of a thin film magnetic head before sliding surface polishing, illustrating a second embodiment of the present invention; FIG. 4 is a diagram showing the relationship between the gap depth and the inductance of the head depending on the amount of polishing of the sliding surface in the head of FIG. 3, and FIG. 2 is a perspective view of a thin film magnetic head before a protective plate is bonded to explain the manufacturing method of the magnetic head, and FIG. 6 is a perspective view of the thin film magnetic head in a completed state. l...Substrate 2...Lower magnetic layer 3...
Gap material layer 3a... Notch portion 4... Electrode coil 5... Insulating layer 6... Upper magnetic layer 8
...Adhesive 9...Protection plate

Claims (1)

【特許請求の範囲】 1)薄膜磁気ヘッドの磁気記録媒体摺動面を研摩して仕
上げる工程を有し、該工程において前記ヘッドの磁気ギ
ャップを構成するギャップ材層に予め形成した所定パタ
ーンの切り欠き部を利用して研摩量の管理を行なうこと
を特徴とする薄膜磁気ヘッドの製造方法。 2)前記ギャップ材層において薄膜磁気ヘッドの磁気回
路を構成する上部磁性層と下部磁性層に挟まれる領域に
前記切り欠き部の少なくとも一部を形成することを特徴
とする特許請求の範囲第1項に記載の薄膜磁気ヘッドの
製造方法。
[Scope of Claims] 1) A step of polishing and finishing the sliding surface of the magnetic recording medium of the thin-film magnetic head, in which a predetermined pattern of cuts formed in advance in the gap material layer constituting the magnetic gap of the head is provided. A method for manufacturing a thin-film magnetic head, characterized in that the amount of polishing is controlled using a notch. 2) At least a part of the notch is formed in a region of the gap material layer sandwiched between an upper magnetic layer and a lower magnetic layer that constitute a magnetic circuit of a thin-film magnetic head. A method for manufacturing a thin-film magnetic head as described in 2.
JP9518887A 1987-04-20 1987-04-20 Production of thin film magnetic head Pending JPS63261509A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9518887A JPS63261509A (en) 1987-04-20 1987-04-20 Production of thin film magnetic head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9518887A JPS63261509A (en) 1987-04-20 1987-04-20 Production of thin film magnetic head

Publications (1)

Publication Number Publication Date
JPS63261509A true JPS63261509A (en) 1988-10-28

Family

ID=14130778

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9518887A Pending JPS63261509A (en) 1987-04-20 1987-04-20 Production of thin film magnetic head

Country Status (1)

Country Link
JP (1) JPS63261509A (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS545708A (en) * 1977-06-15 1979-01-17 Fujitsu Ltd Production of thin-film magnetic heads
JPS6145408A (en) * 1984-08-10 1986-03-05 Hitachi Ltd Working method of thin film magnetic head
JPS63119009A (en) * 1986-11-07 1988-05-23 Alps Electric Co Ltd Manufacture of thin film magnetic head
JPS63253515A (en) * 1987-04-10 1988-10-20 Canon Inc Manufacture of thin-film magnetic head

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS545708A (en) * 1977-06-15 1979-01-17 Fujitsu Ltd Production of thin-film magnetic heads
JPS6145408A (en) * 1984-08-10 1986-03-05 Hitachi Ltd Working method of thin film magnetic head
JPS63119009A (en) * 1986-11-07 1988-05-23 Alps Electric Co Ltd Manufacture of thin film magnetic head
JPS63253515A (en) * 1987-04-10 1988-10-20 Canon Inc Manufacture of thin-film magnetic head

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