JPS63253212A - 膜厚測定方法 - Google Patents

膜厚測定方法

Info

Publication number
JPS63253212A
JPS63253212A JP62088540A JP8854087A JPS63253212A JP S63253212 A JPS63253212 A JP S63253212A JP 62088540 A JP62088540 A JP 62088540A JP 8854087 A JP8854087 A JP 8854087A JP S63253212 A JPS63253212 A JP S63253212A
Authority
JP
Japan
Prior art keywords
film thickness
ultrasonic
core material
waves
liquid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62088540A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0518363B2 (enExample
Inventor
Noritaka Nakaso
教尊 中曽
Yusuke Tsukahara
祐輔 塚原
Masao Saito
雅雄 斎藤
Katsumi Ohira
克己 大平
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toppan Inc
Original Assignee
Toppan Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toppan Printing Co Ltd filed Critical Toppan Printing Co Ltd
Priority to JP62088540A priority Critical patent/JPS63253212A/ja
Publication of JPS63253212A publication Critical patent/JPS63253212A/ja
Publication of JPH0518363B2 publication Critical patent/JPH0518363B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
JP62088540A 1987-04-10 1987-04-10 膜厚測定方法 Granted JPS63253212A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62088540A JPS63253212A (ja) 1987-04-10 1987-04-10 膜厚測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62088540A JPS63253212A (ja) 1987-04-10 1987-04-10 膜厚測定方法

Publications (2)

Publication Number Publication Date
JPS63253212A true JPS63253212A (ja) 1988-10-20
JPH0518363B2 JPH0518363B2 (enExample) 1993-03-11

Family

ID=13945679

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62088540A Granted JPS63253212A (ja) 1987-04-10 1987-04-10 膜厚測定方法

Country Status (1)

Country Link
JP (1) JPS63253212A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997001739A1 (fr) * 1995-06-29 1997-01-16 Bekaert Naamloze Vennootschap Procede et installation pour la mesure d'epaisseur de couche conductrice non ferromagnetique sur un substrat conducteur ferromagnetique
CN102425716A (zh) * 2011-11-14 2012-04-25 航天科工深圳（集团）有限公司 输电线路覆冰监测装置的安放支架

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997001739A1 (fr) * 1995-06-29 1997-01-16 Bekaert Naamloze Vennootschap Procede et installation pour la mesure d'epaisseur de couche conductrice non ferromagnetique sur un substrat conducteur ferromagnetique
AU700581B2 (en) * 1995-06-29 1999-01-07 Bekaert Naamloze Vennootschap Method and installation for measuring the thickness of a non-ferromagnetic conductive layer on a ferromagnetic conductive substrate
US5963031A (en) * 1995-06-29 1999-10-05 N.V. Bekaert Naamloze Vennootschap Method and apparatus for measuring the thickness of a non-ferromagnetic conductive layer on a ferromagnetic conductive substrate
CN102425716A (zh) * 2011-11-14 2012-04-25 航天科工深圳（集团）有限公司 输电线路覆冰监测装置的安放支架

Also Published As

Publication number Publication date
JPH0518363B2 (enExample) 1993-03-11

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