JPS63239174A - Method of joining metal member to ceramic substrate - Google Patents

Method of joining metal member to ceramic substrate

Info

Publication number
JPS63239174A
JPS63239174A JP7384587A JP7384587A JPS63239174A JP S63239174 A JPS63239174 A JP S63239174A JP 7384587 A JP7384587 A JP 7384587A JP 7384587 A JP7384587 A JP 7384587A JP S63239174 A JPS63239174 A JP S63239174A
Authority
JP
Japan
Prior art keywords
ceramic substrate
metal member
joining
metal
bonding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7384587A
Other languages
Japanese (ja)
Inventor
浩一 新富
新五郎 福岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Furukawa Electric Co Ltd
Original Assignee
Furukawa Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Furukawa Electric Co Ltd filed Critical Furukawa Electric Co Ltd
Priority to JP7384587A priority Critical patent/JPS63239174A/en
Publication of JPS63239174A publication Critical patent/JPS63239174A/en
Pending legal-status Critical Current

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  • Pressure Welding/Diffusion-Bonding (AREA)
  • Ceramic Products (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はセラミックス基体と金属部材との接合方法に関
するものであって、特に従来よりも強固な接合強度が得
られる様な接合方法に関するものである。
[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to a method of joining a ceramic substrate and a metal member, and particularly relates to a joining method that can provide stronger joining strength than conventional methods. be.

〔従来の技術及びその問題点〕[Conventional technology and its problems]

近年電子工業の発達に伴い、電子回路基板等セラミック
ス基体と金属部材との接合体が注目されている、従来か
らセラミックス基体と金属部材との接合方法に関しては
多くの方法が提案されており、一般的に、は接着材を用
いたり、加熱、加圧等により接合する方法が行なわれて
いる。
In recent years, with the development of the electronics industry, joined bodies of ceramic substrates and metal components such as electronic circuit boards have been attracting attention.Many methods have been proposed for joining ceramic substrates and metal components; Generally speaking, bonding methods using adhesives, heating, pressure, etc. are used.

これらの方法は基本的にはセラミックスに金属が濡れる
ことが前提であり、比較的金属酸化物と濡れやすい酸化
物系セラミックス例えばAIl、□03、MgO,Si
O□等に関しては、例えば特開昭59−30782号発
明等多数の研究報告や実例が示されている。一方弁酸化
物系セラミックス例えばA/!N、S i、Na 、B
N、S iC等はほとんど金属と濡れないため、あらか
じめこれらセラミックスの表面改質、例えば表面酸化、
酸化物コーティング等を行なった後金属部材と接合する
方法がとられているが、研究報告や実例(例えば特開昭
55−113678号発明等)は酸化物系セラミックス
に比べると少ない。
These methods are basically based on the premise that the metal gets wet with ceramics, and oxide ceramics that are relatively easy to get wet with metal oxides, such as AIl, □03, MgO, Si, etc.
Regarding O□, etc., many research reports and examples have been disclosed, such as the invention in Japanese Patent Application Laid-Open No. 59-30782. On the other hand, valve oxide ceramics such as A/! N, Si, Na, B
Since N, SiC, etc. hardly wet with metals, surface modification of these ceramics, such as surface oxidation,
A method has been used in which ceramics are bonded to metal members after being coated with an oxide, but there are fewer research reports and actual examples (for example, the invention disclosed in JP-A-55-113678) than with oxide-based ceramics.

前記従来のセラミックス基体と金属部材との接合方法に
おいては、セラミックスと金属との接合界面に脆い中間
相が存在することが多く、更にセラミックスと金属との
熱膨張係数の相違によって前記接合界面に応力を生じ、
接合部特にセラミックス側に微細な亀裂が発生する場合
が多いため、充分な接合強度を得ることが出来なかった
In the conventional bonding method of a ceramic substrate and a metal member, a brittle intermediate phase often exists at the bonding interface between the ceramic and the metal, and further stress is generated at the bonding interface due to the difference in thermal expansion coefficient between the ceramic and the metal. arises,
Since minute cracks often occur at the joint, especially on the ceramic side, sufficient joint strength could not be obtained.

更に、スパッタ法や蒸着法等の気相法によってセラミッ
クス基体上にTiやMO等の薄膜を形成した後金属部材
を接合する方法も試みられているが、この場合も接合界
面に脆い中間相(例えばTiの場合はTiet、TiN
、Tic等)が形成されることが多く、やはり充分な接
合強度が得られていない。
Furthermore, attempts have also been made to form a thin film of Ti, MO, etc. on a ceramic substrate by a vapor phase method such as sputtering or vapor deposition, and then bond the metal members together; however, in this case as well, a brittle intermediate phase ( For example, in the case of Ti, Tiet, TiN
, Tic, etc.) are often formed, and sufficient bonding strength is still not obtained.

〔問題点を解決するための手段] 本発明は上記の点に鑑みなされたものであり、その目的
とするところは、セラミックス基体上に金属部材を接合
した際に、従来よりも強固な接合強度が得られる様な接
合方法を提供することである。
[Means for Solving the Problems] The present invention has been made in view of the above points, and its purpose is to provide stronger bonding strength than before when a metal member is bonded to a ceramic substrate. The object of the present invention is to provide a joining method that can obtain the following.

即ち本発明は、セラミックス基体表面を物理的にエツチ
ングした後、金属の薄膜を気相成長法により形成し、該
薄膜を介してセラミックス基体上に所望の金属部材を熱
的又は機械的手段により接合することを特徴とする金属
部材をセラミックス基体に接合する方法である。
That is, in the present invention, after physically etching the surface of a ceramic substrate, a thin metal film is formed by vapor phase growth, and a desired metal member is bonded onto the ceramic substrate via the thin film by thermal or mechanical means. This is a method for joining a metal member to a ceramic substrate.

本発明においてセラミックス基体表面を物理的にエツチ
ングする手段としては、Hz 、A r等のセラミック
ス基体を構成していない原子のイオン或いは電子を用い
ることが出来る。又前記エツチングされたセラミックス
基体表面にAl2.Cu。
In the present invention, as means for physically etching the surface of the ceramic substrate, ions or electrons of atoms that do not constitute the ceramic substrate, such as Hz or Ar, can be used. Further, Al2. Cu.

Fe等の薄膜を気相成長させる手段としては、スパッタ
法、蒸着法、イオンプレーティング法、CVD法、IV
D法の内いずれか1種の方法を用いることが出来る。以
上の様にして形成された′a膜を介してセラミックス基
体上にFe系、Cu系、AI!、系等の金属部材を熱的
又は機械的手段により接合する方法は特に限定されるも
のではなく、加熱、ロー付け、加圧、電圧印加等の方法
を単独で、又は二つ以上組合わせて行なうことが出来る
Methods for vapor phase growth of thin films such as Fe include sputtering, vapor deposition, ion plating, CVD, and IV
Any one of methods D can be used. Fe-based, Cu-based, AI! There are no particular limitations on the method of joining metal members such as , systems, etc. by thermal or mechanical means, and methods such as heating, brazing, pressurization, voltage application, etc. may be used alone or in combination of two or more. It can be done.

〔作用〕[Effect]

本発明においては、セラミックス基体例えばAINやA
2□01等の表面をイオン等でエツチングすることによ
り、前記AINやA2□03が分解して酸素や窒素はセ
ラミックス基体上から遊離し、基体表面はA2に富んだ
組成となる。即ち該基体表面は金属に近い性質を有する
様になるので、該基体表面に強固に結合したAl、Cu
、Fe等の薄膜を形成することが可能であり、該薄膜を
介して金属部材を接合することにより強固な接合強度を
得ることが出来る。又本発明においては接合界面に脆い
中間相を生じることがないので、上記中間相による接合
強度低下も生じない。
In the present invention, a ceramic substrate such as AIN or A
By etching the surface of 2□01 etc. with ions or the like, the AIN and A2□03 are decomposed and oxygen and nitrogen are liberated from the ceramic substrate, so that the substrate surface has a composition rich in A2. In other words, since the surface of the substrate comes to have properties close to metal, Al and Cu strongly bonded to the surface of the substrate
It is possible to form a thin film of , Fe, etc., and by joining metal members through the thin film, strong joint strength can be obtained. Furthermore, in the present invention, since no brittle intermediate phase is generated at the bonding interface, the bonding strength does not deteriorate due to the intermediate phase.

〔実施例1〕 以下に実施例により本発明を更に具体的に説明する。[Example 1] The present invention will be explained in more detail below using Examples.

セラミックス基体としてA1Nセラミックスを用い、こ
れにスパッタ装置内でAr80%、8220%の混合ガ
ス中(ガス圧: 5 Xl0−’Torr)で投入電力
300wでイオンエツチングを行なった後、投入電力5
00WにてAfの薄膜を5−形成した。しかる後B!J
薄膜上にjアさ300−の銅板を重ね、加熱温度700
°C1I Xl0−’Torrの真空雰囲気の接合条件
で接合させた。この様にして得られた接合体の接合強度
は9.6kg/cu+と良好であった。
A1N ceramic was used as the ceramic substrate, and ion etching was performed on it in a sputtering device in a mixed gas of 80% Ar and 8220% (gas pressure: 5 Xl0-'Torr) with an input power of 300 W, and then with an input power of 5
A thin film of Af was formed at 00W. After that, B! J
A copper plate with a diameter of 300 mm was placed on top of the thin film, and heated to a temperature of 700 mm.
The bonding was performed under a vacuum atmosphere bonding condition of °C1IX10-'Torr. The bonding strength of the thus obtained bonded body was 9.6 kg/cu+, which was good.

〔実施例2〕 セラミックス基体としてAffi203セラミックスを
用い、実施例1と同様な方法で厚さ300−の銅板を接
合させた。この様にして得られた接合体の接合強度は9
 、8 kg / cmと良好であった。
[Example 2] Affi203 ceramics was used as the ceramic substrate, and a 300-thick copper plate was joined in the same manner as in Example 1. The bonding strength of the bonded body obtained in this way was 9
, 8 kg/cm, which was good.

(実施例3) セラミックス基体としてSiCセラミックスを用い、実
施例1と同様な方法でイオンエツチングを行なった後、
投入電力500WにてCuの薄膜を5−形成した。しか
る後該薄膜上に厚さ300−の鉄板を重ね、加熱温度1
200°C1I Xl0−’Torrの真空雰囲気の接
合条件で接合させた。この様にして得られた接合体の接
合強度は10 、0 kg / cmと良好であった。
(Example 3) After performing ion etching in the same manner as in Example 1 using SiC ceramics as the ceramic substrate,
A thin Cu film was formed at an input power of 500 W. After that, a 300-thick iron plate was placed on top of the thin film, and the heating temperature was 1.
The bonding was performed under the vacuum atmosphere bonding conditions of 200°C1IX10-'Torr. The bonding strength of the thus obtained bonded body was as good as 10.0 kg/cm.

〔比較例1〕 セラミックス基体としてA42Nセラミツクスを用い、
スパッタ装置内でArガス圧5 X 10− ”Tor
r。
[Comparative Example 1] Using A42N ceramics as the ceramic base,
Ar gas pressure was set at 5 x 10-” Tor in the sputtering equipment.
r.

投入電力900WでTiのyi膜を54形成した。しか
る後該薄膜上に厚さ300−の銅板を重ね、加熱温度1
000’C1I Xl0−’Torrの真空雰囲気の接
合条件で接合させた。この様にして得られた接合体の接
合強度は1 、6 kg / craと低かった。
54 yi films of Ti were formed with an input power of 900 W. After that, a 300-thick copper plate was placed on top of the thin film, and the heating temperature was 1.
The bonding was performed under a vacuum atmosphere bonding condition of 000'C1IX10-'Torr. The bonding strength of the bonded body thus obtained was as low as 1.6 kg/cra.

〔比較例2〕 セラミックス基体として/12chセラミックスを用い
、比較例1と同様な方法で厚さ300−の銅板を接合さ
せた。この様にして得られた接合体の接合強度は5.8
kg/c+aと低かった。
[Comparative Example 2] A 300-thick copper plate was bonded in the same manner as in Comparative Example 1 using /12ch ceramic as a ceramic substrate. The bonding strength of the bonded body obtained in this way was 5.8
It was as low as kg/c+a.

〔比較例3〕 セラミックス基体としてSiCセラミ・νクスを用い、
比較例1と同様な方法でTiの薄膜を5−形成した後、
該f31i膜上に厚さ300μの鉄板を重ね、加熱温度
1200’c、I Xl0−’Torrの真空雰囲気の
接合条件で接合させた。この様にして得られた接合体の
接合強度は1 、8 kg / c+sと低かった。
[Comparative Example 3] Using SiC ceramic νx as the ceramic substrate,
After forming a Ti thin film in the same manner as in Comparative Example 1,
An iron plate having a thickness of 300 μm was placed on the f31i film, and bonding was performed under the following bonding conditions: a heating temperature of 1200° C. and a vacuum atmosphere of I Xl0 −′ Torr. The bonding strength of the bonded body thus obtained was as low as 1.8 kg/c+s.

〔発明の効果〕〔Effect of the invention〕

以上の様に本発明は、セラミックス基体上に金属部材を
、従来よりも強固な接合強度をもって接合せしめること
が出来るという工業上顕著な効果を奏するものである。
As described above, the present invention has an industrially significant effect in that it is possible to bond a metal member onto a ceramic substrate with stronger bonding strength than before.

Claims (6)

【特許請求の範囲】[Claims] (1)セラミックス基体表面を物理的にエッチングした
後、金属の薄膜を気相成長法により形成し、該薄膜を介
してセラミックス基体上に所望の金属部材を熱的又は機
械的手段により接合することを特徴とする金属部材をセ
ラミックス基体に接合する方法。
(1) After physically etching the surface of the ceramic substrate, a thin metal film is formed by vapor phase growth, and a desired metal member is bonded onto the ceramic substrate via the thin film by thermal or mechanical means. A method for bonding a metal member to a ceramic substrate, characterized by:
(2)イオン又は電子で物理的にエッチングすることを
特徴とする特許請求の範囲第1項記載の金属部材をセラ
ミックス基体に接合する方法。
(2) A method for joining a metal member to a ceramic substrate according to claim 1, which comprises physically etching with ions or electrons.
(3)気相成長法として、スパッタ法、蒸着法、イオン
プレーティング法、CVD法、IVD法の内いずれか1
種の方法を用いることを特徴とする特許請求の範囲第1
項記載の金属部材をセラミックス基体に接合する方法。
(3) As a vapor phase growth method, any one of sputtering method, vapor deposition method, ion plating method, CVD method, and IVD method
Claim 1 characterized in that a seed method is used.
A method for joining the metal member described in Section 1 to a ceramic substrate.
(4)熱的、又は機械的手段として、加熱、ロー付け、
加圧、電圧印加の内いずれか1種、又は2種以上の手段
を組合わせて用いることを特徴とする特許請求の範囲第
1項記載の金属部材をセラミックス基体に接合する方法
(4) As thermal or mechanical means, heating, brazing,
A method for joining a metal member to a ceramic substrate according to claim 1, characterized in that one of pressurization and voltage application, or a combination of two or more of them, is used.
(5)金属の薄膜として、Al、Cu、Feの内いずれ
か1種の金属薄膜を用いることを特徴とする特許請求の
範囲第1項記載の金属部材をセラミックス基体に接合す
る方法。
(5) A method for joining a metal member to a ceramic substrate according to claim 1, characterized in that the metal thin film is one of Al, Cu, and Fe.
(6)金属部材がFe系、Cu系、Al系部材の内いず
れか1種の部材であることを特徴とする特許請求の範囲
第1項記載のセラミックス基体と金属部材との接合方法
(6) The method of joining a ceramic substrate and a metal member according to claim 1, wherein the metal member is any one of Fe-based, Cu-based, and Al-based members.
JP7384587A 1987-03-27 1987-03-27 Method of joining metal member to ceramic substrate Pending JPS63239174A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7384587A JPS63239174A (en) 1987-03-27 1987-03-27 Method of joining metal member to ceramic substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7384587A JPS63239174A (en) 1987-03-27 1987-03-27 Method of joining metal member to ceramic substrate

Publications (1)

Publication Number Publication Date
JPS63239174A true JPS63239174A (en) 1988-10-05

Family

ID=13529884

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7384587A Pending JPS63239174A (en) 1987-03-27 1987-03-27 Method of joining metal member to ceramic substrate

Country Status (1)

Country Link
JP (1) JPS63239174A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012044188A (en) * 2004-02-16 2012-03-01 Bondtech Inc Connection method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012044188A (en) * 2004-02-16 2012-03-01 Bondtech Inc Connection method

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