JPS63225214A - Light chopping type microscope - Google Patents
Light chopping type microscopeInfo
- Publication number
- JPS63225214A JPS63225214A JP5986187A JP5986187A JPS63225214A JP S63225214 A JPS63225214 A JP S63225214A JP 5986187 A JP5986187 A JP 5986187A JP 5986187 A JP5986187 A JP 5986187A JP S63225214 A JPS63225214 A JP S63225214A
- Authority
- JP
- Japan
- Prior art keywords
- optical axis
- objective lens
- image observation
- observation
- mirror
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims abstract description 57
- 230000002093 peripheral effect Effects 0.000 abstract description 4
- 230000000007 visual effect Effects 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Microscoopes, Condenser (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は視野全体が鮮明にみえるように工夫された新規
の光切断式顕微鏡に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a novel light sectioning microscope devised so that the entire field of view can be seen clearly.
〔従来の技術〕および〔発明が解決しようとする問題点
〕従来、光切断方式の光学像は垂線に対して左右対称に
配置された先帝投射用対物レンズおよび交切曲線観際用
対物レンズによって光切断による断面像をみるものでめ
った。このため、物体像の周辺個所が像観察用対物レン
ズ（本願の第２対物レンズと交切曲線観察用対物レンズ
に相当する）の焦点距離からはずれて視野全体に亘って
鮮明にみることができない欠陥があった。[Prior Art] and [Problems to be Solved by the Invention] Conventionally, an optical image of the light cutting method is produced using an objective lens for projection and an objective lens for intersecting curve viewing, which are arranged symmetrically with respect to a perpendicular line. I was lucky to see cross-sectional images created by optical sectioning. For this reason, the peripheral parts of the object image are deviated from the focal length of the image observation objective lens (corresponding to the second objective lens and the intersecting curve observation objective lens in the present application) and cannot be clearly seen over the entire field of view. There was a flaw.
本発明は像観察用第１対物レンズ（１）を備えた第１光
軸（２）と、光帯投射用対物レンズ（３）を備えた第２
光軸（４）と交切曲線観察用対物レンズ（５）を備えた
第３光軸（６）と、を被観察面（７）上に於て会合する
状態で有し、＠ｌ光軸（２）に於て像観察用第１対物レ
ンズ（１）よシ上の個所に変向用゛半透明鏡（８）を、
また第３光軸（６）に変向用反射ｉ＃Ｉ（９ｎ夫々これ
等変向用半透鏡（８）および変向用反射ｍ （９）が第
３光軸（６）を第１光軸（２）に合体させる状態として
設けられ、当該合体光軸（１（Ｉ上に像観察用第２対物
レンズ圓を設けられると共に同合体光軸α１に於て第２
対物レンズ（υよシ上の個所に接眼レンズ（１つを、ま
た第２光軸（４）に於て光帯投射用対物レンズ（３）よ
シ上の個所に光帯投射用光学系０を夫々装備したことを
特徴とする光切断式顕微鏡を提供しこれによシ上記の欠
陥を解消するものである。The present invention has a first optical axis (2) equipped with a first objective lens (1) for image observation, and a second optical axis (2) equipped with a first objective lens (3) for light band projection.
It has an optical axis (4) and a third optical axis (6) equipped with an objective lens (5) for observing intersecting curves, which meet on the surface to be observed (7), and the @l optical axis In (2), a translucent mirror (8) for direction change is placed above the first objective lens (1) for image observation;
In addition, the third optical axis (6) has a direction changing reflection i#I (9n), each of which has a direction changing semitransparent mirror (8) and a direction changing reflection m (9) that A second objective lens for image observation is provided on the combined optical axis (1 (I), and a second objective lens is provided on the combined optical axis α1.
An eyepiece (one eyepiece) is placed above the objective lens (υ), and an optical system for light band projection (0) is placed above the objective lens (3) for light band projection on the second optical axis (4). The object of the present invention is to provide a light sectioning microscope characterized in that it is equipped with the following, and thereby eliminate the above-mentioned deficiencies.
図に示す実施例は像観察用５ｇ１対物レンズ（１）を備
えた第１光軸（２）と、光帯投射用対物レンズ（３）を
備え九第２光軸（４）と、交切曲ｉｌ！１観察用対物レ
ンズ（５）を備え九第３光軸（６）とを被観察面（７）
に於て会合する状態で有し、第１光軸（２）に於て像観
察用第１対物レンズ（１）よｐ上の個所に変向用半透鏡
（８）を、ま・九第３光軸（６）に変向用反射鏡（９）
を夫々これ等変向用半透−（８）および変向用反射鏡（
９）が第３光軸（６）を第１光軸（ｔ）に合体させる状
態として設けられ、当該合体光軸αの上に像観察用第２
対物レンズμυを設けられると共に同合体光軸α〔に於
て第２対物レンズａυよシ上の個所に、接眼レンズ０を
備えた観察用光学系０とカメラ撮影用光学系Ｃ１５とラ
ンプ翰および基準スリットａηを備えた基準スリット投
射用光学系ｔｔＳとを夫々設け、更に第２光軸（４）に
於て光帯投射用レンズ（３）よシ上の個所にランプ四お
よびｉｆｍ−スリット板四を備えた光帯投射用光学系０
を設けたものでめる。The embodiment shown in the figure has a first optical axis (2) equipped with a 5G1 objective lens (1) for image observation, and a second optical axis (4) equipped with a light zone projection objective lens (3), which are intersecting. Song il! 1 has an observation objective lens (5) and a 9th third optical axis (6) and a surface to be observed (7).
A half-transparent mirror (8) for deflection is placed above the first objective lens (1) for image observation on the first optical axis (2). Reflector for direction change (9) on 3 optical axes (6)
These are the translucent mirror for direction change (8) and the reflector for direction change (
9) is provided to combine the third optical axis (6) with the first optical axis (t), and a second optical axis for image observation is provided on the combined optical axis α.
An objective lens μυ is provided, and an observation optical system 0 equipped with an eyepiece 0, a camera photographing optical system C15, a lamp holder and A reference slit projection optical system ttS equipped with a reference slit aη is provided, and a lamp 4 and an ifm-slit plate are provided above the light zone projection lens (3) on the second optical axis (4). Optical system for light band projection with 4
It is possible to use one that has .
面、本発明は基準スリット投射用光学系−、カメラ撮影
用光学系（Ｉ！１９を装備しないで笑厖することも可能
である。また実施例の説明および図中では分かシ切った
所要のレンズ、プリズム、鏡、視野照明装置および計測
機械装置等は省略 。However, the present invention can also be used without equipping the reference slit projection optical system and the camera photographing optical system (I!19). Lenses, prisms, mirrors, field illumination devices, measuring instruments, etc. are omitted.
している。are doing.
〔作用〕および〔発明の効果〕
本発明は上記のような構成であるので、使用中に於て光
切断による交切曲線（断面像）が鮮明にみえているのに
視野の周辺個所が鮮明にみえていない場合には、像観察
用第１対物レンズ（１）のみを上下させてピント合せ操
作を行って周辺個所も鮮明にみえるようにすればよいも
のであシ、このように像観察用第１対物レンズ（１）に
ピント合せ操作を加えても、塚観察用第１対物レンズ（
１）と像観祭用第２対物レンズ０υとが分離されている
ため交切曲線観察側の倍率が変らない。従って、交切曲
線はもちろん視野全体に亘つて鮮明にみることができる
ものであって、所期の目的を完全に達成することができ
る優れ九効果を奏するものである。[Operation] and [Effects of the Invention] Since the present invention has the above-described configuration, during use, even though the intersection curve (cross-sectional image) due to light cutting is clearly visible, the peripheral parts of the visual field are not clear. If the image cannot be seen clearly, all you have to do is move the first objective lens for image observation (1) up and down to focus so that the surrounding areas can also be seen clearly. Even if you perform a focusing operation on the first objective lens for mound observation (1), the first objective lens for mound observation (
1) and the second objective lens 0υ for image viewing are separated, so the magnification on the intersection curve observation side does not change. Therefore, not only the intersection curve but also the entire visual field can be seen clearly, and the desired purpose can be completely achieved.
図は本発明光切断顕微鏡の実施例を示すものでらって、
第１図は全体の概念図、第２図は光帯が被観察面に照射
されている状態を示す斜視図、第３図は視野を示す平面
図である。
（１）・・・像銭察用第１対吻レンズ、（２ン・・・第
１光軸、（３）・・・光帯投射用対物レンズ、（４）・
・・第２光軸、（５）・・・交切面ｓ観察用対物レンズ
、（６）・・・第３光軸、（力・・・被観察面、（８）
・・・変向用半透虜、（９）・・・変向用。
反射腕、ａＩ・・・合体光軸、（ｉｌｌ・・・像観察用
第２対物レンズ、ａ）・・・接眼レンズ、ｔ１３・・・
光帯投射用光学系、Ｉ・・・観察用光学系、（２）・・
・カメラ撮影用光学系、霞・・・ランプ、αη・・・基
準スリット、Ｑ→・・・基準スリット投射用光学系、σ
９・・・う／グ、（至）・・・ｍ線スリット板。
特 許 出 願 人 日商精密光学株式会社代理人 弁
理士 杉 山 泰 二Ｊ ｒ、ｒ、。
第１図
（５）・・・交切曲線観察用対物
レンズ
第３図
第２図The figure shows an embodiment of the optical cutting microscope of the present invention.
FIG. 1 is an overall conceptual diagram, FIG. 2 is a perspective view showing a state in which a light band is irradiated onto a surface to be observed, and FIG. 3 is a plan view showing a field of view. (1)...First objective lens for image inspection, (2nd...first optical axis, (3)...Objective lens for light band projection, (4)...
...Second optical axis, (5)...Objective lens for observing intersecting plane s, (6)...Third optical axis, (force...surface to be observed, (8)
... Semi-transparent prisoner for changing direction, (9) ... For changing direction. Reflection arm, aI... combined optical axis, (ill... second objective lens for image observation, a)... eyepiece, t13...
Optical system for light band projection, I... optical system for observation, (2)...
・Camera photography optical system, haze...lamp, αη...reference slit, Q→...reference slit projection optical system, σ
9...U/g, (to)...m-line slit plate. Patent applicant: Nissho Precision Optics Co., Ltd. Agent Patent attorney: Yasushi Sugiyama Jr. Figure 1 (5)... Objective lens for observing intersecting curves Figure 3 Figure 2
Claims (1)
と、光帯投射用対物レンズ（３）を備えた第２光軸（４
）と、交切曲線観察用対物レンズ（５）を備えた第３光
軸（６）とを被観察面（７）上に於て会合する状態で有
し、第１光軸（２）に於て像観察用第１対物レンズ（１
）より上の個所に変向用半透鏡（８）を、また第３光軸
（６）に変向用反射鏡（９）を夫々これ等変向用反射鏡
（８）および変向用（９）が第３光軸（６）を第１光軸
（２）に合体させる状態として設けられ、当該合体光軸
（１０）上に像観察用第２対物レンズ（１１）を設けら
れると共に同合体光軸（１０）に於て第２対物レンズ（
１１）より上の個所に接眼レンズ（１２）を、また第２
光軸（４）に於て光帯投射用対物レンズ（３）より上の
個所に光帯投射用光学系（１３）を夫々装備されたこと
を特徴とする光切断式顕微鏡。A first optical axis (2) with a first objective lens for image observation (1)
and a second optical axis (4) equipped with a light band projection objective lens (3).
) and a third optical axis (6) equipped with an objective lens (5) for observing intersecting curves, which meet on the surface to be observed (7), and the first optical axis (2) The first objective lens for image observation (1
) is a half-transparent mirror (8) for redirection, and a reflector (9) for redirection is installed above the third optical axis (6). 9) is provided to combine the third optical axis (6) with the first optical axis (2), and a second objective lens (11) for image observation is provided on the combined optical axis (10). The second objective lens (
11) Attach the eyepiece (12) above the
A light-cutting microscope characterized in that optical systems (13) for projecting a light band are respectively installed at positions above the objective lens (3) for projecting a light band on the optical axis (4).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5986187A JPS63225214A (en) | 1987-03-14 | 1987-03-14 | Light chopping type microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5986187A JPS63225214A (en) | 1987-03-14 | 1987-03-14 | Light chopping type microscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63225214A true JPS63225214A (en) | 1988-09-20 |
| JPH0558528B2 JPH0558528B2 (en) | 1993-08-26 |
Family
ID=13125381
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5986187A Granted JPS63225214A (en) | 1987-03-14 | 1987-03-14 | Light chopping type microscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63225214A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02272514A (en) * | 1989-04-14 | 1990-11-07 | Fujitsu Ltd | Method for positioning optical cutting microscope device and its optical means |
-
1987
- 1987-03-14 JP JP5986187A patent/JPS63225214A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02272514A (en) * | 1989-04-14 | 1990-11-07 | Fujitsu Ltd | Method for positioning optical cutting microscope device and its optical means |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0558528B2 (en) | 1993-08-26 |
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