JPS63225173A - Phase detector - Google Patents

Phase detector

Info

Publication number
JPS63225173A
JPS63225173A JP6070387A JP6070387A JPS63225173A JP S63225173 A JPS63225173 A JP S63225173A JP 6070387 A JP6070387 A JP 6070387A JP 6070387 A JP6070387 A JP 6070387A JP S63225173 A JPS63225173 A JP S63225173A
Authority
JP
Japan
Prior art keywords
phase
level
voltage
square wave
voltages
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6070387A
Other languages
Japanese (ja)
Inventor
Tsutomu Shibata
柴田 勤
Kazuhiko Hirota
和彦 広田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hioki EE Corp
Original Assignee
Hioki Denki KK
Hioki EE Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hioki Denki KK, Hioki EE Corp filed Critical Hioki Denki KK
Priority to JP6070387A priority Critical patent/JPS63225173A/en
Publication of JPS63225173A publication Critical patent/JPS63225173A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To provide a highly accurate phase detector, by measuring the level of one of two input voltage at the rising point of time of other voltage. CONSTITUTION:With respect to two input voltages V'RS, R'TS' the level of one voltage at the rising point of time of the other voltage is alternately measured by a rising detection means 4 and a level detection means 5. The measuring results are compared with each other by a level comparing means 6 to make it possible to confirm which is an H-level. Therefore, on the basis of the advance or delay of the phase thereof, the phase order of a circuit can be measured by a positive phase and reverse phase discrimination means 7. In the case of phase omission, no rising is detected by the means 4 or the output of the means 5 equally becomes '0' or '1' or the output of the means 6 becomes non-coincidence and, therefore, the phase omission is certainly detected by a phase omission processing means 8. A measuring result is displayed on a display means 9.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、3相交流電路等における線間電圧の位相の
進み、遅れを測定する特にディジタル形の検相器に関す
るものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a particularly digital phase detector for measuring the phase advance and lag of a line voltage in a three-phase AC circuit or the like.

〔従来の技術〕[Conventional technology]

3相交流電路等に回転機器などを接続する場合には、逆
回転による危険発生を防止するため線間電圧の位相が正
相であるか逆相であるかをあらかじめチェックする必要
があり、一般にはアナログ形式の検相器が用いられてい
る。
When connecting rotating equipment to a three-phase AC line, etc., it is necessary to check in advance whether the phase of the line voltage is positive or negative in order to prevent danger from reverse rotation. An analog type phase detector is used.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

ところで、最近では3相交流電路の線間電圧など他の電
気量の測定し9は1例えばマイクロコンピュータを備え
たディジタル形の測定器が利用され、これが主流になっ
てきている。そのため、現場用としては少なくともアナ
ログ形の検相器とディジタル形の他の測定器とを合わせ
て2台用意する必要があり、屋外作業の場合には特に不
便さがあった。
Incidentally, recently, for measuring other electrical quantities such as the line voltage of a three-phase AC power line, digital measuring instruments equipped with, for example, a microcomputer have been used, and these have become mainstream. Therefore, for on-site use, it is necessary to prepare at least two analog phase detectors and another digital measuring instrument, which is especially inconvenient when working outdoors.

この発明は上記の点に鑑みなされたもので、その第1の
目的は、ディジタル的に測定を行う高精度の検相器を実
現することにある。また、この発明の第2の目的は1例
えば他のディジタル計測器に組み込み、その有するマイ
クロコンピュータを共用して測定が行えるようにした検
相器を提供することにある。
This invention has been made in view of the above points, and its first purpose is to realize a highly accurate phase detector that performs measurements digitally. A second object of the present invention is to provide a phase detector which can be incorporated into, for example, another digital measuring instrument and can perform measurements by sharing its microcomputer.

〔測定原理〕[Measurement principle]

第1図を参照しながら、まずこの発明による検相器の測
定原理を説明する。同図(A)において、例えば対称3
相電路の相電圧をそれぞれVR+ VatMlとし、3
本の線路R,S、Tの線間電圧を?*s+?tsとする
と、この2つの電圧の位相関係は例えば第1図(B)の
(イ)に示されるようになる。
First, the measurement principle of the phase detector according to the present invention will be explained with reference to FIG. In the same figure (A), for example, symmetry 3
Let the phase voltage of each phase circuit be VR + VatMl, and 3
What is the line voltage of real lines R, S, and T? *s+? ts, the phase relationship between these two voltages is shown, for example, in (a) of FIG. 1(B).

ここで、例えばVR3を基準として上記電圧vTsを見
た場合、同図の実線で示されるように電圧VTSの位相
が電圧VFIsの位相より進んでいれば正相とし1点線
で示されるように遅れていれば逆相と定めたとする。こ
のようにすると、上記2つの電圧VRsとvisを例え
ばゼロクロスコンパレータにてそれぞれ第1図(B)の
(ロ)、(ハ)に示される電圧V’R5とv’丁sの方
形波に波形整形した場合、電圧v’asがゼロレベルか
ら立ち上がる時点t1又はt2において電圧v′丁sの
レベルを測定すれば、それがHレベルであるかLレベル
であるかによって位相の進み、遅れがわかり、正相、逆
相の判断ができる。
For example, when looking at the voltage vTs with VR3 as a reference, if the phase of the voltage VTS is ahead of the phase of the voltage VFIs, as shown by the solid line in the figure, it is assumed to be in positive phase, and it is delayed as shown by the one-dot line. If so, it is determined that the phase is reversed. In this way, the above two voltages VRs and vis can be converted into square waves of voltages V'R5 and v'Ts shown in (b) and (c) of FIG. 1(B), respectively, using a zero-cross comparator, for example. In the case of shaping, if you measure the level of voltage v'as at time t1 or t2 when voltage v'as rises from zero level, you can tell whether the phase is advanced or delayed depending on whether it is at H level or L level. , it is possible to judge whether the phase is normal or reversed.

この場合、例えばv’Rsの立ち下がり時点t、又はt
4における電圧v’Tsのレベルを測定してもよい、た
だしこの場合にはLレベルのとき正相で、Hレベルのと
きは逆相になる。
In this case, for example, the falling point t of v'Rs, or t
The level of the voltage v'Ts at 4 may be measured; however, in this case, when it is at L level, it is in the positive phase, and when it is at H level, it is in the opposite phase.

〔発明の構成〕[Structure of the invention]

この検相器の実施例においては第2図に示される機能を
備えている。7すなわち、3本の被測定電路R,S、T
から加えられる電圧VR8とvisを例えば適宜のレベ
ルに調整する入力レベル調整手段1と、調整された電圧
をそれぞれ方形波電圧v Rs’とV′τSに変換する
波形整形手段2と、上記波形変換のしきい値レベルを設
定する基準電圧源3を有し、上記変換された一方の電圧
の立ち上がり時点を検出してその時点における他方の電
圧のレベルを交互に測定する立ち上がり検出手段4とレ
ベル検出手段5とを備えている。
This embodiment of the phase detector has the functions shown in FIG. 7, that is, three electrical circuits to be measured R, S, T
an input level adjusting means 1 for adjusting the voltages VR8 and vis applied from the input terminal to appropriate levels, a waveform shaping means 2 for converting the adjusted voltages into square wave voltages vRs' and V'τS, respectively; has a reference voltage source 3 for setting a threshold level of the converted voltage, and a rise detection means 4 for detecting the rise time of one of the converted voltages and alternately measuring the level of the other voltage at that time; means 5.

また、例えば上記レベル検出手段5にて得られる2つの
検出出力V’R3とV′τ、のうち、いずれがHレベル
でいずれがLレベルであるかを比較するレベル比較手段
6と、この比較結果により上記入力電圧VR8とv丁s
の相判定を行う正相逆相判別手段7と、上記立ち上がり
検出手段4において方形波電圧V’R8又はV’丁fi
の立ち上がりが検出されない場合、及び上記レベル検出
手段5において所定回測定しても測定レベルが一様にゼ
ロか1の場合。
Further, for example, a level comparison means 6 for comparing which of the two detection outputs V'R3 and V'τ obtained by the level detection means 5 is the H level and which is the L level; According to the result, the above input voltage VR8 and vdings
The positive phase/negative phase determining means 7 performs phase determination, and the rise detecting means 4 detects the square wave voltage V'R8 or V'
When the rise of the level is not detected, and when the measured level is uniformly zero or 1 even if the level detecting means 5 measures a predetermined number of times.

又はレベル比較手段6の比較結果が前回までの比較結果
と一致しない場合に欠相と判定する欠相処理手段8を有
し、これらの判定を表示する表示手段9を備えている。
Alternatively, it has an open-phase processing means 8 that determines that the phase is open when the comparison result of the level comparison means 6 does not match the previous comparison result, and a display means 9 that displays these determinations.

なお、この実施例においては、例えば上記立ち上がり検
出手段4.レベル検出手段5、及びレベル比較手段6に
所定回測定を行わせるための測定回数設定手段10と、
上記レベル検出手段5の測定出力がゼロレベルの場合、
このレベル検出手段5と上記立ち上がり検出手段4の測
定動作を所定回で打ち切る測定打ち切り手段11とを備
えている。
In this embodiment, for example, the rise detection means 4. measurement number setting means 10 for causing the level detection means 5 and the level comparison means 6 to perform measurements a predetermined number of times;
When the measured output of the level detection means 5 is at zero level,
This level detecting means 5 and a measurement aborting means 11 for aborting the measurement operation of the rise detecting means 4 after a predetermined number of times are provided.

〔作   用〕[For production]

上記機能ブロックの説明と前記動作原理の説明とから明
らかなように、2つの入力電圧v’R3とV’T8につ
いて、立ち上がり検出手段4とレベル検出手段5により
、一方の電圧の立ち上がり時点における他方の電圧のレ
ベルV ’RSヌはv ’Tsを交互に測定し、レベル
比較手段6にて比較すればいずれがHレベルでいずれが
Lレベルであるかが確測定することができも、また、欠
相の場合には立ち上がり検出手段4にて立ち上がりが検
出されないか、又はレベル検出手段5の出力が一様にO
か1になり、あるいはレベル比較手段6の出力が不一致
となるから、これも確実に検出が可能である。
As is clear from the above description of the functional blocks and the above description of the operating principle, the rise detection means 4 and the level detection means 5 detect the two input voltages v'R3 and V'T8 at the time when one voltage rises and the other The voltage level V'RS can be determined by alternately measuring v'Ts and comparing them with the level comparison means 6 to determine which one is the H level and which one is the L level. In the case of an open phase, the rise detection means 4 does not detect the rise, or the output of the level detection means 5 is uniformly O.
or 1, or the output of the level comparison means 6 becomes inconsistent, so this can also be reliably detected.

〔実 施 例〕〔Example〕

この発明の一実施例が示されている第3図を参照すると
、被測定電路R,S、Tの線間電圧VR8及びv−rs
は例えば電路Sを共通にしてそれぞれ2つの減衰器21
a、21bに加えられ、適宜のレベルに調整されたのち
波形整形器22a、22bに入力される。
Referring to FIG. 3 in which an embodiment of the present invention is shown, line voltages VR8 and v-rs of the electrical circuits to be measured R, S, and T are shown.
For example, two attenuators 21 each share the electric circuit S.
a, 21b, and after being adjusted to an appropriate level, it is input to waveform shapers 22a, 22b.

上記第1図(B)の動作原理説明図においてはゼロクロ
スコンパレータにて波形整形を行う場合が例示されてい
るが、この実施例においては雑音等の妨害波を除くため
、例えば基準電圧源23から与えられる所定の基準電圧
をしきい値レベルとするコンパレータが波形整形器とし
て用いられている。この波形整形器22a、22bにて
方形波に変換された電圧v’R,とv’Tsは例えばマ
イクロコンピュータ24に加られ、いずれがHレベルで
いずれがLレベルであるかが検出されたのち、その位相
の進み、遅れにより上記被測定電路R,S、Tの工 順相、逆相が判定され、表示器29に表示されるように
なっている。
In the operating principle explanatory diagram of FIG. 1(B) above, a case is illustrated in which waveform shaping is performed using a zero-cross comparator, but in this embodiment, in order to remove interference waves such as noise, for example, from the reference voltage source 23. A comparator whose threshold level is a given reference voltage is used as a waveform shaper. The voltages v'R and v'Ts converted into square waves by the waveform shapers 22a and 22b are applied to the microcomputer 24, for example, and it is detected which one is the H level and which is the L level. Based on the lead or lag of the phase, the route phase and reverse phase of the electrical circuits to be measured R, S, and T are determined and displayed on the display 29.

このマイクロコンピュータ24には、上記第2図におけ
る立ち上がり検出手段4ないし欠相処理手段8と測定回
数設定手段10及び測定打ち切り手段11等、点線枠で
囲まれたブロック24′内の各機能が備えられている。
This microcomputer 24 is equipped with the respective functions in the block 24' surrounded by the dotted line frame, such as the rise detection means 4 or the phase loss processing means 8, the measurement number setting means 10, and the measurement aborting means 11 in FIG. It is being

ここで、第4を参照しながらその動作を説明する。Here, the operation will be explained with reference to the fourth example.

測定開始に当ってはまず測定の繰り返し回数を例えばワ
ーキングレジスタにセットする。この測定の繰り返しは
誤判定を防止するためのものであって1例えば10回に
設定すると50七の電路の場合には、0.2秒はどで一
連の測定が終了することになる。
At the start of measurement, the number of repetitions of measurement is first set in, for example, a working register. This measurement is repeated to prevent erroneous judgments, and if it is set to 1, for example, 10 times, in the case of 507 electrical circuits, a series of measurements will be completed in about 0.2 seconds.

次に、タイマカウンタを作動させて測定を開始すると、
例えば一方の入力電圧V’R1+の立ち上がりが検出さ
れる。この場合既にレベル1になっていれば、一旦レベ
ルQに戻ってまたレベル1に立ち上がるまで検出が繰り
返され葛。もし、レベル1の状態で変化が無いまま例え
ば0.2秒経過するとタイマカウンタからタイムアウト
の指令が出され、所定のフラグに欠相とセットされて測
定は打ち切られる。上記電圧v′Rsがレベル0のまま
でレベル1に立ち上がらない場合も同様にタイムアウト
になり、欠相として処理される。
Next, activate the timer counter and start measurement.
For example, the rise of one input voltage V'R1+ is detected. In this case, if it is already level 1, the detection will be repeated until it returns to level Q and rises to level 1 again. If, for example, 0.2 seconds elapse without any change in the state of level 1, a timeout command is issued from the timer counter, a predetermined flag is set to indicate an open phase, and the measurement is terminated. If the voltage v'Rs remains at level 0 and does not rise to level 1, a timeout similarly occurs and is treated as an open phase.

電圧v’R,がレベル1に立ち上がると、その時点で例
えば他方の入力電圧V’T8のレベルが検出され、その
値1又は0が所定のフラグにV ’TBとしてセットさ
れる。
When the voltage v'R rises to level 1, for example, the level of the other input voltage V'T8 is detected, and its value 1 or 0 is set in a predetermined flag as V'TB.

次に、上記他方の入力電圧V’、、の立ち上がり時点に
おいて一方の入力電圧V’R8のレベル検出が行われる
。この場合、電圧v’T、がレベル1又はレベルOの状
態のままでその立ち上がりが無ければ同様にタイムアウ
トになり、電圧v’rsは欠相として処理される。電圧
v’T、の立ち上がりがあればその時点で電圧v’Rs
のレベルが検出され、その値1又は0が例えば所定のフ
ラグにv’Rsとしてセットされる。
Next, the level of one input voltage V'R8 is detected at the time of rise of the other input voltage V', . In this case, if the voltage v'T remains at level 1 or level O and does not rise, a timeout similarly occurs and the voltage v'rs is treated as an open phase. If the voltage v'T rises, the voltage v'Rs at that point
The level of is detected, and its value 1 or 0 is set to a predetermined flag, for example, as v'Rs.

次に、上記フラグにセットされた2つのレベルデータv
’R,,v’、、の比較とその相判定が行われる。すな
わち、v ’R,が1でV“’r4も1の場合は異状で
あるから被測定電路には欠相ありとして処理される。デ
ータV“T9が0の場合、1回めの測定であればフラグ
に逆相としてセットされ、残りの回数だけ測定が繰り返
される。複数回測定後であれば前回までのデータと照合
され、そのデータがもし正相となっていたら今回のデー
タとくい違うので異状であり、同様に欠相として処理さ
れる。
Next, the two level data v set in the above flags
A comparison of 'R,,v', and a phase determination thereof are performed. In other words, if v'R, is 1 and V''r4 is also 1, it is an abnormality and is treated as having an open phase in the circuit under test.If the data V'T9 is 0, the first measurement If so, the flag is set as negative phase, and the measurement is repeated the remaining number of times. If it has been measured multiple times, it is compared with the previous data, and if that data is in positive phase, it is different from the current data, which is an abnormality, and is similarly treated as an open phase.

前回までのデータが逆相になっていれば残りの回数の測
定が行われる。
If the data up to the previous time is in reverse phase, the remaining number of measurements are performed.

上記v’Rsのデータが0の場合には、V ’TSのデ
ータが0であれば欠相として処理され、V’TSのデー
タが1であって、かつ、1回めの測定であれば正相とし
てセットし、残りの回数の測定が行われる。複数回測定
後であれば前回までのデータと照合され、不一致があれ
ば同様に欠相として処理され、一致していれば残りの回
数だけ測定が繰り返される。
When the above v'Rs data is 0, if the V'TS data is 0, it is treated as an open phase, and if the V'TS data is 1 and it is the first measurement, it is treated as an open phase. It is set as a positive phase and the remaining number of measurements are taken. If the data has been measured multiple times, it is compared with the previous data, and if there is a mismatch, it is similarly treated as an open phase, and if there is a match, the measurement is repeated the remaining number of times.

〔効   果〕〔effect〕

以」:、詳細に説明したようにこの発明にかかる検相器
は被測定交流電路の2つの線間電圧を例えば減衰器を介
して適宜のレベルに調整したのち波形整形器にて方形波
電圧に変換し、一方の方形波電圧の立ち上がり時点にお
いて他方の方形波電圧のレベルを交互に測定する立ち上
がり検出手段とレベル検出手段とを有し、このレベル検
出手段にて得られた2つの電圧データのいずれがレベル
1でいずれがレベル0であるかによりその位相の進み遅
れを検出するレベル比較手段と、このレベル備えている
As described in detail, the phase checker according to the present invention adjusts the two line voltages of the AC line to be measured to an appropriate level via an attenuator, and then converts the voltage into a square wave voltage using a waveform shaper. and a rise detection means and a level detection means that alternately measure the level of the other square wave voltage at the time of rise of one square wave voltage, and two voltage data obtained by the level detection means. The level comparison means detects the lead or lag of the phase depending on which one is level 1 and which is level 0, and this level is provided.

また、上記立ち上がり検出手段にて方形波電圧の立ち上
がりが検出されない場合と、上記レベル比較手段におけ
る2つの比較データが共に1又は0の場合に、所定時間
経過すると測定を打ち切る測定打ち切り手段を有し、更
に、上記正相逆相判別手段において前回までの測定デー
タに対して今回の測定データが不一致の場合、上記測定
打ち切りの場合とともにそれぞれ欠相と判定する欠相処
理手段とを備えている。
Further, the measurement aborting means aborts the measurement after a predetermined time has elapsed when the rising edge of the square wave voltage is not detected by the rising edge detecting means and when the two comparison data in the level comparing means are both 1 or 0. Furthermore, if the current measurement data does not match the measurement data up to the previous time in the normal phase/inverse phase discrimination means, it is further provided with an open phase processing means that determines that there is an open phase as well as when the measurement is discontinued.

したがって、上記各手段を例えばマイクロコン己 ピユータに置き換えると、被測定3相電路の順相、逆相
又は欠相を高速、かつ、高精度で測定する検相器を提供
することができる。また、他のディジタル甜定器に組み
込んでその有するマイクロコンピュータを共用とすれば
、検相器を備えた比較的低価格で多機能の現場用計測器
を実現することが可能である。
Therefore, by replacing each of the above-mentioned means with a microcomputer, for example, it is possible to provide a phase detector that measures the normal phase, negative phase, or open phase of the three-phase electric circuit to be measured at high speed and with high accuracy. Moreover, if it is incorporated into another digital measuring device and its microcomputer is shared, it is possible to realize a relatively low-cost, multi-functional on-site measuring device equipped with a phase detector.

【図面の簡単な説明】[Brief explanation of the drawing]

添付図面はいずれもこの発明による検相器の実施例に係
り、第1図(A)及び第1図(B)は動作原理説明図、
第2図は機能構成の一例を示すブロック線図、第3図は
装置構成の一例を示すブロック線図、第4図はこの装置
の動作をプログラム制御する場合の一例を示す流れ線図
である。 図中、2は波形整形手段、4は立ち上がり検出手段、5
はレベル検出手段、6はレベル比較手段、7は正相逆相
判別手段、8は欠相処理手段、10は測定回数設定手段
、22a、22bは波形整形器、24はマイクロコンピ
ュータ、R,S、Tは被測定3相電路、V R8* V
 79は線間電圧、V ’ R8+ V ’ TSは方
形波電圧、V’Rjl V’7gはレベル検出データで
ある・ 特許出願人   日置電機株式会社 代理人 弁理士   大 原  拓 也第1図(A) ys 第1図(B)
The attached drawings all relate to embodiments of the phase detector according to the present invention, and FIG. 1(A) and FIG. 1(B) are diagrams illustrating the operating principle;
FIG. 2 is a block diagram showing an example of the functional configuration, FIG. 3 is a block diagram showing an example of the device configuration, and FIG. 4 is a flow diagram showing an example of program control of the operation of this device. . In the figure, 2 is a waveform shaping means, 4 is a rise detection means, and 5 is a waveform shaping means.
1 is a level detection means, 6 is a level comparison means, 7 is a positive/negative phase discrimination means, 8 is an open phase processing means, 10 is a measurement number setting means, 22a, 22b are waveform shapers, 24 is a microcomputer, R, S , T is the three-phase electric circuit to be measured, V R8* V
79 is the line voltage, V'R8+V'TS is the square wave voltage, and V'Rjl V'7g is the level detection data. Patent applicant Takuya Ohara, agent of Hioki Electric Co., Ltd., patent attorney Figure 1 (A) ) ys Figure 1 (B)

Claims (1)

【特許請求の範囲】 被測定3相電路の2つの線間電圧をそれぞれ方形波電圧
に変換し、立ち上がり検出手段を介して一方の方形波電
圧の立ち上がりを検出するとともにその検出時点で他方
の方形波電圧のレベルを交互に所定回数測定するレベル
検出手段と、 該レベル検出手段から送出される上記一方の方形波電圧
のレベル値と他方の方形電圧のレベル値とを比較して上
記2つの方形波電圧の位相の進み遅れを検出するレベル
比較手段と、 該レベル比較手段からの検出出力により上記被測定3相
電路の相順を判定する正相逆相判別手段と、 上記立ち上がり検出手段、レベル検出手段、レベル比較
手段の各出力もしくは正相逆相判別手段の判別データに
より上記被測定3相電路の欠相を判定する欠相処理手段
とを備えていることを特徴とする検相器。
[Claims] The two line voltages of the three-phase electric circuit to be measured are each converted into square wave voltages, and the rising edge of one square wave voltage is detected via a rising edge detection means, and at the time of detection, the rising edge of the other square wave voltage is detected. level detecting means for alternately measuring the level of the wave voltage a predetermined number of times; and comparing the level value of one of the square wave voltages and the level value of the other square wave voltage sent from the level detecting means to determine the level of the two square wave voltages. level comparison means for detecting phase lead/lag of the wave voltage; positive/negative phase discrimination means for determining the phase order of the three-phase electric circuit to be measured based on the detection output from the level comparison means; the rise detection means; A phase detector comprising an open phase processing means for determining an open phase in the three-phase electric circuit to be measured based on the outputs of the detecting means and the level comparing means or the discrimination data of the positive/negative phase discriminating means.
JP6070387A 1987-03-16 1987-03-16 Phase detector Pending JPS63225173A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6070387A JPS63225173A (en) 1987-03-16 1987-03-16 Phase detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6070387A JPS63225173A (en) 1987-03-16 1987-03-16 Phase detector

Publications (1)

Publication Number Publication Date
JPS63225173A true JPS63225173A (en) 1988-09-20

Family

ID=13149913

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6070387A Pending JPS63225173A (en) 1987-03-16 1987-03-16 Phase detector

Country Status (1)

Country Link
JP (1) JPS63225173A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005003626A (en) * 2003-06-16 2005-01-06 Matsushita Electric Ind Co Ltd Connection status judging method of three-phase power source and device therefor
JP2006258722A (en) * 2005-03-18 2006-09-28 Chudenko Corp Voltage/phase rotation checker and clip for detector
JP2010252582A (en) * 2009-04-17 2010-11-04 Daikin Ind Ltd Open phase detector
JP2014066566A (en) * 2012-09-25 2014-04-17 Fuji Electric Co Ltd Open-phase detection device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5414780A (en) * 1977-07-05 1979-02-03 Toshiba Corp Missing phase detector
JPS56162928A (en) * 1980-05-20 1981-12-15 Hitachi Seiko Kk Phase detection control system for polyphase power source
JPS5726766A (en) * 1980-06-10 1982-02-12 Westinghouse Electric Corp Digital phase forward detector

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5414780A (en) * 1977-07-05 1979-02-03 Toshiba Corp Missing phase detector
JPS56162928A (en) * 1980-05-20 1981-12-15 Hitachi Seiko Kk Phase detection control system for polyphase power source
JPS5726766A (en) * 1980-06-10 1982-02-12 Westinghouse Electric Corp Digital phase forward detector

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005003626A (en) * 2003-06-16 2005-01-06 Matsushita Electric Ind Co Ltd Connection status judging method of three-phase power source and device therefor
JP2006258722A (en) * 2005-03-18 2006-09-28 Chudenko Corp Voltage/phase rotation checker and clip for detector
JP2010252582A (en) * 2009-04-17 2010-11-04 Daikin Ind Ltd Open phase detector
JP2014066566A (en) * 2012-09-25 2014-04-17 Fuji Electric Co Ltd Open-phase detection device

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