JPH0510993A - Phase difference measurement device - Google Patents

Phase difference measurement device

Info

Publication number
JPH0510993A
JPH0510993A JP16675891A JP16675891A JPH0510993A JP H0510993 A JPH0510993 A JP H0510993A JP 16675891 A JP16675891 A JP 16675891A JP 16675891 A JP16675891 A JP 16675891A JP H0510993 A JPH0510993 A JP H0510993A
Authority
JP
Japan
Prior art keywords
phase difference
circuit
outputs
output
lag
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16675891A
Other languages
Japanese (ja)
Other versions
JP3052441B2 (en
Inventor
Hideki Yoshitake
秀樹 吉武
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP3166758A priority Critical patent/JP3052441B2/en
Publication of JPH0510993A publication Critical patent/JPH0510993A/en
Application granted granted Critical
Publication of JP3052441B2 publication Critical patent/JP3052441B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Measuring Phase Differences (AREA)
  • Manipulation Of Pulses (AREA)

Abstract

PURPOSE:To obtain a phase difference measurement device which has no restric tion of measuring range and takes one period of measured signal for the response speed. CONSTITUTION:Measured signals A1 and A2 are converted with wave rectifiers 1 and 2 to square waves V1 and V2 and a pulse V3 corresponding to the phase difference is formed by taking an exclusive logical sum. V3 is counted with standard clock pulse (counter 6) and obtains a digital value for the phase difference. A lead/lag decision unit 9 expresses the lead/lag of the phase with a mark and a signal processor 7 outputs the count value and the mark of the lead/lag of the phase as the phase difference measurement value.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は位相差計測装置に関する
ものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a phase difference measuring device.

【0002】[0002]

【従来の技術】従来の位相差計測装置の構成を図3に示
し、その測定原理を図3および図4に基づいて説明す
る。位相差の異なる2入力A1,A2を波形整形器1
0,11で矩形波V1,V2に変換し、排他的論理和回
路13で位相のずれの部分V3を検出する。遅延回路1
2にてV1の遅延波形V4を生成する。またV1,V2
を入力としV1に対してV2が進んでいる時H(レベル
がハイのこと、以下同様)を、遅れている時L(レベル
がロウのこと、以下同様)を出力する進み遅れ判別回路
14を設ける。前記排他的論理和回路13,遅延回路1
2,進み遅れ判別回路14の出力を入力とする論理回路
15から20により、A1よりA2が進んでいる場合は
V5に位相差分の出力パルスを出力しV6にLを出力す
る。逆にA2よりA1が進んでいる場合はV6に位相差
分の出力パルスを出力しV5にLを出力する。V5,V
6をそれぞれ積分回路21,22にて積分し、A/D変
換器23にてデジタル信号に変換し、信号処理部24に
て位相差を演算にて求める。
2. Description of the Related Art The structure of a conventional phase difference measuring apparatus is shown in FIG. 3, and its measuring principle will be described with reference to FIGS. Waveform shaper 1 with two inputs A1 and A2 having different phase differences
At 0 and 11, it is converted into rectangular waves V1 and V2, and the exclusive OR circuit 13 detects the phase shift portion V3. Delay circuit 1
At 2, the delay waveform V4 of V1 is generated. Also V1, V2
Is input, and when V2 is ahead of V1, H (the level is high, the same below) is output, and when it is delayed, L (the level is low, the same below) is output. Set up. Exclusive OR circuit 13, delay circuit 1
2. When A2 is ahead of A1 by the logic circuits 15 to 20 which receive the output of the lead / lag determination circuit 14, an output pulse of the phase difference is output to V5 and L is output to V6. Conversely, when A1 is ahead of A2, an output pulse of the phase difference is output to V6 and L is output to V5. V5, V
6 are integrated by the integrating circuits 21 and 22, respectively, converted into digital signals by the A / D converter 23, and the phase difference is calculated by the signal processing unit 24.

【0003】なお、図4は図3における各部の入力電
圧,出力電圧の各波形を示している。
Incidentally, FIG. 4 shows respective waveforms of the input voltage and the output voltage of each part in FIG.

【0004】[0004]

【発明が解決しようとする課題】従来の位相差計測装置
では、位相差のパルス信号を生成するのに遅延回路を設
けていたので、計測値に上限があった。さらに、積分回
路というアナログ回路を使用していたので応答が遅く、
また調整も必要であった。
In the conventional phase difference measuring device, since the delay circuit is provided for generating the pulse signal of the phase difference, the measured value has an upper limit. Furthermore, since an analog circuit called an integration circuit was used, the response was slow,
Adjustment was also necessary.

【0005】本発明は計測範囲の制限をなくし、応答速
度も被測定信号の1周期とし、また回路の無調整化を実
現した位相差計測装置を提供することを目的としてい
る。
An object of the present invention is to provide a phase difference measuring device which eliminates the limitation of the measuring range, sets the response speed to one period of the signal under measurement, and realizes no adjustment of the circuit.

【0006】[0006]

【課題を解決するための手段】上記目的を達成するため
に本発明の位相差計測装置は、第1および第2の交流入
力を矩形波V1およびV2に変換する第1および第2の
波形整形器と、このV1とV2を入力とする排他的論理
和回路と、この排他的論理和回路の出力とV1を入力と
してV1とV2の位相差V3を出力する第1の論理積回
路と、基準クロックパルス発生器と、基準クロックパル
スとV3を入力として位相差V3の期間に含まれる基準
クロックパルスを出力する第2の論理積回路と、この出
力された基準クロックパルスをカウントするカウンタ
と、このカウンタを1周期ごとにリセットする手段と、
V1とV2を入力とし両者の進み遅れの関係を符号で出
力する進み遅れ判別器とを備え、上記カウンタのカウン
ト値および進み遅れ判別器の出力を第1および第2の交
流入力の位相差計測値として出力している。
In order to achieve the above object, the phase difference measuring apparatus of the present invention comprises first and second waveform shaping for converting first and second AC inputs into rectangular waves V1 and V2. And an exclusive OR circuit that receives V1 and V2 as inputs, a first AND circuit that outputs the output of this exclusive OR circuit and V1 as a phase difference V3 between V1 and V2, and a reference A clock pulse generator, a second AND circuit that inputs the reference clock pulse and V3 and outputs the reference clock pulse included in the period of the phase difference V3, a counter that counts the output reference clock pulse, Means for resetting the counter every cycle,
A lead / lag discriminator which receives V1 and V2 as inputs and outputs a lead / lag relation between the two with a sign, and measures the count value of the counter and the output of the lead / lag discriminator between the first and second AC inputs. It is output as a value.

【0007】[0007]

【作用】本発明は上記した構成で、位相差の計測範囲を
−180°から+180°まで全範囲測定可能とし、応
答速度も被測定信号の1周期とし、また回路のデジタル
化により無調整化を実現した。
According to the present invention, with the above-described structure, the measurement range of the phase difference can be measured over the entire range from -180 ° to + 180 °, the response speed is set to one period of the signal under measurement, and no adjustment is required by digitizing the circuit. Was realized.

【0008】[0008]

【実施例】以下、本発明の実施例を図1および図2に沿
って詳細に説明する。二つの被測定信号第1および第2
の交流入力A1,A2をそれぞれ第1および第2の波形
整形器1,2に入力する。波形整形器1,2は入力信号
が正の時Hを、負の時Lを出力するもので、被測定信号
A1,A2はそれぞれ矩形波V1,V2に変換される。
このような波形整形器1,2は例えば0Vを基準電圧と
するコンパレータにて構成される。排他的論理和回路3
と第1の論理積回路4でV1,V2よりA1,A2の位
相差に相当する位相差パルスV3を生成する。基準クロ
ックパルス発生器8からの基準クロックパルスCKと位
相差パルスV3を第2の論理積回路5に入力しその出力
V4をカウンタ6に入力して位相差V3をV3中に含ま
れたクロックパルスをカウントしたデジタル値に変換す
る。カウンタ6によるクロックパルスのカウントはV1
の立ち下がりで終了するので、信号処理部7ではV1の
立ち下がり後、カウンタ6のカウント値を取り込み、あ
る比例定数を掛けて位相差を算出し位相計測値として出
力する。その後次のカウント開始前にカウンタ6をリセ
ットする。この信号処理部7の構成の一例としてはハー
ドウェアをマイクロコンピュータにて構成し上記処理を
ソフトウェアによって行うようにしてもよい。
Embodiments of the present invention will be described below in detail with reference to FIGS. 1 and 2. Two signals under test, first and second
AC inputs A1 and A2 are input to the first and second waveform shapers 1 and 2, respectively. The waveform shapers 1 and 2 output H when the input signal is positive and output L when the input signal is negative, and the signals under test A1 and A2 are converted into rectangular waves V1 and V2, respectively.
Such waveform shapers 1 and 2 are composed of comparators having a reference voltage of 0V, for example. Exclusive OR circuit 3
Then, the first AND circuit 4 generates a phase difference pulse V3 corresponding to the phase difference between A1 and A2 from V1 and V2. The reference clock pulse CK from the reference clock pulse generator 8 and the phase difference pulse V3 are input to the second AND circuit 5, the output V4 thereof is input to the counter 6, and the phase difference V3 is included in V3. Is converted to a counted digital value. The count of the clock pulse by the counter 6 is V1
Since the signal processing unit 7 ends at the trailing edge of V1, the signal processing unit 7 fetches the count value of the counter 6 after the trailing edge of V1, calculates a phase difference by multiplying it by a certain proportional constant, and outputs it as a phase measurement value. After that, the counter 6 is reset before the next counting is started. As an example of the configuration of the signal processing unit 7, the hardware may be configured by a microcomputer and the above processing may be performed by software.

【0009】位相の進み遅れについてはV1よりV2が
進んでいる時はH、逆の時はLを出力する進み遅れ判別
器9の出力信号により信号処理部7で判断し、位相差に
正負符号を付加して出力する。ここではV1をCK入
力、V2をD入力とし、V1の立ち上がり時にV2がH
であればH、LであればLを出力するDフリップフロッ
プにて構成した例を示す。なお、被測定信号の位相差の
変動や被測定信号のノイズ等により測定値が安定しない
場合は毎回の位相差の平均値を求めて位相計測値として
もよい。なお、図2は図1における各部の入力電圧,出
力電圧の波形図である。
Regarding the phase lead / lag, the signal processing unit 7 judges by the output signal of the lead / lag discriminator 9 which outputs H when V2 is ahead of V1 and outputs L when V2 is ahead of V1. Is added and output. Here, V1 is CK input, V2 is D input, and V2 is H when V1 rises.
If it is H, and if it is L, an example of a D flip-flop that outputs L will be shown. If the measured value is not stable due to fluctuations in the phase difference of the signal under measurement, noise in the signal under measurement, etc., the average value of the phase difference for each time may be obtained and used as the phase measurement value. 2 is a waveform diagram of the input voltage and the output voltage of each part in FIG.

【0010】[0010]

【発明の効果】以上の説明で明らかなように本発明によ
れば、−180°から+180°までフルレンジ測定が
可能で、応答速度も被測定信号の1周期で、また回路の
デジタル化により調整不要な位相差計測装置を実現でき
る。
As is apparent from the above description, according to the present invention, full range measurement from -180 ° to + 180 ° is possible, and the response speed is adjusted by one cycle of the signal under measurement and by digitizing the circuit. An unnecessary phase difference measuring device can be realized.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例における位相差計測装置のブロ
ック回路図
FIG. 1 is a block circuit diagram of a phase difference measuring device according to an embodiment of the present invention.

【図2】同位相差計測装置における各部の電圧波形図FIG. 2 is a voltage waveform diagram of each part in the same phase difference measuring device.

【図3】従来の位相差計測装置のブロック回路図FIG. 3 is a block circuit diagram of a conventional phase difference measuring device.

【図4】同位相差計測装置における各部の電圧波形図FIG. 4 is a voltage waveform diagram of each part in the same phase difference measuring device.

【符号の説明】[Explanation of symbols]

1 第1の波形整形器 2 第2の波形整形器 3 排他的論理和回路 4 第1の論理積回路 5 第2の論理積回路 6 カウンタ 7 信号処理部(カウンタをリセットする手段) 8 基準クロックパルス発生器 9 進み遅れ判別器 A1 第1の交流入力 A2 第2の交流入力 DESCRIPTION OF SYMBOLS 1 1st waveform shaper 2 2nd waveform shaper 3 Exclusive-OR circuit 4 1st AND circuit 5 2nd AND circuit 6 Counter 7 Signal processing part (means for resetting counter) 8 Reference clock Pulse generator 9 Lead / lag discriminator A1 First AC input A2 Second AC input

Claims (1)

【特許請求の範囲】 【請求項1】第1および第2の交流入力を矩形波V1お
よびV2に変換する第1および第2の波形整形器と、こ
のV1とV2を入力とする排他的論理和回路と、この排
他的論理和回路の出力とV1を入力としてV1とV2の
位相差V3を出力する第1の論理積回路と、基準クロッ
クパルス発生器と、基準クロックパルスとV3を入力と
して位相差V3の期間に含まれる基準クロックパルスを
出力する第2の論理積回路と、この出力された基準クロ
ックパルスをカウントするカウンタと、このカウンタを
1周期ごとにリセットする手段と、V1とV2を入力と
し両者の進み遅れの関係を符号で出力する進み遅れ判別
器とを備え、上記カウンタのカウント値および進み遅れ
判別器の出力を第1および第2の交流入力の位相差計測
値として出力する位相差計測装置。
Claims: What is claimed is: 1. First and second waveform shapers for converting first and second alternating current inputs into rectangular waves V1 and V2, and exclusive logic having these V1 and V2 as inputs. An OR circuit, a first AND circuit that outputs the phase difference V3 between V1 and V2 by using the output of this exclusive OR circuit and V1 as an input, a reference clock pulse generator, and a reference clock pulse and V3 as inputs. A second AND circuit that outputs the reference clock pulse included in the period of the phase difference V3, a counter that counts the output reference clock pulse, a means that resets this counter every one cycle, and V1 and V2. And a lead / lag discriminator which outputs the relationship between the leading and trailing sides of the two with a sign, and outputs the count value of the counter and the output of the leading / lag discriminator to the phase difference meter of the first and second AC inputs. Phase difference measuring device that outputs as measured value.
JP3166758A 1991-07-08 1991-07-08 Phase difference measuring device Expired - Fee Related JP3052441B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3166758A JP3052441B2 (en) 1991-07-08 1991-07-08 Phase difference measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3166758A JP3052441B2 (en) 1991-07-08 1991-07-08 Phase difference measuring device

Publications (2)

Publication Number Publication Date
JPH0510993A true JPH0510993A (en) 1993-01-19
JP3052441B2 JP3052441B2 (en) 2000-06-12

Family

ID=15837180

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3166758A Expired - Fee Related JP3052441B2 (en) 1991-07-08 1991-07-08 Phase difference measuring device

Country Status (1)

Country Link
JP (1) JP3052441B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008281498A (en) * 2007-05-14 2008-11-20 Oki Electric Ind Co Ltd Phase difference measuring circuit
JP2009282047A (en) * 2009-09-01 2009-12-03 Mitsubishi Electric Corp Phase difference detection circuit and inclination angle measurement device
JP2016534698A (en) * 2013-08-14 2016-11-04 ワイトリシティ コーポレーションWitricity Corporation Impedance tuning

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5163665A (en) * 1974-11-30 1976-06-02 Matsushita Electric Ind Co Ltd
JPS646702A (en) * 1987-06-29 1989-01-11 Brother Ind Ltd Pinhole detector for magnetic disc

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5163665A (en) * 1974-11-30 1976-06-02 Matsushita Electric Ind Co Ltd
JPS646702A (en) * 1987-06-29 1989-01-11 Brother Ind Ltd Pinhole detector for magnetic disc

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008281498A (en) * 2007-05-14 2008-11-20 Oki Electric Ind Co Ltd Phase difference measuring circuit
JP2009282047A (en) * 2009-09-01 2009-12-03 Mitsubishi Electric Corp Phase difference detection circuit and inclination angle measurement device
JP2016534698A (en) * 2013-08-14 2016-11-04 ワイトリシティ コーポレーションWitricity Corporation Impedance tuning
US11112814B2 (en) 2013-08-14 2021-09-07 Witricity Corporation Impedance adjustment in wireless power transmission systems and methods
US11720133B2 (en) 2013-08-14 2023-08-08 Witricity Corporation Impedance adjustment in wireless power transmission systems and methods

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