JPS63193452A - 二次イオン質量分析計 - Google Patents

二次イオン質量分析計

Info

Publication number
JPS63193452A
JPS63193452A JP62025832A JP2583287A JPS63193452A JP S63193452 A JPS63193452 A JP S63193452A JP 62025832 A JP62025832 A JP 62025832A JP 2583287 A JP2583287 A JP 2583287A JP S63193452 A JPS63193452 A JP S63193452A
Authority
JP
Japan
Prior art keywords
ions
counting
secondary ion
mesh
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62025832A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0587935B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Yasubumi Kameshima
亀島 泰文
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62025832A priority Critical patent/JPS63193452A/ja
Publication of JPS63193452A publication Critical patent/JPS63193452A/ja
Publication of JPH0587935B2 publication Critical patent/JPH0587935B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP62025832A 1987-02-05 1987-02-05 二次イオン質量分析計 Granted JPS63193452A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62025832A JPS63193452A (ja) 1987-02-05 1987-02-05 二次イオン質量分析計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62025832A JPS63193452A (ja) 1987-02-05 1987-02-05 二次イオン質量分析計

Publications (2)

Publication Number Publication Date
JPS63193452A true JPS63193452A (ja) 1988-08-10
JPH0587935B2 JPH0587935B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1993-12-20

Family

ID=12176832

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62025832A Granted JPS63193452A (ja) 1987-02-05 1987-02-05 二次イオン質量分析計

Country Status (1)

Country Link
JP (1) JPS63193452A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003509812A (ja) * 1999-09-03 2003-03-11 サーモ マスラボ リミテッド 高ダイナミックレンジ質量分析計

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003509812A (ja) * 1999-09-03 2003-03-11 サーモ マスラボ リミテッド 高ダイナミックレンジ質量分析計
JP4869526B2 (ja) * 1999-09-03 2012-02-08 サーモ フィニガン リミテッド ライアビリティ カンパニー 高ダイナミックレンジ質量分析計

Also Published As

Publication number Publication date
JPH0587935B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1993-12-20

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