JPS63193372U - - Google Patents
Info
- Publication number
- JPS63193372U JPS63193372U JP8509387U JP8509387U JPS63193372U JP S63193372 U JPS63193372 U JP S63193372U JP 8509387 U JP8509387 U JP 8509387U JP 8509387 U JP8509387 U JP 8509387U JP S63193372 U JPS63193372 U JP S63193372U
- Authority
- JP
- Japan
- Prior art keywords
- clamp
- circuit pattern
- semiconductor device
- electrode
- main body
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000010355 oscillation Effects 0.000 claims description 4
- 239000004065 semiconductor Substances 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987085093U JPH074610Y2 (ja) | 1987-05-30 | 1987-05-30 | 半導体素子発振特性測定治具 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987085093U JPH074610Y2 (ja) | 1987-05-30 | 1987-05-30 | 半導体素子発振特性測定治具 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63193372U true JPS63193372U (enExample) | 1988-12-13 |
| JPH074610Y2 JPH074610Y2 (ja) | 1995-02-01 |
Family
ID=30940184
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987085093U Expired - Lifetime JPH074610Y2 (ja) | 1987-05-30 | 1987-05-30 | 半導体素子発振特性測定治具 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH074610Y2 (enExample) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6142481U (ja) * | 1984-08-21 | 1986-03-19 | 三菱電機株式会社 | 半導体装置の試験装置 |
-
1987
- 1987-05-30 JP JP1987085093U patent/JPH074610Y2/ja not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6142481U (ja) * | 1984-08-21 | 1986-03-19 | 三菱電機株式会社 | 半導体装置の試験装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH074610Y2 (ja) | 1995-02-01 |