JPS6319280U - - Google Patents
Info
- Publication number
- JPS6319280U JPS6319280U JP11227486U JP11227486U JPS6319280U JP S6319280 U JPS6319280 U JP S6319280U JP 11227486 U JP11227486 U JP 11227486U JP 11227486 U JP11227486 U JP 11227486U JP S6319280 U JPS6319280 U JP S6319280U
- Authority
- JP
- Japan
- Prior art keywords
- resistor
- measuring
- current
- steady
- subtraction circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000284 extract Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
Landscapes
- Measurement Of Current Or Voltage (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11227486U JPH0611510Y2 (ja) | 1986-07-21 | 1986-07-21 | 電圧印加電流測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11227486U JPH0611510Y2 (ja) | 1986-07-21 | 1986-07-21 | 電圧印加電流測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6319280U true JPS6319280U (US06373033-20020416-M00002.png) | 1988-02-08 |
| JPH0611510Y2 JPH0611510Y2 (ja) | 1994-03-23 |
Family
ID=30992993
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11227486U Expired - Lifetime JPH0611510Y2 (ja) | 1986-07-21 | 1986-07-21 | 電圧印加電流測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0611510Y2 (US06373033-20020416-M00002.png) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1999028756A1 (fr) * | 1997-12-02 | 1999-06-10 | Advantest Corporation | Procede permettant de mesurer une intensite en appliquant une tension, et dispositif a cet effet |
| JP2008026015A (ja) * | 2006-07-18 | 2008-02-07 | Young Tek Electronics Corp | 集積回路のスタティックパラメータの測定装置 |
| JP2009115506A (ja) * | 2007-11-02 | 2009-05-28 | Yokogawa Electric Corp | 直流試験装置及び半導体試験装置 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2338311B (en) * | 1997-11-20 | 2002-04-17 | Advantest Corp | IC testing apparatus |
-
1986
- 1986-07-21 JP JP11227486U patent/JPH0611510Y2/ja not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1999028756A1 (fr) * | 1997-12-02 | 1999-06-10 | Advantest Corporation | Procede permettant de mesurer une intensite en appliquant une tension, et dispositif a cet effet |
| JP2008026015A (ja) * | 2006-07-18 | 2008-02-07 | Young Tek Electronics Corp | 集積回路のスタティックパラメータの測定装置 |
| JP2009115506A (ja) * | 2007-11-02 | 2009-05-28 | Yokogawa Electric Corp | 直流試験装置及び半導体試験装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0611510Y2 (ja) | 1994-03-23 |
