JPS63192246U - - Google Patents
Info
- Publication number
- JPS63192246U JPS63192246U JP1987082318U JP8231887U JPS63192246U JP S63192246 U JPS63192246 U JP S63192246U JP 1987082318 U JP1987082318 U JP 1987082318U JP 8231887 U JP8231887 U JP 8231887U JP S63192246 U JPS63192246 U JP S63192246U
- Authority
- JP
- Japan
- Prior art keywords
- container
- slit
- view
- shaped outline
- outer slit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 239000000725 suspension Substances 0.000 claims 1
- 210000000988 bone and bone Anatomy 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
- B65D23/00—Details of bottles or jars not otherwise provided for
- B65D23/003—Suspension means
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Details Of Rigid Or Semi-Rigid Containers (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987082318U JPH0414360Y2 (enExample) | 1987-05-29 | 1987-05-29 | |
| KR2019880007683U KR930005420Y1 (ko) | 1987-05-29 | 1988-05-25 | 용기의 2단식 매다는 기구 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987082318U JPH0414360Y2 (enExample) | 1987-05-29 | 1987-05-29 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63192246U true JPS63192246U (enExample) | 1988-12-12 |
| JPH0414360Y2 JPH0414360Y2 (enExample) | 1992-03-31 |
Family
ID=30934863
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987082318U Expired JPH0414360Y2 (enExample) | 1987-05-29 | 1987-05-29 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPH0414360Y2 (enExample) |
| KR (1) | KR930005420Y1 (enExample) |
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04111346U (ja) * | 1991-03-12 | 1992-09-28 | 石塚硝子株式会社 | 輸液ボトル用吊具 |
| US7403028B2 (en) | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
| US7417446B2 (en) | 2002-11-13 | 2008-08-26 | Cascade Microtech, Inc. | Probe for combined signals |
| US7420381B2 (en) | 2004-09-13 | 2008-09-02 | Cascade Microtech, Inc. | Double sided probing structures |
| US7427868B2 (en) | 2003-12-24 | 2008-09-23 | Cascade Microtech, Inc. | Active wafer probe |
| US7436194B2 (en) | 2002-05-23 | 2008-10-14 | Cascade Microtech, Inc. | Shielded probe with low contact resistance for testing a device under test |
| US7443186B2 (en) | 2006-06-12 | 2008-10-28 | Cascade Microtech, Inc. | On-wafer test structures for differential signals |
| US7449899B2 (en) | 2005-06-08 | 2008-11-11 | Cascade Microtech, Inc. | Probe for high frequency signals |
| US7456646B2 (en) | 2000-12-04 | 2008-11-25 | Cascade Microtech, Inc. | Wafer probe |
| US7498829B2 (en) | 2003-05-23 | 2009-03-03 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7504842B2 (en) | 1997-05-28 | 2009-03-17 | Cascade Microtech, Inc. | Probe holder for testing of a test device |
| US7609077B2 (en) | 2006-06-09 | 2009-10-27 | Cascade Microtech, Inc. | Differential signal probe with integral balun |
| US7619419B2 (en) | 2005-06-13 | 2009-11-17 | Cascade Microtech, Inc. | Wideband active-passive differential signal probe |
-
1987
- 1987-05-29 JP JP1987082318U patent/JPH0414360Y2/ja not_active Expired
-
1988
- 1988-05-25 KR KR2019880007683U patent/KR930005420Y1/ko not_active Expired - Fee Related
Cited By (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04111346U (ja) * | 1991-03-12 | 1992-09-28 | 石塚硝子株式会社 | 輸液ボトル用吊具 |
| US7504842B2 (en) | 1997-05-28 | 2009-03-17 | Cascade Microtech, Inc. | Probe holder for testing of a test device |
| US7495461B2 (en) | 2000-12-04 | 2009-02-24 | Cascade Microtech, Inc. | Wafer probe |
| US7456646B2 (en) | 2000-12-04 | 2008-11-25 | Cascade Microtech, Inc. | Wafer probe |
| US7436194B2 (en) | 2002-05-23 | 2008-10-14 | Cascade Microtech, Inc. | Shielded probe with low contact resistance for testing a device under test |
| US7482823B2 (en) | 2002-05-23 | 2009-01-27 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7518387B2 (en) | 2002-05-23 | 2009-04-14 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7489149B2 (en) | 2002-05-23 | 2009-02-10 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7453276B2 (en) | 2002-11-13 | 2008-11-18 | Cascade Microtech, Inc. | Probe for combined signals |
| US7417446B2 (en) | 2002-11-13 | 2008-08-26 | Cascade Microtech, Inc. | Probe for combined signals |
| US7498829B2 (en) | 2003-05-23 | 2009-03-03 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7501842B2 (en) | 2003-05-23 | 2009-03-10 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7427868B2 (en) | 2003-12-24 | 2008-09-23 | Cascade Microtech, Inc. | Active wafer probe |
| US7420381B2 (en) | 2004-09-13 | 2008-09-02 | Cascade Microtech, Inc. | Double sided probing structures |
| US8013623B2 (en) | 2004-09-13 | 2011-09-06 | Cascade Microtech, Inc. | Double sided probing structures |
| US7449899B2 (en) | 2005-06-08 | 2008-11-11 | Cascade Microtech, Inc. | Probe for high frequency signals |
| US7619419B2 (en) | 2005-06-13 | 2009-11-17 | Cascade Microtech, Inc. | Wideband active-passive differential signal probe |
| US7609077B2 (en) | 2006-06-09 | 2009-10-27 | Cascade Microtech, Inc. | Differential signal probe with integral balun |
| US7403028B2 (en) | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
| US7443186B2 (en) | 2006-06-12 | 2008-10-28 | Cascade Microtech, Inc. | On-wafer test structures for differential signals |
Also Published As
| Publication number | Publication date |
|---|---|
| KR930005420Y1 (ko) | 1993-08-16 |
| KR880021769U (ko) | 1988-12-24 |
| JPH0414360Y2 (enExample) | 1992-03-31 |