JPS63192246U - - Google Patents

Info

Publication number
JPS63192246U
JPS63192246U JP1987082318U JP8231887U JPS63192246U JP S63192246 U JPS63192246 U JP S63192246U JP 1987082318 U JP1987082318 U JP 1987082318U JP 8231887 U JP8231887 U JP 8231887U JP S63192246 U JPS63192246 U JP S63192246U
Authority
JP
Japan
Prior art keywords
container
slit
view
shaped outline
outer slit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1987082318U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0414360Y2 (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987082318U priority Critical patent/JPH0414360Y2/ja
Priority to KR2019880007683U priority patent/KR930005420Y1/ko
Publication of JPS63192246U publication Critical patent/JPS63192246U/ja
Application granted granted Critical
Publication of JPH0414360Y2 publication Critical patent/JPH0414360Y2/ja
Expired legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
    • B65D23/00—Details of bottles or jars not otherwise provided for
    • B65D23/003—Suspension means

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Details Of Rigid Or Semi-Rigid Containers (AREA)
JP1987082318U 1987-05-29 1987-05-29 Expired JPH0414360Y2 (enrdf_load_stackoverflow)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1987082318U JPH0414360Y2 (enrdf_load_stackoverflow) 1987-05-29 1987-05-29
KR2019880007683U KR930005420Y1 (ko) 1987-05-29 1988-05-25 용기의 2단식 매다는 기구

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987082318U JPH0414360Y2 (enrdf_load_stackoverflow) 1987-05-29 1987-05-29

Publications (2)

Publication Number Publication Date
JPS63192246U true JPS63192246U (enrdf_load_stackoverflow) 1988-12-12
JPH0414360Y2 JPH0414360Y2 (enrdf_load_stackoverflow) 1992-03-31

Family

ID=30934863

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987082318U Expired JPH0414360Y2 (enrdf_load_stackoverflow) 1987-05-29 1987-05-29

Country Status (2)

Country Link
JP (1) JPH0414360Y2 (enrdf_load_stackoverflow)
KR (1) KR930005420Y1 (enrdf_load_stackoverflow)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04111346U (ja) * 1991-03-12 1992-09-28 石塚硝子株式会社 輸液ボトル用吊具
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7417446B2 (en) 2002-11-13 2008-08-26 Cascade Microtech, Inc. Probe for combined signals
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US7427868B2 (en) 2003-12-24 2008-09-23 Cascade Microtech, Inc. Active wafer probe
US7436194B2 (en) 2002-05-23 2008-10-14 Cascade Microtech, Inc. Shielded probe with low contact resistance for testing a device under test
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7456646B2 (en) 2000-12-04 2008-11-25 Cascade Microtech, Inc. Wafer probe
US7498829B2 (en) 2003-05-23 2009-03-03 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7504842B2 (en) 1997-05-28 2009-03-17 Cascade Microtech, Inc. Probe holder for testing of a test device
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04111346U (ja) * 1991-03-12 1992-09-28 石塚硝子株式会社 輸液ボトル用吊具
US7504842B2 (en) 1997-05-28 2009-03-17 Cascade Microtech, Inc. Probe holder for testing of a test device
US7495461B2 (en) 2000-12-04 2009-02-24 Cascade Microtech, Inc. Wafer probe
US7456646B2 (en) 2000-12-04 2008-11-25 Cascade Microtech, Inc. Wafer probe
US7436194B2 (en) 2002-05-23 2008-10-14 Cascade Microtech, Inc. Shielded probe with low contact resistance for testing a device under test
US7482823B2 (en) 2002-05-23 2009-01-27 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7518387B2 (en) 2002-05-23 2009-04-14 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7489149B2 (en) 2002-05-23 2009-02-10 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7453276B2 (en) 2002-11-13 2008-11-18 Cascade Microtech, Inc. Probe for combined signals
US7417446B2 (en) 2002-11-13 2008-08-26 Cascade Microtech, Inc. Probe for combined signals
US7498829B2 (en) 2003-05-23 2009-03-03 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7501842B2 (en) 2003-05-23 2009-03-10 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7427868B2 (en) 2003-12-24 2008-09-23 Cascade Microtech, Inc. Active wafer probe
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US8013623B2 (en) 2004-09-13 2011-09-06 Cascade Microtech, Inc. Double sided probing structures
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals

Also Published As

Publication number Publication date
KR880021769U (ko) 1988-12-24
KR930005420Y1 (ko) 1993-08-16
JPH0414360Y2 (enrdf_load_stackoverflow) 1992-03-31

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