JPS63187363U - - Google Patents

Info

Publication number
JPS63187363U
JPS63187363U JP7968187U JP7968187U JPS63187363U JP S63187363 U JPS63187363 U JP S63187363U JP 7968187 U JP7968187 U JP 7968187U JP 7968187 U JP7968187 U JP 7968187U JP S63187363 U JPS63187363 U JP S63187363U
Authority
JP
Japan
Prior art keywords
pair
contacts
measuring jig
pushed
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7968187U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0621266Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7968187U priority Critical patent/JPH0621266Y2/ja
Publication of JPS63187363U publication Critical patent/JPS63187363U/ja
Application granted granted Critical
Publication of JPH0621266Y2 publication Critical patent/JPH0621266Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP7968187U 1987-05-26 1987-05-26 半導体素子の測定治具 Expired - Lifetime JPH0621266Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7968187U JPH0621266Y2 (ja) 1987-05-26 1987-05-26 半導体素子の測定治具

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7968187U JPH0621266Y2 (ja) 1987-05-26 1987-05-26 半導体素子の測定治具

Publications (2)

Publication Number Publication Date
JPS63187363U true JPS63187363U (enrdf_load_stackoverflow) 1988-11-30
JPH0621266Y2 JPH0621266Y2 (ja) 1994-06-01

Family

ID=30929775

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7968187U Expired - Lifetime JPH0621266Y2 (ja) 1987-05-26 1987-05-26 半導体素子の測定治具

Country Status (1)

Country Link
JP (1) JPH0621266Y2 (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2014041905A1 (ja) * 2012-09-11 2016-08-18 シャープ株式会社 試験用治具、検査装置、載置装置および試験装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2014041905A1 (ja) * 2012-09-11 2016-08-18 シャープ株式会社 試験用治具、検査装置、載置装置および試験装置

Also Published As

Publication number Publication date
JPH0621266Y2 (ja) 1994-06-01

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