JPS63187069U - - Google Patents
Info
- Publication number
- JPS63187069U JPS63187069U JP7898387U JP7898387U JPS63187069U JP S63187069 U JPS63187069 U JP S63187069U JP 7898387 U JP7898387 U JP 7898387U JP 7898387 U JP7898387 U JP 7898387U JP S63187069 U JPS63187069 U JP S63187069U
- Authority
- JP
- Japan
- Prior art keywords
- hook
- magazine
- frame
- buffer
- supported
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000002457 bidirectional effect Effects 0.000 claims description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Warehouses Or Storage Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7898387U JPH0634708Y2 (ja) | 1987-05-25 | 1987-05-25 | Ic試験用マガジン取出装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7898387U JPH0634708Y2 (ja) | 1987-05-25 | 1987-05-25 | Ic試験用マガジン取出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63187069U true JPS63187069U (enrdf_load_stackoverflow) | 1988-11-30 |
JPH0634708Y2 JPH0634708Y2 (ja) | 1994-09-07 |
Family
ID=30928426
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7898387U Expired - Lifetime JPH0634708Y2 (ja) | 1987-05-25 | 1987-05-25 | Ic試験用マガジン取出装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0634708Y2 (enrdf_load_stackoverflow) |
-
1987
- 1987-05-25 JP JP7898387U patent/JPH0634708Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0634708Y2 (ja) | 1994-09-07 |
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