JPS63182576A - Device for diagnostic deterioration of operational amplifier - Google Patents

Device for diagnostic deterioration of operational amplifier

Info

Publication number
JPS63182576A
JPS63182576A JP1564687A JP1564687A JPS63182576A JP S63182576 A JPS63182576 A JP S63182576A JP 1564687 A JP1564687 A JP 1564687A JP 1564687 A JP1564687 A JP 1564687A JP S63182576 A JPS63182576 A JP S63182576A
Authority
JP
Japan
Prior art keywords
operational amplifier
amplifier
deterioration
internal noise
skewness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1564687A
Other languages
Japanese (ja)
Inventor
Hiroshi Inushima
浩 犬島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP1564687A priority Critical patent/JPS63182576A/en
Publication of JPS63182576A publication Critical patent/JPS63182576A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To attain the diagnosis of deterioration without detaching an operational amplifier from a printed board, to facilitate a diagnosing operation, and to shorten the diagnosing time by displaying the result of comparison of the distortion degree of a signal and a reference value. CONSTITUTION:When an input signal to the operational amplifier 1 as the object of deterioration diagnosis is held at zero, an internal noise signal in the amplifier 1 is inputted to a computing element 5 through a BPF 3 and an amplifier 4 to calculate the distortion degree of the internal noise signal. A comparison reference setter 7, on the other hand, evaluates the distortion rate of the internal noise of a normal operational amplifier and sets a value twice as large as its dispersed value as a comparison reference value. A comparator 6 judges the deterioration of the amplifier 1 when the distortion degree of the internal noise of the computing element 5 exceeds the comparison reference, and displays the result on a display device 8.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、サージ等が入力端に印加されること等によ
シ劣化したオペアンプのなかで、正常なオペアンプと動
作上同等fie性を示す劣化オペアンプを判定するオペ
アンプの劣化診断装置に関するものである。
[Detailed Description of the Invention] [Field of Industrial Application] This invention is an operational amplifier that has been degraded due to surges or the like being applied to its input terminal, and which exhibits operational fieency equivalent to that of a normal operational amplifier. The present invention relates to an operational amplifier deterioration diagnostic device that determines a deteriorated operational amplifier.

〔従来の技術〕[Conventional technology]

第2図は従来のオペアンプの劣化診断装置を示す回路図
であシ、11は診断対象オペアンプ、12は入力バイア
ス電流を測定する電流計で、オペアンプ11の○入力端
子に抵抗Rを介して接続されている。貰た、オペアンプ
11の■入力端子および帰還回路にも、図示のように抵
抗几がそれぞれ接続されている。
Fig. 2 is a circuit diagram showing a conventional operational amplifier deterioration diagnostic device. 11 is an operational amplifier to be diagnosed, and 12 is an ammeter for measuring the input bias current, which is connected to the input terminal of the operational amplifier 11 via a resistor R. has been done. As shown in the figure, resistors are also connected to the input terminal and feedback circuit of the operational amplifier 11 that I received.

次ニ動作について説明する。Next, the second operation will be explained.

まず、オペアンプ11 K’を源(+Vcc 、−Vc
c)を印加し、入力信号電圧および入力オフセットが0
0ときにオペアンプ11の出力電圧をOとする直流入力
電流を測定する。こうして求めた直流入力電流は、入力
バイアス電流で、これを予め正常オペアンプについて上
記と同様にして測定した入力バイアス電流と比較し、こ
れらの測定値間に大きな誤差があるとき上記診断対象オ
ペアンプが劣化していると判断する。
First, the operational amplifier 11 K' is connected to the source (+Vcc, -Vc
c) and the input signal voltage and input offset are 0.
When the output voltage of the operational amplifier 11 is 0, the DC input current is measured. The DC input current obtained in this way is the input bias current, and this is compared with the input bias current previously measured in the same manner as above for a normal operational amplifier. If there is a large error between these measured values, it is determined that the operational amplifier to be diagnosed has deteriorated. judge that it is.

第3図は従来の他の劣化診断装置を示す回路図である。FIG. 3 is a circuit diagram showing another conventional deterioration diagnosing device.

図において、11は診断対象オペアンプ、13は入力オ
フセット電流を算出するのに用いられる電圧計で、これ
がこのオペアンプ11の出方端子に接続されている。1
4.15は入力オフセット電流を算出するときに開閉操
作される連動タイプのスイッチで、オペアンプ11の○
入力端子に接続した抵抗几1および■入力端子に接続し
た抵抗几8を短絡または開放する。また、e入力端子お
よび■入力端子のそれぞれには、上記抵抗R1゜几8と
は異なる他の抵抗R1が1つずつ付加接続されている。
In the figure, 11 is an operational amplifier to be diagnosed, and 13 is a voltmeter used to calculate the input offset current, which is connected to the output terminal of this operational amplifier 11. 1
4.15 is an interlocking type switch that is opened and closed when calculating the input offset current.
Short-circuit or open the resistor 1 connected to the input terminal and the resistor 8 connected to the input terminal. Furthermore, one resistor R1, which is different from the resistor R1°8, is additionally connected to each of the e input terminal and the (2) input terminal.

几2は増幅率を決定する帰還抵抗である。几2 is a feedback resistor that determines the amplification factor.

次に動作について説明する。Next, the operation will be explained.

まず、オペアンプ11に電源(−1−Vcc 、−Vc
c)を印加し、スイッチ14.15を閉じたときの電圧
を電圧計13で測定し、その測定値E1を読み取る。次
に、スイッチ14.15を開Aたときの電圧を同様にし
て電圧計13で測定し、その測定値E2を読み取る。こ
うして求めた測定値El、E2を使って、入力オフセッ
ト電流Iosを(1)弐に従つて計算によシ求める。
First, apply power to the operational amplifier 11 (-1-Vcc, -Vc
c) is applied, the voltage when the switches 14 and 15 are closed is measured with the voltmeter 13, and the measured value E1 is read. Next, the voltage when the switches 14 and 15 are opened A is similarly measured with the voltmeter 13, and the measured value E2 is read. Using the measured values El and E2 thus obtained, the input offset current Ios is calculated according to (1) 2.

すなわち、オペアンプ11がサージ入力等によって劣化
した際には、通常の動作である増幅作用や1次遅れ動作
に関しては正常オペアンプと差が何ら生じないものの、
上記(1)式の演算結果たる入力オフセット電流は、正
常オペアンプとの間に大きな誤差を生じる。従って、こ
の誤差が生じたときには、上記診断対象オペアンプ11
が劣化したと判断する。
In other words, when the operational amplifier 11 deteriorates due to surge input, etc., there is no difference between normal operational amplifiers and normal operational amplifiers in terms of amplification and first-order delay operations.
The input offset current that is the calculation result of the above equation (1) causes a large error with respect to a normal operational amplifier. Therefore, when this error occurs, the operational amplifier 11 to be diagnosed
is judged to have deteriorated.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

従来のオペアンプの劣化診断装置は以上のように構成さ
れているので、入力バイアス電流や入力オフセット電流
を測定するのに、これらの各電流定義に従い複数部品か
らなる測定回路を用意しなければならず、まだ、プリン
ト板などに実装されているオペアンプの劣化診断を行な
うだめには、そのプリント板から診断対象オペアンプを
一旦取シ外して、第2図または第3図の回路接続をする
必要があシ、半田を取シ除いたシ牛田付けしたシするな
どの作業が極めて面倒となってbた。また、上記作業に
伴う診断対象オペアンプの劣化や故障を誘発するなどの
問題点があった。
Conventional operational amplifier deterioration diagnostic equipment is configured as described above, so in order to measure input bias current and input offset current, it is necessary to prepare a measurement circuit consisting of multiple components according to each of these current definitions. However, in order to diagnose the deterioration of an operational amplifier mounted on a printed board, it is necessary to remove the operational amplifier to be diagnosed from the printed board and connect the circuit as shown in Figure 2 or Figure 3. The work of removing the solder and attaching it again became extremely troublesome. In addition, there are also problems in that the above-mentioned work may cause deterioration or failure of the operational amplifier to be diagnosed.

この発明は上記のような問題点を解消するためになされ
たもので、プリント板などに実装されたオペアンプをプ
リント板からはずさずに劣化診断できるとともに、診断
操作が簡単化でき、短時間で実施できるオペアンプの劣
化診断装置を得ることを目的とする。
This invention was made to solve the above-mentioned problems. It is possible to diagnose the deterioration of an operational amplifier mounted on a printed circuit board without removing it from the printed board, and it also simplifies the diagnostic operation and can be carried out in a short time. The purpose of this invention is to obtain a deterioration diagnostic device for operational amplifiers.

〔問題点を解決するだめの手段〕[Failure to solve the problem]

この発明に係るオペアンプの劣化診断装置は、診断対象
オペアンプの内部で発生している内部雑音をバンドパス
フィルターを通して抽出し、その内部雑音の歪度を演算
器によシ計算するとともに、予め基準設定しておいた正
常オペアンプの内部雑音の歪度と歪度比較器において比
較し、診断対象オペアンプの劣化を判定し、この判定結
果を表示装置に表示するように構成したものである。
The operational amplifier deterioration diagnosis device according to the present invention extracts the internal noise generated inside the operational amplifier to be diagnosed through a band-pass filter, calculates the degree of distortion of the internal noise using a calculator, and sets a standard in advance. The skewness of the normal operational amplifier is compared with the skewness of the internal noise of the normal operational amplifier, the deterioration of the operational amplifier to be diagnosed is determined, and the determination result is displayed on the display device.

〔作 用〕[For production]

この発明に訃ける劣化診断対象オペアンプの出力信号は
、このオペアンプの入力信号を0とした場合のものであ
シ、バンドパスフィルターは上記出力信号のDC成分を
しゃ断し、適当な周波成分を通過させ増幅器はそのバン
ドパスフィルターを通過した信号を適当な大きさまで増
幅し、演算器はこの増幅器で得られた信号の歪度を計算
し、歪度比較器は上記演算器で演算した結果とあらかじ
め定められた比較基準とを比較し、その比較結果を表示
装置に表示させ、これによって劣化対象オペアンプをプ
リント板などに実装した状態で、劣化判定を可能にする
The output signal of the operational amplifier targeted for deterioration diagnosis according to this invention is the one obtained when the input signal of this operational amplifier is set to 0.The bandpass filter cuts off the DC component of the output signal and passes an appropriate frequency component. The amplifier amplifies the signal that has passed through the band-pass filter to an appropriate size, the arithmetic unit calculates the distortion of the signal obtained by this amplifier, and the skewness comparator compares the result calculated by the above arithmetic unit with the one in advance. A comparison is made with a predetermined comparison standard, and the comparison result is displayed on a display device, thereby making it possible to determine the deterioration of an operational amplifier to be degraded while it is mounted on a printed circuit board or the like.

〔実施例〕〔Example〕

以下、この発明の一実施例を図について説明する。第1
図において、1は診断時に入力が短絡される劣化診断対
象オペアンプ−[iMであり、これがプリント板などに
実装されて、所定の回路装置の一部を構成している。2
は劣化診断対象オペアンプ1の出力信号、3はこの出力
信号のうち、予め定められた周波数帯域の信号を通過さ
せるバンドパスフィルターで、その通過させる周波数帯
域は劣化診断対象オペアンプ1の種類に応じて決定し、
例えば下限遮断周波数fo = 0.01 Hz 、上
限遮断周波数f 1 = 20 Hzとする。4は上記
バンドパスフィルター3から得られた信号を増幅する増
幅器、5は上記増幅器より得られた信号を用いて内部雑
音の歪度を計算する演算器、7は劣化判定のだめの比較
基準を設定する比較基準設定器である。比較基準の設定
には正常と定義したオペアンプを用い、予め演算器5で
求められる正常オペアンプの内部雑音の歪度を計算する
。そして、さらに複数の正常オペアンプの歪度を評価し
、比較基準を設定する。例えば正常オペアンプの歪度の
分散値を計算し、この分散値の2倍を比較基準とし、こ
の値を越えるものを劣化と判定する。6は上記演算器5
から得られた歪度と上記比較基準設定器から出力される
比較基準とを比較する歪度比較器、8は上記歪度比較器
6から出力された比較結果を表示する表示手段、9は上
記歪度比較器6から出力された比較結果を印字する印字
手段、10は上記歪度比較器6から出力された比較結果
を音声告知する音声告知手段である。
An embodiment of the present invention will be described below with reference to the drawings. 1st
In the figure, reference numeral 1 denotes an operational amplifier to be diagnosed for deterioration whose input is short-circuited during diagnosis, which is mounted on a printed board or the like and constitutes a part of a predetermined circuit device. 2
is the output signal of the operational amplifier 1 targeted for deterioration diagnosis, and 3 is a bandpass filter that passes a signal in a predetermined frequency band among this output signal, and the frequency band to be passed depends on the type of operational amplifier 1 targeted for deterioration diagnosis. decided,
For example, the lower limit cutoff frequency fo = 0.01 Hz and the upper limit cutoff frequency f 1 = 20 Hz. 4 is an amplifier that amplifies the signal obtained from the band pass filter 3; 5 is an arithmetic unit that calculates the distortion of internal noise using the signal obtained from the amplifier; 7 is a comparison standard for determining deterioration. It is a comparison standard setting device. An operational amplifier defined as normal is used to set the comparison standard, and the skewness of the internal noise of the normal operational amplifier, which is determined in advance by the arithmetic unit 5, is calculated. Then, the skewness of a plurality of normal operational amplifiers is further evaluated and a comparison standard is set. For example, the dispersion value of the distortion of a normal operational amplifier is calculated, twice this dispersion value is used as a comparison standard, and anything exceeding this value is determined to be degraded. 6 is the above computing unit 5
8 is a display means for displaying the comparison result output from the skewness comparator 6; 9 is a display means for displaying the comparison result output from the skewness comparator 6; Printing means prints out the comparison results output from the skewness comparator 6, and numeral 10 denotes audio notification means for audibly announcing the comparison results output from the skewness comparator 6.

次に動作について説明する。Next, the operation will be explained.

まず、劣化診断対象オペアンプ1に電源を接続し、かつ
入力を短絡して入力信号をOとする。すると、このオペ
アンプ1は内部雑音を有する出力信号を出力する。この
出力信号はバンドパスフィルター3に入力されて直流成
分が除かれ、予め定められた周波数帯域の信号のみを増
幅器4に入力する。増幅器4はこの入力信号を増幅した
後演算器5に入力し、演算器5ではその増幅器が出力す
る出力信号中の内部雑音の歪度を計算する。
First, a power supply is connected to the operational amplifier 1 to be diagnosed for deterioration, and the input signal is set to O by short-circuiting the input. Then, this operational amplifier 1 outputs an output signal having internal noise. This output signal is input to a band pass filter 3 to remove the DC component, and only a signal in a predetermined frequency band is input to an amplifier 4. The amplifier 4 amplifies this input signal and then inputs it to the arithmetic unit 5, which calculates the degree of distortion of internal noise in the output signal output from the amplifier.

一方、比較基準設定器7では、予め図示しない正常オペ
アンプの内部雑音の歪度を、上記同様の方法で計算し、
この計算結果を複数の正常オペアンプについて評価し、
これを内部雑音の歪度とし、例えばこの分散値の2倍値
を比較基準とする。次に、上記比較器6にはこの比較基
準と演算器5の出力たる内部雑音の歪度とが入力され、
この歪度が比較基準を越えたか否かを判定する。そして
越えたと判定したときは、上記オペアンプ1が劣化して
いるものとして、これを表示装置8に表示させ、必要に
応じて印字装置9によりプリントアウトしたシ、音声告
知装置10により音声出力したりする。
On the other hand, the comparison standard setter 7 calculates in advance the skewness of the internal noise of a normal operational amplifier (not shown) using the same method as above,
Evaluate this calculation result for multiple normal operational amplifiers,
This is taken as the skewness of the internal noise, and for example, the value twice this variance value is used as a comparison standard. Next, this comparison standard and the skewness of the internal noise which is the output of the arithmetic unit 5 are input to the comparator 6,
It is determined whether this skewness exceeds the comparison standard. If it is determined that the operational amplifier 1 has deteriorated, it is displayed on the display device 8, printed out using the printing device 9 as necessary, and outputted as a sound using the audio notification device 10. do.

このようにすれば、オペアンプ1をプリント板などに実
装した状態で劣化試験でき、その試験に係る作業を容易
、迅速に行なうことができ、さらにこの作業をオペアン
プ1の故障を招くことな〈実施できる。
In this way, the deterioration test can be performed with the operational amplifier 1 mounted on a printed circuit board, etc., and the work related to the test can be performed easily and quickly. can.

なお、上記実施例では、設定した比較基準を複数の正常
オペアンプの出力信号の歪度の分散値の2倍としだが、
この1.5倍や3倍としてもよい。
In the above embodiment, the set comparison standard is twice the variance of the distortion of the output signals of a plurality of normal operational amplifiers.
It may be 1.5 times or 3 times this value.

また、複数の正常オペアンプの出力信号の歪度の分散値
の最大値を比較基準と設定してもよい。
Alternatively, the maximum value of the distortion variance values of the output signals of a plurality of normal operational amplifiers may be set as the comparison standard.

また、オペアンプの劣化診断装置の構成において、バン
ドパスフィルター3の次に増幅器4が接続されているが
、バンドパスフィルター3と増幅器4によって得られる
周波数特性が同等であるなら、接続方法は種々考えられ
る。例えば、増幅器4の次にバンドパスフィルター3を
接続する方法や、バイパスフィルター、増幅器、ローパ
スフィルターを順に接続する方法でも同様の効果が得ら
れる。
In addition, in the configuration of the operational amplifier deterioration diagnosis device, the amplifier 4 is connected after the bandpass filter 3, but if the frequency characteristics obtained by the bandpass filter 3 and the amplifier 4 are the same, various connection methods can be considered. It will be done. For example, the same effect can be obtained by connecting the bandpass filter 3 after the amplifier 4, or by connecting a bypass filter, an amplifier, and a low-pass filter in this order.

〔発明の効果〕〔Effect of the invention〕

以上のように、この発明によれば、診断オペアンプの内
部で発生している内部雑音を、バンドパスフィルターを
通して抽出し、その内部雑音の歪度を演算器によって演
算し、この結果を、予め基準設定しておいた正常オペア
ンプの内部雑音の歪度と歪度比較器によって比較して、
上記診断対象オペアンプの劣化を判定し、これを表示装
置に表示するように構成したので、上記診断対象オペア
ンプをプリント基板などから取り外すことなく劣化診断
ができるほか、診断時間の短縮並びに高信頼性のある診
断が可能になシ、さらに診断に特殊な技能を要しないも
のが得られる効果がある。
As described above, according to the present invention, the internal noise generated inside the diagnostic operational amplifier is extracted through a band-pass filter, the skewness of the internal noise is calculated by a calculator, and this result is used as a reference in advance. Compare the skewness of the internal noise of the normal operational amplifier with the skewness comparator that you have set,
Since the configuration is configured to determine the deterioration of the operational amplifier to be diagnosed and display it on the display device, it is possible to diagnose the deterioration without removing the operational amplifier to be diagnosed from the printed circuit board, etc., as well as shorten the diagnosis time and improve reliability. This has the effect of not only making it possible to perform a certain diagnosis, but also requiring no special skills for the diagnosis.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の一実施例によるオペアンプの劣化診
断装置を示すブロック接続図、第2図および第3図は従
来のオペアンプの劣化診断装置を示す回路図である。 1は劣化診断対象オペアンプ!、2はオペアンプの出力
信号、3はバンドパスフィルター、4は増幅器、5は演
算器、6は歪度比較器、7は比較基準設定器、8は表示
手段。 なお、図中、同一符号は同一、または相当部分を示す。 特許出願人  三菱電機株式会社 (外2名)
FIG. 1 is a block connection diagram showing an operational amplifier deterioration diagnosing device according to an embodiment of the present invention, and FIGS. 2 and 3 are circuit diagrams showing conventional operational amplifier deterioration diagnosing devices. 1 is an operational amplifier targeted for deterioration diagnosis! , 2 is an output signal of an operational amplifier, 3 is a bandpass filter, 4 is an amplifier, 5 is an arithmetic unit, 6 is a distortion comparator, 7 is a comparison standard setting device, and 8 is a display means. In addition, in the figures, the same reference numerals indicate the same or equivalent parts. Patent applicant: Mitsubishi Electric Corporation (2 others)

Claims (1)

【特許請求の範囲】[Claims] 入力が短絡された診断対象オペアンプと、この診断対象
オペアンプの出力信号のうち予め定められた周波数成分
を通過させるバンドパスフィルターと、このバンドパス
フィルターから得られた信号を増幅する増幅器と、この
増幅器から得られた出力信号中の内部雑音の歪度を演算
する演算器と、この演算器からの出力信号と予め設定さ
れた比較基準とを比較する歪度比較器と、この歪度比較
器からの比較結果を表示する表示装置とを備えたオペア
ンプの劣化診断装置。
An operational amplifier to be diagnosed whose input is short-circuited, a bandpass filter that passes a predetermined frequency component of the output signal of the operational amplifier to be diagnosed, an amplifier that amplifies the signal obtained from this bandpass filter, and this amplifier. a computing unit that computes the skewness of internal noise in the output signal obtained from the computing unit; a skewness comparator that compares the output signal from this computing unit with a preset comparison standard; An operational amplifier deterioration diagnostic device comprising: a display device that displays comparison results;
JP1564687A 1987-01-26 1987-01-26 Device for diagnostic deterioration of operational amplifier Pending JPS63182576A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1564687A JPS63182576A (en) 1987-01-26 1987-01-26 Device for diagnostic deterioration of operational amplifier

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1564687A JPS63182576A (en) 1987-01-26 1987-01-26 Device for diagnostic deterioration of operational amplifier

Publications (1)

Publication Number Publication Date
JPS63182576A true JPS63182576A (en) 1988-07-27

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Family Applications (1)

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JP1564687A Pending JPS63182576A (en) 1987-01-26 1987-01-26 Device for diagnostic deterioration of operational amplifier

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JP (1) JPS63182576A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101943746A (en) * 2010-09-13 2011-01-12 山东精久科技有限公司 AC programmable power supply high-precision measuring circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101943746A (en) * 2010-09-13 2011-01-12 山东精久科技有限公司 AC programmable power supply high-precision measuring circuit

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