JPS63181956U - - Google Patents
Info
- Publication number
- JPS63181956U JPS63181956U JP7260987U JP7260987U JPS63181956U JP S63181956 U JPS63181956 U JP S63181956U JP 7260987 U JP7260987 U JP 7260987U JP 7260987 U JP7260987 U JP 7260987U JP S63181956 U JPS63181956 U JP S63181956U
- Authority
- JP
- Japan
- Prior art keywords
- outer periphery
- contact probe
- ring terminal
- movable
- ring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 4
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims description 2
- 238000009413 insulation Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7260987U JPS63181956U (fr) | 1987-05-15 | 1987-05-15 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7260987U JPS63181956U (fr) | 1987-05-15 | 1987-05-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63181956U true JPS63181956U (fr) | 1988-11-24 |
Family
ID=30916210
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7260987U Pending JPS63181956U (fr) | 1987-05-15 | 1987-05-15 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63181956U (fr) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100477526B1 (ko) * | 2002-05-03 | 2005-03-17 | 동부아남반도체 주식회사 | 반도체 테스트 장치의 포고 핀 |
WO2007013341A1 (fr) * | 2005-07-26 | 2007-02-01 | Ricoh Company, Ltd. | Appareil d’essai de dispositif de composant électronique |
-
1987
- 1987-05-15 JP JP7260987U patent/JPS63181956U/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100477526B1 (ko) * | 2002-05-03 | 2005-03-17 | 동부아남반도체 주식회사 | 반도체 테스트 장치의 포고 핀 |
WO2007013341A1 (fr) * | 2005-07-26 | 2007-02-01 | Ricoh Company, Ltd. | Appareil d’essai de dispositif de composant électronique |
JP2007033215A (ja) * | 2005-07-26 | 2007-02-08 | Ricoh Co Ltd | 電子部品実装体検査装置 |