JPS63177772U - - Google Patents

Info

Publication number
JPS63177772U
JPS63177772U JP6876287U JP6876287U JPS63177772U JP S63177772 U JPS63177772 U JP S63177772U JP 6876287 U JP6876287 U JP 6876287U JP 6876287 U JP6876287 U JP 6876287U JP S63177772 U JPS63177772 U JP S63177772U
Authority
JP
Japan
Prior art keywords
outputs
waveform shapers
testing
semiconductor
multiplexer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6876287U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6876287U priority Critical patent/JPS63177772U/ja
Publication of JPS63177772U publication Critical patent/JPS63177772U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP6876287U 1987-05-08 1987-05-08 Pending JPS63177772U (US20080094685A1-20080424-C00004.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6876287U JPS63177772U (US20080094685A1-20080424-C00004.png) 1987-05-08 1987-05-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6876287U JPS63177772U (US20080094685A1-20080424-C00004.png) 1987-05-08 1987-05-08

Publications (1)

Publication Number Publication Date
JPS63177772U true JPS63177772U (US20080094685A1-20080424-C00004.png) 1988-11-17

Family

ID=30908881

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6876287U Pending JPS63177772U (US20080094685A1-20080424-C00004.png) 1987-05-08 1987-05-08

Country Status (1)

Country Link
JP (1) JPS63177772U (US20080094685A1-20080424-C00004.png)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5673362A (en) * 1979-11-21 1981-06-18 Advantest Corp Testing device of memory
JPS59215099A (ja) * 1983-05-20 1984-12-04 Hitachi Ltd 半導体メモリの検査方法
JPS59225368A (ja) * 1983-06-06 1984-12-18 Fujitsu Ltd 論理回路試験装置
JPS6079278A (ja) * 1983-10-07 1985-05-07 Hitachi Micro Comput Eng Ltd 半導体集積回路装置
JPS6095369A (ja) * 1983-10-31 1985-05-28 Hitachi Ltd テストパターン発生方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5673362A (en) * 1979-11-21 1981-06-18 Advantest Corp Testing device of memory
JPS59215099A (ja) * 1983-05-20 1984-12-04 Hitachi Ltd 半導体メモリの検査方法
JPS59225368A (ja) * 1983-06-06 1984-12-18 Fujitsu Ltd 論理回路試験装置
JPS6079278A (ja) * 1983-10-07 1985-05-07 Hitachi Micro Comput Eng Ltd 半導体集積回路装置
JPS6095369A (ja) * 1983-10-31 1985-05-28 Hitachi Ltd テストパターン発生方法

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