JPS6317527A - Applying method of resist - Google Patents

Applying method of resist

Info

Publication number
JPS6317527A
JPS6317527A JP16160486A JP16160486A JPS6317527A JP S6317527 A JPS6317527 A JP S6317527A JP 16160486 A JP16160486 A JP 16160486A JP 16160486 A JP16160486 A JP 16160486A JP S6317527 A JPS6317527 A JP S6317527A
Authority
JP
Japan
Prior art keywords
resist
revolution
coating
time
oven body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16160486A
Other languages
Japanese (ja)
Other versions
JPH0255936B2 (en
Inventor
Yasuo Matsuoka
康男 松岡
Noboru Yamamoto
昇 山本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP16160486A priority Critical patent/JPS6317527A/en
Publication of JPS6317527A publication Critical patent/JPS6317527A/en
Publication of JPH0255936B2 publication Critical patent/JPH0255936B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Application Of Or Painting With Fluid Materials (AREA)
  • Coating Apparatus (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE:To decrease dust and resist spots by conducting application at at least one time and bringing the inside of an oven body to open space during the period of application up to the completion of revolution at high speed determining the final film thickness of a resist and discharging a solvent mist. CONSTITUTION:Mask blanks 5 are placed and sucked to a spin chuck 4 while a closing cover 6 and the side-wall upper section of an applying oven body 1 are fast stuck, and the inside of the applying oven body is brought completely to a closed state. A resist is dropped to the center of the mask blanks 5 by a resist nozzle 7, dropping is finished while the spin chuck 4 is turned for a fixed time by revolution at low speed, rotational speed is increased up to normal revolution, high-speed spin coating is performed by the number of revolution for a specified time, and application is completed. The closing cover 6 is lifted and the applying oven body 1 is opened for the time up to the number of revolution at high speed determining predetermined final film thickness at that time, and a ventilating-fan 3 is operated and the mists of a solvent dissolving the resist are removed. Accordingly, dust and resist spots can be decreased, while maintaining resist film thickness uniformly.

Description

【発明の詳細な説明】 〔発明の目的コ (産業上の利用分野) 本発明はレジスト塗布方法に関し、特に高分子、高粘度
のレジストを半導体基板上に塗布する方法に係わる。
DETAILED DESCRIPTION OF THE INVENTION OBJECTS OF THE INVENTION (Industrial Field of Application) The present invention relates to a resist coating method, and particularly to a method of coating a high molecular weight, high viscosity resist on a semiconductor substrate.

(従来の技術) 従来、レジスト塗布は、開空間にて均一に排気を行ない
ながらレジストを滴下した後、一定回転又は多段回転で
膜厚を抑制しながらレジスト塗布及び乾燥を行って来た
(Prior Art) Conventionally, resist coating has been carried out by dropping the resist in an open space while uniformly evacuation, and then applying and drying the resist while controlling the film thickness by constant rotation or multi-stage rotation.

しかしながら、電子ビーム露光用のレジストのような高
分子、高粘度のレジストは、■レジスト滴下直後におけ
る立上がりの加速度、■回転塗布時の排気、環境濃度等
の条件によりレジスト塗布状態が変動する事がわかって
いる。例えば、■の立上がりの加速度が十分大きく取れ
るスピンモータでない場合や、■の排気が強すぎてレジ
ストの溶媒の乾燥が早い場合などは滴下時の滴下跡がそ
の、まま膜厚変動として残ったり、スピンコード時に飛
散するレジストが乾燥し糸状になり、塗布回転中もしく
は回転停止時に基板上に糸状のレジストが乗り塗布不良
となる場合が多い。
However, with polymeric, high-viscosity resists such as resists for electron beam exposure, the state of resist application may fluctuate due to conditions such as: (1) rising acceleration immediately after dropping the resist, (2) exhaust during spin coating, and environmental concentration. know. For example, if the spin motor does not have a sufficiently large acceleration for the start-up of (■), or if the exhaust of (■) is too strong and the resist solvent dries quickly, traces of dripping may remain as they are as changes in film thickness. The resist scattered during the spin code dries and becomes thread-like, and the thread-like resist often gets on the substrate during coating rotation or when the rotation is stopped, resulting in poor coating.

ところで、この問題に対しては、効果なスピンモータを
用いて高速回転までの加速度を上げたり2乗加速度法等
を用いたり、回転開始時塗布釜内の排気を一時的に停止
したり、塗布時の排気量を制御して改善されてきた。し
かし、十分な効果が上がるには至らない。
By the way, to solve this problem, it is possible to increase the acceleration to high speed rotation using an effective spin motor, use the square acceleration method, etc., temporarily stop the exhaust inside the coating pot at the start of rotation, or The control of displacement has been improved over time. However, sufficient effects have not been achieved.

また、最近になって本発明者らにより上記対策を目的と
した密閉塗布方式も検討されその効果がある事が確認さ
れてキ来たが、塗布後の基板表面検査においてダスト及
びレジスト斑点が全体の10%程度存在する事が判明し
、改善が必要とされている。
In addition, recently, the inventors of the present invention have investigated a sealed coating method for the above-mentioned countermeasures, and it has been confirmed that it is effective, but dust and resist spots were observed throughout the substrate surface inspection after coating. It has been found that about 10% of the cases exist, and improvement is required.

(R明が解決しようとする問題点) 本発明は上記事情に鑑みてなされたもので、塗布ムラを
防止してレジスト膜厚を均一に維持しつつ、ダストやレ
ジスト斑点を低減し得るレジスト塗布方法を提供するこ
とを目的とする。
(Problems to be Solved by R-Mei) The present invention was made in view of the above circumstances, and is a resist coating that can reduce dust and resist spots while preventing coating unevenness and maintaining a uniform resist film thickness. The purpose is to provide a method.

[発明の構成コ (問題点を解決するための手段と作用)本発明は、レジ
ストの最終膜厚を決定する高速回転終了までの塗布期間
中に少なくとも1回塗布釜本体内を間中間にし、溶剤ミ
ストの排気を行なうことを特徴とし、これによりダスト
やレジスト斑点の低減、並びに均一膜厚なレジストを得
ることができる。
[Structure of the Invention (Means and Effects for Solving the Problems)] The present invention provides that the coating pot body is heated at least once during the coating period until the end of high-speed rotation, which determines the final film thickness of the resist, and a solvent is removed. It is characterized by exhausting the mist, thereby reducing dust and resist spots and making it possible to obtain a resist film with a uniform thickness.

(実施例) 以下、本発明の一実施例を第1図及び第2図を参照して
説明する。ここで、第1図は本発明に係るレジスト塗布
装置の概略断面図、第2図は密閉塗布時の塗布回転数の
特性図を示す。
(Example) An example of the present invention will be described below with reference to FIGS. 1 and 2. Here, FIG. 1 is a schematic sectional view of a resist coating apparatus according to the present invention, and FIG. 2 is a characteristic diagram of the coating rotation speed during sealed coating.

図中の1は、塗布釜本体である。この塗布釜本体1の側
壁部及び底部は空洞部2となっており、該空洞部2は排
気ファン3に連通されている。前記塗布釜本体1の略中
央部には、例えば矢印六方向に回転可能なスピンチャッ
ク4が設けられている。このスピンチャック4上には、
被処理体としてのマスクブランクス5が吸着されている
。前記塗布釜本体1の上部には側壁部の空洞部2を閉じ
るように取外し自在な密閉蓋6が設けられ、該密閉蓋6
の略中央部にはレジストノズル7が取付けられている。
1 in the figure is the coating pot body. The side wall and bottom of the applicator pot body 1 form a cavity 2, and the cavity 2 communicates with an exhaust fan 3. A spin chuck 4 rotatable, for example, in the six directions of arrows is provided approximately at the center of the coating pot body 1. On this spin chuck 4,
A mask blank 5 as an object to be processed is attracted. A removable sealing lid 6 is provided at the top of the coating pot body 1 so as to close the cavity 2 of the side wall.
A resist nozzle 7 is attached approximately at the center of the image forming apparatus.

こうした構造のレジスト塗布装置の動作は次の如く行な
う。まず、スピンチャック4にマスクブランクス5をの
せ吸着するとともに、密閉蓋6と塗布釜本体1の側壁上
部とを密着させ、塗布釜本体内を完全に密閉状態とする
。つづいて、レジストノズル7よりマスクブランクス5
中央にレジストを滴下する。この滴下が終了したと同時
に、低速回転例えば立上がり0.5秒にてOr、p、a
から200 r、p、mとし、20 Or、p、m テ
3 秒fmDo転ヲ行なった後、0.5秒の立上がりに
て400r、plwの通常回転まで上げ、20秒間この
回転数にて高速回転塗布を行ない、塗布を終了する(第
2図参照)。この際、所定Rum厚を決定する高速回転
数までの約4秒間(第2図の斜線部の期間)、密閉11
6を上げて塗布釜本体1を開放し、排気ファン3を動作
させてレジストを溶かしている溶剤のミストを除去した
The operation of the resist coating apparatus having such a structure is as follows. First, the mask blank 5 is placed on the spin chuck 4 and adsorbed, and the sealing lid 6 and the upper side wall of the coating pot main body 1 are brought into close contact with each other to completely seal the interior of the coating pot main body. Next, from the resist nozzle 7, the mask blank 5 is
Drop resist in the center. At the same time as this dripping is completed, Or, p, a is rotated at low speed, for example, 0.5 seconds after starting.
From 200 r, p, m, after performing fmdo rotation for 3 seconds at 20 or, p, m, increase to normal rotation of 400 r, plw at the start of 0.5 seconds, and high speed at this rotation speed for 20 seconds. Perform spin coating to complete the coating (see Figure 2). At this time, the sealing 11
6 was raised to open the coating pot body 1, and the exhaust fan 3 was operated to remove the solvent mist that was dissolving the resist.

上記実施例によれば、レジストの最終膜厚を決定する高
速回転数までの約4秒間、塗布釜本体1内を間中間にし
て排気ファン3により溶剤ミストの排気を行なうため、
従来と比ベダストやレジスト斑点を低減できる。事実、
ダスト、レジスト斑点が主原因とされる塗布不良の発生
率が、約10%程度(従来)から1%以下に低減され、
大幅な塗布改善を達成できた。また、本来の密閉塗布の
長所である塗布膜厚の均一性も維持できる。
According to the above embodiment, the solvent mist is exhausted by the exhaust fan 3 within the coating pot body 1 for about 4 seconds until the high rotation speed that determines the final film thickness of the resist.
Compared to conventional methods, it is possible to reduce the amount of paint dust and resist spots. fact,
The incidence of coating defects, which are mainly caused by dust and resist spots, has been reduced from about 10% (previously) to less than 1%.
A significant improvement in coating was achieved. Furthermore, the uniformity of the coating film thickness, which is an advantage of the original sealed coating, can be maintained.

なお、上記実施例では、レジスト塗布回転中の溶剤ミス
トの排気を第2図に示す如く1回行なったが、これに限
らない。例えば、第3図に示す如く、塗布時のスピンチ
ャック回転数が急激に立上がってレジストがマスクブラ
ンクスより大量に飛散し、溶剤ミストが発生し易い期間
、例えば立上げ時0〜5秒、3.5〜5.0秒に夫々1
回づつ計2回排気を行なっても上記実施例と同様な効果
を得ることができる。
In the above embodiment, the solvent mist was exhausted once during the resist coating rotation as shown in FIG. 2, but the present invention is not limited to this. For example, as shown in FIG. 3, the spin chuck rotation speed during coating increases rapidly, causing a large amount of resist to scatter from the mask blank, and creating a solvent mist. 1 every .5 to 5.0 seconds
Even if the exhaust is performed twice in total, the same effect as in the above embodiment can be obtained.

[発明の効果] 以上詳述した如く本発明によれば、レジスト膜厚を均一
に維持しつつ、ダストやレジスト斑点を低減し得る信頼
性の高いレジスト塗布方法を提供できる。
[Effects of the Invention] As detailed above, according to the present invention, it is possible to provide a highly reliable resist coating method capable of reducing dust and resist spots while maintaining a uniform resist film thickness.

【図面の簡単な説明】 第1図は本発明に係るレジスト塗布装置の概略断面図、
第2図及び第3図は夫々本発明に係る密閉塗布時の塗布
回転数の特性図を示す。 1・・・塗布釜本体、2・・・空洞部、3・・・排気フ
ァン、4・・・スピンチャック、5・・・マスクブラン
クス(被処理体)、6・・・密閉蓋、7・・・レジスト
ノズルO出願人代理人 弁理士 鈴江武彦 第1図
[BRIEF DESCRIPTION OF THE DRAWINGS] FIG. 1 is a schematic cross-sectional view of a resist coating device according to the present invention;
FIGS. 2 and 3 respectively show characteristic diagrams of the coating rotation speed during sealed coating according to the present invention. DESCRIPTION OF SYMBOLS 1... Coating pot body, 2... Cavity part, 3... Exhaust fan, 4... Spin chuck, 5... Mask blanks (object to be processed), 6... Airtight lid, 7... ...Resist Nozzle O Applicant Representative Patent Attorney Takehiko Suzue Figure 1

Claims (1)

【特許請求の範囲】[Claims] レジスト塗布装置を用いて被処理体上にレジストを塗布
するレジスト塗布方法において、レジストの最終膜厚を
決定する高速回転終了までの塗布期間中に少なくとも1
回塗布釜本体内を開空間にし、溶剤ミストの排気を行な
うことを特徴とするレジスト塗布方法。
In a resist coating method that uses a resist coating device to coat a resist onto an object to be treated, at least
A resist coating method characterized by creating an open space within the multi-coating pot body and exhausting solvent mist.
JP16160486A 1986-07-09 1986-07-09 Applying method of resist Granted JPS6317527A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16160486A JPS6317527A (en) 1986-07-09 1986-07-09 Applying method of resist

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16160486A JPS6317527A (en) 1986-07-09 1986-07-09 Applying method of resist

Publications (2)

Publication Number Publication Date
JPS6317527A true JPS6317527A (en) 1988-01-25
JPH0255936B2 JPH0255936B2 (en) 1990-11-28

Family

ID=15738316

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16160486A Granted JPS6317527A (en) 1986-07-09 1986-07-09 Applying method of resist

Country Status (1)

Country Link
JP (1) JPS6317527A (en)

Also Published As

Publication number Publication date
JPH0255936B2 (en) 1990-11-28

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