JPS63175278A - Switching mechanism for checking head of magnetic disk surface - Google Patents

Switching mechanism for checking head of magnetic disk surface

Info

Publication number
JPS63175278A
JPS63175278A JP502187A JP502187A JPS63175278A JP S63175278 A JPS63175278 A JP S63175278A JP 502187 A JP502187 A JP 502187A JP 502187 A JP502187 A JP 502187A JP S63175278 A JPS63175278 A JP S63175278A
Authority
JP
Japan
Prior art keywords
head
magnetic disk
carriage
axis carriage
axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP502187A
Other languages
Japanese (ja)
Other versions
JPH07105040B2 (en
Inventor
Kiyomi Yamaguchi
山口 清美
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi Electronics Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Electronics Engineering Co Ltd filed Critical Hitachi Electronics Engineering Co Ltd
Priority to JP502187A priority Critical patent/JPH07105040B2/en
Publication of JPS63175278A publication Critical patent/JPS63175278A/en
Publication of JPH07105040B2 publication Critical patent/JPH07105040B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B33/00Constructional parts, details or accessories not provided for in the other groups of this subclass
    • G11B33/10Indicating arrangements; Warning arrangements
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B23/00Record carriers not specific to the method of recording or reproducing; Accessories, e.g. containers, specially adapted for co-operation with the recording or reproducing apparatus ; Intermediate mediums; Apparatus or processes specially adapted for their manufacture
    • G11B23/50Reconditioning of record carriers; Cleaning of record carriers ; Carrying-off electrostatic charges
    • G11B23/505Reconditioning of record carriers; Cleaning of record carriers ; Carrying-off electrostatic charges of disk carriers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/84Processes or apparatus specially adapted for manufacturing record carriers

Abstract

PURPOSE:To reduce the dimensions of a switching mechanism in the X axis direction by using an X axis carriage to which a burnishing head and a projection checking head are attached and a Y axis carriage to which the X axis carriage is mounted. CONSTITUTION:A fixed radius line 1a of a magnetic disk 1 is used as an action line of a burnishing head 2 and a projection checking head 5 respectively. Both heads 2 and 5 are switched with each other and performed their functions, when they are moved to the position of the line 1a with the shift of an X axis carriage 8 carried out by the revolution or a drive motor 9. A Y axis carriage 10 holding the carriage 8 is moved by the revolution of a drive motor 11 and carries out a burnishing or projection checking action up to the center from the outside of a magnetic disk 1 along the line 1a. Thus the space occupation factor is reduced since both heads 2 and 5 are attached to the carriage 8. Then a compact switching mechanism is obtained.

Description

【発明の詳細な説明】 [産業上の利用分野] この発明は、磁気ディスクの表面に存在する突起を除去
とその結果を検査する。磁気ディスクの表面突起検査装
置に間するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention removes protrusions existing on the surface of a magnetic disk and inspects the results thereof. It is used in a magnetic disk surface protrusion inspection device.

[従来の技術] コンピュータシステムの記憶装置として迂用される磁気
ディスクは、磁気媒体の微細化と性能の向上によります
ます高密度化している。このために磁気ディスクの表面
は極めて平滑なことが要求される。磁気ディスクの製造
においては、磁気膜の塗布後、これを平滑にするため研
磨(グラインド)されるが、研磨してもある程度、平滑
度(グライド)を阻害する突起があるので、さらにバー
二・1シユとよばれる工程により突起の除去がなされて
いる、これらの平滑化が行われたディスクに対して、突
起の有無が検査されるものであるが、研磨工程において
は微小な粒子が多量に発生するのでそれが検査装置およ
びその周辺に混入するのを避けて、バー二・ソシュとそ
の結果の検査は次段の工程とし、平滑検査装置(グライ
ドテスター)とよばれる1装置で行われている。従って
、グライドテスターには、バー二・ソシュの機能と検査
機能が兼ねて設けられている。
[Prior Art] Magnetic disks, which are used as storage devices in computer systems, are becoming increasingly dense due to miniaturization and improved performance of magnetic media. For this reason, the surface of the magnetic disk is required to be extremely smooth. In the manufacturing of magnetic disks, after the magnetic film is coated, it is polished (grinded) to make it smooth, but even after polishing, there are protrusions that impede the smoothness (glide) to some extent, so the polishing process is further performed. These smoothed disks, which have had protrusions removed in a process called 1-shu, are inspected for the presence of protrusions, but the polishing process produces a large amount of minute particles. In order to avoid contamination of the inspection equipment and its surroundings, inspection of the Verni Soshu and its results is carried out in the next step, using a single device called a smoothness inspection equipment (glide tester). There is. Therefore, the glide tester is provided with both a Verni-Sosh function and an inspection function.

第2図は従来のグライドテスターのへ・?ドの切り替え
および移動機構の構造の概要を示す平面図で、磁気ディ
スク1に対してバー二・ソシュを行うバー二・ソシュヘ
・シト2と突起検査を行う突起検査ヘッド5とは互いに
角度θをなす支持具2aおよび5aに支持されて配置さ
れている。各支持具2コおよび5aは、それぞれキャリ
ッジ3および6に固定され、駆動モータ4および7によ
り矢印Rの方向(磁気ディスクの半径方向)に移動する
Figure 2 shows the conventional glide tester. 2 is a plan view showing an overview of the structure of the switching and moving mechanism for the magnetic disk 1. The burner/shosh head 2 that burns and burns the magnetic disk 1 and the protrusion inspection head 5 that inspects the protrusion are at an angle θ to each other. The support members 2a and 5a are arranged so as to be supported by the support members 2a and 5a. The supports 2 and 5a are fixed to carriages 3 and 6, respectively, and are moved in the direction of arrow R (radial direction of the magnetic disk) by drive motors 4 and 7.

これらの動作としては、まずキャリッジ6が後退して突
起検査へ−Iドが磁気ディスク1から離れた状態で、キ
ャリッジ3が前進してバーニッシュヘッドが磁気ディス
ク1の表面に接触して突起の除去がされ、表面全体の除
去が終了する0次に、バーニッシュヘッド2が後退し、
代わって突起検査ヘッド5が前進して検査が行う、検査
の範囲は磁気ディスク1の外側から中心までである。
These operations are as follows: First, the carriage 6 retreats to inspect the protrusions. With the I-drive separated from the magnetic disk 1, the carriage 3 moves forward and the burnish head comes into contact with the surface of the magnetic disk 1 to inspect the protrusions. The burnishing head 2 retreats, and the removal of the entire surface is completed.
Instead, the protrusion inspection head 5 moves forward to perform the inspection, and the inspection range is from the outside to the center of the magnetic disk 1.

さて、このようなグライドテスターは他の検査装置とと
もに磁気ディスク検査ラインが構成されて、流れ方式に
より各種の検査が行われているが、多くの検査ステーシ
ョンが連続するため、各装置の幅寸法はコンパクト化し
て極力小さくすることが要請されている。これに対して
、第1図においては、2組のキャリ・Iジ3および6の
なす角度θは1機構の配置上はぼ直角に近く設定されて
いるため、空間占有率が大きい、ただしこの場合、角度
θを小さくして装置の横方向の寸法を縮小することには
機構上の無理があり行い難い。これに対して、簡易な方
法でコンパクト化できる方法が必要とされている。
Now, such a glide tester constitutes a magnetic disk inspection line together with other inspection devices, and various inspections are performed using a flow method, but since many inspection stations are continuous, the width dimension of each device is There is a demand for compactness and miniaturization as much as possible. On the other hand, in Fig. 1, the angle θ formed by the two sets of carry I-jis 3 and 6 is set close to a right angle in terms of the arrangement of one mechanism, so the space occupation rate is large. In this case, it is difficult to reduce the lateral dimension of the device by reducing the angle θ because it is mechanically difficult. In response to this, there is a need for a method that can be made compact in a simple manner.

[発明の目的] この発明はグライドテスターにおいて、コンパクト化さ
れたヘッド切り替え機構を提供することを目的とするも
のである。
[Object of the Invention] An object of the present invention is to provide a compact head switching mechanism in a glide tester.

[問題点を解決するための手段] この発明は、回転中の磁気ディスクの表面に接触して、
表面に存在する突起を除去するバー二・ソシュヘ’yド
と、バーニッシュヘッドにより突起が除去された表面に
残存する突起を検査する突起検査ヘッドとよりなる磁気
ディスク表面突起検査装置のヘッド切り替え機構であっ
て、バーニーIシュヘッドと突起検査ヘッドとを取り付
けたX軸キャリッジと、X軸キャリッジを搭載したY軸
キャリッジよりなる、X、Yキャリッジ機構を有するも
のである。
[Means for Solving the Problems] The present invention provides a method for contacting the surface of a rotating magnetic disk,
A head switching mechanism for a magnetic disk surface protrusion inspection device comprising a burnishing head for removing protrusions existing on the surface and a protrusion inspection head for inspecting protrusions remaining on the surface from which the protrusions have been removed by the burnish head. It has an X, Y carriage mechanism consisting of an X-axis carriage to which a burnie head and a protrusion inspection head are attached, and a Y-axis carriage on which the X-axis carriage is mounted.

のである。It is.

上記のX、Y軸キャリッジ機構としては、そのX軸キャ
リーIジの移動によりバーニーIシュヘッドと突起検査
へ−Iドが切り替えられて、磁気ディスクの表面の一定
の半径上の動作位置にそれぞれセットされる。また、セ
ーIトされた各ヘッドは、Y軸キャリーIジの移動によ
り、上記の一定の半径上を移動してそれぞれの動作をな
すものである6[作用] この発明による磁気ディスク表面検査用へ・・lドの切
り替え機構においては、上記の機構の説明により判明す
るように、バーニッシユヘヅドと突起検査ヘッドが同一
のX軸キャリッジに取り付けられているので、従来のほ
ぼ直角方向をなす2組のキャリーIジを設けた場合に比
較して、空間占有率がかなり低下してコンパクト化され
るものである。
In the above X-axis and Y-axis carriage mechanism, the burnish head and protrusion inspection head are switched by moving the X-axis carry head, and each is set at an operating position on a fixed radius on the surface of the magnetic disk. be done. In addition, each set head is moved on the above-mentioned fixed radius by the movement of the Y-axis carry direction, and performs its respective operation. As is clear from the above explanation of the mechanism, the burnishing head and protrusion inspection head are attached to the same X-axis carriage in the switching mechanism for switching to and from the front. Compared to the case where two sets of carry wheels are provided, the space occupation rate is considerably reduced and the structure is made more compact.

[実施例J 第1図はこの発明による、磁気ディスク表面検査用ヘッ
ドの切り替え機構の実施例における、構造を示す概略の
平面図である0図において、磁気ディスク1の一定の半
径線1aをバーニッシュへN/ド2および突起検査へ−
lド5の動作線とし、バーニッシュヘッド2および突起
検査ヘッド5は、駆動モータ9の回転によるX軸キャリ
ヅジ8の移動により、この半径線1aの位置に移動する
ことにより切り替えられてそれぞれの動作を行う。各動
作は、X軸キャリッジ8を搭載するY軸キャリッジ10
が駆動モータ11の回転により移動して、半径線1aに
沿って磁気ディスク1の外側より中心まで、バー二・’
/lシュたは突起検査を行うものである。なお、ストッ
パ12はヘッド2が動作位置にあるときのX軸キャリッ
ジ8の右側の限界位置である。なおこれ以外にもスト・
ソバが設けられるが、ここでは省略する。
[Embodiment J] Figure 1 is a schematic plan view showing the structure of an embodiment of a switching mechanism for a magnetic disk surface inspection head according to the present invention. To Niche N/Do 2 and protrusion inspection-
The burnish head 2 and protrusion inspection head 5 are switched by moving to the position of this radius line 1a by the movement of the X-axis carriage 8 due to the rotation of the drive motor 9, and perform their respective operations. I do. Each movement is performed by a Y-axis carriage 10 on which an X-axis carriage 8 is mounted.
is moved by the rotation of the drive motor 11, and the bar 2' is moved along the radius line 1a from the outside to the center of the magnetic disk 1.
/l is used to inspect protrusions. Note that the stopper 12 is the right-hand limit position of the X-axis carriage 8 when the head 2 is in the operating position. In addition to this, there are also strikes and
Soba is served, but it is omitted here.

ここで従来の機構とこの発明による81構のサイズを比
較する。
Here, the sizes of the conventional mechanism and the 81 mechanism according to the present invention will be compared.

第2図に示した従来の機構において、磁気゛デ′イスク
1の中心と駆動モータ4の(後端)までの長さ!:Aと
する。ヘッド5の側も同じである0次に第1図において
、ヘッド支持具2a 、Y軸キャリッジ10などを第2
のへ・・!ド支持具2a、キャリッジ3と同じ長さのも
のとすると、両者の縦方向の大きさ寸法はほぼ同一であ
る。しかし、接方向については、第2図の場合はキャリ
ッジ3と6が直角方向にあるので、駆動モータ4と7の
端部の間隔A゛は、はぼ1.4Aである7これに対して
、第1図の場合は、支持具2aがX軸キャリッジ8の移
動方向と直角に取り付けられているため、X軸キャリッ
ジ8の長さをキャリッジ3と等しいとすれば、その移動
範囲BはAにほぼ等しい。すなわち、第2図の場合に比
較して第1図は接方向の寸法を小さくコンパクト化でき
るものである。
In the conventional mechanism shown in FIG. 2, the length from the center of the magnetic disk 1 to the rear end of the drive motor 4! : Set as A. In FIG. 1, the head support 2a, Y-axis carriage 10, etc.
Nohe...! Assuming that the board support 2a and the carriage 3 have the same length, their longitudinal dimensions are almost the same. However, in the tangential direction, since the carriages 3 and 6 are in the right angle direction in the case of FIG. 2, the distance A' between the ends of the drive motors 4 and 7 is approximately 1.4A. In the case of FIG. 1, the support 2a is attached perpendicular to the moving direction of the X-axis carriage 8, so if the length of the X-axis carriage 8 is equal to the carriage 3, its movement range B is A. approximately equal to. That is, compared to the case of FIG. 2, the size in the tangential direction in FIG. 1 can be made smaller and more compact.

[発明の効果] 以上の説明により明らかなように、この発明による磁気
ディスク表面検査用ヘッドの切り替え機構においては、
従来磁気ディスクの中心で直交する2軸の方向に設けら
れていたバー二・・lシュへ・・lドと突起検査ヘッド
のキャリッジに対して、キャリッジを中心から離れた位
置で直交するX、Y軸方向とし、へ・ブトおよび支持具
の取り付は分Y軸方向とすることにより、X軸(槽)方
向の寸法が縮小される効果があり、磁気ディスク検査ラ
インのグライドテスターのコンパクト化に寄与するもの
である。
[Effects of the Invention] As is clear from the above explanation, the magnetic disk surface inspection head switching mechanism according to the present invention has the following effects:
In contrast to the conventional two axes that are orthogonal to each other at the center of the magnetic disk, there are two axes that are orthogonal to each other at a position away from the center of the carriage. By installing the shaft and support in the Y-axis direction, the dimensions in the X-axis (tank) direction can be reduced, making the glide tester for magnetic disk inspection lines more compact. This contributes to

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、この発明による磁気ディスク表面検査用ヘッ
ドの切り替え機構の実施例における、構造を示す平面図
、第2図は従来のヘッド切り替え機構の構造の平面図で
ある。 1・・・磁気ディスク、   1a・・・半径線。 2・・・バーニッシュヘッド、2a・・・支持具。 3.6・・・キャリッジ、5・・・突起検査へ・1ド。 5a・・・支持具、4.7.9.11・・・駆動モータ
。 8・・・X軸キャリーIジ、 IO・・・Y軸キャリッ
ジ。 12・・・スト・ソバ4
FIG. 1 is a plan view showing the structure of an embodiment of a magnetic disk surface inspection head switching mechanism according to the present invention, and FIG. 2 is a plan view showing the structure of a conventional head switching mechanism. 1...Magnetic disk, 1a...Radius line. 2... Burnish head, 2a... Support tool. 3.6...Carriage, 5...Protrusion inspection/1. 5a... Support tool, 4.7.9.11... Drive motor. 8...X-axis carry Iji, IO...Y-axis carriage. 12...Sto Soba 4

Claims (2)

【特許請求の範囲】[Claims] (1)、回転中の磁気ディスクの表面に接触して、該表
面に存在する突起を除去するバーニッシュヘッドと、該
バーニッシュヘッドにより該突起が除去された上記表面
に残存する突起を検査する突起検査ヘッドとよりなる磁
気ディスク表面突起検査装置において、上記バーニッシ
ュヘッドと上記突起検査ヘッドとを取り付けたX軸キャ
リッジと、該X軸キャリッジを搭載したY軸キャリッジ
とよりなるX、Yキャリッジ機構を有することを特徴と
する、磁気ディスク表面検査用ヘッドの切り替え機構。
(1) A burnish head that contacts the surface of a rotating magnetic disk to remove protrusions existing on the surface, and inspects protrusions remaining on the surface from which the protrusions have been removed by the burnish head. In a magnetic disk surface protrusion inspection apparatus comprising a protrusion inspection head, an X, Y carriage mechanism includes an X-axis carriage to which the burnish head and the protrusion inspection head are attached, and a Y-axis carriage on which the X-axis carriage is mounted. 1. A switching mechanism for a magnetic disk surface inspection head, comprising:
(2)、X軸方向の移動により上記バーニッシュヘッド
と上記突起検査ヘッドとが切り替えられて、上記磁気デ
ィスクの表面の一定の半径上の動作位置にそれぞれをセ
ットする上記X軸キャリッジと、該セットされた上記バ
ーニッシュヘッドと上記突起検査ヘッドを、上記一定の
半径上をそれぞれ移動させる上記Y軸キャリッジとより
なる上記X、Y軸キャリッジ機構を有する、特許請求の
範囲第1項記載の磁気ディスク表面検査用ヘッドの切り
替え機構。
(2) the X-axis carriage, which switches between the burnish head and the protrusion inspection head by moving in the X-axis direction, and sets each of them at an operating position on a constant radius on the surface of the magnetic disk; The magnetism according to claim 1, further comprising the X and Y axis carriage mechanism including the Y axis carriage for moving the set burnish head and the protrusion inspection head respectively on the fixed radius. Switching mechanism for disk surface inspection heads.
JP502187A 1987-01-14 1987-01-14 Head switching mechanism for magnetic disk surface inspection Expired - Fee Related JPH07105040B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP502187A JPH07105040B2 (en) 1987-01-14 1987-01-14 Head switching mechanism for magnetic disk surface inspection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP502187A JPH07105040B2 (en) 1987-01-14 1987-01-14 Head switching mechanism for magnetic disk surface inspection

Publications (2)

Publication Number Publication Date
JPS63175278A true JPS63175278A (en) 1988-07-19
JPH07105040B2 JPH07105040B2 (en) 1995-11-13

Family

ID=11599855

Family Applications (1)

Application Number Title Priority Date Filing Date
JP502187A Expired - Fee Related JPH07105040B2 (en) 1987-01-14 1987-01-14 Head switching mechanism for magnetic disk surface inspection

Country Status (1)

Country Link
JP (1) JPH07105040B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5423111A (en) * 1992-09-22 1995-06-13 Hitachi Electronics Engineering Co., Ltd. Magnetic disk tester

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5423111A (en) * 1992-09-22 1995-06-13 Hitachi Electronics Engineering Co., Ltd. Magnetic disk tester

Also Published As

Publication number Publication date
JPH07105040B2 (en) 1995-11-13

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