JPS63170778U - - Google Patents
Info
- Publication number
- JPS63170778U JPS63170778U JP6447087U JP6447087U JPS63170778U JP S63170778 U JPS63170778 U JP S63170778U JP 6447087 U JP6447087 U JP 6447087U JP 6447087 U JP6447087 U JP 6447087U JP S63170778 U JPS63170778 U JP S63170778U
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- exclusive
- input
- under test
- connect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6447087U JPS63170778U (en:Method) | 1987-04-28 | 1987-04-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6447087U JPS63170778U (en:Method) | 1987-04-28 | 1987-04-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63170778U true JPS63170778U (en:Method) | 1988-11-07 |
Family
ID=30900659
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6447087U Pending JPS63170778U (en:Method) | 1987-04-28 | 1987-04-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63170778U (en:Method) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5637572A (en) * | 1979-09-05 | 1981-04-11 | Toshiba Corp | Test unit for semiconductor circuit |
| JPS61105474A (ja) * | 1984-10-29 | 1986-05-23 | Toshiba Corp | 半導体装置試験用ボ−ドの検査装置 |
-
1987
- 1987-04-28 JP JP6447087U patent/JPS63170778U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5637572A (en) * | 1979-09-05 | 1981-04-11 | Toshiba Corp | Test unit for semiconductor circuit |
| JPS61105474A (ja) * | 1984-10-29 | 1986-05-23 | Toshiba Corp | 半導体装置試験用ボ−ドの検査装置 |