JPS63168960A - Scanning method of quadruple mass spectrometer - Google Patents

Scanning method of quadruple mass spectrometer

Info

Publication number
JPS63168960A
JPS63168960A JP61310924A JP31092486A JPS63168960A JP S63168960 A JPS63168960 A JP S63168960A JP 61310924 A JP61310924 A JP 61310924A JP 31092486 A JP31092486 A JP 31092486A JP S63168960 A JPS63168960 A JP S63168960A
Authority
JP
Japan
Prior art keywords
detector
peak
voltage
background
mass spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61310924A
Other languages
Japanese (ja)
Inventor
Kozo Miishi
御石 浩三
Hiroto Itoi
弘人 糸井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP61310924A priority Critical patent/JPS63168960A/en
Publication of JPS63168960A publication Critical patent/JPS63168960A/en
Pending legal-status Critical Current

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  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To prevent a strong current from flowing in a detector and to protect the detector from deterioration, by making either a high-frequency voltage or a DC voltage deviate from a specific relation, and avoiding to detect a background peak, at the point where the background peak exists. CONSTITUTION:In a scanning method of a quadruple mass spectrometer, either a DC voltage or a high-frequency voltage which is applied to a rod is made to deviate from a specific scanning condition at the point where a background peak exists. And the scanning line is made to detour and deviate from the stable area of the background component ions with a strong peak, and the detection of the peak current is avoided. Therefore, the deterioration of a detector such as a secondary electron multiplier owing to a large ion current of an unnecessary background component can be prevented, and the service life of the detector is improved.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は4重極質量分析計を用いた質量スペクトルの測
定技術に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (Industrial Application Field) The present invention relates to a mass spectrum measurement technique using a quadrupole mass spectrometer.

(従来技術) 試料の質量スペクトルを測定する場合、スペクトル中に
強いバックグラウンドピークが存在する場合がある。例
えばガスクロマトグラフ質量分析計においては試料を溶
解した溶媒ピーク、CIイオン化法の場合には反応イオ
ンピーク、放電プラズマをイオン源として用いる装置に
おいてはバルクプラズマを形成するガス成分のイオンに
よるピークなどが強いバックグラウンドピークとして現
れる。
(Prior Art) When measuring the mass spectrum of a sample, a strong background peak may exist in the spectrum. For example, in a gas chromatograph mass spectrometer, there is a strong solvent peak in which the sample is dissolved, in the case of CI ionization, there is a reaction ion peak, and in an apparatus that uses discharge plasma as an ion source, there is a strong peak due to ions of gas components forming the bulk plasma. Appears as a background peak.

強いピークが質量スペクトル中に存在することは、検出
器に強いイオン電流が流入したことを意味するものであ
るが、このように強いイオン電流を2次電子増倍管のよ
うな検出器の劣化を早めるという問題があった。
The presence of strong peaks in the mass spectrum means that a strong ion current has flowed into the detector. There was a problem with accelerating the

(発明が解決しようとする問題点) 本発明は4重極質量分析計による質量スペクトルの測定
の際に、バックグラウンド成分に由来する強いイオン電
流が検出器に流入しないようにして、検出器の劣化を防
止することを目的とするものである。
(Problems to be Solved by the Invention) The present invention prevents strong ion current originating from background components from flowing into the detector when measuring a mass spectrum using a quadrupole mass spectrometer. The purpose is to prevent deterioration.

(問題点を解決するための手段) 上記の目的を達成するために、本発明による4重極質量
分析計の走査方法は、ロッドに印加する直流電圧と高周
波電圧を互いに一定の関係に保ちながら変化させて、試
料の質量スペクトルを走査する4重極質量分析計におい
て、バックグラウンドピークが存在する箇所で、高周波
電圧と直流電圧のいずれか一方を上記関係から逸脱させ
ることにより、バックグラウンドピークの検出を回避す
るようにしたものである。
(Means for Solving the Problems) In order to achieve the above object, the scanning method of the quadrupole mass spectrometer according to the present invention is such that the scanning method of the quadrupole mass spectrometer according to the present invention maintains the direct current voltage and the high frequency voltage applied to the rods in a constant relationship with each other. In a quadrupole mass spectrometer that scans the mass spectrum of a sample by changing the frequency, the background peak can be removed by changing either the high frequency voltage or the DC voltage from the above relationship at the location where the background peak exists. This is to avoid detection.

(作用) 4重極質量分析計は、4本のロッドで囲まれた領域に形
成される4電極場をイオンが通過する際に、イオン軌道
の安定性がイオンの質量数によって異なることを利用し
て質量分析を行うものであり、ロッドに印加される直流
電圧をU1高周波電圧をVとした場合、4電極場におけ
るイオンの安定性は、次式で定義されるパラメータa及
びqによって第1図のように与えられる。
(Operation) Quadrupole mass spectrometers utilize the fact that the stability of ion trajectories varies depending on the mass number of ions when ions pass through a four-electrode field formed in an area surrounded by four rods. When the DC voltage applied to the rod is U1 and the high frequency voltage is V, the stability of ions in the four-electrode field is determined by the parameters a and q defined by the following equation. Given as shown.

a = 4 e U/mω’r o’       (
1)q = 2e V / mω’ra”      
 (2)但しU:直流電圧 V:高周波電圧 m:イオンの質量 ω:高周波角周波数 ro:4本のロッドの内接円半径 図中A、B、Cで囲まれた部分が、ある質量のイオンの
安定領域であり、いまa−q平面において点(a、q)
が直線DEを描くようにU、Vを走査させると、線分F
G間で上記質量数のイオンが安定軌道を描いて検出器に
達することになり、その結実質量スペクトルが得られる
のである。
a = 4 e U/mω'r o' (
1) q = 2e V / mω'ra"
(2) However, U: DC voltage V: High frequency voltage m: Ion mass ω: High frequency angular frequency ro: Radius of the inscribed circle of the four rods The part surrounded by A, B, and C in the diagram has a certain mass. This is the stable region of ions, and now the point (a, q) on the a-q plane
When U and V are scanned so as to draw a straight line DE, the line segment F
Ions with the above mass number draw a stable trajectory between G and reach the detector, and their condensation mass spectrum is obtained.

この走査線DEに対応するUとVの関係式は、(1)式
及び(2)式より U=α+βv(3) と表すことができるので、線分PCの部分でUまたはV
をこの関係式から逸脱させ、図に破線HIJKで示した
ように U〉α+βv(4) となる方向に走査線を迂回させると、線分FG上の質量
数のイオンは検出器に達しなくなる。
The relational expression between U and V corresponding to this scanning line DE can be expressed as U=α+βv(3) from equations (1) and (2).
When deviates from this relational expression and detours the scanning line in the direction of U>α+βv(4) as shown by the broken line HIJK in the figure, ions with the mass number on the line segment FG will no longer reach the detector.

(実施例) 第2図は上述の特定区間HKにおいて、直流型圧Uを(
3)式の条件から逸脱させることによって走査線を迂回
させた例を示したもので、横軸に質量をとり、第1図の
走査線を与えるU、Vの値を質量の関数として表したも
のである。同図において、MI及びM3の質量数のイオ
ンは検出器に達するが、M、の質量数のイオンは、第1
図の破線のように走査線が不安定領域を通るために、検
出器には達しない。
(Example) Figure 2 shows the DC type pressure U (
3) This shows an example in which the scanning line is detoured by deviating from the conditions of the equation.The horizontal axis represents mass, and the values of U and V that give the scanning line in Figure 1 are expressed as a function of mass. It is something. In the same figure, ions with mass numbers MI and M3 reach the detector, but ions with mass number M,
Since the scanning line passes through an unstable region as shown by the broken line in the figure, it does not reach the detector.

従って予め分かっているバックグラウンド成分の強いピ
ークの質量数を、第2図のM、に対応させておけば、強
いピーク電流が検出器に流入するのを防止することがで
きるのである。
Therefore, if the mass number of the strong peak of the background component, which is known in advance, is made to correspond to M in FIG. 2, it is possible to prevent a strong peak current from flowing into the detector.

なお第3図は高周波電圧Vを変えることによって、走査
線を迂回させた例である。
Note that FIG. 3 shows an example in which the scanning line is detoured by changing the high frequency voltage V.

(発明の効果) 上記のように本発明は、4重極質量分析計の走査方法に
おいて、バックグラウンドピークが存在する箇所で、ロ
ッドに印加される直流電圧と高周波電圧のいずれか一方
を一定の走査条件から逸脱させ、強いピークを持つバッ
クグラウンド成分イオンの安定領域から外れるように走
査線を迂回させて、ピーク電流の検出を回避するように
したので、二次電子増倍管などの検出器が不要なバック
グラウンド成分による大きなイオン電流により劣化する
のを防止し、検出器の寿命を向上し得るという利点があ
る。
(Effects of the Invention) As described above, in the scanning method of a quadrupole mass spectrometer, the present invention maintains either the DC voltage or the high frequency voltage applied to the rod at a constant level at a location where a background peak exists. By deviating from the scanning conditions and bypassing the scanning line out of the stable region of background component ions with strong peaks, we avoided detection of peak currents, which makes it difficult to detect detectors such as secondary electron multipliers. This has the advantage of preventing deterioration of the detector due to large ion current due to unnecessary background components and improving the lifetime of the detector.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の原理説明図、第2図は同上の一実施例
の動作説明図、第3図は同上の他の実施例の動作説明図
である。
FIG. 1 is an explanatory diagram of the principle of the present invention, FIG. 2 is an explanatory diagram of the operation of one embodiment of the same, and FIG. 3 is an explanatory diagram of the operation of another embodiment of the same.

Claims (1)

【特許請求の範囲】[Claims] (1)ロッドに印加する直流電圧と高周波電圧を互いに
一定の関係に保ちながら変化させて、試料の質量スペク
トルを走査する4重極質量分析計において、バックグラ
ウンドピークが存在する箇所で、高周波電圧と直流電圧
のいずれか一方を上記関係から逸脱させることにより、
バックグラウンドピークの検出を回避することを特徴と
する4重極質量分析計の走査方法。
(1) In a quadrupole mass spectrometer that scans the mass spectrum of a sample by changing the DC voltage and high-frequency voltage applied to the rod while maintaining a constant relationship with each other, the high-frequency voltage is By making either of the and the DC voltage deviate from the above relationship,
A scanning method for a quadrupole mass spectrometer, characterized in that it avoids the detection of background peaks.
JP61310924A 1986-12-29 1986-12-29 Scanning method of quadruple mass spectrometer Pending JPS63168960A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61310924A JPS63168960A (en) 1986-12-29 1986-12-29 Scanning method of quadruple mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61310924A JPS63168960A (en) 1986-12-29 1986-12-29 Scanning method of quadruple mass spectrometer

Publications (1)

Publication Number Publication Date
JPS63168960A true JPS63168960A (en) 1988-07-12

Family

ID=18011025

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61310924A Pending JPS63168960A (en) 1986-12-29 1986-12-29 Scanning method of quadruple mass spectrometer

Country Status (1)

Country Link
JP (1) JPS63168960A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06290733A (en) * 1993-04-01 1994-10-18 Hitachi Ltd Quadrupole mass spectrometer
JP2007323838A (en) * 2006-05-30 2007-12-13 Shimadzu Corp Quadrupole mass spectrometer
WO2018003011A1 (en) * 2016-06-28 2018-01-04 株式会社島津製作所 Analysis device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS515312A (en) * 1974-05-27 1976-01-17 Reaktor Brennelement Union

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS515312A (en) * 1974-05-27 1976-01-17 Reaktor Brennelement Union

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06290733A (en) * 1993-04-01 1994-10-18 Hitachi Ltd Quadrupole mass spectrometer
JP2007323838A (en) * 2006-05-30 2007-12-13 Shimadzu Corp Quadrupole mass spectrometer
WO2018003011A1 (en) * 2016-06-28 2018-01-04 株式会社島津製作所 Analysis device
CN109416342A (en) * 2016-06-28 2019-03-01 株式会社岛津制作所 Analytical equipment
US10935528B2 (en) 2016-06-28 2021-03-02 Shimadzu Corporation Analysis device

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