JPS63166132U - - Google Patents

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Publication number
JPS63166132U
JPS63166132U JP5878887U JP5878887U JPS63166132U JP S63166132 U JPS63166132 U JP S63166132U JP 5878887 U JP5878887 U JP 5878887U JP 5878887 U JP5878887 U JP 5878887U JP S63166132 U JPS63166132 U JP S63166132U
Authority
JP
Japan
Prior art keywords
support frame
locking
handle
heat transfer
model registration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5878887U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5878887U priority Critical patent/JPS63166132U/ja
Publication of JPS63166132U publication Critical patent/JPS63166132U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Baking, Grill, Roasting (AREA)
JP5878887U 1987-04-17 1987-04-17 Pending JPS63166132U (OSRAM)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5878887U JPS63166132U (OSRAM) 1987-04-17 1987-04-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5878887U JPS63166132U (OSRAM) 1987-04-17 1987-04-17

Publications (1)

Publication Number Publication Date
JPS63166132U true JPS63166132U (OSRAM) 1988-10-28

Family

ID=30889675

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5878887U Pending JPS63166132U (OSRAM) 1987-04-17 1987-04-17

Country Status (1)

Country Link
JP (1) JPS63166132U (OSRAM)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7319335B2 (en) 2004-02-12 2008-01-15 Applied Materials, Inc. Configurable prober for TFT LCD array testing
US7330021B2 (en) 2004-02-12 2008-02-12 Applied Materials, Inc. Integrated substrate transfer module
US7355418B2 (en) 2004-02-12 2008-04-08 Applied Materials, Inc. Configurable prober for TFT LCD array test
US7535238B2 (en) 2005-04-29 2009-05-19 Applied Materials, Inc. In-line electron beam test system
US7569818B2 (en) 2006-03-14 2009-08-04 Applied Materials, Inc. Method to reduce cross talk in a multi column e-beam test system
US7602199B2 (en) 2006-05-31 2009-10-13 Applied Materials, Inc. Mini-prober for TFT-LCD testing

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4316905Y1 (OSRAM) * 1964-03-30 1968-07-13
JPS5547460U (OSRAM) * 1978-09-25 1980-03-28

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4316905Y1 (OSRAM) * 1964-03-30 1968-07-13
JPS5547460U (OSRAM) * 1978-09-25 1980-03-28

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7319335B2 (en) 2004-02-12 2008-01-15 Applied Materials, Inc. Configurable prober for TFT LCD array testing
US7330021B2 (en) 2004-02-12 2008-02-12 Applied Materials, Inc. Integrated substrate transfer module
US7355418B2 (en) 2004-02-12 2008-04-08 Applied Materials, Inc. Configurable prober for TFT LCD array test
US7535238B2 (en) 2005-04-29 2009-05-19 Applied Materials, Inc. In-line electron beam test system
US7569818B2 (en) 2006-03-14 2009-08-04 Applied Materials, Inc. Method to reduce cross talk in a multi column e-beam test system
US7602199B2 (en) 2006-05-31 2009-10-13 Applied Materials, Inc. Mini-prober for TFT-LCD testing

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